Showing results: 961 - 975 of 10458 items found.
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Auto SE -
HORIBA, Ltd.
The Auto SE is a new thin film measurement tool that allows full automatic analysis of thin film samples with simple push button operation.Sample analysis takes only a few seconds and provides a complete report that fully describes the thin film stack – including film thicknesses, optical constants, surface roughness, and film inhomogeneities.
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SMART Quality -
Hexagon AB
HxGN SMART Quality, an enterprise IT solution that enables manufacturers to aggregate all quality-related data and gain insight into resource utilization, driving process optimization and productivity improvements. Take full control of your machines and processes, and achieve a smart, data-driven approach to manufacturing with HxGN SMART Quality – the online quality data and measurement resource management software platform.
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Keysight Technologies
WaferPro Express software performs automated wafer-level measurements of semiconductor devices such as transistors and circuit components. It provides turnkey drivers and test routines for a variety of instruments and wafer probers. Its new user interface makes it easy to setup and run complex wafer-level test plans, while powerful customization capabilities are enabled by the new Python programming environment.
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EL-USB-CO -
Lascar Electronics Ltd
The EL-USB-CO is a USB data logger that measures and stores up to 32,510 Carbon Monoxide (CO) readings over a 0 to 1000 ppm measurement range. The user can easily set up the logging rate and start time, and download the stored data by plugging the module straight into a PC's USB port and running the purpose designed software under Windows 2000, XP or Vista
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Extech 461893 -
Extech Instruments Corporation
With the 461893, you can make non-contact RPM measurements (5 to 99,999 RPM) of rotating objects by pointing the integral light beam (6 in. target distance) at reflective tape placed on the object to be measured. The memory button holds last reading and recalls min/max readings display. Comes with 4 AA batteries, 23 in. (0.6 m) reflective tape, carrying case, and user manual.
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OndoSense
The OndoSense radar sensor solution determines the width of steel plates, steel strips or steel slabs (up to 1600 °C hot) with an accuracy of up to ±300 µm. Thanks to robust radar technology, sophisticated signal processing and smart radar algorithms, our radar sensors offer this high precision in width measurement even in the extreme production environments of the metal and steel industry.
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TP02 -
Hukseflux Thermal Sensors B.V.
TP02 is a probe that offers the possibility to perform a practical and fast measurement of the thermal conductivity (or thermal resistivity) of the medium in which it is inserted at the highest accuracy level. It works in compliance with the ASTM D 5334-00, D 5930-97 and IEEE 442-1981 standards. The standard TP02 probe has proven suitability in soils, thermal backfill materials, sediments, foodstuff, powders, sludges, paints, glues and various other materials. The Non-Steady-State Probe (NSSP) measurement method (also known as transient line source, thermal needle, hot needle, heat pulse- and hot wire technique) has the fundamental advantages that it is fast and absolute while the sample size is not critical. Hukseflux is specialised in NSSP design. Special models have been developed for in-situ field experiments. For permanent installation in soils, a dedicated model, TP01, is available. TP02 has been designed and tested in collaboration with the Applied Physics Group of Wageningen University.
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WLAN Test Toolkit -
NI
The WLAN Test Toolkit gives you direct and fine control over the generation and analysis of IEEE 802.11a/b/g/n/ac and ax signals, as well as 802.11j/p/ah/af waveforms, with industry-leading speed and accuracy. It empowers you to characterize, validate, and test a variety of WLAN connectivity products, such as RF front end components, wireless modules, and user devices.The toolkit includes extensive support for the latest features of the 802.11ax standard, including extended single-user packets, multiuser OFDMA, and multiuser multiple input, multiple output (MIMO) functionality with per-user configuration and measurement results. The WLAN Test Toolkit helps you solve demanding new access point test cases by generating signals that simulate multiuser environments, including per-user impairments. You can also use the new software to generate trigger frames to test the real-time response of client devices and make power precorrection and relative center frequency measurements.
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ScanArm -
FARO Technologies, Inc.
The FARO ScanArm combines all of the advantages of the FaroArm with a hand held laser scanner and is the perfect contact/non-contact measurement system. Unlike other scanning systems, the ScanArm’s hard probe and the Laser Line Probe can digitize interchangeably without having to remove either component. Users can accurately measure prismatic features with the hard probe, then laser scan sections requiring larger volumes of data — all in one simple tool.
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LCR45 -
Peak Electronic Design Ltd.
The new LCR45 does everything that the popular LCR40 does, but we've added some significant enhancements. The LCR45 features a new high capacity micro and high resolution ADCs.*Fluid measurements of L, C and R (continuous readings with selectable hold function).*Fine resolution for improved performance at low inductance/capacitance/resistance.*Auto and Manual component type.*Auto and Manual test frequency.*Frequencies: DC, 1kHz, 15kHz and 200kHz.*Display of component values, complex impedance, complex admittance and magnitude/phase.
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WP400-3 -
Wavecontrol, S.L.
Wavecontrol presents a new and unique field probe for the measurement of electric and magnetic fields that integrates both E & H sensors within dimensions of only 3 cm². Which makes it unique is that Wavecontrol has managed to add an E field sensor in a basic structure of a classical 3 cm² field probe. It has been possible, therefore, to obtain a 3 cm² field probe without compromising the capability of assessing E and H fields of its 100 cm² big sister, the recognized and successful WP400.
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Verisurf Measure -
Verisurf Software, Inc.
Measure part features and complex profile geometries informed by real-time deviation display between CAD and measured data for real-time decisions. Produce one-click inspection reports in standard or custom, shareable formats that feed to your quality management system.The Measure module’s device interface operates and optimizes most popular measurement systems making them more productive and ensuring a better return on your investment. You can also import externally captured data and process it against the nominal CAD model and tolerances. Even run datasets offline with feature extraction and pre-defined datums and constraints.
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MT-7300 Plus -
Guangzhou Wanglu Communications Co., Ltd.
● 32/30dB high dynamic range● ≤2m extra-short event dead zone● 0.05m high distance resolution,128k sampling points● Fast auto measurement, one-button operating● Test up to four wavelengths with a single unit ● Communication light check automatically● Remote function via Ethernet● USB interfaces, supporting USB stick and printer and direct cable download to PC via ActiveSync● Supporting Bellcore GR196 file format in writing or reading● Built-in lithium battery with high capacity for over 8 hours of operating life● Integrated Visible fault locating (VFL)
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Hinds Instruments, Inc.
The 2-MGEM Optical Anisotropy Factor Measurement System is a normal-incidence polarization reflection microscope designed to measure the sample Mueller matrix and is a 2008 R&D 100 Award Winner. This system is designed specifically to evaluate the Optical Anisotropy Factor (OPTAF) of cross sections of TRISO nuclear fuel pyrocarbon layers. Other possible material characterizations include measuring Mueller matrix elements of other crystals, carbon compounds, and thin film coatings (e.g. surfacedeposition films) at normal incidence. The 2-MGEM can also measure retardation (d), circular diattenuation (CD) and the polarization factor (ß). These parameters are not measurable using older techniques, since those techniques do not incorporate a compensating optical element.
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TP121-TH -
Gigahertz-Optik GmbH
The photometric specifications of LEDs must meet very high tolerance requirements regardless of whether they are to be used in general, automotive or other specialist lighting applications. This is often a problem since the manufacturing tolerances of LEDs can be higher than those permitted in the end-use applications. Also, LED binning by LED manufacturers in order to classify LEDs based on their tolerances is performed with flash mode testing using pulsed current flow. However, end-use applications of the LEDs often operate in constant current mode and with significant thermal effects. The sophisticated LED processing industry therefore requires measurement devices that can be used for both manufacturer-compliant pulsed mode, as well as constant current operation mode. When the LEDs are run in constant current mode, the junction temperature has significant influence on the performance and lifetime of the LED. Therefore, test systems should be able to test the LEDs at specific junction temperatures.
