Showing results: 8851 - 8865 of 10458 items found.
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Anton Paar GmbH
Benefit from over 40 years of experience in inline and laboratory beverage analysis: Connect Anton Paar’s versatile and well-proven evaluation units to all generations of Anton Paar density, sound velocity, concentration and CO2 sensors. Let the data acquisition and visualization software master complex measuring tasks for you – bringing home the precision that marks measurement solutions from Anton Paar.
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BWA-CAM 20/20 -
Haas Laser Technologies, Inc.
The Beam Waist Analyzer Camera BWA-CAM 20/20 laser beam analyzer system and software enables “real-time” laser beam measurement, analysis and monitoring of high power CW and pulsed lasers.BWA CAM Laser Beam Analyzer system The system complies with the international standards ISO 11146-1 (2005) and ISO 13694 which relate to lasers and laser related equipment and laser beam spatial metrics.
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ADC-2500 -
TestVonics, Inc.
TestVonics ADC-2500 Air Data Calibrator is a high accuracy pitot static calibrator. The ADC-2500 is capable of controlling and measuring Altitude and Airspeed pressures with the highest degree of accuracy. The control and measurement range of the test system can meets or exceed requirements for both commercial and military application. The ADC-2500 is currently used by all USAF PMEL organizations as well as various other commercial and military organizations worldwide.
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SimBARO -
Spirent Federal Systems
Embedded and Integrated GPS/Inertial navigation systems require an altitude reference data input provided by a barometric pressure altimeter to reduce vertical plane errors inherent within inertial systems. Spirent’s SimBARO product offers a simulated source of barometric pressure altitude data and is available as an add on to SimINERTIAL, Spirent’s Inertial Measurement Unit (IMU) and Embedded GPS/Inertial navigation system (EGI) test tool.
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Analog Devices Inc.
Analog Devices offers a broad selection of digital temperature sensors with I2C, SPI, and mark space interfaces. For more intricate system design applications, some of these sensors have integrated D/A converters, A/D converters, references, and limit alarm register. All of these sensors possess a broad range of uses, including scientific, medical, and aerospace applications, in test and measurement equipment, and in industrial automation.
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Materials Development Corporation
MDC will tailor your CSM/Win Semiconductor Measurement System for your exact requirements. Choose the best capacitance meter, output device, and probe station for your needs. All CSM/Win C-V plotters feature the latest Dell Computers. The computer and capacitance meters are rackmounted in one compact enclosure. When ordered with a hot chuck or probe station, MDC can deliver a turnkey system of unparalleled performance.
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eLockIn203 -
Anfatec Instruments AG
The eLockIn203 can be used as spectrum analyser, as oscilloscope, as sinus generator or as measurement control system. It provides 8 A/D channels as external inputs and controls 8 D/A channels with 156 kHz update rate as external signal outputs. It can store 32 MByte data, provides modern network connection and USB connection. Moreover, it acts as web server and all data are available over the internet.
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NXT vegas -
IDS Imaging Development Systems GmbH
The app-based system makes it as versatile as a smartphone. With the integrated 1.3 MP CMOS sensor, an integrated liquid lens, LED illumination and a ToF sensor (Time of Flight) for distance measurement, it is fully equipped for many different image processing tasks. As a complete embedded vision component, it simplifies integrated design into custom device hardware and software. The board-level option is also very interesting for OEM equipment manufacturers.
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W.L. Gore & Associates
For test applications that require consistent and highly repeatable measurements, GORE® Microwave/RF Assemblies for general purpose test applications provide reliable electrical performance with proven phase and amplitude stability. The smaller diameter and highly flexible, yet durable construction simplify the routing process while ensuring long-lasting electrical performance after installation, particularly in board-to-board and inside-the-box systems.
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Elektra -
Rohde & Schwarz GmbH & Co. KG
The R&S®ELEKTRA test software controls complete EMC systems and automates measurements of equipment under test (EUT) being certified for emissions (EMI) and immunity (EMS). R&S®ELEKTRA simplifies configuration of test systems and test descriptions in accordance with common standards. It speeds up test execution and paves the way to quickly generating a comprehensive test report.
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NI
The Software Platform Bundle provides the entire NI software portfolio for building any application. Develop applications in multiple environments, including LabVIEW Professional, LabWindows/CVI, and Measurement Studio. Extend the functionality of the LabVIEW development environment with all add-ons to perform code deployment, hardware integration, data analysis, and code validation. Build automated test systems with TestStand and real-time test systems with VeriStand.
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INFICON Holding AG
the market-leading Residual Gas Analyzer (RGA) process monitoring system in the semiconductor industry for over a decade. Now Transpector CPM 3 provides industry leading measurement speed and sensitivity through a field proven pumping and inlet system integrated with a new sensor and electronics. Transpector CPM 3 is the ideal RGA process monitor for new and established semiconductor processes such as ALD, CVD, PVD, and Etch.
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930A -
Arbiter Systems, Inc.
Model 930A Three Phase Power Analyzer is an economical alternative to the Model 931A Power System Analyzer when the dc voltage measurement, transducer calibration and timer features are not required. The Model 930A has the same ac accuracy as the Model 931A with PowerDSA™ Digital Signal Analysis. Basic accuracy of 0.05 % of reading and 0.05 ° phase, harmonic analysis, and full three-phase capability are standard.
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Gamma Scientific Inc.
The Gamma Scientific line of display measurement solutions leverages the company’s renowned competencies in developing high-sensitivity spectroradiometer-based equipment. Our range of NIST traceable solutions include handheld and portable instruments, laboratory equipment, and fully automated production inspection systems. With over 50 years of experience in the industry, you won’t find another company with the level of combined knowledge and expertise as the team at Gamma Scientific.
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SemiProbe
Failure Analysis (FA) plays a crucial role in the production of semiconductors. It provides process and design feedback to determine the root cause of any failures. Time-to-data for the FA Engineer is a critical measurement and SemiProbe’s Probe System for Life ® (PS4L) is ideally suited to excel in this application. All key components are interchangeable, making it easy to switch between individual die, wafers, and packaged parts.