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Particle

subatomic or minute speck of matter

See Also: Nanoparticle


Showing results 196 - 210 of 235 products found.

  • ±2 kV Electrostatic Chuck Supply

    Model 645 - TREK, INC.

    Trek’s Model 645 software-driven Electrostatic Chuck Supply offers an array of features that provide significant benefits while accommodating a variety of demanding applications. Documented use shows that customers have seen increases in efficiency and throughput equal to three times that of other supplies. Additionally, the Model 645 virtually eliminates sticky wafer and wafer popping issues, thus ensuring better control over particle contamination. Given the versatility and performance of the Model 645, it can be used in multiple unique tools/processes, thus eliminating the need to specify a new supply for each unique tool/process in a facility.

  • ±3 kV Electrostatic Chuck Supply

    Model 646 - TREK, INC.

    Trek’s Model 646 software-driven Electrostatic Chuck Supply offers an array of features that provide significant benefits while accommodating a variety of demanding applications. Model 646 incorporates Trek technology which has demonstrated increases in efficiency and throughput equal to three times that of other supplies. Virtual elimination of sticky wafer and wafer popping issues ensures better control over particle contamination. Given the versatility and performance of the Model 646, it can be used in multiple unique tools/processes, thus eliminating the need to specify a new supply for each unique tool/process in a facility.

  • SC-1 Monitor

    CS-131 - HORIBA, Ltd.

    The CS-131 is a high-precision chemical concentration monitor designed for use with SC-1 solutions used in cleaning processes during semiconductor manufacturing. It offers a faster response speed in a more compact size than anything available to date. The CS-131 monitors the concentrations of the individual components of the SC-1 solutions (NH3/H2O2/H2O) which is widely used to remove particles and organic substances. The monitor has a number of outputs which can be utilized to keep the concentrations of the individual elements of the SC-1 solutions within the allowable ranges; this eliminates unnecessary replacement of chemicals potentially increasing bath life time and reducing chemical cost. In addition, a model with an integrated cooling unit is available, allowing accommodation of a broader range of sample temperatures.

  • Envelope Density Analyzer

    GeoPyc 1365 - Micromeritis

    The GeoPyc employs a unique displacement measurement technique that uses Dry Flo, a quasi-fluid composed of small, rigid spheres having a high degree of flow-ability. The sample is placed in a bed of Dry Flo which is agitated and gently consolidated about the sample. The GeoPyc collects the displacement data, performs the calculations, and displays or prints the results. The GeoPyc automatically determines the volume and density of a solid object by displacement of Dry Flo, a solid medium. The medium is a narrow distribution of small, rigid spheres that have a high degree of flow ability and achieve close packing around the object under investigation. The particles are sufficiently small that during consolidation they conform closely to the surface of the object, yet do not invade pore space.

  • Micro X-ray Fluorescence (Micro-XRF) Analyzer

    Orbis - EDAX

    ow you can get advanced non-destructive elemental analysis with the flexibility to work across a wide range of sample types and shapes. There is minimal sample preparation. No coating is required. Orbis Micro Energy Dispersive (Micro-EDXRF) Analyzers incorporate fast, simultaneous multi-element X-ray detection with the sensitivity to analyze from parts-per-million to 100% concentrations. Users can conduct elemental analysis on small samples, such as particles, fragments, and inclusions, or automated multi-point and imaging analysis on larger samples, with all of the benefits and simplicity of an XRF analyzer.

  • Nanoparticle Detector

    partector - Naneos Particle Solutions gmbh

    The naneos partector is the world''s smallest nanoparticle detector. It''s easy to use, small, light-weight, has a great battery life and high time resolution. It measures the lung-deposited nanoparticle surface area, the most health-relevant physical particle metric. It uses a novel contactless electrical detection that makes it nearly maintenance-free. LDSA measurement with a time resolution of 1 second (internal instrument time constant 4s; faster on request)

  • Defect Inspection

    Reflex TT MBI - Rudolph Technologies Inc.

    The Reflext TT MBI™ is a manually loaded tool for detecting particles, scratches, area defects and micro-roughness (haze) on mask blanks up to 8"x8". It is a very flexible tool for process characterization and contamination monitoring for R&D purposes. Simple operation and user friendly software make the Reflex TT MBI a valuable tool for a wide range of applications.

  • EDS Micronalysis for the SEM

    Iridium Ultra - IXRF Sytems, Inc.

    The most flexible EDS system you will ever use, Iridium Ultra™ will change the way you analyze your data. Our software suite boasts advanced analytical tools for the beginner, as well as the experienced user. We do not stratify our software suite into low, medium or high-end levels. There is only one high end package which includes advanced spectra, imaging, mapping, particle analysis and microscope stage/column control tools.

  • Camera Module Tester

    Evolusys Technologies Sdn. Bhd.

    * Lens Focusing plus Far Field Sharpness Testing - CTF/MTF/SFR * Near Field Sharpness Testing - CTF/MTF/SFR * Flat Field Grey Image Testing - Optical center, Defect pixels, particles, blemish, shading, color shading, color ratio, SNR, etc. * Dark Field Image Testing - Hot pixels, dynamic range, SNR, etc. * Current Measurement - Active, standby

  • Industrial Real-Time X-Ray Inspection Equipment

    ACCUVUE Model 30-100 - CXR Company, Inc.

    Portable cabinet x-ray inspection system for finding foreign particles, defects in products and correct component assembly. For most applications, products enter the ACCUVUE x-ray unit on a conveyor belt and are visually x-ray inspected. Pumped systems (for slurry products) and pour-through systems (for powder) are available. An image intensifier enhances the x-ray image which is transferred by a CCTV camera to the viewing monitor.

  • Combustion Diagnostics

    Dantec Dynamics A/S

    Dantec Dynamics offers a wide range of measurement solutions for diagnostics throughout all stages of the combustion process, providing information about: Combustion radicals by Laser-Induced Fluorescence (LIF), Fuel distribution by Laser-Induced Fluorescence (LIF), Flame development by Time-resolved Laser-Induced Fluorescence (TR LIF), Flame temperature by Rayleigh Thermometry, Soot volume fraction by Laser-Induced Incandescence (LII), Flow velocity fields by Particle Image Velocimetry (PIV)

  • 500/1000 Watt Regulated High Voltage DC Power Supplies

    PG Series - Glassman High Voltage, Inc.

    The PG Series is available in two configurations ... as a standard PG Series supply or as an ultra-low ripple PG-LR Series for demanding applications, such as particle accelerators. Shown is the dual-stack PG-LR Series with remote control unit. One stack serves as a high voltage multiplier while the second stack provides an additional low-pass ripple filter and a shielded DC feedback network.

  • 250/500 Watt Low Ripple Regulated High Voltage DC Power Supplies

    PG-LR Series - Glassman High Voltage, Inc.

    The PG Series is available in two configurations ... as a standard PG Series supply or as an ultra-low ripple PG-LR Series for demanding applications, such as particle accelerators. Shown is the dual-stack PG-LR Series with remote control unit. One stack serves as a high voltage multiplier while the second stack provides an additional low-pass ripple filter and a shielded DC feedback network.

  • PEM Personal Environmental Monitor

    200 - MSP Corporation

    200 PERSONAL ENVIRONMENTAL MONITORS (PEM™) are small, light-weight personal samplers comprised of a single-stage impactor followed by a 37 mm filter to collect particle samples from the ambient air. Impactor cut-size diameters of 2.5 µm and 10 µm are available for sampling at 2, 4, or 10 L/min for personal PM2.5 and PM10 sampling. The PEM can be operated with personal sampling pumps for personal PM2.5 and PM10 exposure studies.

  • Far Infrared Systems

    Sciencetech, Inc.

    Far-Infrared and terahertz (THz) radiation is the spectral region at the long wavelength end of the infrared and the short end of the microwave region, also known as the sub-millimeter wavelength spectral region. Recently, there has been an explosion of interest in THz applications as the radiation generated can penetrate various materials. THz light is commonly used in materials science, security, pharmaceutical com- pound analysis, biomedical imaging, superconducting materials, astronomy, and particle physics research.