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Voltage Probe
KHZ43201
Beijing KeHuan Century EMC Technology Co,.LTD
The KHZ43201 voltage probe is a standard low resistance test probe, which meets the technical requirements for this product in the CISPR16-1 and CISPR14-1 test equipment. When measuring the interference voltage of the power grid, the artificial power supply network cannot be used at the load port, and sometimes it is necessary to use a voltage probe to measure the interference of the signal port, the load port, and the antenna port. The input impedance of the voltage probe to the ground wire is greater than 1.5KΩ, which can protect the input terminal of the receiver.
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Probe Card
VC20E Series
The 20mm VC20 is a highly adaptable probe card solution for a wide variety of tests including Modeling & Characterization, Wafer Level Reliability or Parametric Test. It can be easily combined with different interfaces to create modular probe cards supporting Keithley, Keysight or other custom tester platforms. Probes can be configured in either single or dual layer.
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Oscilloscope Probe
An oscilloscope probe establishes a physical and electrical connection between a test point or source and an oscilloscope; in fact, an oscilloscope probe is a type of device or network that connects a signal source to an oscilloscope input.
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Transducers and Probes
Olympus NDT probes and transducers are high-quality inspection equipment available in a range of frequencies, configurations, connection styles, and cable types. All our probes and transducers are lightweight but solidly constructed.
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Power Probes
RkP-500 Series
The RkP-500 Series probes take advantage of synchronous detection (chopper/lock-in amplifier) technology to offer unparalleled background noise rejection, S/N ratio, and sensitivity. Total power, average power, and irradiance can be measured. The probes can be mounted directly onto the Rk-570C Optical Chopper to form an integrated measurement system, or the chopper can be operated remotely from the probe.
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TDR Probe
TDP Blade Probe
The TDP Blade Probe enables fast and convenient TDR measurements and debugging. The BladeProbe tips are made from strong and rigid beryllium copper blades for handheld and probe station probing. The passive probe can be used to measure impedance, clock jitters, and skews. The TDP BladeProbe series can be connected to TDR, high performance scopes, and vector network analyzers.
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Probe Card
VC43™/VC43EAF™
VC43™/VC43EAF™ probe cards offer a larger format version of the popular VC20. In addition to saving time, another advantage of the modularity is the ability to leave the interface in place and simply install the VC43™ topside using Celadon’s twist and lock insertion tool which minimizes the possibility of triboelectric or interconnect issues that can occur during typical probe card changes. The VC43™ can be used for production parametric test, modeling, characterization, and wafer level reliability testing. Cards can be configured up to 104 probes in either single or dual layer with near vertical probes to minimize scrub lengths on pads allowing the VC43s to probe pads as small as 30 microns.
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Coaxial Probes
Smiths Interconnect offers the industry's most extensive line of high reliability coaxial probes. Our coaxial probes provide a low noise, controlled impedance signal path with reliable and easy connect/disconnect options.
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Active Probe
This probe is designed to help auto-technicians in troubleshooting electrical circuits. Apart from using the normal multi-tester, this probe can be used in conjunction with it by providing additional functions to assist in diagnosing electrical or components faults or failures in the vehicle.
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Logic Probes
Logic probes are used to analyze the logic states (high/true: logic 1 or low/false: logic 0) of digital signals. To verify and debug today’s high-speed, low-voltage digital signals, you need logic probes that can accurately acquire signals from a wide variety of electronic designs, while protecting signal fidelity. Tektronix logic analyzer probes contain a variety of connectivity options that are engineered to ensure that signal acquisition is a true reflection of your design's performance. Compare and learn more about Tektronix logic analyzer probe solutions below.
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Differential Probe
With signals becoming faster, and power supply voltages going lower, these active differential probes will allow floating measurements from 100uVolts to as high as 7000 volts. These probes provide high CMRR and a broad frequency range.
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Probe Kits
United Western Technologies Corp
UniWest Eddy Current probe kits combine multiple tools used in different NDT applications into one kit. Each field or airframe inspection kit provides all the probes you need for adequate testing.
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Power Probes
RkT Thermopile Series
The RkT Series thermopile power probes are ideal for measuring Nd:YAG, CO2, and other mid-power lasers. The probes are designed to withstand average power densities up to 20kW/cm2 (15MW/cm2 peak pulse power density). The flat UV to far-IR spectral response allows the probes to measure broadband sources as well. Measure the power of cw sources or the average power of sources pulsed at 5Hz or greater.
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Probe Holders
Model P7
Made from 300 series stainless steel, the P7 probe holders accept all model 407 replaceable probe tips, and are secured with a set screw. When used with the P7 Tool Holder Adapter Arm; “Z” position adjustments are easy, and can accommodate a variety fixtures and probe card holders. Designed for both high temperature (-65 to 300°C) and high electrical isolation measurements.
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Differential probe
DP3000 Series
A “differential” probe is an active probe which has two inputs, one positive and one negative as well as a separate ground lead and it drives a single terminated 50Ω cable to transmit its output to one oscilloscope channel
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Scanning Probes
3D Laser Scanning Probes for your existing CMM are options for full-time or part-time use. Laser Design’s broad range of scanning probes ensures a perfect fit between the scanner and the size and detailed features of your parts.