Showing results: 721 - 735 of 2826 items found.
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1132B -
Keysight Technologies
Provides extremely low input capacitance, flat frequency response, and patented resistor probe tip technology.
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1131B -
Keysight Technologies
Provides extremely low input capacitance, flat frequency response, and patented resistor probe tip technology.
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CX1151A -
Keysight Technologies
The CX1151A is an adapter for passive probes for the voltage waveform measurements by the CX3300 series Device Current Waveform Analyzer.
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Four Dimensions, Inc.
Our four point probes measure the sheet resistance / resistivity / thickness of a wide variety of materials including group-IV semiconductors, metals, and compound semiconductors, as well as new materials found in flat panel displays and hard disks. We offer a wide range of models, options, and probe heads to suit your materials', measurement, and budget needs.
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Extech TL620 -
Extech Instruments Corporation
The Extech TL620 is a 200 MHz, 10:1 Oscilloscope Probe with a 1.2 meter cable. It features a 10 M ohm input impedance, 20 pF Capacitance, max voltage of 600 V, and 15 pF to 40 pF compensation range. Includes probe tip, ground lead, marker ring, sprung hook, and adjustment tool.
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RET-5 -
Physitemp Instruments
The RET-5 Rectal Probe for very small animals (neonatal mice). Flexible polyurethane sheath with smooth rounded tip.
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CM460 -
Signatone Corp.
CM460 Semi-automatic 150mm probe station step & repeat, point & shoot, color mapping, and complete software control.
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TP32MTT.03.B -
Delta OHM S.r.L.
Temperature probe with two 4-wire Pt100 1/3 DIN sensors for measuring the soil and air temperature (± 50 mm).
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TPA-95 -
High Power Pulse Instruments GmbH
*Flexible pulse force, pulse sense combined TLP probe arm kit based on TPA-95L and TPA-95R*Compatible with typical standard micropositioner mechanical interfaces*4.7 kΩ pulse sense voltage divider, which results in a voltage transfer ratio of (4700 + 50)/50 = 95 : 1 into 50 Ω*Variable probe pitch configuration*1 m flexible 50 Ω cables with SMA connector for pulse sense*0.1 m flexible 50 Ω cables with SMA connector for pulse force*Tungsten probe tips*Can be used for chuck backside grounded TLP measurements
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Celadon
Over the last 20 years the Celadon Engineering team has developed an expertise in cryogenic materials which has resulted in a solid reputation in the industry for producing extremely stable cryogenic on-wafer probe cards as well as DUT probing solutions. These Cryogenic probe cards have all the benefits of Celadon’s Crash Resistant™ probe technology but with the ability to probe as cold as humanly possible. Celadon’s cryogenic solutions vary from standard VersaTile™ footprints which interface to positioners to innovate custom PCB based designs to allow for flexibility when testing at these very cold temperatures. Lakeshore cryogenic wire is used in standard DC solutions for high density cable-out designs to support high pin count applications. During the development process, Celadon works closely with the cryogenic prober vendor to ensure the integrated solution is optimized for current and future testing needs.
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MP-50 -
FRANKONIA GmbH
The Current Monitoring probes may be used whenever RF current measurements are required. Current measurements are made by placing a current carrying conductor within the “sensing” window of the probe and measuring the probe’s output voltage with an RF detector. Calibration of the probe permits the conversion of the voltages measured to current. Current measurements can be made over the frequency range shown in the transfer impedance curve furnished with each probe. There is virtually no loading of the circuit and the technique permits normal operation of the device under test during measurements. The MP-50 can be used for the procedure for clamp injection when the common- mode impedance requirements cannot be met given in chapter 7.4 of IEC/EN 61000-4-6 „Immunity to conducted disturbances, induced by radio frequency fields”. The MP-50 can also be used as current monitor for BCI testing as per ISO11452-4, RTCA/DO-160 section 20, MIL-STD-461 and various automotive standards.
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CX-75 -
Shenzhen Chuangxin Instruments Co., Ltd.
The Finger Nail Probe is indicated test IEC60335 and UL requirements. Used to check the security of parts that snap together. The spring gauge assembled in the handle can be calibrated to the neccessary force for using the instrument. This probe is make of stainless steel with appropriated hardened tip and a handle in insulating material. Handle has a special adaptor M5 for use with 50N force gauges.
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CX-Z12 -
Shenzhen Chuangxin Instruments Co., Ltd.
The Finger Nail Probe is indicated to test IEC 60335 and UL requirements. Used to check the security of parts that snap together. The spring gauge assembled in the handle can be calibrated to the necessary force for using the instrument. This probe is made of stainless steel with appropriated hardened tip and a handle in insulating material. Handle has a special adaptor M5 for use with 50N force gauges.
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Renishaw Inc.
A range of fixed and manually adjustable heads that connect a touch-trigger probe to the machine quill, allowing flexible inspection of complex components.
