- TEAM SOLUTIONS, INC.
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IEEE488 (GPIC, HPIB) PCI Interface Card - Fits 3.3V or 5.0V Slots, 1KByte Transfer FIFO
GPIB-PCI-XL
The GPIB-PCI-XL is a PCI GPIB controller card that converts any PC with a PCI bus slot into a GPIB controller.
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FRP-25T Test System Interface Probe
FRP-25T
Current Rating (Amps): 5Average DC Resistance lower than (mOhm): 35Test Center (mil): 100Test Center (mm): 2.54Full Travel (mil): 160Full Travel (mm): 4.06Recommended Travel (mil): 120Recommended Travel (mm): 3.05Overall Length (mil): 1,210Overall Length (mm): 30.73
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GPP-95-2 Test System Interface Probe
GPP-95-2
Overall Length (mil): 375Overall Length (mm): 9.53Rec. Mounting Hole Size (mil): 85Rec. Mounting Hole Size (mm): 2.15Recommended Drill Size: #44 or 2.15 mm
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GSP-2B Test System Interface Probe
GSP-2B
Current Rating (Amps): 5Average Probe Resistance (mOhm): 35Test Center (mil): 100Test Center (mm): 2.54Full Travel (mil): 125Full Travel (mm): 3.18Recommended Travel (mil): 125Recommended Travel (mm): 3.18Overall Length (mil): 845Overall Length (mm): 21.46
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RSP-2T Test System Interface Probe
RSP-2T
Current Rating (Amps): 5Average Probe Resistance (mOhm): 20Test Center (mil): 100Test Center (mm): 2.54Full Travel (mil): 167Full Travel (mm): 4.24Recommended Travel (mil): 79Recommended Travel (mm): 2.00
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SIP-90-2 Test System Interface Probe
SIP-90-2
Overall Length (mil): 700Overall Length (mm): 17.78Rec. Mounting Hole Size (mil): 55Rec. Mounting Hole Size (mm): 1.40Recommended Drill Size: #54 or 1.40 mm
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SIP-90-3 Test System Interface Probe
SIP-90-3
Overall Length (mil): 700Overall Length (mm): 17.78Rec. Mounting Hole Size (mil): 55Rec. Mounting Hole Size (mm): 1.40Recommended Drill Size: #54 or 1.40 mm
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SIP-90-4 Test System Interface Probe
SIP-90-4
Overall Length (mil): 693Overall Length (mm): 17.60Rec. Mounting Hole Size (mil): 57Rec. Mounting Hole Size (mm): 1.45Recommended Drill Size: 1,45 mm
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SIP-90-5 Test System Interface Probe
SIP-90-5
Overall Length (mil): 1,000Overall Length (mm): 25.40Rec. Mounting Hole Size (mil): 55Rec. Mounting Hole Size (mm): 1.40Recommended Drill Size: #54 or 1.40 mm
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SIP-90-6 Test System Interface Probe
SIP-90-6
Overall Length (mil): 656Overall Length (mm): 16.66Rec. Mounting Hole Size (mil): 57Rec. Mounting Hole Size (mm): 1.45Recommended Drill Size: 1,45 mm
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K-50 Series Probes
The K-50 coaxial probe provides an instrumentation-quality interface for broadband R.F. measurements up to 4 GHz. With the K-50 R. F. circuit design, impedance characterization measurements can be performed using it as a Network Analyzer port-extending accessory. Accurate and repeatable small signal and R.F. power (50 Watts) measurements provide consistent and repeatable results.
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Interface Probes
Low resistance used in: *ICT Testers *Functional Testers *Special Purpose Machines
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Probe Interfaces
Renishaw's range of interfaces makes it easy to connect a probe to your machine's controller.
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Passive Probe Interface Adapter
CX1151A
The CX1151A is an adapter for passive probes for the voltage waveform measurements by the CX3300 series Device Current Waveform Analyzer.
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13 GHz Differential Probe with ProLink Interface
DH13-PL
Teledyne LeCroy’s DH series 8 to 30 GHz differential probes offer the combination of bandwidth, input range and offset capability to address any high-speed probing requirement from debugging serial data interfaces to validating DDR memory systems. DH series probes provide superior loading characteristics and are calibrated with a custom “fine-tuned” frequency response. The ultra-low loading and flat frequency response ensure accurate measurements.
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16 GHz Differential Probe with ProLink Interface
DH16-PL
Teledyne LeCroy’s DH series 8 to 30 GHz differential probes offer the combination of bandwidth, input range and offset capability to address any high-speed probing requirement from debugging serial data interfaces to validating DDR memory systems. DH series probes provide superior loading characteristics and are calibrated with a custom “fine-tuned” frequency response. The ultra-low loading and flat frequency response ensure accurate measurements.
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20 GHz Differential Probe with ProLink Interface
DH20-PL
Teledyne LeCroy’s DH series 8 to 30 GHz differential probes offer the combination of bandwidth, input range and offset capability to address any high-speed probing requirement from debugging serial data interfaces to validating DDR memory systems. DH series probes provide superior loading characteristics and are calibrated with a custom “fine-tuned” frequency response. The ultra-low loading and flat frequency response ensure accurate measurements.
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25 GHz Differential Probe with 2.92mm Interface
DH25-2.92MM
Teledyne LeCroy’s DH series 8 to 30 GHz differential probes offer the combination of bandwidth, input range and offset capability to address any high-speed probing requirement from debugging serial data interfaces to validating DDR memory systems. DH series probes provide superior loading characteristics and are calibrated with a custom “fine-tuned” frequency response. The ultra-low loading and flat frequency response ensure accurate measurements.
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25 GHz differential probe with ProAxial interface
DH25-PX
25 GHz differential probe with ProAxial interface.
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30 GHz Differential Probe with 2.92mm Interface
DH30-2.92MM
Teledyne LeCroy’s DH series 8 to 30 GHz differential probes offer the combination of bandwidth, input range and offset capability to address any high-speed probing requirement from debugging serial data interfaces to validating DDR memory systems. DH series probes provide superior loading characteristics and are calibrated with a custom “fine-tuned” frequency response. The ultra-low loading and flat frequency response ensure accurate measurements.
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30 GHz differential probe with ProAxial interface
DH30-PX
30 GHz differential probe with ProAxial interface.
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8 GHz Differential Probe with ProBus2 Interface
DH08-PB2
Teledyne LeCroy’s DH series 8 to 30 GHz differential probes offer the combination of bandwidth, input range and offset capability to address any high-speed probing requirement from debugging serial data interfaces to validating DDR memory systems. DH series probes provide superior loading characteristics and are calibrated with a custom “fine-tuned” frequency response. The ultra-low loading and flat frequency response ensure accurate measurements.
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8 GHz Differential Probe with ProLink Interface
DH08-PL
Teledyne LeCroy’s DH series 8 to 30 GHz differential probes offer the combination of bandwidth, input range and offset capability to address any high-speed probing requirement from debugging serial data interfaces to validating DDR memory systems. DH series probes provide superior loading characteristics and are calibrated with a custom “fine-tuned” frequency response. The ultra-low loading and flat frequency response ensure accurate measurements.
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Interface Pin
Smiths Interconnect offers interface probes for all major test equipment manufacturers. We also provide a variety of interface pins for use in test fixtures.
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Tester Electrical Interfaces
The primary element of the tester electrical interface is the Probe Pin Ring (PPR). Sometimes referred to as a ‘tower,’ this array of spring-loaded probes can be arranged to provide a controlled impedance path, a low leakage connection, a low inductance arrangement for high currents, or just about any connection characteristic you require. inTEST EMS provides electrical interfaces in various OEM-supported designs, inTEST standards, and custom configurations.
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ProBus Probe Adapter for TekProbe-BNC Probes
TPA10
- Allows TekProbe interface level II probes to work with any ProBus-equipped Teledyne LeCroy oscilloscope- Automatic probe detection- Provides all necessary power and offset control to the attached probe- Supports probes up to 4 GHz- Easy firmware updates- Wide variety of probes supported including: Preamplifiers, Current Probes, Single-Ended Active Probes and Differential Active Probes
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RF Coaxial Probes & Probe Positioner
Fairview Microwave’s line of coaxial RF probes and RF PCB probe positioner are ideal for use with chip evaluations, signal integrity measurements, coplanar waveguide, substrate characterization, gigabit SERDES and test fixture applications. The RF coaxial probes provide return loss better than 10 dB and a maximum operating frequency of 20 GHz. The probes have a 3.5mm female interface, a pitch of 800 or 1500 micron and they can be cable-mounted. They feature gold-plated contacts and can be used b...show more -
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Interposers and Probes
The Summit product family includes a wide variety of Interposer systems, designed to reliably capture serial data traffic while minimizing perturbations in the serial data stream. Probes include interposers, which are designed to capture data traffic crossing the PCI Express card connector interface, and MidBus probes, which are designed to capture traffic flowing within a PCB.
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JTAG Probe
MAJIC
MAJIC (Multi-Architecture JTAG Interface Controllers) JTAG Probes are small, stand-alone, processor-based systems that provide an intelligent connection between host-based development tools (the debugger) and an embedded processor via its standardized JTAG debug logic IP macrocell.
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Probe Adapters
Probe adapters provide simple and easy interface of third-party probes as well as change between the different Teledyne LeCroy Oscilloscope input and cable types (ProBus, ProLink, K/2.92 mm, BNC and SMA). Depending on the adapters, changing between the Teledyne LeCroy Oscilloscope's input type may have an effect on the overall performance of the channel.
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Probe Antennas
Probe antennas are offered as both standard and custom models with a rectangular waveguide interface. Probe antennas can only support linear polarization. These antennas are often used to measure the gain of other antennas by comparing the signal levels of the probe antenna and antenna under testing. The standard models operate across the full waveguide band and offer 6.5 dB nominal gain and 115 and 60 degrees half power beamwidth at center frequency. The below standard offering covers the frequency range of 8.2 to 170 GHz.
