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See Also: Test Probes, Microprobes, Test Point


Showing results: 526 - 540 of 2824 items found.

  • Flying Probe Tester

    Pilot 4D V8 - SEICA SpA

    The Pilot 4D V8 represents the latest frontier in flying probe test technology; it is the complete solution for those who want maximum performance: the highest test speed, low to medium volume, test coverage and flexibility, for prototyping, manufacturing, or repairing any type of board. Its vertical architecture is the optimum solution for probing both sides of the UUT simultaneously.

  • Probe Card Solutions

    Translarity

    Advanced engineering solutions are required to meet increasing challenges for wafer test, driven by today’s rapid technology acceleration. Translarity offers probe card solutions for the global semiconductor and packaging test industries, tailored to customer specifications. The company’s IP portfolio, design capabilities, innovative products, and reputation for quality, reliability and customer support ensure the right solution for your testing requirements.

  • Optical Voltage Probe

    400-02 - Srico, Inc.

    Srico’s optical voltage probe uses advanced, proprietary optical chip technology to achieve precise, interference-free measurement. Our sensor and optical fibers are made of dielectric materials. This facilitates a high degree of isolation between the voltage test point and the instrumentation system ⎯ at a safe distance of 100 meters and more. This system senses, measures, and transmits electrical data very accurately.

  • Logic Analyzer Probe

    FS2600A - FuturePlus Systems

    The FS2600A is our newest and fastest logic analyzer probe used to test DDR5 RDIMM and LRDIMM memory. It is designed to work exclusively with 4 Keysight U4164A logic analysis modules operating in either Quad Sample State or Quarter Channel 10GHz timing modes. This gives the user an extremely effective tool for debugging, testing and verifying DDR5 RDIMM/LRDIMMs and DDR5 Memory Channels.

  • PCIe mid-bus probe

    U4322A - Keysight Technologies

    Keysight's PCIe 3.0 analyzer uses Keysight's unique ESP (Equalization Snoop Probe) technology, with the ability to tune the equalization algorithm used according to the type of channel the analyzer is monitoring. This ensures that the data captured in the analyzer is exactly what is on the wire. Without this capability, at 8GT/s, there is a high likelihood of misrepresentation of the data on the bus, which can lead to wasted hours, if not days in the validation cycle.

  • Stationman Speaker Probe

    250 SSP - Aines Manufacturing Corp.

    This probe is designed for those technicians that want the best tool available. The Model 250SSP is supplied with a cone-shaped tip and a duckbill tip that is longer and flatter, permitting insertion into larger cables, or cables under tension where slack cannot be obtained. Another feature is the built in speaker for audio without the need for a butt set or headset. The speaker is operated by a slide switch that has a "lock" position for continuous monitoring.

  • Flying Probe Tester

    Condor MTS 505 - Digitaltest GmbH

    Primarily the Flying Probe Tester was developed to enable In-Circuit testing (ICT) of prototype PCBs. For testing a new design an existing fixture has to be changed or a new fixture has to be procured. The fixtureless design of the MTS 505 Condor is one of its most attractive properties, where the unnecessary and costly time delays incurred for fixture build or changes can be avoided. It is the ideal platform for testing prototypes.

  • Digital Inspection Probes

    DI-1000 - Lightel Technologies, Inc.

    The ergonomically designed DI-1000 is Lightel’s all digital video microscope probe. It connects directly to your PC through the computer’s USB2.0 port. Featuring easy single finger focusing, a built-in image freeze/capture button, and detectable resolution to 0.5µm, the DI-1000 package includes our free ConnectorViewTM (standard) software, providing digital zoom, image display, image capture, auto-calibration and basic analysis tools.

  • DDR4 MSO Probes

    FuturePlus Systems

    The DDR4 DIIM and SO-DIMM Mixed Signal Interposers connect Address, Command and Control signals of a DDR4 bus to the Keysight V-Series Oscilloscopes with the MSO option. These interposers also provide accessibility to DDR4 signals for convenient analog probing. The user can then easily observe both the digital and analog representation of the DDR4 Address, Command and Control bus. Solder down N5541A analog probes purchased separately from Keysight Technologies.

  • DDR3 MSO Probes

    FuturePlus Systems

    The DDR3 DIMM and SO-DIMM Mixed Signal Interposers connect Address, Command and Control signals of a DDR3 bus to the Keysight V-Series Oscilloscopes with the MSO option. These interposers also provide accessibility to DDR3signals for convenient analog probing. The user can then easily observe both the digital and analog representation of the DDR3 Address, Command and Control bus. Solder down N5381B analog probes purchased separately from Keysight Technologies.

  • Trace Data Probe

    SuperTrace Probe - Green Hill Software, Inc.

    Green Hills Software's SuperTrace Probe v3 can capture up to 4 GB of trace data at clock speeds up to 1.2 GHz (trace port speeds over 300 MHz). These capabilities combine with the TimeMachine Debugging Suite of trace analysis tools to enable you to: Fix bugs faster, Optimize with ease, Test with confidence. Captures up to 4 GB of trace data, enabling analysis of hundreds of millions of instructions

  • Logic Analyzer Probe

    FS2520 - FuturePlus Systems

    The FS2520 is our newest and fastest logic analyzer probe used to test DDR4 DIMM memory. It is designed to work exclusively with 3 Keysight U4164A logic analysis modules operating in either Quad Sample State or Quarter Channel 10GHz timing modes. This gives the user an extremely effective tool for debugging, testing and verifying DDR4 DIMMs running above 4000MT/s. It’s like having a 100 channel scope.

  • Probes, Cables & Detectors

    Arrow Tech

    Probe has a mica window that has a thickness of 1.8 to 2.0 mg/cm2. This allows detection of alpha radiation as low as 3.0 MeV when in close proximity to the window. Beta radiation in excess of 35 keV and X-ray or gamma radiation greater than 6 keV can also be deteched. The detector is provided with a BNC connector. It can be used with most count rate and survey meters which accept Geiger Mueller (GM) detectors operating at 900V DC.

  • Scanning Probe Microscopy

    SPECS Surface Nano Analysis GmbH

    As Scanning Probe Microscopy (SPM) is a key tool for nanotechnology, SPECS offers dedicated solutions for highly demanding requirements.In UHV, strong emphasis lies on spectroscopic methods such as scanning tunneling spectroscopy and inelastic tunneling spectroscopy as well as single atom and molecule manipulation. With the invention of a Joule-Thomson cryostat by Prof. Wulf Wulfhekel, SPECS now offers the JT-STM , operating sample and sensors in thermal equilibrium below 1K with optional high magnetic field.

  • WiFi Oscilloscope Probe

    IkaScope - Ikalogic s.a.s.

    IkaScope is a wireless oscilloscope probe. It fits perfectly in your hand and works with any connected screen, like a laptop, a tablet or smartphone. Thanks to ProbeClick® technology, IkaScope knows when to measure and when to hold. IkaScope transfers measured signals over high speed wifi connection. 200 MSa/S Sampling rate. 30 MHz Bandwidth. 80 Vpp Input range. AC/DC Coupling. 4000 ptsMemory. 200 FPS Max. refresh rate.

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