Showing results: 31 - 45 of 192 items found.
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National Technical Systems
Scanning Acoustic Microscopy, also known as C-SAM or Acoustic Micro Imaging or AMI, outstanding benefit is its ability to find hidden defects within assemblies and materials that can occur during manufacturing or environmental testing. Defects such as delaminations, voids and cracks can be identified and analyzed more effectively using Acoustic Microscopy than with any other inspection method.Unlike other non-destructive techniques such as X-Ray and Infrared Imaging, Acoustic Microscopy is highly sensitive to the elastic properties of the materials it travels through. Because of this, the ability of Acoustic Microscopy to find and characterize these physical defects is clearly superior. Typical applications include production control, failure analysis, and product development.Through the use of ultra-high frequency ultrasound, C-SAM non-destructively finds and characterizes physical defects—such as cracks, voids, delaminations and porosity— that occur during manufacturing, environmental testing or even under normal component operation. Because of the unique aspects of the technology, AMI can locate these defects better than any other inspection method.
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CLUE Series -
HORIBA, Ltd.
HORIBA Scientific's Cathodoluminescence Universal Extension enhances any SEM’s analytical capabilities while maintaining its original functionality. Since the sample is able to remain in the same spot, CLUE can easily be combined with other microscopy applications, such as EDS and EBIC.
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Crystal Vision -
FA Instruments
Crystal Vision Microscopy suites are transforming the world of IC Diagnostics and failure analysis. Intuitive software allows user friendliness and enables the breadth of analytical disciplines available. Realtime imaging from both Topside and Backside, allows for maximum productivity.
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RAMANforce/RAMANtouch -
Nanophoton Corp.
Nanophoton is the pioneer of confocal laser scanning microscopy and spectroscopic analysis. To celebrate, we relaunch our fastest and highest resolution confocal Raman microscope RAMANtouch/RAMANforce. With a newly designed spectrograph and the latest optical technologies, RAMANtouch/RAMANforce’s spatial resolution and sensitivity have been highly improved, making it the optimal solution for all applications.
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LC30 -
Olympus Corp.
The LC30 is a 3.1 megapixel digital color camera for microscopy that combines versatility with performance. The LC30 is the ideal entry-level microscope camera for quality bright-field imaging － suitable for material science applications. The Olympus LC30 color camera for microscopy combines versatility with performance. With up to 37 frames per second (fps), faithful color reproduction, full integration into Olympus imaging platforms, and an excellent cost-performance ratio, the LC30 is the ideal entry-level microscope camera for quality bright-field imaging － suitable for material science applications.. The sensitivity and frame rate of the 3.1-megapixel CMOS chip can be increased using various binning modes, resulting in easy observation and focusing. The LC30 camera can be quickly and easily mounted on all microscopes equipped with a standard C-mount adaptor, and requires only a single USB 2.0 cable for high-speed data transfer and power supply. Its complete integration into the OLYMPUS Stream imaging platforms helps ensure the seamless interaction of microscope, camera, and additional devices, delivering intuitive and efficient operation.
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analySIS FIVE -
Olympus Corp.
The image analysis software "analySIS FIVE" is designed for users of industrial microscopes compatible with digital cameras for microscopes. Users can select from 5 types depending on their required functions, such as "measurement," "database," "report creation," and "particle analysis."
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WL150 and WL200 -
McBain Systems
The McBain WL150 and WL200 Series Wafer Handler is a safe, semi-automatic wafer loader designed to use with virtually all major microscopes, optics and inspection devices. It is a portable, economically priced tool which serves as a direct replacement for the Irvine Optical Ultrastation systems. The WL Wafer Handler, available in two configurations to handle 3" to 6" wafers or 4" to 8" wafer sizes, is designed for easy operation, seamless integration, and consistent, reliable handling for labs and automated workstations.
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Rocky Mountain Laboratories, Inc.
Scanning Electron Microscopy (SEM Analysis) can produce images of almost any sample at magnifications of 15-300,000X. The SEM has tremendous depth of field allowing for imaging that cannot be accomplished using optical microscopy. Conductive and nonconductive samples can be imaged. When operated in the backscatter (BSE) detection mode, differences in material composition can be observed. Elemental analysis can be performed on any feature observed with an integrated Energy Dispersive Spectroscopy (EDS) detector.
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Toggel -
Lambert Instruments BV
Lambert Instruments today announced the introduction of its next-generation fluorescence lifetime imaging camera: Toggel. This new camera makes fluorescence lifetime imaging microscopy (FLIM) and fluorescence resonance energy transfer (FRET) faster and easier with its excellent light sensitivity, sharp images and fast image acquisition. With Toggel, Lambert Instruments aims to minimize measurement duration, automate image acquisition and simplify data analysis. These factors are of great importance to many of its customers in cell biology, cancer research and high-throughput screening.
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PEM-1000 -
Korima, Inc.
The PEM-1000 emission microscope incorporates the latest technology in real time, high quantum efficiency, mega-pixel CCD detectors in a back-thinned cooled camera. A portable system, the PEM 1000 can interface with all analytical probe stations, ATE (automated test equipment) and bench top configurations for high speed functional testing.
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INFINITY3-6UR -
Teledyne Lumenera
Teledyne Lumenera’s INFINITY3-6UR is the ideal combination of large field of view, high-sensitivity, and extremely fast frame rates for a high-resolution camera. The one-inch optical format of the CCD sensor works best with cost-saving 1X couplers, providing an extensive viewing area.
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Rocky Mountain Laboratories, Inc.
Scanning probe microscopy (SPM) refers to a family of measurement techniques that utilize a scanning probe. The most common measurement is Atomic Force Microscopy (AFM Analysis), which measures surface topography. Imaged areas can be from the nm scale to as large as 100 µm X 100 µm. Heights and depths of features can be measuredand many surface roughness parameters, e.g Ra, can be calculated. 3-D images can also be produced for dramatic data presentation. Magnetic and electrical response can also be measured with SPM.
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INFINITY3-3UR -
Teledyne Lumenera
The INFINITY3-3UR is the go-to camera for critical imaging. This is the “workhorse” of microscopy cameras and accurately replicates what is being seen in the eyepieces. In addition to precise color reproduction, this camera is blazingly fast and ensures lag-less refresh, while the large light-gathering pixels provide increased sensitivity.
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INFINITY3S-1UR -
Teledyne Lumenera
The Teledyne Lumenera INFINITY3S-1UR is the go-to microscope camera when versatility, ease of use, and price are part of the selection criteria.The INFINITY3S-1UR is an ultra-sensitive, low noise CCD camera that offers the speed and accurate color to meet your brightfield imaging requirements, and helps save money by converting into a solution for your routine fluorescence imaging needs.
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INFINITY2-1R -
Teledyne Lumenera
2-1R scientific camera offers a significant performance increase for quantitative and low-light applications over its predecessor. Improved thermal management techniques combined with a much higher dynamic range and 14-bit output have resulted in a versatile entry-level research camera for documentation and image analysis in Life Science, Clinical and Material Science applications. The INFINITY2-1R easily manages seconds of exposure time with a dark current rating of less than 1 e-/s.
