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Particle

subatomic or minute speck of matter

See Also: Nanoparticle, Airborne Particle, Particle Accelerator, Particle Counters, Particle Detection


Showing recent results 211 - 225 of 259 products found.

  • Portable Gas Analyzer

    DX 4040 - Pembroke Instruments

    The Gasmet DX4040 FTIR portable gas analyzer can detect up to 25 gases simultaneously providing validated results in seconds. Measurement with the DX4040 is easy; sample gas is drawn into the analyzer with a built-in pump through a handheld particle filter and Tygon tubing. The analyzer runs in continuous mode, measuring time-weighted averages of user definable length from 1 second to 5 minutes. The DX4040 includes a built-in camera and GPS and measurements are easily linked to the exact physical location along with pictures. The DX-4040 is flexible and can be tailored to your specific gas analysis requirements.

  • Envelope Density Analyzer

    GeoPyc 1365 - Micromeritis

    The GeoPyc employs a unique displacement measurement technique that uses Dry Flo, a quasi-fluid composed of small, rigid spheres having a high degree of flow-ability. The sample is placed in a bed of Dry Flo which is agitated and gently consolidated about the sample. The GeoPyc collects the displacement data, performs the calculations, and displays or prints the results. The GeoPyc automatically determines the volume and density of a solid object by displacement of Dry Flo, a solid medium. The medium is a narrow distribution of small, rigid spheres that have a high degree of flow ability and achieve close packing around the object under investigation. The particles are sufficiently small that during consolidation they conform closely to the surface of the object, yet do not invade pore space.

  • Exhaust Gas Meter For Diesel

    MET 6.2 Diesel tester - Maschinenbau Haldenwang GmbH & Co. KG.

    *Exhaust device impresses with its low weight and size*Short warm-up time and therefore very fast reading readiness*Time-saving and trouble-free testing of gas turbidity / particle concentration in partial flow*Intuitive operation, clear structure in the AU procedure according to the current guideline 5 enable minimal throughput times*Diverse and easy network connection LAN / WLAN (option)*EOBD evaluation with MAHA VCI particularly easy*Acceptance according to PTB requirements 18.09*Momentary or continuous measurement recording*Innovative condensate separation, thanks to active water separator

  • High Voltage Short Pulse Generators

    AET Associates, Inc.

    The high voltage short pulse generators, developed by AET, are capable of producing high-speed, high repetition rate pulses using a thyratron or solid-state switch. The neutral grounding method, which is rare for a pulse generator, is used.Applications include charged particle accelerator power source, non-destructive inspection, X-ray CT, security, X-ray cancer treatment equipment, electron tube driver, accelerator driver, plasma generator power source, electrical discharge experiment and the research of applied physics and chemistry.The specifications below are just examples. Specifications can be customized to meet your needs.

  • ±2 kV Electrostatic Chuck Supply

    Model 645 - TREK, INC.

    Trek’s Model 645 software-driven Electrostatic Chuck Supply offers an array of features that provide significant benefits while accommodating a variety of demanding applications. Documented use shows that customers have seen increases in efficiency and throughput equal to three times that of other supplies. Additionally, the Model 645 virtually eliminates sticky wafer and wafer popping issues, thus ensuring better control over particle contamination. Given the versatility and performance of the Model 645, it can be used in multiple unique tools/processes, thus eliminating the need to specify a new supply for each unique tool/process in a facility.

  • NIM-Modules

    FAST ComTec GmbH

    The "dual channel" TDC'''' - Model 7072T - converts time directly to a digital output. They offer improved performance and linearity specifications compared to separate TAC and ADC modules. There is also the Wilkinson-type ADC, Model 7070 which is suitable for high resolution HPGe detectors. Our Constant-Fraction discriminators are still state-of-the-art even after a more than 20 Year history. The Differential CFD - Model 7029A - still offers the highest counting rate (>50 MHz) of any such devices. Our Pulse-Shape Discriminator - Model 2160A - can be used to separate neutron and gamma particles, alphas and protons, electrons and alphas etc depending on the detector used.

  • Spatially Resolved Spectroscopy

    Hy-Ternity ® - Indatech

    Standard Visible and Near-Infrared (NIR) Spectroscopy performs one single spectrum measurement per sample. Spatially Resolved Spectroscopy (SRS) performs measurements at different distances from the illumination point. This approach provides chemical information but also physical one such as particle size and shape, cell density, uniformity and even weight. As a result, the surface analyzed is also much more important which copes for the recommendation of pharmacopeia. In addition, Several research centers have demonstrated the superiority of Spatially Resolved Spectroscopy and multipoint imaging techniques over standard NIR one.

  • Field Emission Cryo-Electron Microscope

    JEM-Z200FSC (CRYO ARM 200) - JEOL Ltd.

    Cryo-electron microscopy has been established as a method to enable observation of cells and biological molecules with no fixation and no staining. Owing to the recent rapid progress of hardware and software, this microscopy technique has become increasingly important as an atomic-scale structural analysis method. In addition, technologies that enable analysis of membrane proteins without crystallization have been developed, resulting in increased use of cryo-electron microscopy for drug discovery. Thus, installation of cryo-electron microscopes (cryo-EM) in universities and research laboratories is greatly accelerating. To meet the needs of cryo-EM users, JEOL has developed a new cryo-EM "CRYO ARM™ 200", which automatically acquires image data for Single Particle Analysis over a long period of time.

  • SC-1 Monitor

    CS-131 - HORIBA, Ltd.

    The CS-131 is a high-precision chemical concentration monitor designed for use with SC-1 solutions used in cleaning processes during semiconductor manufacturing. It offers a faster response speed in a more compact size than anything available to date. The CS-131 monitors the concentrations of the individual components of the SC-1 solutions (NH3/H2O2/H2O) which is widely used to remove particles and organic substances. The monitor has a number of outputs which can be utilized to keep the concentrations of the individual elements of the SC-1 solutions within the allowable ranges; this eliminates unnecessary replacement of chemicals potentially increasing bath life time and reducing chemical cost. In addition, a model with an integrated cooling unit is available, allowing accommodation of a broader range of sample temperatures.

  • Particle-in-Cell Plasma, Electromagnetic & Electrostatic Simulation Software

    VSim - Tech-X Corporation

    The VSim electromagnetic, particle, and plasma high performance application is a flexible, multiplatform, Particle-in-Cell (PIC) simulation tool for running computationally intensive modeling problems. VSim enables you to switch easily between 1, 2, or 3 dimensions and then watch your model run lightning-fast. Using algorithms designed for the exacting demands of high performance computing systems, VSim can run simulations on your laptop or supercomputing cluster.

  • Camera Module Tester

    Evolusys Technologies Sdn. Bhd.

    * Lens Focusing plus Far Field Sharpness Testing - CTF/MTF/SFR * Near Field Sharpness Testing - CTF/MTF/SFR * Flat Field Grey Image Testing - Optical center, Defect pixels, particles, blemish, shading, color shading, color ratio, SNR, etc. * Dark Field Image Testing - Hot pixels, dynamic range, SNR, etc. * Current Measurement - Active, standby

  • Software

    ThreeParticle - Becker 3D GmbH

    Imagine 3D simulation would be easy to learn in a few days, entry barriers would be minimal, and applications almost limitless. This is already a reality with our revolutionary ThreeParticle ™ software . In a single simulation platform, the Discrete Element Method (DEM) can be used to simulate multi-physical systems with complex particle shapes, including multi-body dynamics (MBS), structural mechanics (FEM) and liquids (CFD) - without coupling to external packages. The simple and intuitive operation via a new user interface is the daily routine of simulation.

  • Standard CW Amplifiers

    Tomco Technologies

    The BT-AlphaA-CW series is a range of classAB RF power amplifiers covering the 10kHz to1MHz frequency range.• Rugged, solid-state design - high reliability• Extremely high phase and amplitude stability• High linearity• In-Built Protection• Very fast blanking• Capable of pulsed operation• Competitively pricedSuitable for CW radar, communications, HF/VHF jamming, particle accelerator applications/plasma systems, plasma, RF heating and otherscientific applications.

  • Ingress Protection Testing, aka IP Code Testing

    Keystone Compliance

    Ingress protection testing tests the level of protection an enclosure provides against intrusions. Intrusions can be defined as body parts, water, dust and other foreign objects. The IP Code, also known as the International Protection Marking, rates the degree of protection that the enclosure provides. The IP Code has two digits. The first digit is the protection from solid particles and the second digit is the protection from liquids.

  • Multiphysics Computational Fluid Dynamics (CFD) Simulation & Analysis

    STAR-CCM+ - Siemens Digital Industries Software

    STAR-CCM+ is a stand-alone simulation solution for computational fluid dynamics (CFD), computational solid mechanics (CSM), heat transfer, particle dynamics, reacting flow, electrochemistry, electromagnetics, acoustics and rheology. STAR-CCM+ delivers accurate and efficient simulation technologies through a single integrated user interface and automated workflows. This facilitates the analysis and exploration of complex real-world problems.