Phasor Measurement Units
synced remote wave monitors measuring ac current and voltage on a power grid. AKA: PMU
See Also: PMU, Smart Grid
- Pickering Interfaces Inc.
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PXI 5A Fault Insertion Switch 20-Chan 1-Bus
40-198-001
The 40-198 is a 20 Channel Fault Insertion switch, primarily designed for the simulation of fault conditions in automotive/avionics applications involving the reliability testing of safety critical controllers.
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Phasor Measurement Unit
Agile P847
The P847 Phasor Measurement Unit forms part of Alstom Grid's system monitoring and control. The devices is used to measure power system data in real time and report to the PDC (Phasor Data Concentrator) for visualisation, data storage and most importantly for running a variety of ‘on line’ and ‘off line’ applications in systems analysis and control. The ultimate goal is to run the system economically and preserve system stability following major disturbances.
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Phasor Measurement Unit
Qualitrol PMU-9/18/36
A scalable and modular substation hardened Phasor Measurement Units for connection to up to ten three phase circuits to calculate and stream phasors.
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Open Source Phasor Measurement Unit
OpenPMU
The OpenPMU project delivers a fully open source Phasor Measurement Unit for power system analysis and research. OpenPMU is a flexible modular system for the development of Synchrophasor technology. The concept of OpenPMU is to break down the functions of a Phasor Measurement Unit into three core subject disciplines. These are:
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Phasor Measurement Unit Calibration System
6135A/PMUCAL
The 6135A/PMUCAL system is the only fully automated and traceable PMU calibration system available today. It fully complies to the IEEE C37.118.1™-2011 and section 7 of IEEE C37.242:2013 standards for PMU operation and verification.
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Device Power Supply (DPS) & Parametric Measurement Units (PMU) ATE
Analog Devices’ parametric measurement units (PMUs) and device power supply (DPS) products offer a flexible range of voltage and current source/measurement capability to meet the needs of a wide range of cost-sensitive test applications. With a proven track record, Analog Devices’ PMU and DPS products serve a wide variety of precision test application requirements, such as measurement and control for voltage and current. Analog Devices’ DPS and PMU products are equipped with unique precision measurement and control capability for today's demanding ATE solutions.
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192 Channel Power Supply
HDPMU
Today cost efficiency is more important than ever. Many manufacturers are working on maximizing multi-site testing. Often maximization can’t be done because of limited tester resources. Salland’s HDPMU gives you up to 192 additional independent parametric measurement units (PMU) channels on a single board. Our solution will increase parallel testing without the need for creating complex device interface board (DIB). It can be used for continuity, functional or parametric tests or simply for device setup or loading. Full integration with the Teradyne IG-XL™ Software, easy set-up and high parallel measurement capability will reduce test costs significantly.
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C Series Current Input Module
The C Series Current Input Module features programmable input ranges, variable connectivity options, and built-in noise rejection. You can also choose from options with built-in anti-aliasing filters or high-channel density to reduce the number of modules needed. The C Series Current Input Module supports safety features, certifications, input ranges, overvoltage ranges, and connectivity for applications such as power quality monitoring and metering, utility pole-mounted smart switches, utility ...show more -
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Digital I/O with Per Channel Programmable Logic Levels and PMU PXI Card
GX5295
The GX5295 offers outstanding digital test capabilities and channel density in a compact 3U PXI form factor. Offering both performance digital and analog test capabilities, the GX5295 provides a cost-effective, tester per pin architecture - making this card the ideal choice for high throughput, mixed-signal component test applications. Each digital channel can be individually programmed for a drive hi, drive lo, sense hi, sense lo, and load value (with commutation voltage level). In addition, each channel offers a parametric measurement unit (PMU) providing users with the capability to perform parallel DC measurements on the DUT (device under test).
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Digital I/O with Per Channel Timing, Programmable Logic Levels and PMU PXI Card
GX5296
The GX5296 offers the most performance and features of any 3U PXI dynamic digital I/O board on the market today. The 32-channel, GX5296 offers timing per pin, multiple time sets, data formatting, and an advanced sequencer – providing users with the capability emulate and test complex digital busses for system, board or device test applications. Offering 1 ns edge placement resolution per pin and a PMU per pin, the GX5296 has the ability to perform both DC and AC parametric testing. Each digital channel can be individually programmed for a drive hi, drive lo, sense hi, sense lo, and load value (with commutation voltage level).
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DPS & PMU
Analog Devices parametric measurement units (PMU) and device power supply (DPS) products provide a flexible range of voltage and current source/measurement capability to meet a wide range of cost-sensitive test application needs. The DPS will source currents to 1.2A and multiple devices can be ganged for even higher power applications.
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Dynamic Digital I/O with Per Channel Programmable Logic Levels and PMU PXI Card
GX5295
The GX5295 offers outstanding digital test capabilities and channel density in a compact 3U PXI form factor. Offering both performance digital and analog test capabilities, the GX5295 provides a cost-effective, tester per pin architecture - making this card the ideal choice for high throughput, mixed-signal component test applications. Each digital channel can be individually programmed for a drive hi, drive lo, sense hi, sense lo, and load value (with commutation voltage level). In addition, each channel offers a parametric measurement unit (PMU) providing users with the capability to perform parallel DC measurements on the DUT (device under test).
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Dynamic Digital I/O With Per Channel Timing, Programmable Logic Levels And PMU PXI Card
GX5296
The GX5296 offers advanced dynamic digital I/O performance and capabilities in a single slot, 3U PXI format. The 32-channel, GX5296 features timing per pin, multiple time sets, data formatting, and an advanced sequencer – providing users with the capability to emulate and test complex digital busses for system, board or device test applications. Offering sub-nanosecond edge placement resolution per pin and a PMU per pin, the GX5296 has the ability to perform both DC and AC parametric testing. Ea...show more -
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Full Wafer Test System
FOX-1P
Enables High Throughput, Single Touchdown, Full Wafer Production Testing. Capable of simultaneously testing up to 16,000 die in a single wafer touchdown. Resource configurable up to 16,384 " Universal Channels " - each programmable as anI/O, Clock, Pin Parametric Measurement Unit ( PPMU ) or Device Power Supply ( DPS ). Software-enabled per site flexibility to support small and large device pin count test needs. Comprehensive functional and parametric test capabilities Deep functional pattern da...show more -
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High Performance 50 MHz Dynamic Digital I/O PXI Subsystem
GX5960 Series
The GX5960 digital subsystem represents the highest level of performance available for PXI-based digital instrumentation and features high performance pin electronics and a timing generator / sequencer in a compact, 6U PXI form factor. The GX5960 series consists of the GX5961 clock generator board with 16 driver / sensor channels and the GX5964 driver / sensor board which supports 32 bi-directional I/O channels. Up to 528 digital I/O channels can be supported by the GX5960 digital subsystem. Eac...show more -
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IDM+
Multi-functional fault recorder including: -- Disturbance fault record (DFR)- Dynamic disturbance recording (DDR) - Phasor measurement unit (PMU C37-118)- Power Quality (PQ Class A)- Travelling wave fault location (TWS to +/-60m) - Impedance fault location- Protocols (61850, Modbus, DNP3) - Sequence of event recording (SOE)- GPS, IRIG and NTP time sync- iQ+ masterstation software.
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Multifunction Data Collection and Analysis System
2002
The Model 2002 DME System is a state of the art, multifunction data collection and analysis system. It is suitable for application in an electrical utility substation or plant environment to produce Sequence of Event (SER), Digital Fault Recorder (DFR), Dynamic Disturbance Recorder (DDR), and Continuous Recorder data in conformance with PRC-002-1 and PRC-018-1. All data recorded by the DME system is stored in IEEE C37.111 format and named in conformance with IEEE C37.232. The system also has a software option to enable the Phasor Measurement Unit (PMU) feature to provide streaming data in conformance with IEEE C37.118.
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Multifunction Data Collection and Analysis System
9000
The Model 9000 DME System is a high performance multifunction data collection and analysis system. It is suitable for application in an electrical utility substation or plant environment to produce Sequence of Event (SER), Digital Fault Recorder (DFR), Dynamic Disturbance Recorder (DDR), and Continuous Recorder data in conformance with PRC-002-1 and PRC-018-1. All data recorded by the DME system is stored in IEEE C37.111 format and named in conformance with IEEE C37.232. The system also has a software option to enable the Phasor Measurement Unit (PMU) feature to provide streaming data in conformance with IEEE C37.118.
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Multi-Function Transient Fault Recorder
TR-3000
The TR-3000 is the only tool you need to capture and diagnose power system anomalies. With multiple recording modes and continuous transient oscillography, you will never miss an event. The TR-3000 captures high speed transients and long term system disturbances with enough memory to give you a complete view of the system disturbance. The TR-3000 takes the place of several devices: • Fault and Disturbance Recorder • Transient Fault Location • Phasor Measurement Unit • Power Quality Monitor • Sequence of Events Recorder.
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NI-9246, 50 kS/s/ch, 20 Arms, 30 Apk, 24-Bit, 3-Channel C Series Current Input Module
783920-01
50 kS/s/ch, 20 Arms, 30 Apk, 24-Bit, 3-Channel C Series Current Input Module - The NI‑9246 is designed to support direct ring lug connectivity to the three-phase high-current measurements of 1 A and 5 A current transformers (CTs). It is optimized for power, energy, and industrial applications. The safety features, certifications, input ranges, overvoltage ranges, and connectivity are well suited for applications such as power quality monitoring and metering, utility pole-mounted smart switches, utility pole-mounted smart grid reclosers, substation merging units, industrial machine measurements, health monitoring, predictive maintenance and prognostics, and phasor measurement units (PMUs).
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NI-9247, 50 kS/s/ch, 50 Arms, 147 Apk, 24-Bit, 3-Channel C Series Current Input Module
783589-01
50 kS/s/ch, 50 Arms, 147 Apk, 24-Bit, 3-Channel C Series Current Input Module - The NI‑9247 is designed to support direct ring lug connectivity to the three-phase high-current measurements of 1 A and 5 A current transformers (CTs). It is optimized for power, energy, and industrial applications. The safety features, certifications, input ranges, overvoltage ranges, and connectivity are well suited for applications such as power quality monitoring and metering, utility pole-mounted smart switches, utility pole-mounted smart grid reclosers, substation merging units, industrial machine measurements, health monitoring, predictive maintenance and prognostics, and phasor measurement units (PMUs).
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OLED Lifetime Test System
58131
The 58131 Lifetime Test System is designed specifically for the OLED industry. Model 58131 provides twoquadrant constant current (CC) and constant voltage (CV) stimulus to each OLED panel and acquires electrical and optical characteristics automatically. Two independent and isolated precision source-and-measure units (PMU) are incorporated in one modular card, which is capable of testing two OLED panels. Additional instrument cards are added to expand test capacity. Hot plug and play is a key fe...show more -
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Power System Recorder with CDR , PMU and IEC 61850 station bus protocol
TESLA 4000
ERLPhase Power Technologies Ltd
The new TESLA 4000 is an intelligent, state of the art, user-friendly multi-timeframe dynamic power system recorder with advanced Phasor Measurement Unit (PMU) and Continuous Disturbance Recording (CDR) capabilities. Wide area swing recording accomodates system performance analysis in minutes Meets NERC continuous disturbance recording standards with non-volatile on board flash memory No mechanical moving parts – flash drive eliminates most common mode of failure in recorders. Each flash drive holds 1000 records. IEEE C37.118-2005 SynchroPhasor Standard
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Power Systems Recorder
TESLA 2000
ERLPhase Power Technologies Ltd
TESLA 4000 is an easy-to-use and cost effective, state-of-the-art, multi-time frame (simultaneous) power system monitoring recorder. Its integrated Phasor Measurement Unit (PMU) functionality streams synchrophasor data for wide area monitoring. Enabled with IEC 61850 protocol, TESLA has advanced communication capabilities that, together with its powerful recording features, provide the most versatile and complete monitoring of power system health.
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Power Systems Recorder
TESLA 3000
ERLPhase Power Technologies Ltd
TESLA 4000 is an easy-to-use and cost effective, state-of-the-art, multi-time frame (simultaneous) power system monitoring recorder. Its integrated Phasor Measurement Unit (PMU) functionality streams synchrophasor data for wide area monitoring. Enabled with IEC 61850 protocol, TESLA has advanced communication capabilities that, together with its powerful recording features, provide the most versatile and complete monitoring of power system health.
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Probe Card Analyzers
PB1500
The PB1500 is a low cost probe card analyzer system. It has the capability to perform all the tests done on the larger PB3600/6500 probe card analyzers, but at a lower cost for low pincount cards. A maximum of 1,280 channels may be configured in the PB1500 MUX system. The Precision Measurement Unit (PMU) has the same accuracy, repeatability and range as the larger analyzers. The repair process consists of selecting a failing probe, which moves it under the binocular microscope and positions a crosshair over the correct position for that probe.
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PXIe Measurement Accelerator
M9451A
The M9451A PXIe Measurement Accelerator combined with Option DPD Digital Pre-Distortion & Envelope Tracking Gateware shows what is possible when you combine state of the art FPGA's with Keysight's trusted measurement expertise and PXIe's high speed data handling. As part of Keysight's RF PA/FEM Characterization & Test, Reference Solution, this combination provides unprecedented performance for demanding envelope tracking and digital pre-distortion measurements required for testing modern...show more -
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PXI FPGA & Measurement Accelerator
Keysight PXI FPGA & measurement accelerator provide digital-pre-distortion (DPD) and envelope tracking (ET) measurements that are embedded in high performance FPGA processing cards.
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Digital Source Capture Unit
DIO2
The DIO-II module is a multimode digital source and capture unit. In Low Speed Mode it provides a 20-bit parallel or 24-bit serial I/O capability running at speeds up to 50 MHz. In High Speed Mode, the DIO-II provides a 16-bit parallel I/O capability up to 200 MHz. In both Modes, the Clock is generated by a low jitter PLL source that is capable of generating clocks from 320 kHz up to 1 GHz.
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21-Ch 6A-250VA 2-Bus Fault Insertion
YAV90077
21 channels 1 thread 6A 250V 2 Fault Insertion Buses Switching up to 250W CAN Control (or Ethernet with Ethernet to CAN Gateway) Drivers dll & VIs available
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3 Function Slot MOSA Nano Data Concentrator Unit (DCU)
NIU3A-DCU-01
NIU3A-RDC-01 is a Modular Open Systems Approach (MOSA) Data Concentrator with low power high performance ARM Cortex -A53 processing. 8 GB RAM, 32 GB SATA Flash, 2 x 10/100/1000Base-T Ethernet.
