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Showing results: 991 - 1005 of 1082 items found.

  • LXI Low Thermal EMF Matrix 1-pole 14x33

    60-510-004 - Pickering Interfaces Ltd.

    The 60-510 is a high density 1-pole matrix module controlled via LXI. It has excellent thermal stability and substantially reduced thermal EMF figures when compared to a conventional switching matrix. Typical applications include signal routing in ATE, selecting thermocouple inputs, switching amplifier gain circuits and high accuracy DC micro-volt measurements. Ruthenium reed switches are used because of their good low level switching capability. They also have a very long life with excellent contact resistance stability, minimal wetting current and low thermal offset. The 60-510 is designed in accordance with the LXI Standard 1.4 and is supplied in a 2U high, full rack width case with 500mm depth.

  • Solar Radiation (Sunshine) Test

    Aero Nav Laboratories, Inc.

    This test determines the effects of direct solar radiation on components and material. The heating effects of solar radiation differ from those of high air temperature in that the amount of heat absorbed depends on the roughness and color of the surface on which the radiation is incident and the angle of incidence to the sun. Variations in the intensity of solar radiation over the surface of the component, may cause components to expand or contract at different rates, which can lead to severe stresses and loss of structural integrity. In addition, degradation due to photo-chemical changes can occur such as fading of color, deterioration of natural and synthetic elastomers and polymers. The test items that are subjected to solar radiation testing are those that are exposed to solar radiation during its life cycle, in the open, in warm climates.

  • Adlink's GPU Solutions

    ADLINK Technology Inc.

    ADLINK is a global provider of leading edge computing solutions and an NVIDIA® Quadro® Embedded Partner and Jetson™ Elite Partner. To enable edge systems to tap into the power that can be provided by GPU computing, ADLINK offers a comprehensive portfolio of optimized heterogeneous computing solutions including embedded MXM GPU modules and PCI Express graphics cards based on NVIDIA® Quadro® GPUs, edge AI platforms based on NVIDIA® Jetson™ modules, GPU computing platforms and other embedded form factors that can accelerate edge computing and AI workloads to satisfy a wide range of embedded requirements based on performance, long life cycle, power consumption, and form factor.

  • Current Protection Relay

    Mors Smitt Group

    The main earth fault protection relays in distributions systems, power stations & large manufacturing / processing plants can fail to detect a high impedance break down to earth causing hazard to human life & potential damage to plant & equipment. In these & other situations demanding extra sensitive earth fault protection, using solid state techniques, can be applied to detect earth currents down to 0.5% of the CT nominal current.The relay is tuned to reject 3rd & higher harmonic frequencies to avoid problems under quiescent conditions. An adjustable time delay is built in to provide stability during switching & other transient disturbances & to allow adequate grading with other protection systems at high fault current levels.

  • Waterproof pH/mV/Temperature Kit

    Extech PH300 - Extech Instruments Corporation

    This pH/Temperature Kit measures pH, mV, and temperature at your workbench or in the field. It has automatic one button calibration of 4, 7 and 10 pH with a choice of three point calibration for better accuracy and automatic temperature compensation. Memory stores up to 200 readings with series number, measured value and temperature. The meter has a large, blue, backlit LCD display screen with an auto power off function with disable that saves battery life. The IP57 waterproof housing protects it from moisture and the elements. Comes with a pH/mV/temp electrode, a protective rubber holster, the pH calibration solutions (4, 7, and 10 pH), two AA batteries, hard carrying case, and user manual.

  • High Low Temperature Test Chamber

    ACMAS Technologies Pvt. Ltd.

    The high low temperature test chambers from Weiber are climatic test chambers, designed to simulate highly precise high and low temperature environments for the testing of electrical and electronics items, metallic products, automobile parts, food items, biological samples, chemicals, building materials and other wide variety of processed and packaged goods. These test chambers find widespread usage in manufacturing units, quality control units and scientific research organizations and are commonly employed for heat endurance test, cold endurance test and humidity and dryness endurance tests of products. These tests help in determining the product performance in specific environments and also help in identifying any manufacturing flaws and in determining its stability and shelf life.

  • MicroLite USB Data Loggers

    Fourier Systems

    The family of MicroLite USB data loggers includes six models covering temperature, humidity, current and voltage measurements, providing the ideal solution for a wide range of industrial applications. Combining innovation with simplicity, the MicroLite product line offers cost effective logging, with rich functionality in a compact design, direct USB connection, multi-trip usage, and high measurement accuracy and resolution. Real-time sensor readings with a corresponding time stamp are clearly displayed on the logger’s LCD screen, incorporating alarm thresholds. The logger is designed for low power consumption to extend battery life and reduce the time between battery replacements. The comprehensive MicroLite range allows you to select the device most appropriate to your mission-critical application.

  • Digital (1kV up) H.V. Insulation Tester

    6212A IN (Ranges: 0.5kV to 10kV 0.5kV increment steps) - Standard Electric Works Co., Ltd

    ● Microprocessor-controlled.● 2 ×16 characters; large intelligent LCD module.● 20 Insulation test voltages 500V, 1kV, 1.5kV, 2kV, 2.5kV, 3kV,    3.5kV, 4kV, 4.5kV, 5kV, 5.5kV, 6kV, 6.5kV, 7kV, 7.5kV, 8kV, 8.5kV,    9kV, 9.5kV, 10kV.● Ener-Save™ feature to extend battery life.● Bargraph indicates test voltage; rise and decay can be observed.● Visual and audible warning if external voltage is present(>500Vac or    Vdc.)● Insulation resistance; auto-ranging on all ranges.● Overload protection.● Low battery indicator (read time battery voltage measurement).● Measures insulation time duration of the test.● Low battery consumption.● Better than 10% accuracy on all ranges.● Auto-off.

  • Digital (1kV up) H.V. Insulation Testers

    6212A IN (Ranges: 0.5kV to 10kV 0.5kV increment steps) - Standard Electric Works Co., Ltd

    ● Microprocessor-controlled.● 2 ×16 characters; large intelligent LCD module.● 20 Insulation test voltages 500V, 1kV, 1.5kV, 2kV, 2.5kV, 3kV,    3.5kV, 4kV, 4.5kV, 5kV, 5.5kV, 6kV, 6.5kV, 7kV, 7.5kV, 8kV, 8.5kV,    9kV, 9.5kV, 10kV.● Ener-Save™ feature to extend battery life.● Bargraph indicates test voltage; rise and decay can be observed.● Visual and audible warning if external voltage is present(>500Vac or    Vdc.)● Insulation resistance; auto-ranging on all ranges.● Overload protection.● Low battery indicator (read time battery voltage measurement).● Measures insulation time duration of the test.● Low battery consumption.● Better than 10% accuracy on all ranges.● Auto-off.

  • PXI-5154, 1 GHz, 2 GS/s, 8-Bit, 64 MB/ch, PXI Oscilloscope

    780319-02 - NI

    1 GHz, 2 GS/s, 8-Bit, 64 MB/ch, PXI Oscilloscope—The PXI‑5154 is ideal for acquisition and characterization of fast, nanosecond-edge speeds. It is well-suited for automated test and data streaming applications in the consumer electronics, semiconductor, aerospace/defense, and life sciences industries. The PXI‑5154 also comes equipped with up to 256 MB of memory per channel to provide high, sustained sample rates over extended data capture windows. This digitizer, optimized for automated test, uses a high-throughput bus to lower test times, provides picosecond-level synchronization among modules, and integrates with the entire suite of NI hardware, so you can build and customize a complete mixed-signal or high‑channel‑count test system.

  • PXI-5154, 1 GHz, 2 GS/s, 8-Bit, 256 MB/ch, PXI Oscilloscope

    780319-03 - NI

    1 GHz, 2 GS/s, 8-Bit, 256 MB/ch, PXI Oscilloscope—The PXI‑5154 is ideal for acquisition and characterization of fast, nanosecond-edge speeds. It is well-suited for automated test and data streaming applications in the consumer electronics, semiconductor, aerospace/defense, and life sciences industries. The PXI‑5154 also comes equipped with up to 256 MB of memory per channel to provide high, sustained sample rates over extended data capture windows. This digitizer, optimized for automated test, uses a high-throughput bus to lower test times, provides picosecond-level synchronization among modules, and integrates with the entire suite of NI hardware, so you can build and customize a complete mixed-signal or high‑channel‑count test system.

  • PXI-5154, 1 GHz, 2 GS/s, 8-Bit, 8 MB/ch, PXI Oscilloscope

    780319-01 - NI

    1 GHz, 2 GS/s, 8-Bit, 8 MB/ch, PXI Oscilloscope—The PXI‑5154 is ideal for acquisition and characterization of fast, nanosecond-edge speeds. It is well-suited for automated test and data streaming applications in the consumer electronics, semiconductor, aerospace/defense, and life sciences industries. The PXI‑5154 also comes equipped with up to 256 MB of memory per channel to provide high, sustained sample rates over extended data capture windows. This digitizer, optimized for automated test, uses a high-throughput bus to lower test times, provides picosecond-level synchronization among modules, and integrates with the entire suite of NI hardware, so you can build and customize a complete mixed-signal or high‑channel‑count test system.

  • PXI Dual 3-Channel 10A Solid State MUX

    40-666-011 - Pickering Interfaces Ltd.

    The 40-666 is a high current multiplexer available in dual 3-channel or single 6-channel configurations occupying two slots of PXI chassis. Each multiplexer switch uses a fully isolated solid state relay which has been designed to offer fast operation under hot switching conditions and high inrush current with no operational life degradation. Each multiplexer channel can support 10A of continuous current and switch up to 200V signals. The switches can sustain inrush currents in excess of 50A. AC or DC signals can be switched since the switch is polarity insensitive. Note: The 40-666-011 supersedes the 40-666-001 which is functionally the same but with some changes in specification. A data sheet for the 40-666-001 can be found in the40-666/667 User Manual.

  • PXI Dual 3-Channel 30A Solid State MUX

    40-667-011 - Pickering Interfaces Ltd.

    The 40-667 is a high current multiplexer available in dual 3-channel or single 6-channel configurations occupying two slots of PXI chassis. Each multiplexer switch uses a fully isolated solid state relay which has been designed to offer fast operation under hot switching conditions and high inrush current with no operational life degradation.Each multiplexer channel can support 30A of continuous current and switch up to 40V signals. The switches can sustain inrush currents in excess of 120A. AC or DC signals can be switched since the switch is polarity insensitive.Note: The 40-666-011 supersedes the 40-666-001 which is functionally the same but with some changes in specification. A data sheet for the 40-666-001 can be found in the 40-666/667 User Manual.

  • Optical Path Converter

    LS512A/LS512B - Lisun Electronics Inc.

    There are many LED manufactories using two integrating spheres and one spectrophotometer to do test. The previous testing way is: when you use big sphere to test, the customer need to connect the detector cable and optical fiber from the Spectrophotometer to the big sphere, after the calibrating and then you can do the test. When you use the small sphere, you need to take away the detector cable and optical fiber from the big sphere to the small sphere, then need to calibrate again. It is too troublesome to take out the detector cable and optical fiber between the big sphere and small sphere, and you need to calibrate again for every change. The frequent change will also shorten the life of the detector cable and optical fiber.

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