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Photoluminescence Microspectrometers
Photoluminescence Microspectrometer: an instrument designed to measure the fluorescence, photoluminescence, and emission spectra of microscopic samples with excitation in the UV, visible and NIR regions. our revolutionary technologies that include a range of microspectrophotometer, UV-Vis-NIR microscope, Raman microspectrometer, NIST traceable standards, accessories and software solutions.
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Photoluminescence Spectrometer
FLS1000
The FLS1000 sets the standard in both steady state and time-resolved photoluminescence spectroscopy for both fundamental research and routine laboratory applications. The system is a modular fluorescence and phosphorescence spectrometer for measuring spectra from the ultraviolet to the mid-infrared spectral range (up to 5,500 nm), and lifetimes spanning from picoseconds to seconds. All of this can be achieved through various upgrade routes, either at the time of order or in the future. Whether you are studying photophysics, photochemistry, biophysics, biochemistry, material or life sciences, the FLS1000 will enable you to reliably and accurately measure luminescence spectra and kinetics using state-of-the-art sources, detectors, acquisition techniques, quality optics and precision mechanics. The large sample chamber will house practically any type of sample accessory.
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Photoluminescence Microspectrometer
MicOS
MicOS, the latest in microscope spectrometers is a fully integrated, versatile and cost effective microscope spectrometer that combines a microscope head with a high-performance, triple grating, imaging spectrometer that can accommodate up to 3 different detectors.
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Photoluminescence Mapping System
VS6845A
Industrial Vision Technology Pte Ltd.
With its unique optical design technology, the System detects and classifies defects that affect yield and uses advanced photoluminescence (PL) technology to enable real-time monitoring of MOCVD production processes.
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Microscope Photoluminescence Spectrometer
Flex One
Photoluminescence (PL) is the light emission from a material under the excitation by ultraviolet, visible or near infrared radiation. In semiconductor luminescent property measurements, the sample (e.g. GaN, ZnO, GaAs etc.) was usually excited by a laser (with a wavelength of 325 nm, 532 nm, 785 nm etc.), and its PL spectrum is measured to analyze the optical physical properties, such as the band gap width etc.. Photoluminescence is a high sensitivity, non-destructive analysis method, which can provide the information about the structure, composition and surrounding atomic arrangement of materials. Therefore, it is widely used in physics, materials science, chemistry and molecular biology and other related fields.
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Raman Photoluminescence & Cathodoluminescence
R-CLUE
The R-CLUE all-in-one fiber coupled solution offers colocalized Raman, PhotoLuminescence and Cathodoluminescence Imaging and spectroscopy analysis.R-CLUE takes benefit of HORIBA Scientific extended know-how in Raman and PL spectroscopy with field-proven optical components, guaranteeing optical stability, reproducibility and collection efficiency.
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Wafer Lifetime Measurement with Photoluminescence Detector
WCT-120PL
Measure the calibrated carrier-recombination lifetime of a silicon wafer using both the standard method and the photoluminescence meth
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Extensions for CathodoLuminescence, Photoluminescence & Raman Spectroscopy
Clue Series
CLUE SERIES offers the unique capability to evolve with your requirements. Start with an affordable panchromatic CL detector to end up with a complete combination of all spectroscopic techniques, hyperspectral & panchromatic CL, Raman & photoluminescence. multiple UV, visible & NIR mono and multichannel detectors (CCD and PMT), vacuum technology (VUV), time-resolved fluorescence TCSPC (IBH fast electronics & detection components), Raman spectroscopy, photoluminescence, fast imaging with EMCCD and SWIFT, angular-resolved CL, high performance gratings…
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Photoluminescence & Electroluminescence Measurement System (PL/EL)
PL
PL/EL Measurement System includes Laser, Spectrometer, Lock-in amplifier, Optical Chopper, Sample Holder(PL/EL), PMT/CCD, Fiber, Optical optics, Optical Table, Refrigerator（low temperature）,Sample Chamber and related accessories;
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High-Resolution Double and Triple Spectrometers
TriVista
Teledyne Princeton Instruments
TriVista spectrometers are 2-stage or 3 stage spectrographs designed for demanding spectroscopy applications in material science, chemistry and life science. It is the most versatile and customizable spectroscopy platform for Raman, photoluminescence, resonance Raman and fluorescence.
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Real-time and Direct Correlative Nanoscopy
LabRAM Soleil Nano
Fully integrated system based on our OmegaScope scanning probe microscope and LabRAM Soleil Raman microscope. LabRAM Soleil Nano offers unprecedented capabilities for direct co-localized AFM-Raman and photoluminescence measurements. AFM imaging modes (topographic, electrical, mechanical, etc.) and Raman acquisition can be performed either sequentially or simultaneously at the same location of the sample surface. Optical nano-resolution is also achievable with Tip-Enhanced Raman Spectroscopy and Photoluminescence (TERS/ TEPL). LabRAM Soleil Nano is compatible with the environmental chamber for AFM and Raman measurements in controlled atmosphere and at low temperatures.
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Luminescence Defect Inspection System
INSPECTRA® PL Series
This system uses luminescent images created using photoluminescence (PL) to perform high-speed, high-sensitivity automatic inspection for crystal defects, cracks, and luminescence defects which cannot be detected with conventional visible light surface inspection!
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NUV-PL SiC Defect Inspection System
VS6845E
Industrial Vision Technology Pte Ltd.
Comply with IEC63068-3 Standard: Test method for defects using photoluminescence, Model VS-6845 SiC Wafer defect inspection system has capability on Non-destructive recognition criteria of defects in silicon carbide homoepitaxial wafer for power devices.
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Wafer and Cells PL System
HS-PL
Photoluminescence (PL) Imaging is a unique non-invasive inspection tool as it can be used in-line at many different steps of the cell manufacturing process. This facilitates the direct comparison of data obtained at one process step to data obtained at another. Additionally, PL imaging can be compared to electroluminescence (EL) imaging on finished cells using comparable equipment.
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High Power Tuneable Light Source (280-1100nm)
TLS120Xe
This compact solution easily fits into a wide range of applications in spectroscopy and spectrophotometry and delivers superlative stability and continuous tuning over 280-1100nm. The wavelength agile TLS120Xe offers a high power monochromatic beam suited to a wide range of materials and photodetector characterisation applications in research, industry and OEM, including: Fluorescence imaging, Photoluminescence / fluorimeter excitation, Detector responsivity / QE evaluation ...
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AFM Optical Platform
OmegaScope
The OmegaScope is a state-of-the-art turn-key solution that combines Optics and ultra-resolution multi-range research AFM. The OmegaScope AFM is an advanced research instrument that provides path for researchers in spectroscopy and photonics. It is available in reflection configurations providing direct top and side optical access. The flexibility of the OmegaScope platform offer almost endless possibilities in correlation of high spatial resolution spectroscopies (Raman, Photoluminescence, Fluorescence) and AFM imaging modes.
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Advanced Stand-Alone AFM
SmartSPM
The SmartSPM Scanning Probe Microscope is the first 100% automated system that offers its cutting-edge technology of ultra-fast, metrological and high-resolution measurements for the most advanced materials research at the nanoscale in all AFM and STM modes. With the SmartSPM zooming in from large up to 100 µm overview scans down to atomic resolution has become a reality. Its design has been specially developed to be capable of being seamlessly integrated with optical spectroscopies (SNOM, Raman, Photoluminescence and TERS/SERS techniques).
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Raman Imaging & High Resolution Spectrometer
LabRAM Odyssey
Special 50 years anniversary series: true confocal Raman microscope enabling the most detailed images and analyses to be obtained with speed and confidence. Ideally suited for both micro and macro measurements, it offers advanced confocal imaging capabilities in 2D and 3D. With guaranteed high performance and intuitive simplicity, the LabRAM Odyssey™ is the ultimate instrument for Raman spectroscopy, widely used for standard Raman analysis, PhotoLuminescence (PL), Tip Enhanced Raman Spectroscopy (TERS) and other hybrid methods.
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Confocal Raman Microscope
LabRAM HR Evolution
The LabRAM HR Evolution Raman microscopes are ideally suited for both micro and macro measurements, and offer advanced confocal imaging capabilities in 2D and 3D. The true confocal Raman microscope enables the most detailed images and analyses to be obtained with speed and confidence. With guaranteed high performance and intuitive simplicity, the LabRAM HR Evolution is the ultimate instrument for Raman spectroscopy. They are widely used for standard Raman analysis, PhotoLuminescence (PL), Tip Enhanced Raman Spectroscopy (TERS) and other hybrid methods.
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Solar Cell PL/EL/IV 3-in-1 Testing System
VS6841
Industrial Vision Technology Pte Ltd.
This luminescence Analyzer integrates a Photoluminescence (PL), Electroluminescence (EL) , and I-V Measurement Technology, has a Device’s PL image, EL image, as well Device’s I-V characteristics in One system. It is being using to quantitatively map Minority-Carrier Lifetime, and to characterize the defect of silicon wafer & solar wafer, and measure the key parameters from solar cell I-V Curve. It is also a useful tool for scientist to develop other methodology & parameters that can be used as a promising technique for online material monitoring and process control.
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Spectrometer
Model 207
The Model 207 offers the user the most throughput and fastest aperture in a long focal length monochromator. This is ideal for photoluminescence and Raman spectroscopy applications. It is also available in a vacuum compatible version. Used in air and with a selection of gratings, the spectral range of the 207 extends from 185 nanometersm to 20 microns or more. Under vacuum range is extended down to 105 nm (depends on the grating.) Multiple ports are available for mounting accessories or CCD detectors, etc. McPherson SNAP IN gratings allow the alignment-free use of many different gratings. Easily view a wider spectral range or obtain higher resolution! You can retrofit years later and not have to worry about alignment with the McPherson SNAP IN approach. Our dual grating turret also accepts these easy to exchange gratings.
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AFM (Atomic Force Microscope) Optical Platform
The AFM platform allows fully-integrated use of confocal Raman microscopy and AFM for Tip-Enhanced Optical Spectroscopies (such as Tip-Enhanced Raman Spectroscopy (TERS) and Tip-Enhanced PhotoLuminescence (TEPL)), but also for truly co-localized AFM-Raman measurements.The myriad of AFM (Atomic Force Microscope) techniques that allow study of topographical, electrical and mechanical properties can be performed with any laser source available in Raman spectrometer, or with other external illumination (e.g., solar simulator or other tunable or continuum source). TERS and TEPL can provide nanoscale chemical and structural information, making the AFM-Raman platform a two-way road; where complimentary techniques provide novel and unique imaging capabilities to each other.
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Testing for Si Solar Cells Using High Performance CCD
EL Imaging Tester
EL Testing for Si Solar Cells using High Performance CCD. The determination of luminescence (photo emissions) in solar cells is an important characterization tool. Typical solar cells often have defects which limit the efficiency or lifetime of a cell. Many of these defects are visualized with Luminescence Imaging. By using this technique, the manufacturing process can be optimized to produce better cells. Luminescence Imaging takes advantage of the radiative inter-band recombination of excited charge carriers in solar cells. The emitted photons can be captured with a sensitive CCD camera to obtain an image of the distribution of the radiative recombination in the cell. This distribution is determined by the local excitation level, allowing the detection of electrical losses, thus mapping the diffusion length of minority carriers as the emitted light is low intensity and in the near infra-red range, the CCD camera has a high sensitivity wavelength from 900 to 1100 nm with little thermal noise. This CCD camera provides excellent resolution of 1024 x 1024 pixels with a large 1μm pixel size, multi-megahertz readout speed, and robust USB 2.0 connectivity. The EL CCD Camera is the ultimate high-performance CCD camera for electroluminescence and photoluminescence imaging for Photovoltaic (PV) Cells and Modules. This camera combines low noise electronics and optimal sensitivity in NIR.
