Memory Device
directly accessible computer's internal or main memory.
See Also: Memory, Memory Test, DDR, NAND, DRAM, RAM, ROM, Memory Testers, DUT
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PCI-5124, 150 MHz Bandwidth, 200 MS/s, 12-Bit PCI Oscilloscope Device
779171-01
150 MHz Bandwidth, 200 MS/s, 12-Bit PCI Oscilloscope Device—The PCI-5124 high-resolution oscilloscope device has two channels that sample up to 200 MS/s with flexible settings for coupling, impedance, voltage range, and filtering. Oscilloscope devices also feature a number of triggering modes, deep onboard memory, and an instrument driver that includes data streaming and analysis functions. This device is ideal for both time-domain and frequency-domain applications that require high-resolution measurements with up to 150 MHz of analog bandwidth.
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PCI-5152, 300 MHz Bandwidth, 2 GS/s, 8-Bit PCI Oscilloscope Device
779945-01
300 MHz Bandwidth, 2 GS/s, 8-Bit PCI Oscilloscope Device—The PCI‑5152 high-speed oscilloscope device has two channels that sample up to 2 GS/s with flexible settings for coupling, impedance, voltage range, and filtering. Oscilloscope devices also feature a number of triggering modes, deep onboard memory, and an instrument driver that includes data streaming and analysis functions. This device is ideal for applications with fast signals that require up to 300 MHz of analog bandwidth and flexible measurement configurations.
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PCI-5152, 300 MHz Bandwidth, 2 GS/s, 8-Bit PCI Oscilloscope Device
779945-02
300 MHz Bandwidth, 2 GS/s, 8-Bit PCI Oscilloscope Device—The PCI‑5152 high-speed oscilloscope device has two channels that sample up to 2 GS/s with flexible settings for coupling, impedance, voltage range, and filtering. Oscilloscope devices also feature a number of triggering modes, deep onboard memory, and an instrument driver that includes data streaming and analysis functions. This device is ideal for applications with fast signals that require up to 300 MHz of analog bandwidth and flexible measurement configurations.
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PCI-5152, 300 MHz Bandwidth, 2 GS/s, 8-Bit PCI Oscilloscope Device
779945-03
300 MHz Bandwidth, 2 GS/s, 8-Bit PCI Oscilloscope Device—The PCI‑5152 high-speed oscilloscope device has two channels that sample up to 2 GS/s with flexible settings for coupling, impedance, voltage range, and filtering. Oscilloscope devices also feature a number of triggering modes, deep onboard memory, and an instrument driver that includes data streaming and analysis functions. This device is ideal for applications with fast signals that require up to 300 MHz of analog bandwidth and flexible measurement configurations.
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PCI-5153, 500 MHz Bandwidth, 2 GS/s, 8-Bit PCI Oscilloscope Device
780318-02
500 MHz Bandwidth, 2 GS/s, 8-Bit PCI Oscilloscope Device - The PCI‑5153 high-speed oscilloscope device has two channels that sample up to 2 GS/s with flexible settings for coupling, voltage range, and filtering. Oscilloscope devices also feature a number of triggering modes, deep onboard memory, and an instrument driver that includes data streaming and analysis functions. This device is ideal for applications with fast signals that require up to 500 MHz of analog bandwidth and flexible measurement configurations.
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PCI-5153, 500 MHz Bandwidth, 2 GS/s, 8-Bit PCI Oscilloscope Device
780318-01
500 MHz Bandwidth, 2 GS/s, 8-Bit PCI Oscilloscope Device - The PCI‑5153 high-speed oscilloscope device has two channels that sample up to 2 GS/s with flexible settings for coupling, voltage range, and filtering. Oscilloscope devices also feature a number of triggering modes, deep onboard memory, and an instrument driver that includes data streaming and analysis functions. This device is ideal for applications with fast signals that require up to 500 MHz of analog bandwidth and flexible measurement configurations.
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PCI-5153, 500 MHz Bandwidth, 2 GS/s, 8-Bit PCI Oscilloscope Device
780318-03
500 MHz Bandwidth, 2 GS/s, 8-Bit PCI Oscilloscope Device - The PCI‑5153 high-speed oscilloscope device has two channels that sample up to 2 GS/s with flexible settings for coupling, voltage range, and filtering. Oscilloscope devices also feature a number of triggering modes, deep onboard memory, and an instrument driver that includes data streaming and analysis functions. This device is ideal for applications with fast signals that require up to 500 MHz of analog bandwidth and flexible measurement configurations.
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PCI-5154, 1 GHz Bandwidth, 2 GS/s, 8-Bit PCI Oscilloscope Device
780320-03
1 GHz Bandwidth, 2 GS/s, 8-Bit PCI Oscilloscope Device - The PCI‑5154 high-speed oscilloscope device has two channels that sample up to 2 GS/s with flexible settings for coupling, voltage range, and filtering. Oscilloscope devices also feature a number of triggering modes, deep onboard memory, and an instrument driver that includes data streaming and analysis functions. This device is ideal for applications with fast signals that require up to 1 GHz of analog bandwidth and flexible measurement configurations.
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PCI-5154, 1 GHz Bandwidth, 2 GS/s, 8-Bit PCI Oscilloscope Device
780320-02
1 GHz Bandwidth, 2 GS/s, 8-Bit PCI Oscilloscope Device - The PCI‑5154 high-speed oscilloscope device has two channels that sample up to 2 GS/s with flexible settings for coupling, voltage range, and filtering. Oscilloscope devices also feature a number of triggering modes, deep onboard memory, and an instrument driver that includes data streaming and analysis functions. This device is ideal for applications with fast signals that require up to 1 GHz of analog bandwidth and flexible measurement configurations.
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PCI-5154, 1 GHz Bandwidth, 2 GS/s, 8-Bit PCI Oscilloscope Device
780320-01
1 GHz Bandwidth, 2 GS/s, 8-Bit PCI Oscilloscope Device - The PCI‑5154 high-speed oscilloscope device has two channels that sample up to 2 GS/s with flexible settings for coupling, voltage range, and filtering. Oscilloscope devices also feature a number of triggering modes, deep onboard memory, and an instrument driver that includes data streaming and analysis functions. This device is ideal for applications with fast signals that require up to 1 GHz of analog bandwidth and flexible measurement configurations.
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PXI Device Power Supply - 4 Isolated Channels, 20-bit Measurement Resolution
52310e series
Chroma 52310e Series i s a programmabl e PXI-Express DPS (Device Power Supply) Card designed for high-accuracy and reliable output power for device test applications. Its compact size, easy level of integration, and high flexibility make the 52310e Series ideal for multi-channel power supplies. Chroma 52310e Series features 8 selectable control bandwidths to ensure high speed output and stable operation; multiple current measurement ranges with a 20-bit DAC/ADC provide the highest resolution and...show more -
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PCI-5114, 125 MHz Bandwidth, 2-Channel, 8-Bit PCI Oscilloscope Device, 256 MB
779745-03
125 MHz Bandwidth, 2-Channel, 8-Bit PCI Oscilloscope Device—The PCI‑5114 low-cost oscilloscope device has two channels that sample up to 250 MS/s with flexible settings for coupling, impedance, voltage range, and filtering. Oscilloscope devices also feature a number of triggering modes, deep onboard memory, and an instrument driver that includes data streaming and analysis functions. This device is ideal for applications with fast signals that require flexible measurement configurations and up to 125 MHz of analog bandwidth.
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PCI-5114, 125 MHz Bandwidth, 2-Channel, 8-Bit PCI Oscilloscope Device, 64 MB
779745-02
125 MHz Bandwidth, 2-Channel, 8-Bit PCI Oscilloscope Device—The PCI‑5114 low-cost oscilloscope device has two channels that sample up to 250 MS/s with flexible settings for coupling, impedance, voltage range, and filtering. Oscilloscope devices also feature a number of triggering modes, deep onboard memory, and an instrument driver that includes data streaming and analysis functions. This device is ideal for applications with fast signals that require flexible measurement configurations and up to 125 MHz of analog bandwidth.
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PCI-5114 , 125 MHz Bandwidth, 2-Channel, 8-Bit PCI Oscilloscope Device, 8 MB
779745-01
125 MHz Bandwidth, 2-Channel, 8-Bit PCI Oscilloscope Device—The PCI‑5114 low-cost oscilloscope device has two channels that sample up to 250 MS/s with flexible settings for coupling, impedance, voltage range, and filtering. Oscilloscope devices also feature a number of triggering modes, deep onboard memory, and an instrument driver that includes data streaming and analysis functions. This device is ideal for applications with fast signals that require flexible measurement configurations and up to 125 MHz of analog bandwidth.
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Handheld Metal Hardness Tester
TIME®5330
Beijing TIME High Technology Ltd.
Handheld Metal Hardness Tester TIME®5330 is loaded with 4.3 inch LCD screen and a large memory of 2000 groups of data. Built-in conversion table enables you to read HB value directly if D/DC impact devices are installed.
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High Frequency RF and Microwave USB Programmable Signal Generators
LMS Series
The Lab Brick LMS series of high frequency RF and microwave USB-compatible, synthesized signal generators cover a frequency range from 0.5 MHz - 20 GHz with low noise, fast 100-microsecond switching time, and fine 100 Hz frequency resolution. They require no additional DC supply voltage and offer advanced features such as phase-continuous linear-frequency sweeping, internal/external 10 MHz reference, and optional pulse modulation. GUI software can track and control several connected signal generators, simplifying multiple-signal test setups. Each device stores settings in internal memory, allowing it to power up in a specific instrument state.
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High Speed Pick and Place Handler
Commander 2000
At throughput rates in excess of 2000 Units per Hour the HT Commander 2000 system provides unparalleled performance for the production handling and programming of flash memory devices or modules.
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High Speed & Precision Pressure Insensitive Mass Flow Module
D700MG
Critical semiconductor manufacturing processes continuously desire precision gas flow control devices that enable both future innovation, and lab to fab transition of leading edge memory and logic device. HORIBA's propose the new pressure based MFC D700MG, the upper compatible model of the D500MG to support customer’s challenges.
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High Voltage Waveform Digitizer Family
PXD731x/PXD70xx
The PXD731x High Voltage Waveform Digitizer family features up to two 100MS/s simultaneously sampled input channels with 16Bit resolution, input voltages up to ±250V and a bandwidth up to 50MHz. Every digitizer channel has its own 2MB memory which allows up to 1 million samples. Data can be acquired before and after the trigger event with a programmable sample counter, that controls the number of data points. All PXD731x High Voltage Waveform Digitizer family devices have a high common mode rejection ratio (CMRR).
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Imbedded A5 Processor Test Interface
Advanced Microtechnology, Inc.
Advanced Microtechnology has extended the application of its Optimum product line with theintegration of ARC5 imbedded test functions. Up to 40 controllers may be independently powered and monitored for functionality using the process test interface of the Optimum WinAOS application. Each part may have 2 separate biases featuring both current and voltage monitoring. Independent test is implemented through a standard JTAG interface. A separate serial clock and command interface may be used if re...show more -
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Industrial ATX Motherboard with 6th/7th Gen Intel® Core™ i7/i5/i3 Processor (Code name: Skylake/Kabylake)
IMB-M43H
IMB-M43H is an ATX motherboard supporting the Desktop 6th/7th Generation Intel Core i7/i5/i3 Processors with Intel H110 Chipset, providing the most cost-competitive solution anywhere in embedded computing and fulfilling the specific needs of all users requiring 5 PCI add-on cards. With high-speed data transfer interfaces such as PCIe 3.0/2.0, USB 3.0, and SATA 6 Gb/s (SATA III), dual-channel DDR4 memory up to 32 GB in two DIMM slots for industrial automation applications, the ADLINK IMB-M43H car...show more -
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IP Core and FPGA Products
Our FPGA offerings include development boards and IP cores for Altera FPGA devices. The IP cores include: I2C, PCIe, JPEG-LS, LVDS Camera Link and memory controllers.
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JTAG Functional Test
JFT
JFT comprises a series of software modules that support boundary-scan test and programming activities under Python, National Instruments LabVIEW and Microsoft .NET framework. Using JFT users can create JTAG/boundary-scan test application scripts, VIs or programs for PCB assemblies and systems that control individual driver/sensor pins, groups of pins declared as variables or register bits. These applications are typically used to test logic devices or mixed signal clusters and can also be trans...show more -
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JTAGulator 24-Channel Hardware Hacking Tool
32115
On-chip debug (OCD) interfaces can provide chip-level control of a target device and are a primary vector used by engineers, researchers, and hackers to extract program code or data, modify memory contents, or affect device operation on-the-fly. JTAGulator is an open source hardware tool that assists in identifying OCD connections from test points, vias, or component pads on a target device.
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Kestrel /QX
0149-QX
Quad+ speed Windows/NT Kestrel Co-Processor for four times the speed of the Kestrel /SX. Occupies one PCI slot. A writable control store, FPGA implementation of the HP1000 architecture with 4 MBytes of tightly coupled, zero wait-state memory. Includes compatible hardware floating point. On-card x86 microprocessor rapidly processes "virtual" I/O instructions. PCI bus speeds increase disk throughput by at least a factor of ten. HP1000 Bus support logic for non-emulated devices is provided on-board with connector to wide bandwidth fibrechannel adapter. Operates only under Windows/NT. WNT Support license included.
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Kestrel /SX Co-Processor
0149-SX
Same speed Windows/NT Kestrel Co-Processor for equivalent system throughput, or more. Occupies one PCI slot. A writable control store, FPGA implementation of the HP1000 architecture with 4 MBytes of tightly coupled, zero wait-state memory. Includes compatible hardware floating point. On-card x86 microprocessor rapidly processes "virtual" I/O instructions. PCI bus speeds increase disk throughput by at least a factor of ten. HP1000 Bus support logic for non-emulated devices is provided on-board with connector to wide bandwidth fibrechannel adapter. Operates only under Windows/NT. WNT Support license included.
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Lab Power Supplies
SYSKON Series
The analog interface is equipped with two programmable trigger inputs and three signal outputs, which can be linked to various device functions for indication, or for controlling external devices and an auxiliary power output. Beyond this, monitor outputs and control inputs for voltage and current setpoints are available as well. Sensing leads allow for auto-sensing operation at the power consumer. Strict menu-driven operation supports highly diverse programming functions. The device is transformed into a freely programmable test signal generator by means of an expanded sequence memory and extra functions.
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Leeb Hardness Tester
THL500
It is the highest brightness display in China showing all functions and parameters, easy read Largest screen Oled screen and operate,also can save lots of energy .the largest screen of Leeb hardness tester in China. Two hardness scale dual-display in the screen. Measuring direction in 360 and add the auto measure direction to make test easy and precision. Add four new hardness scales, HRA, HB for D impact device of alloy tool steel; HV for cast aluminum alloy. Add New user material function, to ...show more -
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Leeb Hardness Tester
THL210
LCD display of 128×64 matrix with back-light, showing all functions and parameters. Converts to all common hardness scales (HV,HB,HRC,HRB,HRA,HS). English displaying and easy and convenient menu operation. Powerful PC Software available and USB 1.0 interface and USB with Protective Membrane. 7 types of Impact Device optional, which don't need to be recalibrated when changing them. Memory of 600 groups data(impact times:32~1). Lower limit setting and sound alarm. Material of “cast steel” is added...show more -
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Leeb Hardness Tester
HT6561
Product synopsis1.1 Typical Applications* Die cavity of molds* Inspection of bearing and other mass produced parts on aproduction line* Failure analysis of pressure vessel, steam generator andother equipment* Inspection of installed machinery, permanent parts ofassembled systems and heavy work pieces.* Testing surface of a small hollow space* Material identification in the warehouse of metallic materials* Rapid testing in large range and multi-measuring areas forlarge-scale work piece1.2 Testing...show more