Showing results: 1 - 15 of 66 items found.
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TMPF-300-100 -
Taiyo Industrial Co., Ltd.
he TMPF-300-100 is a simple prober that uses bump FPC technology for making contact. It has a test piece guide movable in X and Y directions for increased usability. There is a transparent acrylic plate for mounting test pieces so it can be used with light tables. The TMPF-300-100 may be used with a wide variety of terminals of LCD panels or FPCs.
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TMPF-60-512 -
Taiyo Industrial Co., Ltd.
The TMPF-60-512 is for checking panels from 1.5 to 3.5 inches that have contact terminals on the same plane as the display panel. Accurate alignment is possible by using a micrometer for adjusting the X, Y, and θ axes. Features mechanisms for adjusting contact pressure, and reducing speed in contact operations. May be loaded with a CCD camera and backlight for position recognition.
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TMPF-160-256 -
Taiyo Industrial Co., Ltd.
For checking panels up to 2 inches in size. The TMPF-160-256 has an overdrive mechanism for adjusting contact pressure, along with a transparent acrylic plate for mounting test pieces so it may be used with light tables. The bump FPC used for making contact, and the contact FPC used on the checker side, are attached by screw pressure-fit connections allowing the bump FPC to be changed easily.
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TMPBF-65-960 -
Taiyo Industrial Co., Ltd.
The TMPBF-65-960 is for testing the lighting of STN-LCDpanels. It is driven by an air cylinder, and can contact terminals on separate sides that are on different geometrical planes. Alignment is done manually while position verification is done through a CCD camera monitor.
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TMPB-60-512 -
Taiyo Industrial Co., Ltd.
The TMPB-60-512 is for checking panels from 2.2 to 3.5 inches that have contact terminals on the plane opposite to the display panel. Accurate alignment is possible by using a micrometer for adjusting the X, Y, and θ axes. Features an overdrive mechanism, and may be loaded with a CCD camera and backlight for position recognition.
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MICRONICS JAPAN CO.LTD.
Full Automatic Wafer Prober. Semi Automatic Wafer Prober. High Current Probe Block. 6-inch Manual Prober. 8-inch Manual Prober. 12-inch Manual Prober.
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Prexa MS -
Tokyo Electron Ltd.
The latest fully automated 300mm wafer prober for memory devices. Featuring high rigidity and exceptional thermal control, the system enables full-wafer contact testing.
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Prexa -
Tokyo Electron Ltd.
The latest fully automated 300mm wafer prober. The system offers excellent productivity and advanced functions, contributing to KGD (known good die) testing for advanced packaging.
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Precio octo -
Tokyo Electron Ltd.
200mm wafer prober. The system adapts ultra-high speed indexing and high-speed wafer exchange functions to reduce test cost and improve overall equipment effectiveness (OEE) markedly enhancing productivity.
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Precio XL -
Tokyo Electron Ltd.
Fully automated 300mm wafer prober. The system achieves high productivity, excellent contact performance, improved cleanliness, and short lead time, and offers a number of high value-added functions as options.
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Flying Fixture -
Yamaha Fine Technologies Co., Ltd.
Industry-standard testing machines for electronic circuit boards achieving high productivity and contact accuracy simultaneously. The pass rate and throughput greatly affect the productivity in the electrical testing process of circuit substrates. While improving both of these has proven difficult using the existing fixture method or flying method, Yamaha's Flying Fixture™ method has solved this.
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QTOUCH1202C -
Qmax Test Technologies Pvt. Ltd.
he Prober Test System is capable of movement in XYZ directions with fixed angle (θ) and dual probe heads (further expandable up to 4 ) . The system has in-built Vision Camera for easy monitoring of probe needle contact.The prober supports automatic fiduciary recognition. The system has built –in linear encoders to achieve higher precision. It also comes with in-built image processing unit with minimum 5 Mega pixel Camera ,tele-centric lens with image processing software, illuminated with LED bar light with controls.The V-I signature test shall be in-built in the Prober system with “ Best fit Curve “ algorithm .Provision for adding various external Test & Measurement instruments like GPIB / USB / PXI Instruments is available.
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WDF 12DP+ -
Tokyo Electron Ltd.
The WDF 12DP is a prober/handler capable of transporting and testing standard 300-mm wafers and dicing frames without need of a changeover kit. To support multiple tests after dicing, it has a special positioning function that differs from former types, as well as image-processing functions such as wafer level packaging.
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PN-300 -
Tokyo Electron Ltd.
The Wafer Prober Networking System PN-300 utilizes a database to facilitate data access from other systems and provides an environment that enables the user to edit data and handle processing. The system achieves wide-ranging compatibility by adopting standard hardware and operating system. In addition, it is equipped with an N-PAF (Network-based Prober Advanced Function) to provide robust support for wafer prober operation and maintenance.