Showing results: 196 - 210 of 450 items found.
-
-
FM-Nanoview 6800 -
Zhengzhou Nanbei Instrument Equipment Co. Ltd
All-in-one design, smart structure and shape.Scan head and sample stage are designed together, strong anti-vibration performance .Precision laser detection and probe alignment device make laser adjustment simple and easy.Adapt servomotor to drive the sample approaching tip manually or automatically, to realize precision scanning area positioning.
-
VistaScope -
Anfatec Instruments AG
VistaScope is a unique AFM with flexible & full optical access to the tip/sample region. The VistaScope controller comes equipped with multiple lock-in amplifiers that allow patented photo-induced force microscopy (PiFM) and patented demodulation technique for background suppressed scattering scanning near-field optical microscopy (s-SNOM). It provides the ultimate capability in tip-enhanced optical microscopy as well as co-located AFM and far field optical techniques such as confocal Raman and confocal photoluminescence.
-
VS-SKP -
Ametek Scientific Instruments
The Kelvin Probe experiment uses a nondestructive method to determine the relative work function difference between the probe and the sample. Work function describes the energy required to liberate an electron from the surface of a conductor; electrochemists often interpret this as the difference from an electrode’s Fermi Level, average energy of electrons, and that of vacuum.
-
XGT-9000 -
HORIBA, Ltd.
- <15µm probe size with ultra-high intensity without compromising sensitivity or spatial resolution. - High resolution cameras and multiple illumination modes to help capture images.- Dual types of detectors for transmission and fluorescent X-rays.- Detectable element range down to carbon with a light element detector.
-
-
-
FVMPE-RS -
Olympus Corp.
The Olympus FVMPE-RS multiphoton imaging system is purpose-built for deep imaging in biological tissue, aimed at revealing both detail and dynamics. Innovative features for efficient delivery and detection of photons in scattering media enable high signal-to-noise ratio acquisition. This translates to bright images with precise details — even from deep within the specimen. High sensitivity is matched with high-speed imaging to capture rapid in vivo responses. For advanced applications, dual-wavelength excitation extending to 1300 nm is available. Independent control of visible or multiphoton laser light stimulation and the ability to synchronize with patch clamp data are also possible.
-
Linkham Scientific Instruments
Specialists in temperature controlled microscopy, Linkam Scientific Instruments, announce the launch of their Optical DSC450 which enables simultaneous visualization of thermal processes for improved materials characterisation. The Optical DSC450 enables the user to measure glass transitions and melting behaviour of a wide range of substances whilst accurately controlling temperature from -196 °C to 450 °C. The atmosphere of the stage can also be purged with gas as required by the user. A new feature which will increase the characterisation capabilities of the DSC system is to combine it with imaging capability. The new LINK Digital Imaging module enables additional information to be obtained by correlating optical changes such as colour with temperature. The new TASC analysis tool takes this further. TASC (Thermal Analysis by Surface Characterisation) is a new image analysis capability which enables structural changes in samples to be tracked and quantified optically. It has the unique ability to measure local transition temperatures allowing different points on a sample to be identified. The new DSC system is great tool to use in research and quality control to measure quantitative values for glass transitions, melting peaks and sample purity and, when combined with TASC, even sample homogeneity.
-
Fuzhou Zhongtuo Optoelectronic Co.,Ltd
Inspection microscopes are low power microscopes by nature, meant to view opaque objects with top lighting, just like a stereo microscope does. So regardless of an inspection microscope possibly having a single eyepiece (not always), it is still considered a stereo microscope.
-
Fuzhou Zhongtuo Optoelectronic Co.,Ltd
Inspection microscopes are low power microscopes by nature, meant to view opaque objects with top lighting, just like a stereo microscope does. So regardless of an inspection microscope possibly having a single eyepiece (not always), it is still considered a stereo microscope.
-
Sciencescope International
ELZ-Series Mini Stereo Zoom Binocular Microscope Systems. SSZ-II Stereo Zoom Binocular Microscope Systems. NZ-Series Stereo Zoom Binocular Microscope Systems. E-Series Parallel Zoom Binocular Microscope Systems.
-
-
M400 -
Yamasaki Optical Technology
The Yamasaki M400 Fiber Optic Microscope has high quality precision all glass optics and integrated infra-red safety filter making them the most sought after Fiber Optic Microscopes for use in the field or laboratory.
-
MicroINSPECT -
Microtronic, Inc.
MicroINSPECT Semiconductor Wafer Defect Microscope Inspection System combines state-of-the-art robotics, intelligent microscopes and SITEview software to provide a flexible, easy-to-operate defect inspection platform for either micro or macro defect wafer inspection.