Showing results: 301 - 315 of 2826 items found.
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Teledyne LeCroy
Differential active probes are like two probes in one. Instead of measuring a test point in relation to a ground point (like single-ended active probes), differential probes measure the difference in voltage of a test point in relation to another test point
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69600 -
Lisle Corp.
Kit includes 14 flexible test probes, long straight probe, piercing back probe, crocodile clip, 4mm circuit tester adapter and Deutsch spooned probe. The probes are designed to be used on popular Weather-Pack, Metri-Pack and Micro-Pack style connectors. The test probes are 5" in length and are flexible to help eliminate damage to the connector terminals that can result from testing with a standard test probe. The 4mm adapter allows conversion of some circuit testers to a 4mm banana connector, which provides a better connection. Kit comes in a pouch for storage.
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Picoprobe
The PICOPROBE® DUAL MICROWAVE PROBE consists of two separate probes mounted on a single holder. One probe is fixed to the holder; the other is adjustable. Each probe may be individually configured with GSG, GS, or SG footprints having any fixed pitch from 50 to 2540 microns. The probe to probe (signal to signal) spacing is user adjustable over a 4000 micron (160 mil) range. When ordering, an initial signal to signal spacing should be specified (up to .75 inches).
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NCI Logic Analyzers
Three probe types are available for GoLogicXL logic analyzers: flying leadset, Mictor, and Pinpoint probes. The Mictor and Pinpoint probes are compatible with similar Keysight/Agilent "soft touch" and Tektronix "connectorless" probes. All GoLogicXL probes are coaxially shielded and use passive termination inputs to prevent loading the device under test. Both differential and single-ended input signals are supported by all probes. Input voltage swings small as 300 mV are supported in single-ended mode, and 150 mV for differential signals.
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Extech MO290-P -
Extech Instruments Corporation
The MO290-P is a Moisture Pin Probe for use as spares or replacement probes with select Extech Moisture Meters (MO290/MO295/MO297/MO300). Includes two durable, sharp, 0.4" (1cm) length pins assembled on probe.
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CryoPro -
Materials Development Corporation
The MDC Model 441 Cryogenic Probe Station is a cost effective alternative to high-priced vacuum based cryogenic probe stations. With up to five probes available and sample diameters up to six inches, the MDC Cryogenic Probe Station allows for electrical measurements at temperatures near liquid nitrogen levels (77K).
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Anteral S.L.
Anteral has extensive background in the design of Near Field Probes (open ended waveguides probes). Our Near Field Probes are currently being used in several laboratories around the world including the ESA's anechoic chamber. Anteral designs Near Field Probes from 10 GHz to 750 GHz covering the sectors requirements. Moreover, our Near Field Probes have a sharped design minimize reflections.
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Extech RH550-P -
Extech Instruments Corporation
The Extech RH550-P is a spare/replacement Humidity and Temperature Probe for the RH550. The probe can either be clipped directly onto the tablet (RH550) or attached to a cable (RH550-C) to measure humidity and temperature. Field-replaceable probe does not require recalibration.
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Dynamic Test Solutions
DTS offers both generic and custom PCBs blanks for probe cards. Probe card PCBs are available for all tester platforms and can be configured for any vertical technology, epoxy cantilever and legacy blade cards. DTS probe card blanks are made to precise specifications required for all probing technologies and are available in high speed and high temperature materials. All probe card PCBs employ a balanced layering construction to maintain tight flatness specifications and minimize warping, allowing good probe planarity. Gold plating on all surface metals facilitates easy soldering and minimizes probe resistance. DTS is continually adding new probe card blanks to its library!
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Teledyne LeCroy
Transmission line probes are a special type of passive probe designed for use at very high frequencies. They replace the high impedance probe cable found in a traditional passive probe with a precision transmission line, with a characteristic impedance that matches the oscilloscope input (50 Ohm). This greatly reduces the input capacitance to a fraction of a picofarad, minimizing the loading of high frequency signals. A matching network at the tip increases the DC input resistance. While they have lower DC input resistance than a traditional passive probe (usually 500 Ohm) to 1kOhm), the input impedance of these probes remains nearly constant over their entire frequency range. A traditional /10 passive probe will have a 10 MOhm) input impedance at DC, however this impedance drops rapidly with frequency, passing below the input impedance of a transmission line probe at less than 100 MHz.
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Schwarzbeck Mess Elektronik
Nearfield Probe Set includingHFSL 7101 Active Near Field Probe (magnetic), 9 kHz - 30 MHzHFSH 7102 Active Near Field Probe (magnetic), 4 MHz - 1000 MHzEFS 7103 Active Near Field Probe (electric), 9 kHz - 1000 MHzand Separator EW 7110 and AC/DC adaptor ACDC 7110 in storing case
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B3 -
Nidec SV Probe Pte. Ltd.
The patent-pending B3™ structure requires a minimum number of parts and can handle up to 300 probes. This vertical technology can provide: • Increased Uptime • Extended Probe Lifetime • Reduced Maintenance • Lower Cost of TestThe B3™ is an ideal solution for testing small pads and the low force probes minimize scrub. Planarity also remains stable over time increasing probe card life. Contact your sales representative to learn more about our B3™ probe cards.
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SST-2 -
Physitemp Instruments
The SST-2 skin surface temperature probe for humans, with convenient plastic handle. Probe re-useable and has a fast response time.
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Instec, Inc.
INSTEC's Probe Systems offer an integrated solution for performing component-level electrical measurements over a wide temperature range.Compact Mini Probe Stages enable an existing inspection microscope or optical test setup to be converted easily into a precision temperature-controlled semiconductor testing and qualification station.Analytical probe stations are fully featured industry-standard platforms for all modern probing applications and testing.Benchtop Probe Stations provide the user with four independent electrical probes with X,Y,Z micropositioning for precise placement without opening the sample chamber.Highly configurable probe systems meet a range of requirements for atmospheric and temperature control, sample areas, and electrical measurements.
