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Particle

fundamental objects of quanta.

See Also: Nanoparticle, Airborne Particle, Particle Accelerator, Particle Counters, Particle Detection, Wave


Showing results: 256 - 270 of 325 items found.

  • HF/HNO3 Monitor

    CS-153N - HORIBA, Ltd.

    The CS-153N is a high-precision chemical solution concentration monitor designed to meet the strict demands of semiconductor wet-etching processes. Etching processes use HF/HNO3 solution to etch silicon oxide and remove particles from the wafer surface. The CS-153N continually monitors each component of the HF/HNO3 solution (HF/HNO3/H2O), alerting the user each time the solution is replaced or replenished. This allows you to maintain the concentration of the HF/HNO3 solution within the tolerance range, while eliminating unnecessary solution replacement.

  • Ingress Protection: Water Jets and Powerful Water Jets Tests (IPX5 & IPX6)

    Keystone Compliance

    Ingress protection testing tests the level of protection an enclosure provides against intrusions. Two such sets of ingress protection tests involve exposing the equipment under test (EUT), to water jets and powerful water jets. These tests are numbered IPX5 and IPX6. The first digit, represented by the “X”, ranges from 0 to 6 and specifies the protection from solid particles. The second digit, in the case of water jets, would always be a 5, and in the case of powerful water jets, would always be a 6.

  • Sensor Solutions for IoT

    imec

    Imec is a reference in the design of ultra-low power electronics, low-power algorithms to increase intelligence and data security, and in all aspects of data science. Our multi-sensor environmental monitoring platform features sensors for temperature, relative humidity, NO2, CO2, VOC (volatile organic compounds), particle matter, ambient light, sound, vibrations and presence detection. Our test platform is suitable for indoor and outdoor air quality monitoring and control, and can be used in smart buildings, smart cities and more.

  • Ingress Protection: Spraying Water and Splashing Water (IPX3 & IPX4)

    Keystone Compliance

    Ingress protection testing tests the level of protection an enclosure provides against intrusions. Two such sets of ingress protection tests involve exposing the equipment under test (EUT), to spraying water and splashing water. These tests are numbered IPX3 and IPX4. The first digit, represented by the “X”, ranges from 0 to 6 and specifies the protection from solid particles. The second digit, in the case of spraying water, would always be a 3, and in the case of splashing water, would always be a 4.

  • BHF Concentration Monitor

    CS-137 - HORIBA, Ltd.

    The CS-137 is a high-precision chemical solution concentration monitor designed to meet the strict demands of semiconductor wet-etching processes. Etching processes use BHF solution to etch silicon oxide and remove particles from the wafer surface. The CS-137 continually monitors each component of the BHF solution (NH4F/HF/H2O), alerting the user each time the solution is replaced or replenished. This allows you to maintain the concentration of the BHF solution within the required component ranges, while eliminating unnecessary solution replacement.

  • Combustion Check Gas Analyzer

    KM 5410 - Kusam Electrical Industries Limited

    * Hand-pump with filter to isolate dirt and particles.* Thermocouple offset adjustment ±3°C (6°F).* Automatic power off battery saver.* 2 channel display(LCD).* Display Back-Light.* Analyzer Directly Measures: Flue Gas Oxygen Content in % and Flue Gas Temperature in °F or °C* Analyzer Computes: When the measured oxygen level is below 17.9%, Flue Gas Carbon Dioxide content in %, , Excess Air in %(0 to 400%), Flue Natural Gas/Oil #2/Propane in %

  • Software

    ThreeParticle - Becker 3D GmbH

    Imagine 3D simulation would be easy to learn in a few days, entry barriers would be minimal, and applications almost limitless. This is already a reality with our revolutionary ThreeParticle ™ software . In a single simulation platform, the Discrete Element Method (DEM) can be used to simulate multi-physical systems with complex particle shapes, including multi-body dynamics (MBS), structural mechanics (FEM) and liquids (CFD) - without coupling to external packages. The simple and intuitive operation via a new user interface is the daily routine of simulation.

  • Digital Dust Monitor

    3443 - KANOMAX USA, Inc.

    The Kanomax Digital Dust Monitor – Model 3443 measures aerosol concentrations corresponding to PM10. The intake isolates the aerosol sample so that the optics chamber is kept sterile for improved reliability and low maintenance. The unit measures 0.1 to 10µm particle size aerosol contaminants such as fumes, dust, smoke and mists. It is battery-operated, data-logging, light-scattering laser photometer that gives you real time aerosol mass readings. It is also suitable for clean office settings well as harsh industrial workplaces, construction and environmental sites, and outdoor applications.

  • Electron Multipliers

    Hamamatsu Photonics K.K.

    Electron multipliers are mainly used as positive/negative ion detectors. They are also useful for detecting and measuring vacuum UV rays and soft X-rays. Hamamatsu electron multipliers have a high gain (multiplication factor) yet low dark current, allowingoperation in photon counting mode to detect and measure extremely small incoming particles and their energy. This means our Hamamatsu electron multipliers are ideal for electron spectroscopy and vacuum UV spectroscopy such as ESCA (electron spectroscopy for chemical analysis) and Auger electron spectroscopy as well as mass spectroscopy and field-ion microscopy.

  • Defect Inspection and Review

    KLA-Tencor Corp

    KLA’s defect inspection and review systems cover the full range of yield applications within the chip and wafer manufacturing environments, including incoming process tool qualification, wafer qualification, research and development, and tool, process and line monitoring. Patterned and unpatterned wafer defect inspection and review systems find, identify and classify particles and pattern defects on the front surface, back surface and edge of the wafer. This information allows engineers to detect, resolve and monitor critical yield excursions, resulting in faster yield ramp and higher production yield.

  • Magnetic Flaw Detector

    CDX-Ⅲ - Mitech Co., LTD.

    magnetic particle flaw detector is the self-designed magnetic participle flaw detector of MITECH CO.,LTD. With small size, light weight, easy operation, multifunction in one unit. The detector can equip A, D, E O four types of probes to realize the functions of magnetic clamp detection, electromagnetic yoke detection, cross magnetic yoke detection, ring detection. It is the necessary detector to do quality control, safety check, life evaluation in the fields of petrol, chemicals, metallurgy, shipbuilding, aviation, railway etc

  • Reliable Monitoring of Measurement Parameters

    (RMS) Rotronic Monitoring System – - Rotronic Measurement Solutions

    High quality standards in R&D, production and storage necessitate a comprehensive monitoring system. The adaptive RMS Rotronic Monitoring System documents and visualizes all necessary measured data in one system. It consists of analog and digital hardware elements and a server software.The data can be accessed at any time from anywhere by PC, tablet or smart phone. The system monitors parameters such as relative humidity, temperature, dew point, door contacts, particles and many more. In addition to this, it provides maximum flexibility, and is versatile and easy to use.

  • Vibrating Sample Magnetometer

    VSM - Dexing Magnet Tech. Co., Ltd

    The VSM (also named M-H CURVE Hysteresis Graph TEST SYSTEM ) can be used for the measurement of the basic magnetic properties of the magnetic materials. Such as the Hysteresis loops of the materials, Magnetization curve, Warming Curve , Warming /Cooling curve, Cooling curve and the changes of the temperature as time goes away , then we will get some Magnetic parameters such as the Saturated strength of the magnetization, the left strength of the magnetization , Coercive force, the Max of Magnetic energy product,the Curie temperature and the Magnetic conductivity(the Initial Magnetic conductivity is included ). It can also measure the magnetic materials such as the powder, the particles, the films, the liquid and the massive.

  • Failure Analysis

    Pacific Testing Laboratories

    A partial list of our state of the art test equipment, applicable to these testing disciplines, will include the following: Two Scanning Electron Microscopes with EDS (SEM/EDS) Three Differential Scanning Calorimeters (DSC) Three Thermogravimetric Analyzers (TGA) Three Thermo Mechanical Analyzers (TMA) One Dynamic Mechanical Analyzer (DMA) Two Real-Time Fluoroscopic X-ray Systems, including a Microfocus System One Fourier Transform Infrared Microscope (FTIR) (capable of identifying a single particle of an unknown material) Two Ion Chromatographs (IC) (capable of identifying ionic impurities in ppm)

  • TMAH/H2O2 Monitor

    CS-139E - HORIBA, Ltd.

    The CS-139E is for TMAH/H2O2 solutions in the cleaning process in semiconductor manufacturing, and monitors the concentration of chemical solutions with high precision. Achieve unprecedented high-speed responsiveness and compactness. The concentration of each component of the TMAH/H2O2 solution (TMAH/H2O2/H2O), which is used as an alternative SC-1 for the removal of particles and organic matter, is constantly monitored. By feedback control employing monitor output, it is possible to keep the concentration of TMAH/H2O2 solution within the allowable range while eliminating unnecessary chemical solution exchange. In addition, a lineup of integrated coolers is also available, covering a wide range of sample temperatures.

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