Showing recent results 151 - 165 of 263 products found.
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Spartan™ - Brooks Automation, Inc.
The unified wafer management system gives the Spartan™ Sorter the minimum scale and complexity required to accomplish its core job – to move wafers as cleanly and as quickly as possible. The Spartan Sorter offers improved reliability and maximized efficiency, while delivering industry-leading cleanliness with the lowest particle levels.
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SI502 - BSWA Technology Co., Ltd.
SI502 Sound Intensity Probe is built using ICP type preamplifiers. It complies with IEC 1043 Class 2 Standard. Based on the technique of simultaneous determination of sound pressure and particle velocity by two closely spaced microphones, SI502 can be directly connected to ICP inputs to perform sound intensity measurements.
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DFA100 - Doble Engineering
The DFA100 Dielectric Fault Analyzer is a handheld survey tool used to identify and locate partial discharge, particles, and mechanical defects.With three measuring modes, continuous, phase and pulse, the DFA100 uses its acoustic emission sensor to find in-service acoustic signals produced by partial discharge and loose components.
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Naneos Particle Solutions gmbh
The naneos partector TEM sampler is the perfect marriage between simplicity and power: You can use it as a simple survey instrument to quickly identify nanoparticle sources in workplaces. You can also use it to sample particles directly to a standard transmission electron microscope (TEM) grid.
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PiV - nac Image Technology Inc.
The Invisible® Vision PiV series of multi-frame cameras are designed to achieve ultra fast shuttering combined with zero frame to frame distortion – so essential for quantitative particle image velociometry applications in the analysis and scientific modelling of high speed events.
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TSI Inc.
Electronic products are part of the world we live in. The constant need for increased processing power in a smaller package has driven the size of line widths inside components into the nano-particle size range. This means smaller, nano-size particles can disrupt manufacturing processes and impact yields which impacts the bottom line.
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Fraunhofer-Gesellschaft
Semiconductor substrates such as Si wafers or masks for the next generation of extreme ultraviolet lithography (EUVL) are handled in a vacuum. For nm structures and exact overlay, the reproducibility of the substrate evenness is a crucial factor, as unevenness results in structural distortions. Particles are problematic and heat input as well as thermal expansion must be taken into account.
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HIGHVOLT Prüftechnik Dresden GmbH
Electrostatic precipitators are used for clean process and exhaust gases, for example, in the cement and building materials industry, in steel mills, in conventional power plants, and in waste incineration plants. The dust particles are discharged electrostatically charged by a spray electrode, deflected by a DC electric field and deposited on the electrode.
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Quest Engineering Solutions
Quest Engineering Solutions has the capability to perform IPX Water (Intrusion Protection) testing per numerous IEC standards, including IEC 60529. This testing is designed as a means to verify that the products' internal components are adequately sealed and protected from the intrusion of foreign objects, liquids, and fine particles.
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LIGHTsEE - Unity Semiconductor SAS
High throughputNanometer range vertical sensitivitySimultaneous double side inspectionNanotopography and Topography measurementDetection of Slip lines, particles, Hairline cracks, SOI voids, Comets, EPI defects…Compliant with thin or thick wafers, taiko wafers, highly warped wafers
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LC-4000 Series - Jasco Analytical Instruments
The LC-4000 Series UHPLC system offers high performance separations at up to 130MPa (around 20,000psi) for use with the smallest particle sizes and longest column lengths. The pump, autosampler and detectors are optimized for the smallest band broadening and fastest cycle times.
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MDC Vacuum Products llc
The Ultracart 3000A is a sophisticated mobile analytical system for simultaneous real-time analysis of particles, oxygen, and moisture contamination in UHP process gases. Through a single connection, the Ultracart's UHP gas systems delivers sample gas to each of its three primary analytical instruments at proper flows and pressures.
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magtrack - Matesy GmbH
The magtrack is based on the Magnetic Marker Monitoring. It was developed for the recording of the motion sequences in closed systems, in order to analyze and optimize such processes. With the magtrack it is possible to detect the absolute orientation in a defined space of the magnetic marked particles. The magtrack-System has a modular design and can be adjusted to most equipment and a variety of systems.
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Panasonic Automotive & Industrial Systems Europe GmbH
There are many production processes where electrostatic charges disturb smooth operation. To eliminate static, ionizers are used. One typical field of application is the semiconductor industry where the components are extremely sensitive and can even be damaged by high electric static charges. Another example is the printing industry: Here friction between the rollers and the paper generates static. The static makes the paper cling and not move correctly through the printing machine. Especially when printing on vinyl or plastics, electrostatic charges need to be removed. In the packaging industry, plastic sleeves or foils tend to stick to each other, which can be prevented with an ionizer eliminate static. A general problem in assembling processes is the adhesion of dust and dirt particles. Contamination of workpieces can be prevented by having static eliminators neutralize and blow away undesired particles.
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IPC-650-HP - North American Technical Services
The IPC-650-HP ultra-low background windowless automatic is a newly redesigned instrument based upon the IPC-650, which was the foundation product of Protean. The ICP-650-HP incorporates a built-in color touch screen Interface and is targeted toward health physics applications. This hemispherical, windowless, gas-flow proportional counter design offers the best efficiencies available for low-energy beta and alpha particles.
