Showing results: 556 - 570 of 3048 items found.
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CDP 2017 -
CDP Systems Corp.
*> 30% conversion efficiency from pump pulse to parametric radiation*Wavelength conversion for ExciPro, TAPPIR, FOG 100-DA*Wavelength conversion options for wavelength tuning from 240 nm to 16 mm
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X5005 -
Shinho Company
Fiber Ranger X-5005 is the most portable test instrument in the industry. It adopts the OTDR technical principles and integrates the powerful analysis software, which enables the fiber ranger to detect fiber faults location more accurate and easy.
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VS-OSP -
Ametek Scientific Instruments
The VersaSCAN OSP integrates the Base with a high-accuracy, high-speed laser displacement sensor. The OSP technique uses diffuse reflection mechanism to measure topography of a sample. OSP can be used to measure topography, as a very sensitive leveling mechanism, or charting topography to be implemented with other scanning probe techniques for constant-distance mode operation.
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OD-10 -
JFE Advantech Co., Ltd.
Measurement of dissolved oxygen for aeration flow rate control at sewage treatment plants and monitoring of water quality at rivers,lakes,and etc.
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Tektronix, Inc.
Depend on Tektronix to provide you with performance you can count on, and industry-leading service and support.*Broad Wavelength Response 500 to 950 nm or 1100 to 1700 nm*High-bandwidth DC up to 1.2 GHz*High Gain 1 V/mW*Low Noise <11 pW/√Hz*Probe Connects to DPO7000*1 and DPO/DSA/MSO70000*2Series*SONET/SDH and Fibre Channel Reference Receiver Performance
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Alnair Laboratories Corporation
The FDM-OTDR encodes multiple probe pulses at different frequencies, in the same time frame that conventional C-OTDRs send out a single pulse. This frequency-division-multiplexing enables larger data acquisition in the same measurement time compared to C-OTDRs. As a result the FDM-OTDR can achieve higher dynamic range with the same measurement time, or a significantly reduced measurement time with the same dynamic range.
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7210-P -
Chroma ATE Inc.
Chroma 7210-P is an inspector to examine solar cells during metallization process. Its small dimension design can be easily installed on the metallizing rotary table. The defects on the c-Si PV cells that caused by front-side (sunny-side) printing process may affect the performance, reliability and appearance.
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EM2 -
U. S. Digital
The EM2 provides digital A & B quadrature outputs with a third output index channel. Each EM2 module is resolution specific and is matched to the resolution of a code wheel. The EM2 operates with a single 5V supply and provides single ended outputs which are capable of both sinking and sourcing 5mA. An internal 0.1 uF decoupling capacitor is designed into the EM2 to provide enhanced noise immunity.
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MIV-X -
Shimadzu Corp.
Thanks to Shimadzu’s proprietary light imagining technique, which combines an ultrasonic oscillator with a stroboscope, defects near the surface of a material, including peeling of the bonding and adhesive surfaces of heterogeneous materials, as well as paint, thermal sprays, and coatings can be inspected easily and non-destructively.
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Wuhan Sunma Technology Co., Ltd.
SunmaFiber is a worldwide leading provider for fiber optic equipment, fiber optic test instruments and other data network & telecom products of communications, commercial, and consumer markets. The Company offers test and measurement systems and services to telecommunications service providers, cable operators, and network equipment manufacturers. In addition, the Company offers components, modules, and subsystems for Wireless, Telecommunication, Datacom, Power, Cable TV measurement instruments and utilities applications.
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OpenStand -
Prior Scientific Inc.
Whether developing new automation techniques and software or developing new imaging methods, you can quickly find that you need a microscope system tailored to your application and business needs. Prior Scientific has developed OpenStand® to offer a working platform to build OEM solutions and one-off customizations with excellent value for money and reduced development time.
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Zenith UHS -
Koh Young Technology
High-speed full 3D AOI that brings about a revolution in SMT process management Industry-leading speed for full 3D measuring inspection equipment skill solutions- Only solution in the industry to set inspection criteria according to IPC-610 standards- Performs defect diagnosis through measurement-based data and eliminates the causes of possible errors- Powerful 3D solder joint inspection
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QFP Srl
QFP markets transportable 3D scanners featuring high scanning speed and accuracy. Our non-contact 3D scanners are ideal for digitizing physical models. QFP contactless 3D scanning systems are easy to use.