Showing results: 8761 - 8775 of 10567 items found.
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TWA Advanced Series -
IBEKO Power AB
TWA Advanced series is the latest DV Power solution for three-phase transformer winding resistance measurement and tap changer analysis. They are capable of testing six transformer windings with a single cable connection, as well as three-phase automatic transformer demagnetization. It has the option of the automated test mode, where the instrument operates the tap changer without operator input (minimizing the risk of human error) and records winding resistance results based on pre-selected stabilization criteria.The unique DVtest method of tap changer analysis enables checking the moving contacts of on-load tap changers during the transition, measuring the transition time, detecting open circuits, and many other types of faults. It is performed with 0.1 ms sampling rate, together with the measurement of tap changer motor current which detects motor and mechanical issues. A special proprietary algorithm is used for testing tap changers connected through a built-in series (booster) transformer. The DVtest can be performed either on one phase or simultaneously on three phases. It can also be performed together with the winding resistance test in all tap positions.A unique advantage of TWA Advanced instruments is the capability of simultaneously testing the winding resistance of all three phases of a three-phase transformer connected in a YN configuration. This can significantly speed up the testing– for example, it enables the operator to perform 33 measurements instead of 99 on a tap changer with 33 tap positions.TWA500 is equipped with a large 10.1” graphical touch-screen display, while TWA400 has a 7” graphical touch-screen display. Besides making the interface much more user-friendly compared to older winding ohmmeters, it also enables certain test options that were previously available only with DV-Win software. The most important among them are DVtest, tap changer motor current measurement, “Heat Run” test, test templates, and automatic test mode.
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LMS-3000 -
Lisun Electronics Inc.
• Measure and display the relative spectral power distribution (UV-VIS-NIR) P(λ), chromaticity coordinate, correlated color temperature, rending index, color difference, peak wavelength, luminous flux, luminous flux efficiency and photometry parameters of light source and light material under the control of general PC. • Automatically adjust high-voltage, it not only shortens the measurement time, but also reduces the wear and tear of the instrument • Simultaneously measure the temperature in both environment and integrating sphere to make the data more visually and reliably • Figure of chroma and color difference in test report can be exchanged freely • Color display and print. The relative spectral power distribution (UV-VIS-NIR) P(λ), reports both in English. RS-232-C interface, compatible with all kinds of computer • LSP-500 AC Power source PC RS-232-C interface. compatible with all kinds of computer • Range of wavelength: 380nm～780nm(Special:200nm～780nm) • Accuracy of wavelength: ±0.2nm • Repeatability of wavelength: ±0.1nm • Accuracy of chromaticity coordinate: ±0.0003(under standard illuminate A) • Spectrum sample interval: 5nm(Special order:1nm) • Luminosity linearity: 0.3% • Accuracy of luminosity: 1 class • Correlated color temperature measure range: 1500K～25000K • Accuracy of CCT: ±0.3%(under standard illuminate A) • Accuracy of rending index: ±(0.3%rd±0.3) • Environment temperature measure range: -10℃～80℃ • Temperature measure range(In sphere): -10℃～100℃
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Amida Technology, Inc.
AMIDA 2020XP CIS tester is the latest generation of CMOS image sensor-specific measuring instruments from Metatech. In addition to the original true and accurate measurement, the high-throughput mass production solution designed for the high-throughput inspection of image lens modules and camera lenses has been well received after nearly 20 years of mass production experience. First-class factories at home and abroad import production. AMIDA 2020XP CIS testing machine not only meets the customer's testing time and high output and accuracy requirements. Within the range of functional flexibility, users can customize their measurement requirements according to the definition of various sensors. AMIDA 2020XP CIS tester is a new generation of CMOS Image Sensor dedicated tester, which integrates DC open/short/leakage test, AC Pattern test and image test. It uses 180 Pin high-speed cable to connect to the test end
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Dalian Taijia Technology Co.,Ltd
Digital durometer for shore hardness testing pocket size model with integrated probe● Test scale: shore hardness● Standards: DIN53505, ASTMD2240, ISO7619, JISK7215● Parameters displayed: hardness result, average value, max. value● Measurement range:0-100HA(HD)(HC)● Measurement deviation:＜1%H● Resolution: 0.1● Auto switch off● With RS232C interface● Operating conditions: 0℃ to 40℃● Power supply: 4x1.5V AAA (UM-4) battery● Battery indicator: low battery indicator● Dimensions: 162x65x38mm● Weight (not including probe):173g● Application:Shore A is designed to measure the penetration hardness of rubber, elastomers and other rubber like substances such as neoprene, silicone, and vinyl. It can also be used for soft plastics, felt, leather and similar materials.Shore D is designed for plastics, Formica, Epoxies and Plexiglass.shore C is designed for various foam and sponge.
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CHY002 -
Rinch Industrial Co.,Limited
Using import semiconductor laser tube and import semiconductor photosensitive tube, assure sensitivity and response speed.Using import micropump，assure sampling volume steady，reduce noise.The key component-light scattering sensor obviously eliminate intracorporal stray light, improve SNR, test result more precise and reliable.The light scattering sensor got Chinese patent.Confidence measurement of this instrument，According to GB/T6167-2007 Standard，realize auto estimate clean class, creatively to auto estimate ≤9 location points clean class.1000 records stored, free to check previous data.User can optional PC data analysis software, realize data management.User can choose humidity sensor (optional accessories).Sampling volume display as digit, more intuitive and precise.“Measurement Number”function，realize multipoint management.Lithium battery，more safety，continuous working 6 hours.
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Radiant Technologies, Inc.
Radiant's Chamber/Pyroelectric Task sets the sample to a series of temperatures by performingGPIB control of an external thermal device. At each temperature it captures the sample’s polarization response and/or small-signalcapacitance. These are combined to calculate the pyroelectric coefficient. The Pyroelectric Task is to be used with a Radiant Test System and a Linkam Stage (-196C to 600C), Thermal Chambers, Hot Chucks, or a Furnace to automatically measure the Pulse Polarization response and Small Signal Capacitance of a Pyroelectric material that is being heated and/or cooled. Radiant's Pyroelectric measurement Task can be added to Vision at additional cost. This measurement suite fully characterizes the pyroelectric charge (polarization) response of the sample under test. The Pyroelectric Task suite controls various thermal controllers such as Quantum Design, Lake Shore, Delta Design, and many others. Detailed Listing of Thermal Controllers Registered in Vision. The Chamber/Pyroelectric Task is quoted upon request.
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DVTest Inc.
The Positioner HD is a two-axis azimuth over elevation positioner, for precise angular positioning with full spherical coverage. Designed for antenna and RF device measurement, the positioner is built out of low-reflection materials, with additional RF shielding for minimal multipath and improved measurement accuracy. A slip ring is included to allow for continuous 360° rotation in both axes. This system is highly configurable, with options for RF rotary joints, slip rings for data communications, and custom sizing. An external motor controller is included by default with the Positioner HD. This motor controller connects to a computer via USB and includes an easy-to-use graphic interface. Other command options include automated macros, manual control knobs, Python, Matlab, or Labview interfaces, or direct control via ASCII commands. The controller also includes a digital I/O trigger system, for precise synchronization with other devices.
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KP Technology
Our Ultra-high Vacuum Scanning Kelvin Probes (UHVSKP2020 and UHVSKP5050) give the user full access to work function (Φ) and contact potential difference (CPD) measurements under vacuum with the ability to scan a sample area of 20 x 20mm or 50 x 50mm respectively. Each system comes with the UHV head unit, tip amplifier (located at the mounting port), digital control unit and host PC with dedicated software. The tip can be retracted 100mm from the sample and approaches normal to the sample. The associated digital electronic unit powers the head unit and provides an interface between the head unit and the data acquisition system. The system comes with a complete user manual, which includes an introduction to work function measurements and a detailed description of the system software, including examples. The work function resolution of the Ultra-High Vacuum Scanning Kelvin Probes is 1-3 meV.
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LF1 set -
Langer EMV-Technik GmbH
The LF1 near-field probe set consists of 4 shielded near-field probes used during the development process for emission measurement of longwave, medium wave, and shortwave frequencies on electronic devices. The probe heads of the LF1 set are designed for incremental detection of sources of electromagnetic interference on assemblies. First, the electromagnetic interference of the assembly is detected by the LF-R 400 probe from up to 10 cm. Then probes with higher resolution like the LF-B 3, LF-U 5 and LF-U 2.5 are used to more precisely detect any source of interference. The probe heads are designed for taking measurements at single pins and larger components. Near-field probes are small and handy. They have a current attenuating sheath and, therefore, are electrically shielded. They can be connected to a spectrum analyzer or an oscilloscope with a 50 Ω input. The H-field probes do not have an internal terminating resistance of 50 Ω.
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Extech EX470A -
Extech Instruments Corporation
The Extech EX470A True RMS Multimeter and Infrared Thermometer with Capacitance, Frequency, and Duty Cycle Measurements and 2 K-Type Remote Probes is the perfect meter for HVAC or plant maintenance. The IR thermometer measures the surface temperature from -4 to 518 °F (-20 to 270 °C) without contact. The built-in laser pointer centers the measuring area. Multimeter functions include AC and DC Voltage to 600 Volt, AC and DC current to 10A, resistance to 40MOhm, continuity and diode test. Also includes Type K thermometer for contact or air temperature measurements from -4 to 1832 °F (-20 to 750 °C). Advanced functions include Capacitance, Frequency and Duty Cycle. The meter comes complete with test leads, Type K temperature probe, 9 Volt battery, protective holster, adjustable tilt stand and Velcro hanging strap.
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783761-01 -
NI
PXIe, ±200 V, ±1 A DC, ±3 A Pulsed, Up to 40 W DC, 100 fA Precision System PXI Source Measure Unit - The PXIe-4137 is a high-precision, system source measure unit (SMU). It features 4-quadrant operation and sources up to 40 W of DC power and can pulse up to 500 W. Analog-to-digital converter technology helps you perform high-precision measurements with a current resolution of 100 fA or high-speed acquisitions up to 1.8 MS/s. The module also can maximize stability and measurement accuracy with SourceAdapt technology, which you can use to tune the transient response to match the characteristics of any load. The PXIe-4137 is ideal for a broad range of applications including manufacturing test, board-level test, and lab characterization with devices such as ICs, power management ICs (PMICs), and RFICs and discrete devices including LEDs and optical transceivers.
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783762-01 -
NI
PXIe, ±200 V, ±1 A DC, ±3 A Pulsed, Up to 40 W DC, 10 fA Precision System PXI Source Measure Unit - The PXIe-4135 is a high-precision, system source measure unit (SMU). It features 4-quadrant operation and sources up to 40 W of DC power and can pulse up to 500 W. Analog-to-digital converter technology and native triaxial connectors help you perform high-precision measurements with a current resolution of 10 fA or high-speed acquisitions up to 1.8 MS/s. The module also can maximize stability and measurement accuracy with SourceAdapt technology, which you can use to tune the transient response to match the characteristics of any load. The PXIe-4135 is ideal for a broad range of applications including manufacturing test, board-level test, and lab characterization with devices such as ICs, power management ICs (PMICs), and RFICs and discrete devices including LEDs and optical transceivers.
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783762-02 -
NI
PXIe, ±200 V, ±1 A DC, ±3 A Pulsed, Up to 40 W DC, 10 fA Precision System PXI Source Measure Unit - The PXIe-4135 is a high-precision, system source measure unit (SMU). It features 4-quadrant operation and sources up to 40 W of DC power and can pulse up to 500 W. Analog-to-digital converter technology and native triaxial connectors help you perform high-precision measurements with a current resolution of 10 fA or high-speed acquisitions up to 1.8 MS/s. The module also can maximize stability and measurement accuracy with SourceAdapt technology, which you can use to tune the transient response to match the characteristics of any load. The PXIe-4135 is ideal for a broad range of applications including manufacturing test, board-level test, and lab characterization with devices such as ICs, power management ICs (PMICs), and RFICs and discrete devices including LEDs and optical transceivers.
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783761-02 -
NI
PXIe, ±200 V, ±1 A DC, ±3 A Pulsed, Up to 40 W DC, 100 fA Precision System PXI Source Measure Unit - The PXIe-4137 is a high-precision, system source measure unit (SMU). It features 4-quadrant operation and sources up to 40 W of DC power and can pulse up to 500 W. Analog-to-digital converter technology helps you perform high-precision measurements with a current resolution of 100 fA or high-speed acquisitions up to 1.8 MS/s. The module also can maximize stability and measurement accuracy with SourceAdapt technology, which you can use to tune the transient response to match the characteristics of any load. The PXIe-4137 is ideal for a broad range of applications including manufacturing test, board-level test, and lab characterization with devices such as ICs, power management ICs (PMICs), and RFICs and discrete devices including LEDs and optical transceivers
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6310 IN -
Standard Electric Works Co., Ltd
● 2 Lines × 16 Characters LCD● Microprocessor-controlled● Tests insulation resistance up to 20 TΩ● 4 Insulation test voltages: 1000V, 2500V, 5000V, 10000V● AC / DC Voltmeter (30~600V)● Short-circuit current up to 5mA● PI (Polarization Index) indication● DAR (Dielectric Absorption Ratio) indication● Auto-ranging on all insulation ranges● Optical USB to RS-232 data transmission● Well isolated from contact● Well protected from surges● 2 built-in optical LEDs for data transfer● Visual and audio warning of external voltage presence (≥30Vac or ≥30Vdc)● Auto-hold function to freeze reading● Overload protection● Adjustable testing duration: 1~30 minutes● Internal memory for data storage● Displays testing duration for insulation measurement● Auto-off function● 200 measurement results can be saved in memory and recalled on
