Showing results: 61 - 75 of 2825 items found.
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KHZ43201 -
Beijing KeHuan Century EMC Technology Co,.LTD
The KHZ43201 voltage probe is a standard low resistance test probe, which meets the technical requirements for this product in the CISPR16-1 and CISPR14-1 test equipment. When measuring the interference voltage of the power grid, the artificial power supply network cannot be used at the load port, and sometimes it is necessary to use a voltage probe to measure the interference of the signal port, the load port, and the antenna port. The input impedance of the voltage probe to the ground wire is greater than 1.5KΩ, which can protect the input terminal of the receiver.
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VC20E Series -
Celadon Systems, Inc.
The 20mm VC20 is a highly adaptable probe card solution for a wide variety of tests including Modeling & Characterization, Wafer Level Reliability or Parametric Test. It can be easily combined with different interfaces to create modular probe cards supporting Keithley, Keysight or other custom tester platforms. Probes can be configured in either single or dual layer.
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Matrix Technology Inc.
An oscilloscope probe establishes a physical and electrical connection between a test point or source and an oscilloscope; in fact, an oscilloscope probe is a type of device or network that connects a signal source to an oscilloscope input.
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Evident Scientific
Olympus NDT probes and transducers are high-quality inspection equipment available in a range of frequencies, configurations, connection styles, and cable types. All our probes and transducers are lightweight but solidly constructed.
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RkP-500 Series -
Laser Probe Inc.
The RkP-500 Series probes take advantage of synchronous detection (chopper/lock-in amplifier) technology to offer unparalleled background noise rejection, S/N ratio, and sensitivity. Total power, average power, and irradiance can be measured. The probes can be mounted directly onto the Rk-570C Optical Chopper to form an integrated measurement system, or the chopper can be operated remotely from the probe.
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TDP Blade Probe -
PacketMicro Inc.
The TDP Blade Probe enables fast and convenient TDR measurements and debugging. The BladeProbe tips are made from strong and rigid beryllium copper blades for handheld and probe station probing. The passive probe can be used to measure impedance, clock jitters, and skews. The TDP BladeProbe series can be connected to TDR, high performance scopes, and vector network analyzers.
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VC43™/VC43EAF™ -
Celadon
VC43™/VC43EAF™ probe cards offer a larger format version of the popular VC20. In addition to saving time, another advantage of the modularity is the ability to leave the interface in place and simply install the VC43™ topside using Celadon’s twist and lock insertion tool which minimizes the possibility of triboelectric or interconnect issues that can occur during typical probe card changes. The VC43™ can be used for production parametric test, modeling, characterization, and wafer level reliability testing. Cards can be configured up to 104 probes in either single or dual layer with near vertical probes to minimize scrub lengths on pads allowing the VC43s to probe pads as small as 30 microns.
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