Showing recent results 91 - 105 of 281 products found.
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Laser Quantum Ltd.
Infra-red (IR) lasers at 1064 nm are primarily used for optical trapping, tweezing and manipulation of small particles. These techniques allow measurement and monitoring of the particles without interference from other mechanical or chemical restraining mechanisms.
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CAMSIZER - Retsch Technology GmbH
Dynamic Image Analysis (DIA) is a modern high-performance method for the characterization of particle size and particle shape of powders, granules and suspensions. Retsch Technology's optical analyzers CAMSIZER P4 and CAMSIZER X2 are based on this technology, covering a measuring range from 0.8 m to 30 mm.
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Microtrac
Since the release of the 7991 in 1974, the first commercially available particle size analyzer, Microtrac has been at the forefront of Laser Diffraction technology. By continuously improving the instrument technology, Microtrac offers customers a robust portfolio of Laser Diffraction instruments that’s ideal for particle sizing and characterization.
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Wafer Inspection Services, Inc.
The PSL Contamination Standard is a bare silicon wafer that has microscopic latex spheres deposited on its surface. PSL Contamination Standards (PSLCS), are produced for particle size calibration of instruments that detect particles on the substrate’s surface. The polystyrene latex (PSL) spheres that are deposited on the PSL Contamination Standard are highly spherical, have well characterized reproducible optical properties, and a tight, monodisperse size distribution. These parameters make PSL spheres a Metrology Equipment QA accepted Standard for the calibration and monitoring of particle counting instruments and wafer inspection tools.
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TQC B.V.
Dispersions are often used in latex wall paints, which can thus be diluted with water. The homogenity of a dispersion depends on size and weight of particles. To determine the size of particles the use of a Fineness of Grind gauge or grindometer is needed. For proper mixing and / or stirring a variety of laboratory and industrial tools are available depending on volume or capacity.
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ORTEC
High Purity Germanium (HPGe) DetectorsSilicon Charged Particle DetectorsScintillation DetectorsORTEC is a leading supplier of solid-state, high resolution, semiconductor radiation detectors. These radiation detectors are used in research, commercial industry, environmental protection, health and medical physics, as well as homeland security to detect gamma-rays, X-rays, and charged particles.
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SZ-100 - HORIBA, Ltd.
The SZ-100 nanopartica series instruments are flexible analytical tools for characterizing the physical properties of small particles. Depending on the configuration and application the system can be used as a particle size analyzer, or also used to measure zeta potential, molecular weight, (MW) and second virial coefficient (A2). Typical applications for the SZ-100 include nanoparticles, colloids, emulsions, and submicron suspensions.
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Shanghai Selon Scientific Instrument Co. Ltd.
biological sampler is a kind of high effective air biological sampler. It is designed according to the principle of multi jet holes particle impact and isokinetic sampling. And it gets the consistence of animalcule more accurately. When sampling, airborne particles will impact on agar surface of substrate utensil through tiny holes; after incubation of the agar plate, colonies can be counted and identified.
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SICK Sensor Intelligence
The reliable way to detect low dust concentrationsLight scattering by dust particles is a measurement principle that allows even very low concentrations of dust to be detected. Depending on the system-specific requirements, either forward scattering or backward scattering can be used in this context. Both measurement principles return stable and reproducible measurement results, regardless of the gas velocity, humidity, or dust particle charges.
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KW-LU - JFE Advantech Co., Ltd.
This advanced belt conveyor-type constant feeder weighs various raw materials in particle or powder form, and products on the belt conveyor.
