Showing results: 241 - 255 of 273 items found.
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Exact Metrology
Software is a comprehensive component to any advanced metrology system. Combined with laptops and portable equipment, 3D scanning and measurement is now possible virtually anywhere. 3D scanner software plays a critical role in every stage from the creation of a concept design to the manufacturing and inspection of prototypes. Below is a look at some of the Laser Scanner Software and 3D Scanner Software providers and platforms we represent and handle.
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N432A -
Keysight Technologies
Keysight N432A is the replacement for Keysight's legacy 432A analog thermistor power meter. The single-channel, average RF power meter operates with the Keysight 8478B and 478A thermistor mounts. The N432A-and-thermistor-mount pair is ideal for applications that require high measurement accuracy, particularly in metrology and calibration laboratory environments. The enhanced thermistor power meter comes with a digital color LCD display, and user-friendly front panel interface. Its built-in calibration factor table provides a more convenient and accurate method of storing calibration factors as compared to the old knob-turning approach of the 432A. The N432A is LXI compliant, and programmable via GPIB, USB and LAN.
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Keysight Technologies
Keysight Technologies is a world leader in the design and manufacture of laser interferometry systems, advanced electronic measurement systems, high-precision optical components, complex monolithic optics (CMOs), and opto-electronic systems design for the most demanding metrology applications. Keysight systems offer high precision in a wide dynamic range, the ability to simultaneously measure a position with multiple degrees of freedom, and the highest accuracy available in both air and vacuum systems.
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RedLux Ltd
Our OmniLux metrology system is highly versatile and provides unparalleled levels of 3D CMM capture for component measurement in seconds. This high precision non contact, metrology system is extremely versatile because it measures components of any geometry and of any material. Geometries possible include: spheres, asphere, cylinder, internal bore, cone/taper, step height or freeform in any material such as polished or rough metals or ceramics and polymers. The Omnilux is fast and accurate because, unlike direct contact sensors, the use of optical sensors means that the whole surface can be analysed while the object is suspended in space, ensuring that no damage comes to delicate surfaces. Our easy-to-use software interface, developed from years of experience enables the operator to effortlessly control the system. Rich data analysis, automation and export of results for the immediate generation of reports as well as a compact footprint means OmniLux is the leading solution for production or R&D environments where reducing cycle times is critical to sustainable success.
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ASTEL 3.2 TYPE -
MeterTest Ltd.
ASTeL 3.2 meter test equipment is a fully automatic system that enables simultaneous, multi-position calibration and verification of three-phase electric energy meters. ASTeL 3.2 offers full compatibility with IEC 60736. Thanks to excellent parameters, superior functionality and outstanding flexibility, ASTeL 3.2 is an ideal solution for utility companies, energy meter manufacturers, governmental institutes of metrology, metrological laboratories, and other customers interested in electricity meters testing.
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ASTEL 1.2 TYPE -
MeterTest Ltd.
ASTeL 1.2 meter test equipment is a fully automatic system that enables simultaneous, multi-position calibration and verification of single-phase electric energy meters. ASTeL 1.2 offers full compatibility with IEC 60736. Thanks to excellent parameters, superior functionality and outstanding flexibility, ASTeL 1.2 is an ideal solution for utility companies, energy meter manufacturers, governmental institutes of metrology, metrological laboratories, and other customers interested in electricity meters testing.
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MEB -
The Eastern Specialty Company
Perform qualification, disconnect, communication, and advanced functional tests with TESCO’s new Meter Engineering Board. With basic metrology (0.1% accuracy) TESCO’s new MEB can also be used as a demand board or a time-run board, as part of meter certification, or to meet regulatory testing requirements. A new socket design provides automated operation to make loading easier. All new TESCO boards include our new electronically actuated sockets.
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ISRA Vision AG
Flawlessly glossy surfaces are among the most important quality features of many premium products. The smallest surface defects immediately have a degrading effect on the product. The result: disappointed end customers or buyers. At the same time, reflective surfaces are often very sensitive and a challenge for optical metrology. A manual inspection is tedious, expensive, and ultimately always governed by subjective decision criteria. During production, faulty painting or coating processes can cause high scrap rates. Defects that are not detected even during the final inspection can lead to expensive complaints and, in the worst case, to the loss of the customer. Only an efficient, automated surface inspection achieves the highest quality at acceptable costs.
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Lt665R -
Teledyne Lumenera
The Lt665R builds on EXview HAD II CCD Quad Tap sensor technology to deliver high quality imaging and high sensitivity in a compact camera rich in features. Low noise electronics ensure clear and sharp images rendering details with amazing accuracy. Its superior responsiveness positions it as a good choice for Near-Infrared (NIR) imaging. This camera is ideal for applications where high speed, sensitivity and resolution are critical including traffic, tolling, ophthalmology, life sciences, metrology, high-speed inspection, machine vision and NIR applications. A scientific-grade variant is available for the most demanding life science applications. The Lt665R can also be customized to suit OEM designs.
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ARO-PR -
JFE Advantech Co., Ltd.
The Portable optical DO meter makes use of the fast-response optical DO sensor RINKO, maintaining its high-speed response performance (99% response < 7sec). The meter probe is equipped with a temperature sensor close to the sensing foil, and the measurements are made by simply inserting the probe into a DO sample bottle (the calibration is carried out using the National Metrology Institute of Japan (NMIJ) certified traceable gases standards). Differently from galvanic electrode sensors, the instrument does not require water sample stirring or fixing reagents, since there is no oxygen consumption. Thus, the required time to estimate dissolved oxygen is considerably reduced. The display unit shows the output instantaneously, and you can check the measured values in real time.
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UVISEL -
HORIBA, Ltd.
The UVISEL Spectroscopic Phase Modulated Ellipsometer is a turn-key thin film metrology instrument for in-line measurement of thin film thickness and optical properties. It features rapid measurement capability with data acquired every 50 ms for powerful control of thin film uniformity across the entire web.The design of the UVISEL ellipsometric heads allows simple integration into roll-to-roll systems, while the software provides advanced communication capabilities suited to roll-to-roll production.
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Measurements International Ltd.
The Shunt Reactor Loss Measurement System is a microprocessor controlled, metrology based, high voltage Capacitance, Inductance and Reactor Loss Measurement bridge which is based on the two stage- compensated current transformer. The 7010C bridge can be ordered by itself or it can be ordered with high voltage capacitors up to 800 kV line to ground and two-stage-compensated current transformers up to 4000A. the system is fully automatic displaying the rms voltage at the top of the capacitor, the reactor current and the reactor losses.
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KLA-Tencor Corp
An error-free reticle (also known as a photomask or mask) represents a critical element in achieving high semiconductor device yields, since reticle defects or pattern placement errors can be replicated in many die on production wafers. Reticles are built upon blanks: substrates of quartz deposited with absorber films. KLA’s portfolio of reticle inspection, metrology and data analytics systems help blank, reticle and IC manufacturers identify reticle defects and pattern placement errors, thereby reducing yield risk.
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Nikon Instruments Inc.
Metrology's walk-around laser scanner for portable metrology applications. Accurate, easy-to-use and with stunning performance ensure it to be the most capable handheld scanning solution without mechanical constraints. The scanner is tracked by the K-CMM Optical Tracker, so that operators can measure anywhere needed. K-Scan MMDx is the ultimate tool for accurate part-to-CAD inspection and productive reverse engineering, combining the accuracy and productivity of the MMDx laser scanner and the user freedom, measurement volume and motion compensation of the K-CMM Optical Tracker system.
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LIGHTiX -
Unity Semiconductor SAS
Next generation macro inspection system (AOI).• All-side wafer inspection: Front, back and edge inspection.• 100% defect images without throughput impact.• Integrated high-end microscope review.• True Color Inspection (TCI) technology.• Advanced CD, 2D/3D, OVL and EBR metrology.• Automatic defect classification• Best in class cost of ownership for high resolution AOI• High-speed patterned wafer inspection• High defect sensitivity• ISO Class 1 certified• Tool – to – tool matching
