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Portable Measuring Microscope
Opto's portable microscope is designed to handle even the most demanding on-site inspections. With its ergonomic design, robust construction and perfectly matched optics configuration, it is a precise and reliable tool.
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Inspection And Measuring Microscope
McBain ZIII Micro Inspection System
The McBain ZIII Micro Inspection System is the industry standard for CD measurements and inspection, pre/post dicing inspection, pre/post probing inspection, mask inspection, image stitching and critical particle counting.
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Measuring Microscopes, Image Processing
Measuring Microscopes
Optik Elektronik Gerätetechnik GmbH
Image processing software for dimensional measurements, motorized measuring microscopes and fully automatic measuring machines.
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Measuring Microscopes, Image Processing
Milling & Drilling
Optik Elektronik Gerätetechnik GmbH
OEG manaufactures all mechanical parts in house and offers these services to other companies.
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Measuring Microscopes, Image Processing
COMEF
Optik Elektronik Gerätetechnik GmbH
Image processing system.
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3D Measuring Laser Microscope
LEXT OLS5000
The OLS5000 laser confocal microscope precisely measures shape and surface roughness at the submicron level. Data acquisition that's four times faster than our previous model delivers a significant boost to productivity. Measure samples that are up to 210 mm tall. Capture the shape of any surface. Total magnification: 54x - 17,280x
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FOV Micro Measuring Microscope 4.0
The new ultra-compact digital micro measuring microscope from Opto is the perfect tool for on-site measurements in production.
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Measuring Microscopes, Image Processing + Optics Test Equipment
Development And Production Services
Optik Elektronik Gerätetechnik GmbH
Development and assembly of opto-mechanical building groups, including software development.
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Measuring Microscopes, Image Processing + Semiconductor Technology, Micro Scriber
Line Width Measurement
Optik Elektronik Gerätetechnik GmbH
COMEF is an image processing software with special functions for the highly accurate measurement of line width and line distance. Using grey value algorithms, the width and distance of conductor lines or structures on silicon wafers can be measured with subpixel accuracy.
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Measuring Microscopes, Image Processing + Drawing Die And Wire Measurement
Easy Low Cost Wire Drawing Die Measuring Microscope
Optik Elektronik Gerätetechnik GmbH
Simple optical measuring system for diameter and ovality of wire drawing dies with image processing software.
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Atomic Force Microscope
LensAFM
The Nanosurf LensAFM is an atomic force microscope that continues where optical microscopes and profilometers reach their resolution limits. It is mounted like a normal objective lens, thus extending the resolution and measuring capabilities of these instruments.
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Industrial Microscope Solutions
Industrial microscopes are a vital tool used for measuring, quality control, inspection, and in soldering and manufacturing. Each industrial microscope we offer uses complex designs that provide unique solutions for the inspection process and aim to improve resolution and sample contrast.
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MicroImagerTM
Exicor®
The Hinds Birefringence Imaging Microscope is ideal for measuring birefringence in biological structures, glass, crystals, and many other organic and inorganic samples.
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All-In-One Unit
RH-8800
"RH-8800" is an All-In-One digital microscope, which enables intuitive and comfortable operation by integrating "Observation", "Recording", "Measuring", together as one.
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Non Contact Measurement
There is no one-size-fits-all solution for accurate measurement, and different applications require different measurement systems. At Vision Engineering, we design and manufacture a broad range of non-contact measurement systems from toolmakers’ measuring microscopes to fully automated CNC video measuring systems with optional contact measurement available. Combined with the latest metrology software solutions available, we offer the right tool for the job.
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Micro Vickers Hardness Tester
900-392
The 900-392 Micro Vickers Hardness Tester is engineered to produce a clearer indentation and hence a more precise measurement. By means of a 10 × lens and a 40 × lens the 900-392 vickers hardness tester has a wide measurement field and a broad usage range. Equipped with a digital microscope, it shows the measuring methods, the test force, the indentation length, the hardness value, the dwell time of the test force as well as the number of the measurements, all shown on its LCD screen.
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Osmometer
LD-LOSM-A10
OsmometerLD-LOSM-A10is colorful LCD touch display with sample size 50 μl to 100 μl and measuring range up to 0 to 3000 mOsmol /kg H2O at ambient temperature 10 to 30°C. Features with on-screen display of molar concentration, freezing point, and osmolarity. At very low testing time it provides fast and accurate osmolality test results. Applicable in General medicine, Routine and research, Forensic medicine, Electron microscope.
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Nuclear Magnetic Resonance Spectrometer
NMR
NMR is an abbreviation for Nuclear Magnetic Resonance. An NMR instrument allows the molecular structure of a material to be analyzed by observing and measuring the interaction of nuclear spins when placed in a powerful magnetic field.For the analysis of molecular structure at the atomic level, electron microscopes and X-ray diffraction instruments can also be used, but the advantages of NMR are that sample measurements are non-destructive and there is less sample preparation required.Fields of application include bio, foods, and chemistry, as well as new fields such as battery films and organic EL, which are improving and developing at remarkable speed. NMR has become an indispensable analysis tool in cutting-edge science and technology fields.
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2-MGEM Optical Anisotropy Factor Measurement System
The 2-MGEM Optical Anisotropy Factor Measurement System is a normal-incidence polarization reflection microscope designed to measure the sample Mueller matrix and is a 2008 R&D 100 Award Winner. This system is designed specifically to evaluate the Optical Anisotropy Factor (OPTAF) of cross sections of TRISO nuclear fuel pyrocarbon layers. Other possible material characterizations include measuring Mueller matrix elements of other crystals, carbon compounds, and thin film coatings (e.g. surfacedeposition films) at normal incidence. The 2-MGEM can also measure retardation (d), circular diattenuation (CD) and the polarization factor (ß). These parameters are not measurable using older techniques, since those techniques do not incorporate a compensating optical element.
