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Probe Systems
use programmable motorized staging to position contacting pin s.
See Also: Probe Stations, Flying Probes
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Laser Probing Tool
InfraScan™ LTM
Checkpoint Technologies' laser probing tool, the InfraScan LTM (Laster Timing Tool), employs a cw laser to optically probe circuit node to produce electronic waveforms. Checkpoint Technologies' stabilized laser source and optical-to-electronic conversion module provides high bandwidth optical probing up to 12 GHz. The LTM can be integrated into an existing InfraScan product such as an INV or TDE or installed as a stand alone system.
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Surface Analysis
Innova-IRIS
This provides researchers a perfect combination of chemical or crystallographic information at high spatial and spectral resolution with the most advanced atomic force microscopy characterization. The Innova-IRIS can be integrated with your choice of a leading Raman system to provide the best opaque sample TERS investigations available today. However you tailor your system, your application will benefit from Bruker exclusive, high-contrast IRIS TERS probes and the best tip preservation and lowest drift, guaranteeing that alignment is preserved even over the optical integration times necessary to interrogate weak Raman scatterers.
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Spectral Response SystemsQuantum Efficiency SystemsIPCE Measurement Systems
QE system provides electronics and software designed for fully automated measurement of external quantum efficiency of solar cells. All systems include probes and a fixed plate sample stage for samples up to 150 mm x 150 mm. The main system components include: custom designed software, measurement electronics, and computer system (Windows 8 operating system). The measurement involves focusing monochromatic light to a spot on the device under test, then accurately measuring the photon flux and current from the test cell. The system utilizes a dual beam configuration with lock-in detection, providing an absolute accuracy of ±3%. The QE system uses a grating monochrometer with silicon/InGaAs/Ge detectors. The system includes automatic order sorting filters and two light sources for monochromatic illumination (a Xenon- arc lamp and a halogen lamp). A single lock-in amplifier is used to measure both the reference detector and test device. The main system comes with all the hardware needed to measure quantum efficiency, a fixed plate sample stage and probes.
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Portable Calibration Shaker Table
AT-2030
The AT-2030 portable calibration shaker table is designed for simple accelerometer and vibration transducer calibration without the need for advanced features. AT-2030 shaker table and vibration calibrator is a variable frequency, variable amplitude, battery operated portable shaker capable of calibrating accelerometers, transducers, and proximity probes. Applications are producing a known vibration signal in g’s, mils, or ips for sensor, wiring, instrumentation, and system checkout in vibration condition monitoring applications.
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Triple Quadrupole Mass Spectrometry
Xevo TQ-XS
Demands on analytical laboratories are changing and every laboratory needs to ensure it can keep pace with these changes. The Xevo® TQ-XS offers: *StepWave XS™ ion guide that provides increased sensitivity for challenging compounds. *Enhanced detection system with six orders of linear dynamic range to ensure sensitivity is accessible. *Tool-free probe design reduces the time taken for any routine maintenance and provides improved reproducibility between users.
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Pulsed IV Systems
AM3200-Series
AMCAD Engineering has created professional, industry-proven pulsing technology for both standalone IV-testing (Pulsed IV, PIV) as well as pulsed-bias load pull (Pulsed Load Pull, PLP) and high-voltage power semiconductor applications. Systems come equipped with a mainframe controller which includes integrated power supplies. Input and output pulser modules (probes, pulsers) are selected for specific applications and are available in bipolar ±25V/1A and high-voltage 250V/30A models.
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Robotic Probing of Circuit Cards
System provides reliable automatic access to test points on a printed circuit under test providing rapid and accurate diagnostic measurements. Accomplished by an automated test probe with video image capability, under control of application software running on a VXI Test System utilizing LabVIEW. A VXI Prober Interface Module (VPIM), developed to Plug and Play standards, provides interface between prober and VXI Test System.
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NI Semiconductor Test Systems
The STS delivers the openness and flexibility of the NI PXI platform to the semiconductor production environment. For easy integration into the production test cell, the STS comes with features such as handler/prober integration, spring probe device under test interfacing, STDF data reporting, and system calibration.
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Full Wafer Test System
FOX-1P
Enables High Throughput, Single Touchdown, Full Wafer Production Testing. Capable of simultaneously testing up to 16,000 die in a single wafer touchdown. Resource configurable up to 16,384 " Universal Channels " - each programmable as anI/O, Clock, Pin Parametric Measurement Unit ( PPMU ) or Device Power Supply ( DPS ). Software-enabled per site flexibility to support small and large device pin count test needs. Comprehensive functional and parametric test capabilities Deep functional pattern data and capture memory optimized for BIST/DFT testing. Per channel PMU for per site parametric testing Individual channel over-current protection to protect wafers and probe cards. Configured for high volume production. Compatible with industry standard probers and probe cards. Available as an integrated test cell with prober, probe cards and 16,384 channel probe I/F. Configurable as a single or dual system integrated test cell.
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Flying Probe Tester
FA1817
Flying Probe Tester FA1817, an automatic testing system designed to inspect printed wiring on bare boards. The FA1817’s features and capabilities make it ideal for use in inspecting high-density printed wiring boards. With support for a broad range of test types, from low-resistance measurement to high-insulation-resistance measurement, the system reliably detects the latent defects that trouble end-users.
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Psychrometers
The In-Duct Hot-Wire Anemometer & Psychrometer accessory head, AAT3 allows HVACR professionals to measure air velocity, temperature, and %RH all in one tool. The engineered 38" telescoping probe with laser etching and quick-response sensor provides quick and easy airflow measurements from the correct location--near the evaporator. When using with the Fieldpiece HVAC Guide System Analyzers, the AAT3 can automatically calculate target super heat and target evaporator exit temperature.
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Reference Temperature Sensors
AMETEK Sensors, Test & Calibration
Our reference sensors can be used as your daily working-reference sensors in laboratory or field calibration applications. A large selection of types are available, including; straight, 90 degree angle, 4 mm or 1/4”. The superior design and specifications combined with a long history of reliability and low drift have made the STS probes the working-standard in many EN/IEC 17025 accredited laboratories worldwide. The DLC sensors are a part of our patented Dynamic Load Compensation system.
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Humidity & Temperature Probes & Filters
Rotronic Measurement Solutions
The HygroClip2 is a completely new type of probe in a class of it's own in terms of accuracy and performance. Thanks to the new AirChip3000 technology, it also boasts a unique calibration and adjustment process as well as many other superb innovations. At the same time ROTRONIC has taken humidity measurement technology to a whole new level of performance and reliability: the HygroClip2 offers you the best possible reproducibility and a superb system accuracy of < ±0.8 %rh and ±0.1 K.
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Automation Solutions
We have customized (partially) automated measuring solutions that can be fully integrated seamlessly across all levels of your plant – from cleanroom-compatible measuring systems for automated production to robot-assisted probes in thickness measurement. Whether X-ray, terahertz or electromagnetic, random sampling or 100 % inspection: We offer measurement technology that allows you to inspect surfaces quickly and under constant conditions, save time and costs and ensure the quality of your production.
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Semiconductor Test
Smiths Interconnect’s test socket and probe card solutions utilize IDI contact technology to ensure superior quality and reliability in semiconductor test applications. Our best-in-class engineering, development and technical expertise ensure support of automated, system level and development test platforms.
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Professional Meters
Whether standard or high precision, ThermoWorks handheld meters feature rugged housing and best-in class accuracy across a variety of temperature ranges. Choose from integrated systems or meters that accept multiple probes, single or dual channel meters, alarms or reference models. Perfect for BBQ or sous-vide applications, dairy processing and meat processing, pharmaceutical labs, concrete curing, health departments, and for line checks, critical control point management, and HACCP checklists.
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Reference Meters
Whether standard or high precision, ThermoWorks handheld meters feature rugged housing and best-in class accuracy across a variety of temperature ranges. Choose from integrated systems or meters that accept multiple probes, single or dual channel meters, alarms or reference models. Perfect for BBQ or sous-vide applications, dairy processing and meat processing, pharmaceutical labs, concrete curing, health departments, and for line checks, critical control point management, and HACCP checklists.
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CombiVolt™ 1 Voltage/Continuity Tester
DL6780
Testing of AC/ DC voltages from 12 to 690 V AC/DC Continuity testing with optical and acoustic indication Automatic switching between voltage and continuity Phase rotation test system Single pole phase indication Fully compliant with GS38 Fully operational voltage indication even when batteries are discharged Will not trip any RCD when testing across Live and Earth Single pole detection when L2 probe connected above 100V
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Semiconductor Metrology Systems
MTI Instruments'' semiconductor wafer metrology tools consist of a complete line of wafer measurement systems for virtually any material including Silicon wafer (Si), Gallium Arsenide wafer (GaAs), Germanium wafer (Ge) and Indium Phosphide wafer (InP). From manual to semi-automated wafer inspection systems, the Proforma line of wafer metrology inspection tools is ideal for wafer thickness, wafer bow, wafer warp, resistivity, site and global flatness measurement. Our proprietary push/pull capacitance probes provide outstanding accuracy throughout their large measurement range, allowing measurement of highly warped wafers and stacked wafers. MTII''s solar metrology tools include off line manual systems for wafer thickness and Total Thickness Variation (TTV), as well as, in-process measurement systems capable of measuring wafer thickness, TTV and wafer bow at the speed of 5 wafers/second.
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DC12V Heavy Duty Circuit Tester
TE6-0706
Hangzhou Tonny Electric & Tools Co., Ltd.
*Heavy Duty probe *Heavy plastic handle and insulated ground clip*Testers light up and/or buzz to indicate testing result*Lights for easy visibility.*Heavy duty coil cord or straight cord (optional).*Durably designed for a long service life*For testing 6-12 volt systems for wire breaks, shorts, fuses, lamps, relays, armatures and more.*Suite able for a broad range of household, car, trucks, boats, trailers, vans, motorcycles, industrial and commercial uses.
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Advanced Stand-Alone AFM
SmartSPM
The SmartSPM Scanning Probe Microscope is the first 100% automated system that offers its cutting-edge technology of ultra-fast, metrological and high-resolution measurements for the most advanced materials research at the nanoscale in all AFM and STM modes. With the SmartSPM zooming in from large up to 100 µm overview scans down to atomic resolution has become a reality. Its design has been specially developed to be capable of being seamlessly integrated with optical spectroscopies (SNOM, Raman, Photoluminescence and TERS/SERS techniques).
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Antenna Kits
A.H. Systems offers 10 models of portable antenna kits. Each kit provides all the reliable antennas, current probes and accessories needed to satisfy a wide array of customer requirements. Each component has a specific storage compartment in the carrying case therefore, loss and breakage are virtually eliminated. Cables, a tripod with azimuth and elevation head and a tripod carrying case accompany each antenna kit. Click on a model below to learn more about it''s characteristics and included antennas.
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Multiparameter Water Quality Meter
ProDSS
Handheld multiparameter instrument with multiple cable optionsThe YSI ProDSS (digital sampling system) handheld multiparameter meter provides extreme flexibility with two main cable options. Choose between the fully loaded 4-port cable assembly outfitted with any four DSS sensors (with depth or no depth) or the ODO/CT probe and cable - where you get accurate DO measurements every time with an optical dissolved oxygen sensor with an inline conductivity sensor, allowing for real-time salinity compensation.
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Resistivity Meter
Model 2180
The unit is compact and lightweight. The basic system is 7″ wide by 2.5″ high and 12″ long. When measurements are needed below approximately 100 micro-ohm-centimeters, the basic system is piggybacked onto a second enclosure that houses a power amplifier with a current gain of ten. The combined unit measures 7″ wide by 5″ high and 12″ long. The combined unit weighs 11.5 pounds. Two short cables interconnect the two enclosures for powering the power amplifier and routing the signals to the fixture or four point probe. The front panel of the basic system includes a 32-character backlit LCD display and a set of function keys. An easy-to-use menu will allow access to user defined parameters such as sample thickness, sample volume, and calibration constants; upper and lower alarm limits, relative measurements, and several others.
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IC Tester
ICE1
The IC Test System was developed to measure the EMC behavior of circuits (ICs) in the event of targeted field or line-related interference and for measuring emissions. The test IC is tested in function. The test environment ICE1 creates the functional environment of the test IC. The respective measurement task is carried out with the corresponding probe set.
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Fiber Optic Measurement Systems & Sensors
MTI Instruments offers large measurement range and standoff distance fiber-optic measurement sensors and probes that provide ultra sensitive linear output response. Our modular (interchangeable) non-contact fiber optic sensors systems have dual channel that enables the user to make simultaneous measurements. Our fiber optic probes are designed to automatically compensate large changes in reflectivity making it possible to monitor dynamic reflectance of up to 100:1 making it ideal for measuring vibration of ultrasonic horns, modal analysis of disk drive suspension, displacement and timing of fuel injectors and lateral motion measurements.
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Powerful, Fully Integrated Workstation for Emission Microscopy
PEM-1000
The PEM-1000 emission microscope incorporates the latest technology in real time, high quantum efficiency, mega-pixel CCD detectors in a back-thinned cooled camera. A portable system, the PEM 1000 can interface with all analytical probe stations, ATE (automated test equipment) and bench top configurations for high speed functional testing.
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Complete Power Quality Analysis System
PK4564
PK4564 complete Power Quality Analysis System includes PS4550 Power Quality Analyzer with extended memory, AC charger, Quick-Start manual, deluxe voltage leads, four eFX6000 flexible current probes, SD memory card, CAS3 hard-shell carrying case, PSM-A Software, and 1-year deluxe warranty.
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Low-Voltage Tester
69127
Device for checking live 6-24V, AC or DC circuits.Tests for shorts in automotive and truck electrical systems, motor field coils, radio and low-voltage circuits, ground circuit of all lamps, wiring, fuses, etc.Bulb in handle glows when circuit is complete (bulb included).Pointed 3-3/4'' (95 mm) probe makes checking easier.Deluxe 3.5'' (89 mm) long handle with nylon top holds replaceable bulb.36'' (914 mm) test lead with alligator clip.Replacement bulb: Cat. No. 69130
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Hook Probe Circuit Tester
TE6-0707
Hangzhou Tonny Electric & Tools Co., Ltd.
*Used to locate hot circuits and troubleshoot primary circuits on all 6, 12 and 24 volt systems.*Suitable for a broad range of household, car, trucks, boats, trailers, vans, motorcycles, industrial and commercial uses..*Convenient screwdriver-type handle*Heavy Duty probe *Heavy plastic handle and insulated ground clipTesters light up to indicate testing result*Durably designed for a long service life.*Lights for easy visibility.*Heavy duty coil cord or straight cord (optional).*Materials: plastic/metal
