Showing results: 256 - 270 of 539 items found.
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JSCAN -
Navatek Engineering Corp.
JSCAN lets you view and control JTAG pins in real-time without having to touch your board! With a simple click of your mouse, you can set pins HIGH or LOW and observe the results right on your PC.J-SCAN works independently of any logic inside the JTAG device, you do not need any special firmware, code or logic installed. View and control pins in real-time, program FLASH memories, create test macros, for system test, easy to use graphical interface and affordable.
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NI
Industrial Controllers are high-performance, fanless controllers that provide connectivity for communication and synchronization to EtherCAT and Ethernet CompactRIO chassis, EtherCAT motion drives, GigE Vision and USB3 Vision cameras, and other automation equipment. Controllers also have onboard isolated, transistor‐transistor logic (TTL), and differential digital I/O. You can use LabVIEW system design software to create, debug, and deploy logic to both the onboard FPGA and the processor. LabVIEW contains over 950 signal processing, analysis, control, and mathematics functions to accelerate development.
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Avtec Systems, Inc.
RT Logic recorder systems are trusted to record and faithfully replay the most critical signals and data streams—analog baseband, IF, digital serial, IP packets, and timing signals—from DC to multi-Gbps.
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Link Instruments
A Pattern Generator outputs digital data and is used to stimulate circuits. The data can be from user files, previously captured data or from the data creation wizard (editor) in the software. All of our Pattern Generators (digital word generators) are also Logic Analyzers and are controlled with easy-to-use Windows software. Some or all of the outputs are bi-directional and can be used to capture data.
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ACTAS CF80 -
KoCoS Messtechnik AG
Stationary test system for sequential final factory tests and function tests on up to 8 drives. The drive test system is operated and controlled with the ACTAS operating software. The test position is selected using the multiplex method. The test system can reproduce drive control with the aid of a logic module. This makes it possible to test any drive even if there is no control unit.
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JT 2111/MPV DIOS IDC -
JTAG Technologies Inc.
The JT 2111/MPV is a 64 channel boundary-scan digital I/O scan module enclosed in an impact resistant housing. The module is designed to test and control edge connectors, on-board connectors and logic clusters in boundary-scan applications. Multiple modules can be connected serially to increase the number of I/Os. Available with 96-pin DIN 41612 connectors and 20-pin 0.1″ pitch IDC connectors.
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TEST-330 -
Beijing GFUVE Electronics Co.,Ltd.
Test-330 three phase protective relay test equipment is a three phase current output and five phase voltage output relay tester with embedded host machine equipped with Complex Programmable Logic Device.
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40-410-001 -
Pickering Interfaces Ltd.
The 40-410 range of Digital I/O Modules are suitable for operating external devices, such as heavy duty relays (power, RF and high voltage types), solenoids, lamps, or for interfacing with external logic such as a programmable instrument with a BCD interface.
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NS-7001 -
Innovative Technical Systems
The NS-7001 is high-power noise source specifically designed to operate in the 2.11-2.17 GHz UMTS band. It features flat output power that is regulated over a wide temperature range with high rejection outside the operating band of interest. Logic control is provided to enable/disable the noise source and an internal BIT function continuously monitors the output power. Other frequency bands and power levels are available.
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Laurel Electronics, Inc
Accepts low-level differential or single-ended 5 V logic level quadrature signals from shaft encoders to display scaled position or scaled rate. One, two or four transitions may be counted at a maximum combined rate of 250 kHz and be mathematically scaled to display in engineering units from -999,999 to +999,999. An analog output scaled to the display and relay outputs are optional.
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TestKompress -
Mentor Graphics Corp.
TestKompress is an automatic test pattern generation (ATPG) tool that provides the highest quality scan test with the absolute lowest test cost. TestKompress has an industry-proven ATPG engine that applies effective fault models to your entire logic design. Manufacturing test costs are held in check by an award-winning test pattern compression technique called Embedded Deterministic Test (EDT).
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Telerik A.D.
Automated testing has come of age with Progress® Telerik® Test Studio. With the industry's fastest test recorder, its patent-pending mixed element find logic makes tests more stable and reliable while keeping test maintenance to a minimum. Test Studio maximizes test coverage ensuring optimal app quality and addresses QA’s top challenges.
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779005-01 -
NI
±5 V to 24 V, 6 Differential/Single-Ended Channels, 500 ns C Series Digital Module - The NI‑9411 works with industrial logic levels and signals for direct connection to a wide array of industrial switches, transducers, and devices. The NI‑9411 is a correlated digital module, so it can perform correlated measurements, triggering, and synchronization when installed in a CompactDAQ chassis.
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779005-02 -
NI
±5 V to 24 V, 6 Differential/Single-Ended Channels, 500 ns C Series Digital Module - The NI‑9411 works with industrial logic levels and signals for direct connection to a wide array of industrial switches, transducers, and devices. The NI‑9411 is a correlated digital module, so it can perform correlated measurements, triggering, and synchronization when installed in a CompactDAQ chassis.
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MachXO -
Lattice Semiconductor
*Up to 27.6 Kbits sysMEM™ embedded block RAM and up to 7.7Kbits distributed RAM*SRAM based logic can be reconfigured in milliseconds using JTAG port*IOs support LVCMOS, LVTTL, PCI, LVDS, Bus-LVDS, LVPECL, RSDS*Up to two analog PLLs per device that enable clock multiplication, division, and phase shifting*Available in TQFP, csBGA, caBGA and ftBGA packages