Showing results: 226 - 240 of 450 items found.
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DS-Fi3 -
Nikon Metrology, Inc.
The DS-Fi3 is equipped with a 5.9 megapixel CMOS image sensor, which enables the capture of high-definition images of up to 2880 x 2048 pixels. With a new CMOS image sensor and high-speed data transfer via USB3.0, the DS-Fi3 enables fast focusing even in high-resolution imaging, and efficient image acquisition when using a wide range of illumination techniques. The DS-Fi3 has significantly higher quantum efficiency and lower readout noise than conventional models. It allows the capture of brighter images with higher S/N ratios in fluorescence observation.
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INFINITY8-8 -
Teledyne Lumenera
The new INFINITY8-8 camera is designed to reproduce what your eye sees in the eyepiece, complete with an intuitive software package all for a price that will fit within the most constrained budgets. Stream live videos or capture still images and share with ease.
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INFINITY8-2 -
Teledyne Lumenera
The INFINITY8-2M is the new go-to microscopy camera for routine fluorescence imaging on a constrained budget. With huge light-gathering pixels, large field of view, and low noise characteristics, this camera enables labs to have a dedicated monochrome camera for their low-light imaging requirements. And, with refresh rates of up to 96 fps at full resolution, the INFINITY8-2M provides exceptional low light sensitivity and allows for accurate imaging, even in variable lighting conditions.
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NeoARM JEM-ARM200F -
JEOL Ltd.
"NEOARM" comes with JEOL’s unique cold field emission gun (Cold-FEG) and a new Cs corrector (ASCOR) that compensates for higher order aberrations. The combination of a Cold-FEG and ASCOR enables atomic-resolution imaging at not only 200 kV accelerating voltage, but also a low voltage of 30 kV."NEOARM" is also equipped with an automated aberration correction system that incorporates JEOL’s new aberration correction algorithm for automatic fast and precise aberration correction. This system enables higher-throughput atomic-resolution imaging even at low accelerating voltages. Furthermore, a new STEM detector that provides enhanced contrast of light elements is incorporated as a standard unit.
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ioLight Ltd.
Viewing transparent samples from below in a Petri dish, flask, well plate or cavity slide. The microscope is compact and can be put inside most incubators to view experiments without opening the door. Time-lapse images can be saved and viewed remotely.Ideal for use as a Bench Microscope in teaching applications.
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ZEISS Celldiscoverer 7 -
Carl Zeiss AG
Combine the ease of use of an automated microscope with the image quality and flexibility of a research microscope. Whether working with 2D or 3D cell cultures, tissue or small model organisms, you will acquire better data in shorter times with this automated live cell imaging platform. Add LSM 900 with Airyscan 2 to gently image dynamic processes with highest framerates in superresolution.
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FIB-SEMs -
Carl Zeiss AG
Combine imaging and analytical performance of a high resolution field emission scanning electron microscope (FE-SEM) with the processing ability of a next-generation focused ion beam (FIB).
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MX63 / MX63L -
Olympus Corp.
The MX63 and MX63L microscope systems are optimized for high-quality inspections of wafers as large as 300 mm, flat panel displays, circuit boards, and other large samples. Their modular design enables you to choose the components you need to tailor the system to your application. These ergonomic and user-friendly microscopes help increase throughput while keeping inspectors comfortable while they do their work. Combined with OLYMPUS Stream image analysis software, your entire workflow, from observation to report creation, can be simplified.
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STM -
A.P.E. Research
A.P.E. Research instrument is a versatile Scanning Tunneling Microscope, STM, capable of scanning samples of almost any size. It can operate in UHV and in air. The systems have been designed to evaporate (e.g. metals, organic molecules) in UHV directly onthe sample mounted on the STM head.
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HORIBA, Ltd.
The AFM platform allows fully-integrated use of confocal Raman microscopy and AFM for Tip-Enhanced Optical Spectroscopies (such as Tip-Enhanced Raman Spectroscopy (TERS) and Tip-Enhanced PhotoLuminescence (TEPL)), but also for truly co-localized AFM-Raman measurements.The myriad of AFM (Atomic Force Microscope) techniques that allow study of topographical, electrical and mechanical properties can be performed with any laser source available in Raman spectrometer, or with other external illumination (e.g., solar simulator or other tunable or continuum source). TERS and TEPL can provide nanoscale chemical and structural information, making the AFM-Raman platform a two-way road; where complimentary techniques provide novel and unique imaging capabilities to each other.
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ViTec Co. Ltd
To develop a complex for visual inspection of electronic components (other micro-objects) in order to identify visual defects, record the resulting image and transfer information for processing.
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DAISI-V3 -
DATA-PIXEL SAS
The ultimate production interferometer for measuring end-face geometry on single-fiber connectors, equipped with a revolutionary «no-exterior-moving-parts» mechanical design.
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BX53M -
Olympus Corp.
Designed with modularity in mind, the BX3M series provide versatility for a wide variety of materials science and industrial applications. With improved integration with OLYMPUS Stream software, the BX3M provides a seamless workflow for standard microscopy and digital imaging users from observation to report creation.
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Trialon Corp.
Trialon has the equipment and experienced staff to operate this highly technical piece of laboratory equipment. Our state-of-the-art materials analysis lab located in Auburn Hills, MI is managed by a Ph.D with over 20 years of hands-on experience in root cause failure analysis of design, material and process for current and future products.