Showing recent results 91 - 105 of 264 products found.
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Laser Quantum Ltd.
Infra-red (IR) lasers at 1064 nm are primarily used for optical trapping, tweezing and manipulation of small particles. These techniques allow measurement and monitoring of the particles without interference from other mechanical or chemical restraining mechanisms.
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KANOMAX USA, Inc.
This sensor detects the particle with light scattering method, using one light emitter and two light receptors, and discriminates pollen from other particles with two factors: “scattered light intensity” and “degree of polarization”.
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JFE Advantech Co., Ltd.
This is a wired instrument that measures particle size distribution and the concentration of suspended particles automatically through image processing. Also, it is possible to measure particle size distribution of prepared slide sand samples. The instrument is compact and can be used in a variety of situations from field observations to laboratories. Still images are produced by emitting light pulses at the front of a CCD camera lens, which in turn, through continuous shooting, captures the particles while they are between the light source and the lens. The measurements are made in an open-cell system, where a gap works as a flow path. However, adding a flow path connected to a pump it is also possible to use nearly as a flow cell.
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ZetaView® - Particle Metrix GmbH
ZetaView® Nanoparticle Tracking Analyzer for hydrodynamic Particle Size, Zeta Potential and Concentration. With ZetaView® individual particle tracking, classical micro-electrophoresis and Brownian motion are presented as modern analysis tools. Auto-alignment and auto-focusing make the “Seeing is Believing” principle user friendly. By sub-volume scanning robust results of zeta potential and size histograms are derived from thousands of particles.
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Phenom GSR - Phenom-World BV.
Gunshot Residue (GSR) analysis plays an important role in the determination if a firearm has been used in a crime. Established GSR analysis techniques are based on the use of a scanning electron microscope (SEM), which is used to scan the sample and find suspect GSR particles. If a suspect particle is found, an Energy Dispersive Spectroscopy (EDS) technique is used to identify the elements in that particle.
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Wafer Inspection Services, Inc.
The PSL Contamination Standard is a bare silicon wafer that has microscopic latex spheres deposited on its surface. PSL Contamination Standards (PSLCS), are produced for particle size calibration of instruments that detect particles on the substrate’s surface. The polystyrene latex (PSL) spheres that are deposited on the PSL Contamination Standard are highly spherical, have well characterized reproducible optical properties, and a tight, monodisperse size distribution. These parameters make PSL spheres a Metrology Equipment QA accepted Standard for the calibration and monitoring of particle counting instruments and wafer inspection tools.
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Brookhaven Instruments Corporation
Light Scattering occurs when polarizable particles in a sample are bathed in the oscillating electric field of a beam of light. The varying field induces oscillating dipoles in the particles and these dipoles radiate light in all directions. This important and universal phenomenon is the basis for explaining why the sky is blue, why fog and emulsions are opaque and other observations. It has been utilized in many areas of science to determine particle size, molecular weight, shape, diffusion coefficients etc.
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ORTEC
High Purity Germanium (HPGe) DetectorsSilicon Charged Particle DetectorsScintillation DetectorsORTEC is a leading supplier of solid-state, high resolution, semiconductor radiation detectors. These radiation detectors are used in research, commercial industry, environmental protection, health and medical physics, as well as homeland security to detect gamma-rays, X-rays, and charged particles.
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CAMSIZER - Retsch Technology GmbH
Dynamic Image Analysis (DIA) is a modern high-performance method for the characterization of particle size and particle shape of powders, granules and suspensions. Retsch Technology's optical analyzers CAMSIZER P4 and CAMSIZER X2 are based on this technology, covering a measuring range from 0.8 m to 30 mm.
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Microtrac
Since the release of the 7991 in 1974, the first commercially available particle size analyzer, Microtrac has been at the forefront of Laser Diffraction technology. By continuously improving the instrument technology, Microtrac offers customers a robust portfolio of Laser Diffraction instruments that’s ideal for particle sizing and characterization.
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TQC B.V.
Dispersions are often used in latex wall paints, which can thus be diluted with water. The homogenity of a dispersion depends on size and weight of particles. To determine the size of particles the use of a Fineness of Grind gauge or grindometer is needed. For proper mixing and / or stirring a variety of laboratory and industrial tools are available depending on volume or capacity.
