Showing results: 271 - 273 of 273 items found.
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KLA-Tencor Corp
KLA’s extensive portfolio of packaging solutions accelerates the manufacturing process for outsourced semiconductor assembly and test (OSAT) providers, device manufacturers and foundries for a wide range of packaging applications. Innovations in advanced packaging, such as 2.5D/3D IC integration using through silicon vias (TSVs), wafer-level chip scale packaging (WLCSP), fan-out wafer-level packaging (FOWLP) and heterogeneous integration as well as a wide range of IC substrates create new and evolving process requirements. KLA offers systems for packaging inspection, metrology, die sorting and data analytics focused on meeting quality standards and increasing yield before and after singulation. SPTS provides a broad range of etch and deposition process solutions for advanced packaging applications. Orbotech offers a portfolio of technologies that includes automated optical inspection (AOI), automated optical shaping (AOS), direct imaging (DI), UV laser drilling, inkjet/additive printing and software solutions to ensure manufacture of the highest quality of IC substrates.
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VUVAS-10X -
McPherson, Inc.
A new ultraviolet spectrophotometer system for optical metrology just arrived at NASA Goddard! The VUVAS-10X spectrophotometer works best in the 90 to 160 nanometer wavelength range, also known as deep or vacuum ultraviolet (VUV) region. It uses a windowless hydrogen plasma light source and differential pump section to reach many wavelengths beyond those of conventional deuterium lamps. The source also works with other gases, or gas mixtures, for atomic spectral line emission from about 30 nanometers (double ionized Helium gas) up to the Visible light range. The new spectrophotometer system, McPherson VUVAS-10X, uses a one-meter focal length high-resolution monochromator with the special light source, scintillated detector and Model 121 goniometric sample chamber. The system is ideal for optical transmission, absorbance and specular reflectance at incident angles up to 60 degrees. This McPherson spectrophotometer system will help develop, inspect and qualify optical materials and coatings used for very high altitude and extraterrestrial space flight missions.
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Leica Absolute Tracker AT403 -
Leica Geosystems AG
New all-in-one large-volume laser tracker system that sets a new standard for portability, simplicity, robust construction and measurement efficiency. An all-in-one metrology solution more portable than any other on the market, the Leica Absolute Tracker AT403 from Hexagon Manufacturing Intelligence is a self-contained measurement workshop inside a compact and convenient single case. With outperforming measurement process speed, operational simplicity like no other laser tracker and an unmatched level of robust construction, the Leica Absolute Tracker AT403 is a calculated bundle of affordable innovation without equal on the portable measurement market. Improvements include faster and more economical stationary and continuous measurement processes, along with a streamlined station change procedure. Added WiFi access point functionality and hot-swappable batteries deliver unmatched measurement freedom. Designed for leading results in almost any imaginable measurement environment, it is rated for operation in temperatures ranging from -15 to 45 degrees Celsius and features built-in environmental monitoring, orient-to-gravity functionality and construction in line with the rigorous IP54 certification standard.
