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subatomic or minute speck of matter

See Also: Nanoparticle, Airborne Particle, Particle Accelerator, Particle Counters, Particle Detection

Showing recent results 241 - 255 of 278 products found.

  • Standard CW Amplifiers

    Tomco Technologies

    The BT-AlphaA-CW series is a range of classAB RF power amplifiers covering the 10kHz to1MHz frequency range.• Rugged, solid-state design - high reliability• Extremely high phase and amplitude stability• High linearity• In-Built Protection• Very fast blanking• Capable of pulsed operation• Competitively pricedSuitable for CW radar, communications, HF/VHF jamming, particle accelerator applications/plasma systems, plasma, RF heating and otherscientific applications.

  • Software

    ThreeParticle - Becker 3D GmbH

    Imagine 3D simulation would be easy to learn in a few days, entry barriers would be minimal, and applications almost limitless. This is already a reality with our revolutionary ThreeParticle ™ software . In a single simulation platform, the Discrete Element Method (DEM) can be used to simulate multi-physical systems with complex particle shapes, including multi-body dynamics (MBS), structural mechanics (FEM) and liquids (CFD) - without coupling to external packages. The simple and intuitive operation via a new user interface is the daily routine of simulation.

  • Particle-in-Cell Plasma, Electromagnetic & Electrostatic Simulation Software

    VSim - Tech-X Corporation

    The VSim electromagnetic, particle, and plasma high performance application is a flexible, multiplatform, Particle-in-Cell (PIC) simulation tool for running computationally intensive modeling problems. VSim enables you to switch easily between 1, 2, or 3 dimensions and then watch your model run lightning-fast. Using algorithms designed for the exacting demands of high performance computing systems, VSim can run simulations on your laptop or supercomputing cluster.

  • Camera Module Tester

    Evolusys Technologies Sdn. Bhd.

    * Lens Focusing plus Far Field Sharpness Testing - CTF/MTF/SFR * Near Field Sharpness Testing - CTF/MTF/SFR * Flat Field Grey Image Testing - Optical center, Defect pixels, particles, blemish, shading, color shading, color ratio, SNR, etc. * Dark Field Image Testing - Hot pixels, dynamic range, SNR, etc. * Current Measurement - Active, standby

  • Geiger Counters

    PCE Instruments

    At PCE-Instruments you will find geiger counters, devices for measuring illumination, electro maGeiger Counters for measuring illumination, electro magnetic fields, solar radiation and solar activity.gnetic fields, solar radiation and solar activity. The geiger counters for electro magnetic fields, solar radiation and lux each day become more important due to the increased negative effects of the environment. geiger counters are used for both personal and professional for measuring such things as transformers, power lines and electrical devices. It is also used extensively in the industrial sector or in research and development. These geiger counters can be DIN ISO 9000 calibrated and certified and have other optional accessories available. A Geiger counter is an instrument that measures the radioactivity of an object or place. It is a particle detector that measure ionizing radiation.

  • Portable Magnetometer

    FerroCheck - Spectro Scientific

    The FerroCheck 2000 is a portable magnetometer offering accuracy and convenience for total ferrous measurement of in-service lubricating oils. FerroCheck enables users to perform accurate measurements of ferrous wear particles, both in the field, and in the lab where it can be used to analyze gearbox, transmission and other fluids in fleet and industrial maintenance applications. FerroCheck works by sensing disruption of a magnetic field that is generated due to the presence of ferrous debris, specifically iron, in the oil. Operation involves simply drawing the sample, placing it in the instrument and using the touchscreen to complete the analysis and view the results. Non-lab personnel can operate the FerroCheck with no solvents or sample preparation required. The lightweight unit weighs less than five pounds, is compact and battery-operated for fast, 30-second testing of small samples.

  • Power Integrative Characteristic Tester

    Shanghai Selon Scientific Instrument Co. Ltd.

    Powder is a complex system both in flowing and static state. The intrinsic properties as well as friction between particles express some special flowing properties, research on which is significant for powder processing, packing, transport and storage. BT-1000 Powder Integrative Characteristic Tester is co-developed by China Tsinghua University, Dept of Power Tech. Development and Danodong Bettersize Instrument Co., Ltd designed for evaluating flowing properties of powder including angle of repose (AOR in short), collapse angle (CA in short), flat plate angle, dispersibility, loose (bulk) density, tap density, etc. through which the difference angle, compressibility, voidage, regularity & uniformity (R & U in short) are obtained, as well as flowability and jetting ability by Carr index. The instrument is characterized by multi-use, easy operation, good repeatability, flexible test requirement and multi-standard available, etc. It provides a new method for powder integrative characteristic test in research and production.

  • Produce Quality Meter

    F-750 - Felix Instruments

    The F-750 Handheld Brix & Dry Matter Meter uses near-infrared (NIR) spectroscopy to estimate quality metrics such as dry matter, Total Soluble Solids (TSS or brix), titratable acidity, and color. Working like a high-powered flashlight, the F-750 sends particles of light into a commodity, then measures the NIR light interactance with molecular components inside of the commodity to quantify user-selected traits. The F-750 has a wide range of applications, from determining optimal harvest timing by assessing fruit maturity, to providing an objective analysis of produce quality of fruit in packing houses and upon import. The F-750 is a handheld, fully integrated system, allowing users to operate it out in the orchard or inside the QA lab. Its simple, intuitive user interface makes it easy for anyone to use, while its model building software makes it customizable and versatile.

  • Equipment Fault Simulator for Electric Equipment

    Hangzhou Xihu Electronic Institute

    Integration: Built-in non-PD test variations and coupling capacitors.Detection of diversification: can be used to test pulse current, UHF, ultrasonic, high frequency and other PD detection technology.No PD design: the entire apparatus pressure PD levels below 1pC. Discharge Simulator: simulate tip, suspended particles and other air-gap discharge within the GIS common defect site, to implement two and two or more discharge models coexist, and can control the discharge starting voltage, and discharge extinction voltage strength.Continuous use of good: each model can withstand tens of thousands of times the discharge is not damaged.

  • Vibrating Sample Magnetometer

    VSM - Dexing Magnet Tech. Co., Ltd

    The VSM (also named M-H CURVE Hysteresis Graph TEST SYSTEM ) can be used for the measurement of the basic magnetic properties of the magnetic materials. Such as the Hysteresis loops of the materials, Magnetization curve, Warming Curve , Warming /Cooling curve, Cooling curve and the changes of the temperature as time goes away , then we will get some Magnetic parameters such as the Saturated strength of the magnetization, the left strength of the magnetization , Coercive force, the Max of Magnetic energy product,the Curie temperature and the Magnetic conductivity(the Initial Magnetic conductivity is included ). It can also measure the magnetic materials such as the powder, the particles, the films, the liquid and the massive.



    "Bulk Micro Defects," (BMD) is a term commonly used to refer to oxygen precipitates in silicon. In fact, many imperfections in the silicon lattice create defects, and BMDs could be any imperfections including oxygen precipitates, voids, inclusions, slip lines, etc. BMDs go by many names, referring to the problems they cause, how they were created, or their physical characteristics. Examples include COPs (Crystal Originated Particles) and Grown-In Defects.Dislocations can be formed during crystal growth but also at thermal processing of wafers, during CMOS device manufacturing like epitaxial layer growth and implant anneal steps.

  • Front-End Defect Inspection

    KLA-Tencor Corp

    KLA-Tencor''s front-end defect inspection tools cover the full range of yield applications within the IC chip manufacturing environment, including incoming process tool qualification, wafer qualification, reticle qualification, research and development, and tool, process and line monitoring. Patterned and unpatterned wafer defect inspection tools find particles, pattern defects and electrical issues on the front surface, back surface and edge of the wafer, allowing engineers to detect and monitor critical yield excursions. Fabs rely on our high sensitivity reticle defect inspection tools to ensure that reticles are defect-free thereby preventing reticle defects from printing on production wafers. The defect data generated by our defect inspection tools is compiled and reduced to relevant root-cause and yield-analysis information with our suite of data management tools. By implementing our front-end defect inspection tools and analysis systems, IC chip manufacturers are able to take quick corrective action, resulting in faster yield improvement and better time to market.

  • The Nanoworkbench

    Klocke Nanotechnik

    In light microscopy it is natural to use toolsets like tweezers, knives, probes and several different measurement tools. Without this many present-day products and methods would not exist. The operators of SEM/FIB-Systems generally work without toolsets, although the wavelength limit of light is no physical boundary. It can be imagined how technology would be pushed when a SEM/FIB Workbench reaches the same degree of practicability and utilization as toolsets for light microscopes. The Nanoworkbench is the first system substituting the eye-hand coordination effectively with nm precision in a SEM/FIB-system. The Nanoworkbench features a set of applications including TEM lamella preparation, nano probing, nano cutting, nano cleaning, force distance measurement, particle sorting and material preparation. Every application supports automated processes so almost no user interaction is needed. Even complex processes can be done within seconds and even by untrained users. Applications can be combined to create new and more complex processes. Expanding the SEM/FIB to a material processing system and a nano-analytical workbench by utilizing the Klocke Nanoworkbench enables new applications in research and production of material research, live sciences, tribology, environmental & forensic research and semiconductor technology.

  • Electronic Components Test

    Lisun Electronics Inc.

    Parameters to be measured (absolute value): Measure hypo-class U, Iout, Hz, Hc, Br, Bm, Hm, Br /Bm, m, magnetic core loss, B-H curve, U curve and I curve Output capacity of the high frequency power: Uout: 1~300V, Iout: 0.05~5A, Pout: 300VA, frequency: 10~300kHz Accuracy: 2% With 12-bit high-speed A/D, sampling rate up to 40MHz, ensuring data precise and stable test result Supermaximal database, suitable for almost all kinds of magnetic material in market, such as: circle, E ,U , ETD-EER, JAR, RM , EP , PM , EL , ER, PQ, EFD, plane E, etc Perfect software interface enables observation of curve in detail Meet international test requirements for magnetic particle ASTM E1444, ASTM E709-08.

  • PCI Express Waveform Digitizer: 14-Bit A/D, 200 MS/s, 4-CH, 125 MHz BW, 8-16 GB Memory

    Razor Express 14 CompuScope - PCIe - GaGe

    Available in 4-CH and 2-CH models featuring 17 software selectable A/D sampling rates from minimum 1 kS/s to maximum 200 MS/s per channel with input bandwidth of 125 MHz. ADC data can be captured in quad, dual, or single channel modes. Full-featured front-end with software selectable DC/AC coupling and 50Ω / 1MΩ inputs. Ease of integration with External or Reference Clock In & Clock Out. External Trigger In & Trigger Out with advanced triggering operations. PCIe Gen2 x8 data streaming rates at 1.6 GB/s. Programming-free operation with GaGeScope PC oscilloscope software. Software Development Kits available for C/C#, LabVIEW and MATLAB for custom application development. Ideal for applications such as Automatic Test Equipment (ATE), Wideband RF Signal Analysis & Recording, RADAR, Electronic Warfare (EW), Ultrasonic Non-Destructive Testing (NDT), LIDAR, Communications, Spectroscopy, High-Performance Imaging, Time of Flight (TOF), Life Sciences, Particle Physics, and more.