Showing recent results 121 - 135 of 279 products found.
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DEM Solutions Ltd.
Whether you want to deploy Discrete Element Method in your research or want to expand your curriculum with a DEM-related subject, EDEM software can add another dimension to your research and help expand horizons for your students. * Combine DEM simulation with experimental investigation to understand processes involving particles, * Develop new equipment and methods for bulk solids handling and processing, * Investigate fundamental characteristics of particle systems
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Loma Systems
The BottleChek Metal Detector Conveyor is designed to inspect pharmaceutical bottles or vials at the end of the packaging line for unwanted metallic particles. The system easily integrates into any production line for side-by-side transfers.
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Bruker Nano Analytics
Our range of techniques includes MRI (Magnetic Resonance Imaging) , PET (Positron Emission Tomography), SPECT (Single Photon Emission Computed Tomography) micro-CT (Micro Computed Tomography), optical imaging and magnetic particle (MPI) imaging.
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Omega Engineering, Inc
A Doppler ultrasonic flow meter uses a transducer to emit an ultrasonic beam into the stream flowing through the pipe. For the flow meter to operate, there must be solid particles or air bubbles in the stream to reflect the ultrasonic beam.
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LIGHTsPEED - Unity Semiconductor SAS
High throughput• Nanometer scale sensitivity• Autofocus• Full haze characterization• Multisize capability• Pits / Particle distinction• High lifetime / low CoO solid state laser• Advanced Automatic Defect Classification
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Atomtex
This Radiation monitor package is designed to measure flux density and surface activity of 239Pu alpha particles, as well as to simultaneously monitor gamma radiation ambient dose equivalent rate and ambient dose equivalent at system operator''s location.
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FFF - Wyatt Technology
Is a separation technique where a field is applied to a fluid suspension or solution pumped through a long and narrow channel, perpendicular to the direction of flow, to cause separation of the particles present in the fluid, depending on their differing "mobilities" under the force exerted by the field.
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GrayWolf Sensing Solutions
GrayWolf DirectSense® monitors interface with GrayWolf 6 channel handheld particle counters and with Thermo MIE™ pDR particulate concentration meters. Display and log particulates right on the DirectSense® mobile PC.
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Test Products International, Inc.
TPI's wide range of IAQ instruments provides the capability to measure air velocity, humidity, temperature, carbon monoxide (CO), carbon dioxide (CO2), percent outside air, and particles.
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ALPHASPEC - 1K - CSpark Research
The AlphaSpec-1K is a compact and robust solution for studying the nature of Alpha particles by measuring energy spectra. Energies up to 10MeV are sorted into 1024 bins by the built-in multi channel analyzer.
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ZIII - McBain Systems
The McBain ZIII Micro Inspection System is the industry standard for CD measurements and inspection, pre/post dicing inspection, pre/post probing inspection, mask inspection, image stitching and critical particle counting.
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DANFYSIK A/S
We offer a wide selection of electrostatic devices for various applications in particle accelerators. They range from electrostatic quadrupole lenses, beam bcanning systems for small accelerators and Wien filters to large electrostatic dipole analysers for spectrometers.
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EV Group
An accurate wafer bonding process is the key factor in obtaining high quality single crystalline silicon films on insulating substrates. The EVG850 SOI/Direct Wafer Bonding systems are designed to fulfill a wide range of fusion/molecular wafer bonding applications, with main focus on SOI substrates manufacturing. Ultra clean handling of wafers throughout the bonding process assures high-yield and void-free bonds. All essential steps, from cleaning and alignment to pre-bonding and IR-inspection are combined in one high volume production system. EVG850 is the only production bonding system built to operate in high throughput, high-yield environments and guarantees void-free SOI wafers up to 300 mm.The EVG300 series single wafer cleaning systems are designed for efficient removal of particles. In semiconductor processing, efficient cleaning and particles removal prior to critical process steps enables maximum yield. Wafer Bonding is a process which is strongly affected by particles: each particle on the wafer surface produces a void orders of magnitude larger than its diameter, contributing to a dramatic yield loss.
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ChipCHECK - Gastops
Gastops specializes in advanced fluid sensing and analysis systems specifically designed and developed for critical equipment condition monitoring applications.ChipCHECK offers the fastest way of making on-site equipment maintenance decisions. It is a field deployable analyzer designed for rapid on-site identification of equipment lube oil. This automated maintenance decision-support tool employs innovative laser spectroscopic technology, which enables on-site analysis of microscopic chip debris. ChipCHECK provides the maintainers with quick, reliable, and conclusive information, including the total number of particles, and the size, shape, and specific alloy classification for each individual particle on the sample.
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Spectris plc
Materials Analysis provides products that enable customers to determine structure, composition, quantity and quality of particles and materials, during their research and product development processes, when assessing materials before production, or during the manufacturing process. Our products help customers to improve accuracy and speed of materials analysis in the laboratory. We see a growing demand for the application of our solutions in quality and process control. Our key customers in this segment are leaders in the metals, minerals and mining, pharmaceutical and academic research industries. The operating companies in this segment are Malvern Instruments, PANalytical and Particle Measuring Systems. Malvern Instruments and PANalytical merged on 1 January 2017.
