Showing results: 1711 - 1725 of 10458 items found.
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Langer EMV-Technik GmbH
The MP CI set up to measure coupling impedance is used to determine EMC characteristics of connectors and cables. The coupling inductivity defines the coupling inductance of external disturbance on the shield or on the ground with the desired signals. If the coupling inductivity is considered in the construction set-up and the pin or wire assignment of connectors or cables, then the connectors or cables will be more interference-resistant. The MP CI set-up for measuring coupling impedance can be used for following measurements at connectors or cables: 1. measurement of a single signal (common mode) 2. measurement of a symmetrical signal (common mode) 3. measurement of a symmetrical signal (differential mode)
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10706B -
Keysight Technologies
The Keysight 10706B High Stability Plane Mirror Interferometer is a dual pass interferometer used for multiple axis applications such as X-Y stages where the measurement mirror may move perpendicular to the measurement axis. This thermally stable optic, an exact functional replacement for the 10706A Plane Mirror Interferometer, reduces thermal measurement drift to 1/12 the value typically achieved by conventional plane mirror interferometers. The unique contribution of the 10706B is its tolerance of angular misalignment of the plane mirror reflector. The 10706A can accept a range of measurement mirror angular alignment changes.
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EVG®50 -
EV Group
High-throughput, high-resolution metrology for bonded stacks and single wafers. The EVG 50 (fully automated stand-alone tool) and the Inline Metrology Module (integrated in EVG''s high-volume manufacturing systems) offer highly accurate measurements at high speed, utilizing different measurement methods for a large number of applications. The tool''s application range covers multi-layer thickness measurements for determination of the total thickness variation (TTV) of an intermediate layer, the inspection of bond interfaces as well as resist thickness measurement, and meets the most demanding requirements of the yield-driven semiconductor industry.
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E3300 Family -
Advantest Corp.
The E3310 is a WAFER MVM-SEM* for next generation wafers, supporting 1Xnm node process development and volume production at the 22nm node and beyond. With its high-speed carrier system employing a dual arm vacuum robot, and low-vibration platform to improve measurement accuracy, the E3310 delivers high throughput and performance for wafer measurements. Its multi detector configuration and unique 3D measurement algorithm also enable stable, high-accuracy measurement of 3D transistor technologies such as FinFET. The E3310 makes a significant contribution to reducing process development turnaround time and improves productivity for next-generation devices.
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Model 2130 -
Magnetic Instrumentation Inc.
The Model 2130 Fluxmeter is a fully featured, high-end Fluxmeter based measurement system. It is a compact instrument with high accuracy, automatic drift correction, microprocessor control, and twelve measurement ranges to allow the operator to configure the meter for maximum resolution and accuracy. The Model 2130 is capable of measuring (DC), alternating (AC), or pulsed magnetic fields. Selecting primary measurement functions is quick and easy with dedicated front panel function keys. An easy to use menu allows access to user defined parameters such as upper and lower magnetic limits and relative magnetic measurements.
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Extech RPM33 -
Extech Instruments Corporation
The RPM33 provides both contact (2 to 19,999 rpm) and non-contact (2 to 99,999 rpm) RPM measurements for enhanced versatility. Laser guided non-contact RPM measurements taken up to 1.6-foot (500mm) away for added safety. Readings are displayed on the large five-digit backlit LCD. Store/recall 10 data sets in memory with 4 parameters (measurement, max, min and average). Comes with contact wheel for linear surface speed (0.2 to 6560 feet/minute; 0 to 1999.9 meters/minute) or RPM measurements, 9-volt battery, reflective tape, carrying case, and user manual.
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GT210PXIe -
Guide Technology, Inc.
With the GT210PXIe you can determine any frequency to 0.01 part per million (eight digits) in just 1 mS, and resolve each time measurement to 8pS. Couple that with 2300 measurements per second, one of the fastest rates available and you can acquire more data in a single second than a typical GPIB counter can in one minute! Faster measurements and higher resolution, along with built-in statistics functions give you a more thorough analysis of your signal. Standard deviation, peak to peak jitter, or a graph of the measurements are available at the push of a button.
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GT210PCIe -
Guide Technology, Inc.
with the GT210PCIe you can determine any frequency to 0.01 part per million (eight digits) in just 1 mS, and resolve each time measurement to 8pS. Couple that with 2300 measurements per second, one of the fastest rates available and you can acquire more data in a single second than a typical GPIB counter can in one minute! Faster measurements and higher resolution, along with built-in statistics functions give you a more thorough analysis of your signal. Standard deviation, peak to peak jitter, or a graph of the measurements are available at the push of a button.
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GT210PCI -
Guide Technology, Inc.
with the GT210PCI you can determine any frequency to 0.01 part per million (eight digits) in just 1 mS, and resolve each time measurement to 8pS. Couple that with 2300 measurements per second, one of the fastest rates available and you can acquire more data in a single second than a typical GPIB counter can in one minute! Faster measurements and higher resolution, along with built-in statistics functions give you a more thorough analysis of your signal. Standard deviation, peak to peak jitter, or a graph of the measurements are available at the push of a button.
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colorCONTROL MFA -
Micro-Epsilon Group
The colorCONTROL MFA is used for measurement of color and intensity on LEDs, displays, and colored objects. An additional benefit is the flexible positioning of the small fibers to the targets. By utilizing the colorCONTROL MFA up to 495 measurement points can be monitored simultaniously.
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EDB GmbH
Loudness Measurement and Monitoring according ITU-R BS.1770.3, EBU R-128 and ATSC A/85, incl. True Peak Measurement for all sub-channels incl. oversampling for enhanced accuracy, Loudness Range calculation and much more
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PARTICLE COUNTER | VP 135046 -
Maschinenbau Haldenwang GmbH & Co. KG.
With the PARTICLE COUNTER emission tester, you can really count every particle. Compact, rugged design, clearly readable display, rapid readiness for measurement and precise measurement results are the distinguishing features of the MAHA particle counter.
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Boonton Electronics
Providing the highest video bandwidth and fastest rise times, RTP5000 peak power sensors with Boonton’s Real-Time Power ProcessingTM deliver 100,000 measurements per second, no gaps in signal acquisition and zero measurement latency.
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Boonton Electronics
Providing the highest video bandwidth and fastest rise times, RTP5000 peak power sensors with Boonton’s Real-Time Power ProcessingTM deliver 100,000 measurements per second, no gaps in signal acquisition and zero measurement latency.
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Chromatic Focus Probe -
Werth Inc.
Measurement of highly reflective, absorbent and transparent materialsMeasuring results are independent of the surface propertiesEspecially suitable for fast and precise measurements on reflective surfaces, lenses, prisms and other optical devicesFlexible probe configurations for highly customized applications
