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Probe Systems

use programmable motorized staging to position contacting pin s.

See Also: Probe Stations, Flying Probes


Showing results: 451 - 465 of 502 items found.

  • Supported Test Systems

    The Test Connection, Inc.

    TTCI is a leading solutions provider of application development for test systems from Seica, Keysight, Teradyne, Digitaltest, and XJTAG. We offer a wide variety of testers and test solutions to meet your needs. Our Seica Pilot and Digitaltest Condor flying probe systems can handle all of your low- to mid-volume production, prototypes, and PC boards with accessibility issues. The Keysight 3070 and Teradyne TestStation can address your larger production runs and fixture requirements. In addition, we can also address your functional and boundary scan needs.

  • Temperature Data Acquistion

    THERMES-USB RF - Physitemp Instruments

    Physitemp’s original Thermes high accuracy ISA based data acquisition system has been redesigned to create a more versatile USB model. The new system requires no internal connections to your computer and simply connects via an external USB port on your laptop or desktop computer. Two versions of the data acquisition system are available. The standard version, THERMES USB, is connected to your computer USB port. The wireless version - THERMES USB WFI, can be either directly connected to a USB port or, with the included wireless receiver, positioned up to 100 feet from the host computer. Each unit will accommodate up to 7 type T thermocouple sensors and multiple Thermes units may be connected to the same computer for more thermocouple inputs. A high accuracy electronic cold junction compensation circuit maintains typical system accuracy of ±0.2°C over an ambient temperature range of 15 to 35°C. Individual offsets may be added to each input in software to facilitate individual calibration of each channel. For information on our wide selection of Type T Thermocouple temperature probes.

  • The Nanoworkbench

    Klocke Nanotechnik

    In light microscopy it is natural to use toolsets like tweezers, knives, probes and several different measurement tools. Without this many present-day products and methods would not exist. The operators of SEM/FIB-Systems generally work without toolsets, although the wavelength limit of light is no physical boundary. It can be imagined how technology would be pushed when a SEM/FIB Workbench reaches the same degree of practicability and utilization as toolsets for light microscopes. The Nanoworkbench is the first system substituting the eye-hand coordination effectively with nm precision in a SEM/FIB-system. The Nanoworkbench features a set of applications including TEM lamella preparation, nano probing, nano cutting, nano cleaning, force distance measurement, particle sorting and material preparation. Every application supports automated processes so almost no user interaction is needed. Even complex processes can be done within seconds and even by untrained users. Applications can be combined to create new and more complex processes. Expanding the SEM/FIB to a material processing system and a nano-analytical workbench by utilizing the Klocke Nanoworkbench enables new applications in research and production of material research, live sciences, tribology, environmental & forensic research and semiconductor technology.

  • NI-9231 and cDAQ-9171 USB Sound and Vibration Measurement Bundle

    865665-01 - NI

    NI-9231 and cDAQ-9171 USB Sound and Vibration Measurement Bundle - The USB Sound and Vibration Measurement Bundle with NI-9231 and cDAQ-9171 includes the NI-9231 C Series Sound and Vibration Input Module and the cDAQ-9171 CompactDAQ Chassis for sound and vibrations measurements. This bundle provides a portable, USB-based sensor measurement system that helps you measure signals from integrated electronic piezoelectric (IEPE) and non IEPE sensors such as accelerometers, tachometers, and proximity probes. The included NI-9234 features 8 channels with built-in anti-aliasing filters that automatically adjust to your sample rate. Additionally, the bundle supports simultaneous sampling and high dynamic range measurements necessary for modern measurement microphones and accelerometers.

  • NI-9234 and cDAQ-9171 USB Sound and Vibration Measurement Bundle

    865664-01 - NI

    NI-9234 and cDAQ-9171 USB Sound and Vibration Measurement Bundle - The USB Sound and Vibration Measurement Bundle with NI-9234 and cDAQ-9171 includes the NI-9234 C Series Sound and Vibration Input Module and the cDAQ-9171 CompactDAQ Chassis for sound and vibration measurements. This bundle provides a portable, USB-based sensor measurement system that helps you measure signals from integrated electronic piezoelectric (IEPE) and non IEPE sensors such as accelerometers, tachometers, and proximity probes. The included NI-9234 features 4 channels with built-in anti-aliasing filters that automatically adjust to your sample rate. Additionally, when used with NI software, the bundle provides processing functionality for condition monitoring such as frequency analysis and order tracking.

  • Multi-Interface TDM, Optical, And Packet/IP Rackmount & Probe Test Platforms

    mTOP™ - GL Communications Inc.

    Most equipment manufacturers and large enterprises prefer rack-based test tools as they are compact and higher density form factor solution for testing, monitoring, and troubleshooting network conditions. GL’s Multiple TDM Optical and Packet (mTOP™) rack enclosure can house any combination of USB based test equipment which are easily deployed and securely fixed to an equipment rack to provide extraordinary scalability to test switches, routers and end-to-end networks. These rack based platforms incorporates the basic test unit along with the necessary PC hardware, Windows® 10 64-bit operating system and remote accessibility via scripting and remote desktop. There are no moving parts with the unit, so reliability and longevity are integral. GL’s latest mTOP™ Probe stand-alone hardware variant is an all-in-one self-contained test instrument. The mTOP™ Probe can include any of the multiple TDM Optical and Packet interfaces USB device combined with the PC into one single box. The comprehensive mTOP™ Probe hardware unit is designed for easier portability and convenient for field testing which incorporates the testing features for multiple interfaces along with necessary PC hardware in a single box. GL’s USB based test equipment - PacketExpert™ (Ethernet), tProbe™ (T1/E1), USB T3/E3 (TDM), Dual UTAs (Analog/Wireless), and LightSpeed1000™ (SONET SDH) to support multiple interfaces in a compact rack space or included in a portable Probe unit.

  • Rack Based Test Solutions

    GL Communications Inc.

    Most equipment manufacturers and large enterprises prefer rack-based test tools as they are compact and higher density form factor solution for testing, monitoring, and troubleshooting network conditions. GL’s Multiple TDM Optical and Packet (mTOP™) rack enclosure can house any combination of USB based test equipment which are easily deployed and securely fixed to an equipment rack to provide extraordinary scalability to test switches, routers and end-to-end networks. These rack based platforms incorporates the basic test unit along with the necessary PC hardware, Windows® 10 64-bit operating system and remote accessibility via scripting and remote desktop. There are no moving parts with the unit, so reliability and longevity are integral. GL’s latest mTOP™ Probe stand-alone hardware variant is an all-in-one self-contained test instrument. The mTOP™ Probe can include any of the multiple TDM Optical and Packet interfaces USB device combined with the PC into one single box. The comprehensive mTOP™ Probe hardware unit is designed for easier portability and convenient for field testing which incorporates the testing features for multiple interfaces along with necessary PC hardware in a single box. GL’s USB based test equipment - PacketExpert™ (Ethernet), tProbe™ (T1/E1), USB T3/E3 (TDM), Dual UTAs (Analog/Wireless), and LightSpeed1000™ (SONET SDH) to support multiple interfaces in a compact rack space or included in a portable Probe unit.

  • Drop-In Functional Test Fixtures

    Circuit Check, Inc.

    Circuit Check’s drop-in base fixture and replaceable personalized plates are the ideal solution where production volumes are lower and the need to change from one fixture and test program to another occurs quickly. Interchangeable test fixture drop-ins enable the same test system to be quickly reconfigured with different tooling and probe patterns for different products. This maximizes equipment re-use, while minimizing the cost for each new test. With Circuit Check’s base fixture and drop-ins, the wiring and test electronics are not disturbed, thus ensuring configuration consistency each time the system is re-tooled.

  • Vision Measuring Projector

    Sinowon Innovation Metrology Manufacture Ltd.

    ◆ The lifting system adopts linear guide rail and precision screw drive, which makes the lift drive more comfortable and stable;◆ With precision toothless rod and fast movement locking device, ensure return error is within 2um;◆ High accuracy A optical scale and precision working stage, ensure machine accuracy is within 3+L/200 um;◆ HD zoom lens and HD color digital camera, ensure clear image without distortion;◆ With programmable surface 4-ring 8-division LED cold light and contour LED parallel illumination, it can control the brightness of the 4-ring 8-division independently;◆ With powerful iMeasuring2.1 software system , to enhance the control quality;◆ Optional imported contact probes and 3D measuring software, it can help upgrade the machine to be coordinate measuring machine;◆ Optional FexQMS measurement data analysis and real-time monitor software, enhance process control, reduce material consumption;

  • Evaluation Board

    emPower - SEGGER Microcontroller GmbH & Co. KG

    The emPower eval board provides a comprehensive set of SEGGER's middleware products, accelerating the start of any embedded project. SEGGER's embOS real-time operating system is at the heart of the evaluation. Furthermore, evaluation versions of the file system emFile, graphics library emWin, emUSB Host & Device, and TCP/IP stack embOS/IP (including web server demo) enable full use of the available emPower peripherals. emPower also features a J-Link OB, an on-board version of SEGGER's market-leading debug probe J-Link, which includes drag & drop programming and COM-Port support. There are three expansion interfaces to easily connect additional modules. Each connector provides I2C, SPI, UART, GPIO/timer, analog input and power. A display adapter connector enables the connection of small TFT displays. The emPower board is powered by USB only. Current consumption drawn strongly depends on the application and connected peripherals. Idle consumption is approx. 85 mA.

  • Aurora®

    Northern Digital Inc.

    The Aurora® electromagnetic tracking solution provides unobstructed real-time tracking of micro sensors that can be embedded into rigid and flexible OEM medical instruments such as ultrasound probes, endoscopes, catheters, guidewires – even at the tip of a needle. With the Aurora® electromagnetic tracking solution, no line-of-sight is needed for in-vivo tracking of instruments through twisting anatomical tracts. When integrated as a component into the workflow of OEM image-guided surgery or interventional systems, the Aurora acts as the link between patient image sets and 3D space, enabling the instruments’ positions and orientations to be instantly localized and visualized within the operative field. It does so with the exceptional speed, accuracy, and precision required by today’s most demanding minimally invasive approaches.

  • Stimulus Induced Fault Testing

    SIFT - FA Instruments

    SIFT allows for the analysis of numerous stimuli to identify speed, fault, and parametric differences in silicon. The heart of the SIFT technique revolves around intentionally disturbing devices with external stimuli and comparing the test criteria to reference parts or timing/voltage sensitivities. Synchronous interfacing is possible to any tester without any wiring or program changes. The system can be based on either a motorized probe station or portable microscope stand for test head applications.

  • Multi-Channel Anemometer

    1550/1560 Series - KANOMAX USA, Inc.

    Kanomax Multi-Channel Anemometers are research-grade airflow measuring instruments designed for high performance and precision. When coupled with our highly accurate probes this four-channel anemometer provides highly accurate and reliable data readings. It features a LCD display that displays the data from each channel. The Our 1550 & 1560 models house module bays for the connection of up to 24 channels (model 1560) or 64 channels (model 1550) of simultaneous air velocity measurements. Each bay accepts one of five unique modules allowing for a wide variety of custom configurations for air velocity, temperature, and humidity measurement. For a larger system, you can connect up to 5 units in a cascade for up to 320 air velocity channels and transfer the data to your company computer.

  • Autosamplers for Chromatography

    Teledyne LABS

    Maximize the throughput and flexibility of your ACCQPrep system by adding automated sample loading for longer unattended operation.The two rack AS 2x2 and four rack AS 4x2 sampler options allow different chromatographic conditions to be applied to a variety of different samples and doubles or triples the fraction collection capabilities of the base system.The ACCQPrep AutoSamplers provide high recovery of samples with 99.9% transfer of analyte. PeakTrak software allows users to quickly create sample queues for walk up open-access labs and overnight purifications. Develop methods that result in the highest purity and largest loading capacity with the 3 Step Focused Gradient Generator that works seamlessly with the AutoSampler and PeakTrak software. An integrated wash station and sophisticated robotic probe movement ensures sample purity and limits cross contamination.

  • Solar Cell Testers

    Photo Emission Tech., Inc.

    Solar Cell Testers are integrated systems incorporating Solar Simulator and I-V Measurement systems. PET offers Standard and Advance IV Measurement software. PET Cell Testers are capable of measuring a diverse range of solar cell parameters such as Isc,Voc, Imax,Vmax, Pmax, FF, Rsh, Rs and η cell conversion efficiency, complete light and dark I-V curves. All that needs to be done to test a cell is to load the cell, make electrical probes contact and press “Measure” icon on the I-V Measurement System software. The software will automatically open the Solar Simulator shutter, perform the test and close the shutter after the test is complete. The design is modular in nature and can be easily upgraded. Some options can added at a later time.

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