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Passive Probe
PP011-1
Passive probes are the standard probe provided with most oscilloscopes. Typical passive probes provide a 10:1 attenuation and feature a high input resistance of 10 MΩ. This high input resistance means that passive probes are the ideal tool for low frequency signals since circuit loading at these frequencies is minimized. Passive probes are designed to handle voltages of at least 400V, some as high as 600V. Teledyne LeCroy passive probes feature an attenuation sense pin which tells the oscilloscope to scale the waveforms automatically requiring no user input.Each passive probe is recommended for a certain oscilloscope, using the right passive probe with the right oscilloscope means that the probe will be properly compensated across the entire bandwidth. Using probes with a different oscilloscope will only let you compensate for low frequencies.
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Probe Cards
Vertical Probe Card. (Mobile D-RAM, L.D.I Flip Chip 60um Pitch,. System LSI, Soc Devices). Cantilever Probe Card. Low Leakage Probe Card.
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Probe Holders
Probe holders from ZEISS offer the possibility to use optical and tactile scanning probes on one CMM. With the articulating probe holder even complex parts can be measured with less effort.
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Passive Probes
Passive voltage probes ship standard with most oscilloscopes and provide a low cost, general purpose probing solution. Generally, these probes lack the performance of an active voltage probe but provide the ruggedness and wide dynamic range suitable for visualizing signals over a broad range of applications. Tektronix has released a new class of passive probes that redefine performance in the passive probe product category.
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Probe Cards
PICOPROBE® PROBE CARDS by GGB Industries, Inc., allows for more chip design flexibility because each probe card is custom configured to your circuit for testing wafers on either manual or automatic probe stations. Probe cards with complex layouts consisting of numerous DC contacts and multiple microwave probes with operating frequencies of 40, 50, 67, or 110 GHz can be custom fabricated quickly and inexpensively.
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Waveguide Probes
We are a leading Manufacturer & Exporter of Waveguide Probes such as Tunable Probe and Waveguide Matched from India.
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Specialty Probes
Upgraded "bare" versions of our probes for space-saving installation into oil (or SF6) tanks are now available. These probes are similar to the VD series probes with somewhat lower accuracy at a somewhat lower cost. When installing these probes some information about the surrounding areas is required. The length of a VD-120 bare probe (120 kV) is 0.35 m. These units are threaded and can therefore be stacked into higher voltage units. The VD-60 and VD-120 are offered at 60 kV and 120 kV respectively. The bare probes are now available for use in air, but only at 60 and 1120 kV sizes.
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Passive Probes
Passive probes are the standard probe provided with most oscilloscopes. Typical passive probes provide a /10 attenuation and feature a high input resistance of 10 MOhm. This high input resistance means that passive probes are the ideal tool for low frequency signals since circuit loading at these frequencies is minimized. Passive probes are designed to handle voltages of at least 400 V, some as high as 600 V. Teledyne LeCroy passive probes feature an attenuation sense pin which tells the oscilloscope to scale the waveforms automatically requiring no user input.
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Oscilloscope Probes
Teledyne LeCroy has a wide variety of world class probes and amplifiers to complement its product line. From the ZS high impedance active probes to the WaveLink differential probing system which offers bandwidths up to 25 GHz, Teledyne LeCroy probes and probe accessories provide optimum mechanical connections for signal measurement.
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Gaussmeter Probes
2100
Magnetic Instrumentation manufactures Hall Effect Probes in a wide range of styles and sizes. Probes are supplied with magnetic, electrical, temperature stability and calibration data for each measurement range. Probe are supplied with flash memory and a temperature sensor that allow the 2100 Gaussmeter to correct for Hall Element inaccuracies due to temperature change. Probes are supplied with a NIST traceable Certificate of Calibration and test data.
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Contact Probes
Rika Denshi Group Contact Probes - specialty probes including fine pitch testing, high frequency testing, high temperature testing, kelvin test, and high current test, as well as standard probes for 0.4mm-, 0.5mm-, 0.65mm-, 0.8mm-, and 1.0mm pitch.
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Gold Probes
4900 Series
The "GOLD PROBE" has been designed specifically for use with Tektronix, Hewlett Packard and other high performance oscilloscopes. This new slim design along with a host of versatile accessories, allows you to reach the most difficult test point in today's highly complex circuitry. The gold plated Probe Tips, Sprung Hook, Ground Lead, Alligator Tip and other critical interconnect points within the Gold Probe, provide excellent contacts for probing low level analog signals and high speed digital data. Unlike most "off shore" commodity probes, Probe Master guarantees quality and continuing domestic support for our "Made in America" Gold Probe.
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Probes And Accessories
Choose from a broad portfolio of Tektronix probes and accessories, all perfectly matched to our industry-leading oscilloscopes. With over 100 choices available, select the oscilloscope probe you need for your specific testing application. Download our Probe Selector Guide here.
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Probe Card
T90™ Series
The 90 mm tile was designed for mounting on a standard 4.5″ probe card holder for multi-site wafer level reliability testing. The 1.6 mm (0.062″) thick rails allow the chassis to slip into planarity adjustable probe card holders for most analytical probe stations.
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Energy Probes
RjP-600 Series
The RjP-600 Series energy probes integrate the detector and preamplifier in the same enclosure, thereby maximizing signal integrity between the detector and preamplifier. This permits longer cable runs between the probe and instrument, as is often necessary in production environments. Probe specific information, like calibration date and wavelength response curves, is stored in the probe for access by the instrument. Other features include interchangeable filter holders and ¼-20 mounting hole.
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Probe Cards
U-Probe for Multi-die Test of Memory IC. Vertical-Probe Needle Type Probe card suitable for multi-die test of devices with peripheral pads. ertical-Probe Spring Type. Probe card suitable for area array pad test. 64DUTs Multi-Die. Probe Card for RF devices. Fine Pitch.
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Probe Card
Japan Electronic Materials Corp.
The probe card is a tool for testing semiconductors used at "Wafer Test" to check quality of IC or LSI in the first process of semiconductor manufacturing. The probe card is expendable.
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Analyzer Probes
The following probes are available for the MA51x0 and MA41x0 series analyzers. These probes are designed for low-voltage and high-speed midbus probing or probing with an interposer. The following JEDEC memory standards are widely used by these probes: DDR5 (JESD79-5), DDR4 (JESD79-4), DDR3 (JESD79-3), LPDDR5 & LPDDR5X (JESD209-5), LPDDR4 & LPDDR4X (JESD209-4), and LPDDR3 (JESD209-3).
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Energy Probes
RjP-400 Series
The RkP-400 Series probes consist of a compact detector assembly, or head, and a preamplifier housed in a separate enclosure. The external dimensions of all the 400 Series Probes are the same, with identical detector planes, allowing for easy interchange of probes in an experiment. The heads have both ¼-20 and M6 tapped holes, a built-in 1" (25mm) filter holder, and a side-mounted BNC connector. Probe specific data, including spectral response curves and calibration dates, is stored in the preamplifier for access by the instruments.
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Power Probes
RkP-400 Series
The RkP-400 Series probes consist of a compact head containing the detector and a preamplifier housed in a separate enclosure. The external dimensions of all the 400 Series Probes are the same, with identical detector planes, allowing for easy interchange of probes in an experiment. The heads have both ¼-20 and M6 tapped holes, a built-in 1” (25mm) filter holder, and a side-mounted BNC connector. Probe specific data, including spectral response curves and calibration dates, is stored in the preamplifier for access by the instruments.
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Logic Probes
Logic probes allow you to capture signals using the logic portion of a mixed signal instrument. Yokogawa offers low and high voltage, isolated and non-isolated logic probes.
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Current Probes
Current probes allow you to measure DC or AC current. Yokogawa's selection of current probes allow measurements ranges up to 500 ARMS and bandwidths up to 100MHz.
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Hall probes
Axial, transverse, multi-axis, and tangential Hall probes for measuring magnetic flux density. Choose from a wide range of lengths and thicknesses—probes are also available for cryogenic applications.
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Current Probe
DCP-BTA
Vernier Software & Technology, LLC
The Current Probe measures DC and low-frequency AC currents up to 600 mA. Use Current Probes in combination with Differential Voltage Probes to investigate Ohm's Law and explore series and parallel circuits. The 0.1 shunt resistor minimizes changes to your circuit. If currents will exceed 1 A, use the High Current Sensor.
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Microscopic Probes
M12PP
CAPRES M12PP Microscopic Twelve-Point Probes are specialized versions of the CAPRES Micro Multi-Point Probes. By using a dedicated 12-by-4 multiplexer, a total of 495 different pin-configurations can be obtained, each with different probe pitch. This is utilized in e.g. the CIPTech, where 8 or more combinations are used to obtain a “depth profiling” of the measured structures.