Filter Results By:

Products

Applications

Manufacturers

Particle

subatomic or minute speck of matter

See Also: Nanoparticle, Airborne Particle, Particle Accelerator, Particle Counters, Particle Detection


Showing recent results 256 - 270 of 281 products found.

  • Produce Quality Meter

    F-750 - Felix Instruments

    The F-750 Handheld Brix & Dry Matter Meter uses near-infrared (NIR) spectroscopy to estimate quality metrics such as dry matter, Total Soluble Solids (TSS or brix), titratable acidity, and color. Working like a high-powered flashlight, the F-750 sends particles of light into a commodity, then measures the NIR light interactance with molecular components inside of the commodity to quantify user-selected traits. The F-750 has a wide range of applications, from determining optimal harvest timing by assessing fruit maturity, to providing an objective analysis of produce quality of fruit in packing houses and upon import. The F-750 is a handheld, fully integrated system, allowing users to operate it out in the orchard or inside the QA lab. Its simple, intuitive user interface makes it easy for anyone to use, while its model building software makes it customizable and versatile.

  • Power Integrative Characteristic Tester

    Shanghai Selon Scientific Instrument Co. Ltd.

    Powder is a complex system both in flowing and static state. The intrinsic properties as well as friction between particles express some special flowing properties, research on which is significant for powder processing, packing, transport and storage. BT-1000 Powder Integrative Characteristic Tester is co-developed by China Tsinghua University, Dept of Power Tech. Development and Danodong Bettersize Instrument Co., Ltd designed for evaluating flowing properties of powder including angle of repose (AOR in short), collapse angle (CA in short), flat plate angle, dispersibility, loose (bulk) density, tap density, etc. through which the difference angle, compressibility, voidage, regularity & uniformity (R & U in short) are obtained, as well as flowability and jetting ability by Carr index. The instrument is characterized by multi-use, easy operation, good repeatability, flexible test requirement and multi-standard available, etc. It provides a new method for powder integrative characteristic test in research and production.

  • Capacitive Proximity Sensors

    SICK Sensor Intelligence

    Sometimes you need to know what is hidden beneath a surface. Behind a wall, for example, inside a storage container, inside a shipping container, or behind a cover. Capacitive proximity sensors are ideal for level and feed monitoring. From solid material, such as paper or wood, to granules or liquids, they can be relied upon to detect what is happening in the production process and during final inspection. Is there something behind that cover? Is the finished package really full? How much paint is still left in the tank? For capacitive proximity sensors, these are easy questions to answer. SICKs capacitive proximity sensors are never far from the action. Sensing ranges between 1 and 25 mm allow them to be used in nearly all installation situations, making them extremely adaptable for a wide range of applications. These sensors are also remarkably resistant to interference. Impurities, contamination, dust, and airborne spray particles have little effect on them, nor does electromagnetic interference. No wonder they are installed in a wide range of industries, such as food and automotive, or in storage and conveyor systems.

  • Front-End Defect Inspection

    KLA-Tencor Corp

    KLA-Tencor''s front-end defect inspection tools cover the full range of yield applications within the IC chip manufacturing environment, including incoming process tool qualification, wafer qualification, reticle qualification, research and development, and tool, process and line monitoring. Patterned and unpatterned wafer defect inspection tools find particles, pattern defects and electrical issues on the front surface, back surface and edge of the wafer, allowing engineers to detect and monitor critical yield excursions. Fabs rely on our high sensitivity reticle defect inspection tools to ensure that reticles are defect-free thereby preventing reticle defects from printing on production wafers. The defect data generated by our defect inspection tools is compiled and reduced to relevant root-cause and yield-analysis information with our suite of data management tools. By implementing our front-end defect inspection tools and analysis systems, IC chip manufacturers are able to take quick corrective action, resulting in faster yield improvement and better time to market.

  • The Nanoworkbench

    Klocke Nanotechnik

    In light microscopy it is natural to use toolsets like tweezers, knives, probes and several different measurement tools. Without this many present-day products and methods would not exist. The operators of SEM/FIB-Systems generally work without toolsets, although the wavelength limit of light is no physical boundary. It can be imagined how technology would be pushed when a SEM/FIB Workbench reaches the same degree of practicability and utilization as toolsets for light microscopes. The Nanoworkbench is the first system substituting the eye-hand coordination effectively with nm precision in a SEM/FIB-system. The Nanoworkbench features a set of applications including TEM lamella preparation, nano probing, nano cutting, nano cleaning, force distance measurement, particle sorting and material preparation. Every application supports automated processes so almost no user interaction is needed. Even complex processes can be done within seconds and even by untrained users. Applications can be combined to create new and more complex processes. Expanding the SEM/FIB to a material processing system and a nano-analytical workbench by utilizing the Klocke Nanoworkbench enables new applications in research and production of material research, live sciences, tribology, environmental & forensic research and semiconductor technology.

  • Smoke Detection Sensor – 120VAC Wire-In with Battery Backup

    ENVIROMUX-SDS-120V - Network Technologies Inc

    For warning of smoke and invisible fire particles. Ionization smoke detector. Applications from 40°F to 100°F (4°C to 38°C). Front loading battery door. 9V battery backup (included) in case of power failure. One button design for easy testing and HUSH mode activation control. LED indicates four modes of operation: standby condition, alarm condition, alarm memory and hush mode. Hush mode: silences false alarms for 8 minutes, or low battery warning for 13 hours. Voltage supply: 120VAC. Pre-stripped wiring harness with tinned strands. Audio alarm: 85dB at 10ft. Dimensions: 5" diameter x 1.75" depth. Dust cover prevents false alarms. Tamper resist feature. Links with up to 24 devices. Max distance between first and last device: 1000ft (305m). Alarm memory indicates initiating alarm in interconnected systems. Use compatible relay (ENVIROMUX-RLY-SDS120V) for connection to the ENVIROMUX system or other auxiliary warning devices such as external sirens or stairwell lighting. ENVIROMUX-RLY-SDS120V includes normally open and normally closed contacts. Contact ratings: 10A at 120VAC, 5A at 30VDC. Regulatory approvals: UL.

  • PCI Express Waveform Digitizer: 14-Bit A/D, 400 MS/s, 2-CH, 248 MHz BW, 512 MB Memory

    PX14400D2 - PCIe - Signatec

    2-CH DC-coupled model with a frequency synthesized clock that allows the ADC sampling rate to be set to virtually any value from 20 MHz to 400 MHz, offering maximum flexibility for sampling rate selection. ADC data can be captured in dual or single channel modes with input bandwidth up to 248 MHz. PCIe x8 data streaming rates at 1.4 GB/s. Programming-free operation with Scope oscilloscope software. Software Development Kits available for C++ for custom application development. Ideal for applications such as Automatic Test Equipment (ATE), Wideband RF Signal Analysis & Recording, RADAR, Electronic Warfare (EW), Ultrasonic Non-Destructive Testing (NDT), LIDAR, Communications, Spectroscopy, High-Performance Imaging, Time of Flight (TOF), Life Sciences, Particle Physics, and more.

  • Bearing Testers

    Anderon Meters - M.E.A. Testing Systems Ltd.

    *Measures the anderon value in an assembled bearing.*Detects slight surface irregularities arising from machining imperfections and other factors.*Detects displacement in a radial direction caused by rolling surface irregularities.*Provides the “anderon” value, a numerical expression of the degree of vibration and noise in the bearing, allows quantitative assessment of bearing performance.*Enables the discovery of the causes of vibrations (scratches on the raceways of outer and inner races made during machining, scratches on ball surfaces, contamination by dust particles, etc.).*Enables the sorting of bearings by precision class and more accurate assessment of bearing quality.*Development of high-quality products: aids in the development of high-quality, durable bearings that generate minimal vibration and noise.*Assurance of product quality: allows data to be gathered that can be used for objective assessment of quality, particularly vibration and noise characteristics.*Optimal management of products by quality: High-sensitivity detection of minute but critical variations in product characteristics, allowing to sort bearings accurately by quality for optimal product management.*Improved productivity: allows inspection of bearings before installation in high-precision, high-performance products susceptible to vibration, minimizing defects in assembled products and improving productivity.*Optimal parts control in the open market environment: permits high-accuracy acceptance inspections of delivered parts, allowing to test various samples obtained from both domestic and overseas manufacturers to help secure parts that offer optimal quality.

  • PCI Express Waveform Digitizer: 12-Bit A/D, 200 MS/s, 4-CH, 125 MHz BW, 8-16 GB Memory

    Razor Express 12 CompuScope - PCIe - GaGe

    Available in 4-CH and 2-CH models featuring 17 software selectable A/D sampling rates from minimum 1 kS/s to maximum 200 MS/s per channel with input bandwidth of 125 MHz. ADC data can be captured in quad, dual, or single channel modes. Full-featured front-end with software selectable DC/AC coupling and 50Ω / 1MΩ inputs. Ease of integration with External or Reference Clock In & Clock Out. External Trigger In & Trigger Out with advanced triggering operations. PCIe Gen2 x8 data streaming rates at 1.6 GB/s. Programming-free operation with GaGeScope PC oscilloscope software. Software Development Kits available for C/C#, LabVIEW and MATLAB for custom application development. Ideal for applications such as Automatic Test Equipment (ATE), Wideband RF Signal Analysis & Recording, RADAR, Electronic Warfare (EW), Ultrasonic Non-Destructive Testing (NDT), LIDAR, Communications, Spectroscopy, High-Performance Imaging, Time of Flight (TOF), Life Sciences, Particle Physics, and more.

  • PCI Express Waveform Digitizer: 14-Bit A/D, 125 MS/s, 4-CH, 100 MHz BW, 4-16 GB Memory

    Octave Express 14 CompuScope - PCIe - GaGe

    Available in 4-CH and 2-CH models featuring 20 software selectable A/D sampling rates from minimum 1 kS/s to maximum 125 MS/s per channel with input bandwidth of 100 MHz. ADC data can be captured in quad, dual, or single channel modes. Full-featured front-end with software selectable DC/AC coupling and 50Ω / 1MΩ inputs. Ease of integration with External or Reference Clock In & Clock Out. External Trigger In & Trigger Out with advanced triggering operations. PCIe Gen2 x8 data streaming rates at 1 GB/s. Programming-free operation with GaGeScope PC oscilloscope software. Software Development Kits available for C/C#, LabVIEW and MATLAB for custom application development. Ideal for applications such as Automatic Test Equipment (ATE), Wideband RF Signal Analysis & Recording, RADAR, Electronic Warfare (EW), Ultrasonic Non-Destructive Testing (NDT), LIDAR, Communications, Spectroscopy, High-Performance Imaging, Time of Flight (TOF), Life Sciences, Particle Physics, and more.

  • PCI Express Waveform Digitizer: 14-Bit A/D, 125 MS/s, 8-CH, 100 MHz BW, 4-16 GB Memory

    Octopus Express 14 CompuScope - PCIe - GaGe

    8-CH model featuring 20 software selectable A/D sampling rates from minimum 1 kS/s to maximum 125 MS/s per channel with input bandwidth of 100 MHz. ADC data can be captured in octal, quad, dual, or single channel modes. Full-featured front-end with software selectable DC/AC coupling and 50Ω / 1MΩ inputs. Ease of integration with External or Reference Clock In & Clock Out. External Trigger In & Trigger Out with advanced triggering operations. PCIe Gen2 x8 data streaming rates at 2 GB/s. Programming-free operation with GaGeScope PC oscilloscope software. Software Development Kits available for C/C#, LabVIEW and MATLAB for custom application development. Ideal for applications such as Automatic Test Equipment (ATE), Wideband RF Signal Analysis & Recording, RADAR, Electronic Warfare (EW), Ultrasonic Non-Destructive Testing (NDT), LIDAR, Communications, Spectroscopy, High-Performance Imaging, Time of Flight (TOF), Life Sciences, Particle Physics, and more.

  • PCI Express Waveform Digitizer: 14-Bit A/D, 200 MS/s, 4-CH, 125 MHz BW, 8-16 GB Memory

    Razor Express 14 CompuScope - PCIe - GaGe

    Available in 4-CH and 2-CH models featuring 17 software selectable A/D sampling rates from minimum 1 kS/s to maximum 200 MS/s per channel with input bandwidth of 125 MHz. ADC data can be captured in quad, dual, or single channel modes. Full-featured front-end with software selectable DC/AC coupling and 50Ω / 1MΩ inputs. Ease of integration with External or Reference Clock In & Clock Out. External Trigger In & Trigger Out with advanced triggering operations. PCIe Gen2 x8 data streaming rates at 1.6 GB/s. Programming-free operation with GaGeScope PC oscilloscope software. Software Development Kits available for C/C#, LabVIEW and MATLAB for custom application development. Ideal for applications such as Automatic Test Equipment (ATE), Wideband RF Signal Analysis & Recording, RADAR, Electronic Warfare (EW), Ultrasonic Non-Destructive Testing (NDT), LIDAR, Communications, Spectroscopy, High-Performance Imaging, Time of Flight (TOF), Life Sciences, Particle Physics, and more.

  • PCI Express Waveform Digitizer: 14-Bit A/D, 400 MS/s, 2-CH, 200-400 MHz BW, 512 MB Memory

    PX14400A - PCIe - Signatec

    2-CH AC-coupled model with a frequency synthesized clock that allows the ADC sampling rate to be set to virtually any value from 20 MHz to 400 MHz, offering maximum flexibility for sampling rate selection. ADC data can be captured in dual or single channel modes. Hardware configurable options include a programmable gain amplifier front end with 200 MHz input bandwidth or direct transformer front end with 400 MHz input bandwidth. PCIe x8 data streaming rates at 1.4 GB/s. Programming-free operation with Scope oscilloscope software. Software Development Kits available for C++ for custom application development. Ideal for applications such as Automatic Test Equipment (ATE), Wideband RF Signal Analysis & Recording, RADAR, Electronic Warfare (EW), Ultrasonic Non-Destructive Testing (NDT), LIDAR, Communications, Spectroscopy, High-Performance Imaging, Time of Flight (TOF), Life Sciences, Particle Physics, and more.

  • PCI Express Waveform Digitizer: 16-Bit A/D, 100 MS/s, 4-CH, 65 MHz BW, 4-16 GB Memory

    Oscar Express 16 CompuScope - PCIe - GaGe

    Available in 4-CH and 2-CH models featuring 16 software selectable A/D sampling rates from minimum 1 kS/s to maximum 100 MS/s per channel with input bandwidth of 65 MHz. ADC data can be captured in quad, dual, or single channel modes. Full-featured front-end with software selectable DC/AC coupling and 50Ω / 1MΩ inputs. Ease of integration with External or Reference Clock In & Clock Out. External Trigger In & Trigger Out with advanced triggering operations. PCIe Gen2 x8 data streaming rates at 800 MB/s. Programming-free operation with GaGeScope PC oscilloscope software. Software Development Kits available for C/C#, LabVIEW and MATLAB for custom application development. Ideal for applications such as Automatic Test Equipment (ATE), Wideband RF Signal Analysis & Recording, RADAR, Electronic Warfare (EW), Ultrasonic Non-Destructive Testing (NDT), LIDAR, Communications, Spectroscopy, High-Performance Imaging, Time of Flight (TOF), Life Sciences, Particle Physics, and more.

  • PCI Express Waveform Digitizer: 16-Bit A/D, 200 MS/s, 4-CH, 125 MHz BW, 8-16 GB Memory

    Razor Express 16 CompuScope - PCIe - GaGe

    Available in 4-CH and 2-CH models featuring 17 software selectable A/D sampling rates from minimum 1 kS/s to maximum 200 MS/s per channel with input bandwidth of 125 MHz. ADC data can be captured in quad, dual, or single channel modes. Full-featured front-end with software selectable DC/AC coupling and 50Ω / 1MΩ inputs. Ease of integration with External or Reference Clock In & Clock Out. External Trigger In & Trigger Out with advanced triggering operations. PCIe Gen2 x8 data streaming rates at 1.6 GB/s. Programming-free operation with GaGeScope PC oscilloscope software. Software Development Kits available for C/C#, LabVIEW and MATLAB for custom application development. Ideal for applications such as Automatic Test Equipment (ATE), Wideband RF Signal Analysis & Recording, RADAR, Electronic Warfare (EW), Ultrasonic Non-Destructive Testing (NDT), LIDAR, Communications, Spectroscopy, High-Performance Imaging, Time of Flight (TOF), Life Sciences, Particle Physics, and more.