Showing recent results 106 - 120 of 283 products found.
-
DEM Solutions Ltd.
Whether you want to deploy Discrete Element Method in your research or want to expand your curriculum with a DEM-related subject, EDEM software can add another dimension to your research and help expand horizons for your students. * Combine DEM simulation with experimental investigation to understand processes involving particles, * Develop new equipment and methods for bulk solids handling and processing, * Investigate fundamental characteristics of particle systems
-
CF2000 - Postnova Analytics GmbH
The new advanced Postnova CF2000 Series was developed to become the first professional modular Centrifugal FFF system available. It is completely controled by the NovaFFF single software platform which runs the entire system from autosampler to detectors. The CF2000 Centrifugal FFF incorporates the combined proven know-how and the technologies from three decades of leadership in FFF. Due to its unique design, the CF2000 Centrifugal FFF system offers more flexibility, higher robustness and better performance than traditional particle sizer systems. The CF2000 allows high resolution particle separation and sizing at the same time and consequently sets a complete new standard and offers a real alternative to traditional particle characterization techniques.
-
Electrogrip Company
Lightweighted and low-expansion chucks with 10nm active-area flatness are required in EUV lithographic tools. These chucks also have low outgassing and low particle generation.
-
Brooks Automation, Inc.
Combines best particle and AMC cleaning performance and provides humidity control at the highest throughput. Vacuum decontamination chambers are integrated to the footprint and loaded by the robot.
-
DRK8091 - Shandong Drick Instruments Co., Ltd.
Widely used in particle analysis in pharmaceutical, food, cosmetics, food and other industries, the use of advanced integrated circuit control, the operation is extremely simple.
-
Bertin Instruments
Coriolis Air samplers are dedicated to the collect of biological particles in the air which bring new perspectives for the control of airborne contamination thanks to its liquid sample.
-
Mi415 - Milwaukee Instruments
Turbidity refers to the concentration of undissolved, suspended particles present in a liquid.Turbidity is a measure of the clarity of a sample.For potable water applications turbidity is a good indicator of water quality.
-
EV Group
An accurate wafer bonding process is the key factor in obtaining high quality single crystalline silicon films on insulating substrates. The EVG850 SOI/Direct Wafer Bonding systems are designed to fulfill a wide range of fusion/molecular wafer bonding applications, with main focus on SOI substrates manufacturing. Ultra clean handling of wafers throughout the bonding process assures high-yield and void-free bonds. All essential steps, from cleaning and alignment to pre-bonding and IR-inspection are combined in one high volume production system. EVG850 is the only production bonding system built to operate in high throughput, high-yield environments and guarantees void-free SOI wafers up to 300 mm.The EVG300 series single wafer cleaning systems are designed for efficient removal of particles. In semiconductor processing, efficient cleaning and particles removal prior to critical process steps enables maximum yield. Wafer Bonding is a process which is strongly affected by particles: each particle on the wafer surface produces a void orders of magnitude larger than its diameter, contributing to a dramatic yield loss.
-
DANFYSIK A/S
Our wide selection of beam diagnostics components covers most requirements for particle accelerators ranging from low energy in ion implanters to high energy in synchrotrons
-
Teledyne e2v
We have supplied high power, often bespoke, products to many of the world’s most powerful particle accelerators for over 60 years.We partner with our customers to provide switching solutions across the particle physics market; supporting research experiments in Discovery Science, diagnosis and therapy in Medicine, manufacturing in Industry and inspection in Security.Through continuous product and technology development and expert support throughout customer partnership, we offer unique solutions to meet exacting requirements.
-
ALPHASPEC - 1K - CSpark Research
The AlphaSpec-1K is a compact and robust solution for studying the nature of Alpha particles by measuring energy spectra. Energies up to 10MeV are sorted into 1024 bins by the built-in multi channel analyzer.
-
NANOPIX mini - Rigaku Corp.
Non-destructive measurement of particle size and size distribution.Rigaku NANOPIX mini is the world’s first benchtop small angle X-ray scattering (SAXS) system that is engineered to deliver automatic nanoparticle size distribution analysis for both quality control (QC) and research and development (R&D) applications. Nanoparticle size, size distribution, and particle shape are the key pieces of information obtained from SAXS. Samples may range from solutions, suspensions or slurries to solid plastics, rubbers or polymers.
-
Teledyne e2v
We have supplied high power, often bespoke, products to many of the world’s most powerful particle accelerators for over 60 years. We partner with our customers to provide switching solutions across the particle physics market; supporting research experiments in Discovery Science, diagnosis and therapy in Medicine, manufacturing in Industry and inspection in Security.Through continuous product and technology development and expert support throughout customer partnership, we offer unique solutions to meet exacting requirements.
-
Test Products International, Inc.
TPI's wide range of IAQ instruments provides the capability to measure air velocity, humidity, temperature, carbon monoxide (CO), carbon dioxide (CO2), percent outside air, and particles.
-
McBain ZIII Micro Inspection System - McBain Systems
The McBain ZIII Micro Inspection System is the industry standard for CD measurements and inspection, pre/post dicing inspection, pre/post probing inspection, mask inspection, image stitching and critical particle counting.
