Showing results: 2371 - 2385 of 2981 items found.
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OM210A -
Advanced Fiber Solutions
The OM210 power meter is designed for POF (plastic optical fiber) and short wavelength applications (visible and near infrared). The OM210 optimizes a Silicon detector suitable for large core fibers. It is the ideal tool for working with shorter wavelengths whether the system is glass, plastic or multimode fibers.
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YIS 200 -
RMS Vision Systems Inc
The YIS and SF Series metrology systems are designed for optical detection of wafer defects such as crystaldislocations, slip and other defects. The YIS-300HM (for 300 mm wafers) and YIS-200HM (for 200 mm wafers) utilizeMakyoh optics technology (Magic Mirror) and integrated robotic wafer handler provided by Hologenix.
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CAMSIZER -
Retsch Technology GmbH
Dynamic Image Analysis (DIA) is a modern high-performance method for the characterization of particle size and particle shape of powders, granules and suspensions. Retsch Technology's optical analyzers CAMSIZER P4 and CAMSIZER X2 are based on this technology, covering a measuring range from 0.8 m to 30 mm.
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XGS 8000 -
ON Semiconductor
The XGS 8000 is a 8.8 Mp (4096 x 2160) 4k / UHD resolution Global Shutter CMOS image sensor in 1/1.1 inch optical format, supporting up to 120 frame per second readout at full resolution. The device provides high resolution, global shutter imaging with high readout speed for industrial imaging customers. A compact package design and low power footprint make the device compatible with a 29 x 29 mm2 camera footprint. Two speed grades are available to match device output to key computer interfaces and application requirements.
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ASE Sources -
Fibotec Fiberoptics GmbH
Fiber optic broadband light sources use amplified spontaneous emission (ASE) within optically pumped rare earth doped fibers. The spectral width of the light source can be determined by the developer in a range of a few nm to the full width of the emission spectrum of the active ion (eg, erbium ion). The optical power density of fiber optic ASE sources is typically higher than that of fiber-coupled broadband semiconductor light sources with simultaneously lower intensity noise (RIN). These properties, and the lack of resonator interference, of good incoherence make ASE sources a preferred instrument for use in metrology applications.
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XO1 -
Yamasaki Optical Technology
FiberPulse OTDRs send pulses down fiber optic networks from one end of the fiber, displaying a trace and reporting all detected events such as splices, connectors, macrobends and fiber ends and breaks. The total fiber length is reported along with name, location, loss and reflectance of detected events. The intuitive keypad design features integrated shortcut keys designed for quickly positioning and analysing events. Another feature of this unit is the Live Optical Signal Detect Function, which tests if the fiber is live before sending the pulse, this can effectively prevent accidental damage to the OTDR and attached communication equipment.
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TM536 Series -
T&M Tools Limited Co
TM536 Series Mini Visual Laser Source totally complies with the human engineering. It's small in size, easy to operate, portable and integrated with a launching indicator. A Visual Laser Source is usually used to inspect the damaged or broken point of a optical fiber, cable, patchcord and etc.If the inspected fiber does have a defect, user could find the visual laser at the broken or damaged point. TM536 Series Mini Visual Laser Source is suitable for both single mode and multimode fibers. The performance of the visual laser source will act a little different on different fiber coat and color.
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Xtium 2 CLHS PX8 LC -
Teledyne DALSA
The Xtium™ 2 CLHS PX8 features CameraLink HS standard on the PCI Express™ Gen 3.0 platform. This single cable, single slot solution supports up to 4-CLHS lanes, each operating at 10.3 Gbits/s, to acquire images at up to 5.0 GBytes/s and transfer them using PCIe x8 slots to the host memory. The Xtium2-CLHS supports Active Optical Cable (AOC) to extend the cable length beyond 100 meters. Built-in data-forwarding and multi-board sync capabilities deliver a platform for distributed processing for high-speed, computational intensive machine vision applications.
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Saluki Technology Inc.
Saluki S2106 Series Optical Time Domain Reflectometer is a high performance multi-function test instrument designed for the FTTx network. The product has a range resolution of up to 0.05m and a ultra-short event blind zone of 0.8m. This product integrates OTDR, LS, OPM, VFL, Event Map (iONM), OLT and OFD function all in one. It adopts touch and button dual operation mode. The product has rich external interface, which can realize remote control through Ethernet interface or two different USB interface for external USB flash drive, printer and data communication with PC.
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Shenzhen Graigar Technology Co.,Ltd.
Measurement of the speed of a rotating shaft is a common requirement in many industrial and laboratory applications. Such measurements have usually been carried out in the past with the help of contact type tachometers with friction drive. More recently digital optical non-contact tachometers have been designed which count the reflected pulses from a white patch on the shaft and then display the speed in rpm. The light source is usually a filament lamp operating with dry cells leading to limited life and illumination. A similar ideawith magnetic pick-up from a particular area of the shaft has also been used for speed measurement.
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Quasar™ 4K IR PTZ Cameras -
Teledyne FLIR
With crisp 4K video resolution, on-board long-range IR illumination, and 22x or 31x optical zoom options, FLIR Quasar™4K IR PTZ cameras deliver critical situational awareness. Exceptional field of view gives operators the ability to seamlessly monitor key details throughout large areas. The combination of high-performance optics and sensors, exceptional low light visible imaging, and effortless integration with all major third-party VMS and FLIR United VMS makes Quasar 4K IR PTZ cameras an ideal solution for critical infrastructure sites and remote facilities that require close monitoring.
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e-CAM10_CU0130_MOD -
Sensory Analytics
The e-CAM10_CU0130_MOD is a 1.3 MP NIR Camera module (Monochrome) based on the Aptina / ON Semiconductor AR0130CS CMOS image sensor with S-mount lens holder attached to it. The AR0130 is a 1/3” Optical Form factor, Electronic Rolling Shutter CMOS sensor with enhanced sensitivity in the Near Infrared region and superior low light performance. The e-CAM10_CU0130_MOD is designed to connect with any Application Processor that has parallel digital video interface. The standard S-Mount lens holder can accommodate a wide range of lenses based on the customer choice. e-CAM10_CU0130_MOD’s S-Mount holder can also house a fisheye lens or a zoom lens to meet their application requirements.
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Imaginant Inc.
Utilizing optical and semiconductor fabrication techniques, Imaginant manufactures the PureView PrecisionTM line of RoHS-compliant delay-line ultrasound transducers with center frequencies ranging from 50 MHz to 250 MHz (higher and lower transducer frequencies are also available). Imaginant's precision-manufacturing process produces transducers that exhibit high reliability and high uniformity from device to device. This manufacturing consistency enables uniform test system performance to be attained across multiple systems. Imaginant transducers are available in focused and flat-face models that can be produced with minimal-damping for applications requiring maximal sensitivity or with maximal-damping and high-bandwidth for applications requiring the highest-degree of temporal precision.
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Tropel® FlatMaster® -
Corning Inc.
Tropel® FlatMaster® Surface Form Analysis System Fast and Precise Measurements of Ground, Lapped, Honed, Polished and Super-finished Components. The Tropel® FlatMaster® offers industry leading performance for surface form measurements to precision component manufacturers. Our non-contact optical technique analyzes the entire surface of the part in seconds, regardless of its size or complexity. The FlatMaster provides five nanometer resolution and a standard accuracy of 50 nm (2.0 μ). It rapidly and accurately measures flatness, line profile, radius and other surface parameters on a variety of materials and surface finishes.
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MultiView 2000 -
Nanonics Imaging Ltd.
an advanced single probe scanning probe microscope enabling a variety of modes of AFM/SPM/NSOM imaging. Nanonics has designed The MultiView 2000TM for excellence in scanning probe microscopy while allowing for near-field and far-field optical NSOM/Raman/TERS imaging without perturbation. The Multiview 2000TM is the only commercially available instrument that offers both tip and sample scanning. This versatility is important for different operation modes where the user can now choose whether the sample or tip is static. The Multiview 2000TM further offers the most stable feedback mechanism available in the form of normal force feedback with tuning fork actuation.
