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Particle

subatomic or minute speck of matter

See Also: Nanoparticle, Airborne Particle, Particle Accelerator, Particle Counters, Particle Detection


Showing recent results 211 - 225 of 264 products found.

  • ±3 kV Electrostatic Chuck Supply

    Model 646 - TREK, INC.

    Trek’s Model 646 software-driven Electrostatic Chuck Supply offers an array of features that provide significant benefits while accommodating a variety of demanding applications. Model 646 incorporates Trek technology which has demonstrated increases in efficiency and throughput equal to three times that of other supplies. Virtual elimination of sticky wafer and wafer popping issues ensures better control over particle contamination. Given the versatility and performance of the Model 646, it can be used in multiple unique tools/processes, thus eliminating the need to specify a new supply for each unique tool/process in a facility.

  • Equipment Fault Simulator for Electric Equipment

    Hangzhou Xihu Electronic Institute

    Integration: Built-in non-PD test variations and coupling capacitors.Detection of diversification: can be used to test pulse current, UHF, ultrasonic, high frequency and other PD detection technology.No PD design: the entire apparatus pressure PD levels below 1pC. Discharge Simulator: simulate tip, suspended particles and other air-gap discharge within the GIS common defect site, to implement two and two or more discharge models coexist, and can control the discharge starting voltage, and discharge extinction voltage strength.Continuous use of good: each model can withstand tens of thousands of times the discharge is not damaged.

  • DEFECT INSPECTION

    Semilab

    "Bulk Micro Defects," (BMD) is a term commonly used to refer to oxygen precipitates in silicon. In fact, many imperfections in the silicon lattice create defects, and BMDs could be any imperfections including oxygen precipitates, voids, inclusions, slip lines, etc. BMDs go by many names, referring to the problems they cause, how they were created, or their physical characteristics. Examples include COPs (Crystal Originated Particles) and Grown-In Defects.Dislocations can be formed during crystal growth but also at thermal processing of wafers, during CMOS device manufacturing like epitaxial layer growth and implant anneal steps.

  • Spatially Resolved Spectroscopy

    Hy-Ternity ® - Indatech

    Standard Visible and Near-Infrared (NIR) Spectroscopy performs one single spectrum measurement per sample. Spatially Resolved Spectroscopy (SRS) performs measurements at different distances from the illumination point. This approach provides chemical information but also physical one such as particle size and shape, cell density, uniformity and even weight. As a result, the surface analyzed is also much more important which copes for the recommendation of pharmacopeia. In addition, Several research centers have demonstrated the superiority of Spatially Resolved Spectroscopy and multipoint imaging techniques over standard NIR one.

  • Portable Gas Analyzer

    DX 4040 - Pembroke Instruments

    The Gasmet DX4040 FTIR portable gas analyzer can detect up to 25 gases simultaneously providing validated results in seconds. Measurement with the DX4040 is easy; sample gas is drawn into the analyzer with a built-in pump through a handheld particle filter and Tygon tubing. The analyzer runs in continuous mode, measuring time-weighted averages of user definable length from 1 second to 5 minutes. The DX4040 includes a built-in camera and GPS and measurements are easily linked to the exact physical location along with pictures. The DX-4040 is flexible and can be tailored to your specific gas analysis requirements.

  • SC-1 Monitor

    CS-131 - HORIBA, Ltd.

    The CS-131 is a high-precision chemical concentration monitor designed for use with SC-1 solutions used in cleaning processes during semiconductor manufacturing. It offers a faster response speed in a more compact size than anything available to date. The CS-131 monitors the concentrations of the individual components of the SC-1 solutions (NH3/H2O2/H2O) which is widely used to remove particles and organic substances. The monitor has a number of outputs which can be utilized to keep the concentrations of the individual elements of the SC-1 solutions within the allowable ranges; this eliminates unnecessary replacement of chemicals potentially increasing bath life time and reducing chemical cost. In addition, a model with an integrated cooling unit is available, allowing accommodation of a broader range of sample temperatures.

  • Envelope Density Analyzer

    GeoPyc 1365 - Micromeritis

    The GeoPyc employs a unique displacement measurement technique that uses Dry Flo, a quasi-fluid composed of small, rigid spheres having a high degree of flow-ability. The sample is placed in a bed of Dry Flo which is agitated and gently consolidated about the sample. The GeoPyc collects the displacement data, performs the calculations, and displays or prints the results. The GeoPyc automatically determines the volume and density of a solid object by displacement of Dry Flo, a solid medium. The medium is a narrow distribution of small, rigid spheres that have a high degree of flow ability and achieve close packing around the object under investigation. The particles are sufficiently small that during consolidation they conform closely to the surface of the object, yet do not invade pore space.

  • Field Emission Cryo-Electron Microscope

    JEM-Z200FSC (CRYO ARM 200) - JEOL Ltd.

    Cryo-electron microscopy has been established as a method to enable observation of cells and biological molecules with no fixation and no staining. Owing to the recent rapid progress of hardware and software, this microscopy technique has become increasingly important as an atomic-scale structural analysis method. In addition, technologies that enable analysis of membrane proteins without crystallization have been developed, resulting in increased use of cryo-electron microscopy for drug discovery. Thus, installation of cryo-electron microscopes (cryo-EM) in universities and research laboratories is greatly accelerating. To meet the needs of cryo-EM users, JEOL has developed a new cryo-EM "CRYO ARM™ 200", which automatically acquires image data for Single Particle Analysis over a long period of time.

  • Standard CW Amplifiers

    Tomco Technologies

    The BT-AlphaA-CW series is a range of classAB RF power amplifiers covering the 10kHz to1MHz frequency range.• Rugged, solid-state design - high reliability• Extremely high phase and amplitude stability• High linearity• In-Built Protection• Very fast blanking• Capable of pulsed operation• Competitively pricedSuitable for CW radar, communications, HF/VHF jamming, particle accelerator applications/plasma systems, plasma, RF heating and otherscientific applications.

  • Gasmet Portable FTIR Ambient Gas Analyser

    DX4030 - Quantitech Limited

    The Gasmet DX4030 was the first truly portable FTIR gas analyzer in the world. The lightweight analyzer module is located in durable Teflon–coated backpack. The DX4030 analyser module houses a Fourier Transform Infrared (FTIR) spectrometer, Rhodium-Gold coated sample cell and signal processing electronics. The sample gas is extracted into the sample cell via a probe with built in a particle filter. Hence no sample preparation is needed.

  • Multiple Frequency Comb Generator Instrument

    Model MFG-1001-B - AtlanTecRF

    AtlanTecRF's Comb Generators can be used in up to the minute particle physics and materials science research. The input signal is amplified to provide power to a comb generator. Frequencies are selected by a switched filter bank. Signal control for AM modulation is provided by way of a voltage variable attenuator and phase shift control through a line stretcher. The signal is then amplified to provide an output at one of 6 frequencies.

  • BDR Bidirectional Reflectometer

    SOC-210 - Surface Optics Corporation

    The SOC-210 Bidirectional Reflectometer is a precision laboratory instrument designed for mapping bidirectional reflectance distribution functions (BRDF) of surfaces, paints, coatings, liquids, and particles. The SOC-210 BDR measures the BRDF of samples from the ultraviolet to infrared spectral range (including visible) using an assortment of interchangeable sources, spectral bandpass filters, and detectors. Complete hemispherical coverage is obtained by varying both incident polar and azimuth angles and reflected polar and azimuth angles.

  • Sensor Solutions for IoT

    imec

    Imec is a reference in the design of ultra-low power electronics, low-power algorithms to increase intelligence and data security, and in all aspects of data science. Our multi-sensor environmental monitoring platform features sensors for temperature, relative humidity, NO2, CO2, VOC (volatile organic compounds), particle matter, ambient light, sound, vibrations and presence detection. Our test platform is suitable for indoor and outdoor air quality monitoring and control, and can be used in smart buildings, smart cities and more.

  • Preclinical Imaging Modalities and Solutions

    Bruker Corporation

    Bruker offers advanced preclinical imaging solutions for a broad spectrum of application fields, such as oncology, neurology, cardiology, inflammation, infectious diseases, cancer research, functional and anatomical neuroimaging, orthopedics, cardiac imaging and stroke models. Our range of techniques includes MRI (Magnetic Resonance Imaging) , PET (Positron Emission Tomography), SPECT (Single Photon Emission Computed Tomography) micro-CT (Micro Computed Tomography), optical imaging and magnetic particle (MPI) imaging.

  • Oil Analyzes

    SES2i

    Oil analyzes are very important in determining the aging condition of oil insulation and analyzing its degree of contamination. A contaminated oil is indicative of the damage to a transformer and the influence on its life.The oil analysis tests are divided into two groups: Physicochemical Dissolved gas Furanic derivatives Acidity index Water content PCB content Metal content Particle contentdielectrics Dielectric Rigidity Power factor