Showing results: 1201 - 1215 of 10560 items found.
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Line Width Measurement -
Optik Elektronik Gerätetechnik GmbH
COMEF is an image processing software with special functions for the highly accurate measurement of line width and line distance. Using grey value algorithms, the width and distance of conductor lines or structures on silicon wafers can be measured with subpixel accuracy.
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Production C-V Measurement -
Materials Development Corporation
The production software offers a streamlined C-V plotting and bias-temperature stress program with minimumoperator input. A single keystroke begins the measurement.
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Conductance Measurement and Analysis -
Materials Development Corporation
MDC uses conductance to give a complete picture of MOS devices as well as to correct for series resistance effects. MDC C-V plotters use conductance and capacitance measurements to plot true device capacitance and depletion region conductance.
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Distance Measurement Sensor (Qwiic) -
SparkFun Electronics
The LIDAR-Lite v4 Qwiic from GARMIN is a high-performance, wireless optical distance measurement sensor that doesn't require any soldering to get started. This is the ideal solution for drone, robot, IoT, or unmanned vehicle operations when space is tight and power is limited. This sensor has up to a 10 meter range, 1cm resolution, and requires 85mA during data acquisition. The user can read and write to the LIDAR-Lite v4 using the I2C protocol; this is where the addition of the SparkFun Qwiic system really shines. The LIDAR sensor requires 5V to operate but runs on 3V3 logic. With a 5V boost circuit and an easy-to-use Qwiic connector you can power the sensor and get distance measurements over Qwiic all with a single piece of hardware.
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Pressure measurement -
Baumer Holdings AG
Our wide product range includes high-quality solutions made of stainless steel (MEX5/MEX3) for the most demanding environments, such as those found in the petrochemical industry or with applications involving sea-water. In addition we develop special solutions for military and civil aviation and shipping. Many EPC contractors have recognized our value as a skilled partner for measuring instruments for the construction of entire plants such as refineries, power stations or water treatment plants.
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MOS C-V Measurement and Analysis -
Materials Development Corporation
MOS capacitance-voltage measurement is one of the most common process monitoring diagnostics employed in device manufacturing. A vast amount of information can be derived from this simple test.
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Junction Measurement and Analysis -
Materials Development Corporation
A comprehensive set of analyses for junction diode or Schottky barriers begins with C-V data gathering that adjusts the voltage step to the slope of the C-V characteristics. This assures an optimum set of C-Vdata whether the voltage range is small or large. Doping profile and resistivity profile are both available at the touch of a key. Plots of 1/C2 - V or Log(C) - Log (V+ phi) show doping uniformity and doping slope factor. Exclusive recalculation options allow adjustment of stray capacitance and area to facilitate calibration using a standard reference wafer of known doping or resistivity.
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NIP PRESSURE MEASUREMENT SYSTEM -
Tekscan, Inc.
A completely wireless system for measuring nip pressure between rollers in real-time
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Current-Voltage Measurement Option -
Materials Development Corporation
CSM/Win Systems with an I-V option can measure both MOS and diode structures. For junctions, both forwardand reverse bias curves can be analyzed. Junction ideality factor, series resistance, and reverse saturation current are found. Solar cells can be checked for efficiency. Gate Oxide Integrity of MOS devices can be measured as well.
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ECHOMAC® Velocity Measurement -
Magnetic Analysis Corp
Variations in Nodularity, a type of graphite structure that can develop during the production process, can attenuate the velocity of sound waves passing through the automotive component being tested. Echomac VM measures the sound velocity and, using known limits, reports whether the part is acceptable.
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Real Time Ice Thickness Measurement -
Sensors and Software Inc.
The IceMap real-time display shows the automatically detected bottom of the ice (blue line) in real time. Users can set a minimum thickness warning threshold (gold line). Winter ice roads and bridges are a common transportation link in the northern regions of Canada, Alaska, Europe and Russia. The Sensors & Software IceMap system is designed to measure the ice thickness on these temporary, yet vital, links and ensure the safety of all travelers. The GPR sensor is towed across the ice surface behind a truck or snowmobile and the ice thickness data, displayed in real-time as a cross-sectional image, are sent wirelessly to the operator’s computer.
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Apogee Instruments, Inc.
Apogee offers two types of spectroradiometers. The Field Spectroradiometer was designed for unattended field measurements as well as laboratory measurements. The Lab Spectroradiometer is for laboratory measurements and portable measurements.
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CSM Products, Inc.
For the purposes of the setup of measurement chains from one source, CSM offers software solutions for the configuration of the CSM measurement modules as well as for the measurement and visualisation of measurement data.
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MOS Capacitance-Time Measurement and Analysis -
Materials Development Corporation
The Capacitance-Time transient resulting from an MOS device pulsed into deep depletion reveals important information about bulk properties of the semiconductor and about damage or contaminants introduced during processing.
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Srive-Level Capacitance Profiling (DLCP) Measurement -
Materials Development Corporation
Drive-levelcapacitance profiling is an extremely useful technique to characterize amorphoussilicon or other semiconductor material with large concentrations of deep band gap states.