Showing results: 796 - 810 of 1427 items found.
-
all-sun
*Measures surface temperature without contact*Laser pointer for accurate use*Easy to read large digital display*Blue backlight*Low battery indication
-
LISST-VSF -
Sequoia Scientific, Inc.
In-situ measurements of P11, P12 and P22 elements of scattering Mueller matrix, (P11 is VSF) from 15-150º.VSF (P11) only at small angles, 0.05 to 10º in 32 logarithmic steps in angles.Only two detectors employed with absolute radiant sensitivity (A/W) calibration.Beam attenuation measured with optics similar to our LISST-100X.Roving Eyeball™ optics permit 1-degree resolution in angles between 15 -150º.Sampling rate at 3 seconds per measurement set (involves 3 turns of Roving Eyeball with unpolarized, vertical, and horizontal polarized laser).Daylight rejection by laser modulation.Dynamic range in VSF measurements extended via laser power modulation.Data from small and large angles in a single data stream, including depth and temperature.
-
M² -
mks Ophir
M², or Beam Propagation Ratio, is a value that indicates how close a laser is to being a single mode TEM00 beam, which in turn determines how small a beam waist can be focused. For the perfect Gaussian TEM00 condition the M² equals 1. M² cannot be determined from a single beam profile measurement. The ISO/DIS 11146 requires that M² be calculated from a series of measurements. M² is measured on real beams by focusing the beam with a fixed position lens of known focal length, and then measuring the characteristics of the artificially created beam waist and divergence. We have a number of solutions for the measurement of M² ranging from simple manual processes to fully automated dedicated instruments, depending on the frequency of the need to measure M² of lasers and laser systems.
-
NanoScan -
mks Ophir
Measure your beam as never before with the NanoScan™ beam profiler. The advantage of scanning slit beam profiling is sub-micron precision for measuring beam position and size. Scan head configurations include Silicon, Germanium, and Pyroelectric versions for a wide range of wavelengths and laser power levels. The NanoScan software is available in two versions: Standard and Professional, and includes an extensive set of ISO quantitative measurements, an M2 Wizard, and the ability to measure laser power.
-
Bristol Instruments, Inc.
Bristol Instruments'' wavelength meters are for scientists and engineers who need to know the exact wavelength of their lasers. These systems use proven interferometer-based technology to measure absolute wavelength to an accuracy as high as 0.0001 nm. To achieve the reliable accuracy that is expected from Bristol Instruments, all of its wavelength meters include a built-in wavelength standard for continuous calibration. Systems are available for CW and pulsed lasers that operate at wavelengths from 350 nm to 12 m.
-
KANOMAX USA, Inc.
A Laser Doppler Velocimeter (LDV) measures fluid velocity by utilizing coherence of laser light. It detects the Doppler shift frequency of the scattering light of particles in the fluid and calculates the velocity of the particles (fluid). With a LDV system, non-intrusive measurements without disturbing the measuring object, liquid or gas flow, are achieved. No calibration is necessary and reverse flow measurements at a high resolution is also possible. The LDV system provides the absolute value of the flow velocity with accuracy.
-
Euresys Inc.
Ease the configuration and the setup of a laser triangulation scanner using the Coaxlink Quad 3D-LLESimplify the calibration procedureDisplay interactive Depth Maps, 3D Point Clouds and ZmapsFree of charge
-
OpenFixture -
TinyLabs
OpenFixture is a fully parametric programming/test fixturing solution written in openscad. The inputs are generated/captured from the users board layout software and a laser cuttable fixture is generated automagically.
-
OPM-50 -
ShinewayTech
OPM-50 paired with SLS-50 Intelligent Stabilized Laser Source can be used to identify fiber, measure attenuation and loss, verify continuity and evaluate fiber link transmission quality.
-
LIGHTnPS -
Unity Semiconductor SAS
• Best in class throughput• High surface sentivity• Full haze characterization• High lifetime / low CoO solid state laser• Advanced Automatic Defect Classification
-
Rollball International
In fiber-optic communications, wavelength-division multiplexing is a technology which multiplexes a number of optical carrier signals onto a single optical fiber by using different wavelengths of laser light.
-
Leuze electronic GmbH + Co. KG
With moving system parts that need to automatically work together, the positioning of parts or work pieces with millimeter accuracy is of great importance. For this purpose, sensors with various operating principles are provided: laser distance measurement devices that measure against a reflector, bar code positioning systems whose red light laser determines position and speed relative to a bar code tape, sensors for optical guidance using edge detection as well as solutions for camera-based compartment fine positioning.
-
Renesas Electronics Corp.
RV2X6376A Series of directly modulated laser (DML) diodes deliver 25 Gbps x four wavelengths as the light source in 100 Gbps optical transceivers that enable high-speed communications inside 4.9G and 5G LTE base stations, and between data center routers and servers. The RV2X6376A Series are the industry’s first industrial-temperature (-40°C to 95°C) DML diodes that support full 25 Gbps speed (per individual laser) without cooling.
-
PSD-Array -
SiTek Electro Optics AB
The PSD array consists of 16 parallel one-dimensional PSD elements on the same chip. By utilizing the triangulation technique the reflection of a laser line or multiple laser spots onto the PSD array will provide information about the contour of the illuminated object. The possibility for simultaneous readout of the 16 elements together with the fast response of each element makes the PSD array suitable for applications like high speed 3D contour measurements and measurements of parallel, moving objects such as cantilevers.
-
HORIBA, Ltd.
UV Raman (with laser wavelengths below 400nm) can be used to probe specific sample properties, and benefit from experiment properties different from typical visible Raman measurements – for example, greatly increased Raman scattering efficiency, modified laser penetration within the sample, and resonance coupling to different chemical moeities. However, UV analyses come with a number of technical challenges, that require considered instrument design to allow UV Raman to be a truly useful tool for the researcher.