Showing results: 1 - 15 of 966 items found.
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Intepro Systems
The Procyon PTS 2100-10 is a configurable turnkey Power Test System, delivering automated test equipment (ATE) to some of the world’s largest-volume manufacturers as well as the affordability needed by niche market producers. Aerospace, defense, and avionics power supply ATE test systems applications include functional testing of AC and DC power supplies, generator, and engine control units, as well as a wide range of associated electronics.
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ShibaSoku Co., Ltd.
Power device or module with which are digitally controlled and memory can be measured per system.
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ShibaSoku Co., Ltd.
This system is suitable for DC testing of IGBT, IGBT module (1in1~7in1). Built-in hi-current switching relay circuit inside test head, it is capable ofDC testing from device itself to module. Highly accurate repeatability testing is available by high speed rise time which is suppressed its heat in hi-current
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FineTest Inc.
FineSoft on LabWindows CVI platform 2 testers connected with Ethernet hub to dedicated server GPIB Test.
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Aero Nav Laboratories, Inc.
This test is also known as the power supply line voltage and frequency variations test. A few of the measured characteristics are: voltage and frequency modulation, voltage spike, and voltage transient recovery.
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Chroma C8000 -
Chroma Systems Solutions, Inc.
The Chroma 8491 ATS is equipped with optimized standard test items for LED driver testing (lighting & TV backlight). The user is only required to define the test conditions and specifications for the standard test items to perform the test.
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AMETEK Programmable Power, Inc.
The Energy Absorber Test System includes power supplies and a regenerative energy absorber with a rating of 400VDC at ±150A. The system consists of DC power supplies, an AC distribution and interlock system, an energy absorber chassis and an absorber load resistor chassis. The power sources are equipped with a remote control option allowing control via GPIB or with front panel controls in local mode. The operation of the specific parts of the system is described in the sections below.
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ITC52300 -
Integrated Technology Corp.
The ITC52300 is designed for high-volume intermittent or steady-state operating life testing on Insulated Gate Bipolar Transistors (IGBTs), power MOSFETs, diodes, and other bipolar devices in a production environment. (The ITC52300 is an enhanced version of the ITC5230.)
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MPM-210HMPM-211, 212, 213, 215 -
Santec Corporation
Our MPM-210H is ideal for IL, WDL and PDL measurement of multi-port optical components including Dense Wavelength Division Multiplexing (DWDM), Arrayed Waveguide Gratings(AWG) , Wavelength Selective Switches (WSS) and more. When combined with our TSL-Series laser equipped with a power monitor output, the MPM-210H allows the user to complete real-time high precision IL measurements.
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Chroma ATE Inc.
Automatic Test system is the ultimate solution for power electronic testing. The system includes a wide range of hardware choice such as AC/DC Sources, Electronic Loads, DMM, Oscillate Scope, Noise Analyzer and Short /OVP Tester. This flexibility combined with its open architecture software platform-PowerPro III, gives users a flexible, powerful and cost effective test system for almost all types of power supply testing.
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TS-960e -
Marvin Test Solutions, Inc.
The GENASYS Semi TS-960e PXI Express Semiconductor Test System is an integrated test platform that offers comparable system features and capabilities found in proprietary ATE systems. Available as a bench top system or with an integrated manipulator, the TS-960e takes full advantage of the PXI architecture to achieve a cost-effective and full-featured test solution for device, SoC and SiP test applications.
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17020E -
Chroma ATE Inc.
Charge/discharge modes (CC, CV, CP)Power Range: 10kW / 20kW per channelVoltage Range: 60V/ 100VCurrent Range: 100A/200A/300A/400A/ 500A/600A/700A/800A per channelRegenerative battery energy discharge, efficiency 85%Channels paralleled for higher currentsDriving cycle simulationFast current conversion without current interruptHigh precision measurementSmooth current without over shootTest data analysis functionData recovery protection (after power failure)Independent protection of multi-channel
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3380P -
Chroma ATE Inc.
The 3380D/3380P/3380 test system have 4 wires HD VI source and any-pins-to-any-site high parallel test (multi-sites test) functions (512 I/O pins to test 512 ICs in parallel) that can meet the upcoming higher IC testing demands.
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17040E -
Chroma ATE Inc.
High-power testing equipment up to 1,700V/ 4800A/ 1.2MW Multiple safety protections for personnel safety risk management and control of battery testing Flexible Integration for automated battery verification solutions