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Luminance Probe
LP471LUM2
Photometric probe for measuring the LUMINANCE, spectral response according to the photopic curve, angular field 2°.
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Probe Station
S-1160
S-1160 Probe Station 100mm, 150mm and 200mm wafer stage's completely manual and user friendly.
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Vane Probe
AP472S2
Vane probe ∅ 60 mm with handle to measure air speed in the range 0.5…20 m/s.
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Battery Probes
Offer a wide range of terminations for SMT, PTH or double-ended probes for simplified hardware mount solutions.
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Contact Probes
We offer a wide range of contact probe varieties and make it possible to have the optimal fit for each specific contact-making task. Our proximity to the market and customers, as well as our many years of experience in constructing and producing spring contact probes, form a strong basis for functional, innovative, and economical products.
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Probe Cards
Direct Dock
Direct dock style wafer probing allows for a higher bandwidth, increased pin density and testing more devices in parallel. Direct dock probe cards also support the growing movement of traditional final test to wafer probe which allows for known good die (KGD) and reduced cost of ownership.
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Probe Station
EPS1000
Reasonable price and compact design. - Sellectable chuck size : 4inch, 6inch, 8inch when ordering probe station. - Hot chuck can be installed. Temp range: RT ~ 300°C - Hot and cool chuck from 0 °C ~ 300 °C can be provided. - Maximum pcs of manipulators can be installed on the base unit of probe
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Rakes and Probes
AEI offers industry leading aerothermal rake and probe design and manufacuring. Aerodyn's unique combination of extensive in-house capabilities and close-knit structure allows challenging and time pressured rake and probe jobs to be handled. AEI welcomes anything from simple make-to-print jobs to elaborate design/fabricate/proof test projects.
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Irradiance Probe
LP471RAD
Radiometric probe for measuring the IRRADIANCE in the spectral range 400 nm…1050 nm, cosine correction diffuser.
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Probe Stations
PSI's 600LS Series Probe Station is designed to exceed performance metrics of equipment priced significantly higher.
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UV Probe
UV Probe
UV probe to monitor UV intensity in UV application system by using UV lamp and UV LED.
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Voltage Probe
VOL-PBE
• EMI Receiver equipped with voltage probe can test disturbance voltage from load terminals or control terminals
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Temperature Probe
DLTP6
Replacement Stainless Steel Temperature probe for LTT Data Logger6' cable with 4" stainless steel sensor
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Step Probes
*Precisely controlled probe travel*Step tip geometry*Replaceable and non-replaceable versions*Plating options available
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Probe Adapters
Probe adapters provide simple and easy interface of third-party probes as well as change between the different Teledyne LeCroy Oscilloscope input and cable types (ProBus, ProLink, K/2.92 mm, BNC and SMA). Depending on the adapters, changing between the Teledyne LeCroy Oscilloscope's input type may have an effect on the overall performance of the channel.
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Probe Card
VersaTile™
Celadon has reduced the size of a probe card to 28mm with the VersaTile™ with Advanced Cantilever™ technology. The VersaTile™ with Advanced Cantilever™ technology can fit on a conventional 3-hole mount probe positioner for single site probing. The same VersaTile™ with Advanced Cantilever™ technology can be used in a 300mm VersaPlate™ for multi-site probing.
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Probe Station
EPS500
Reasonable price and compact design. - Sellectable chuck size : 4inch, 6inch, 8inch when ordering probe station. - Hot chuck can be installed. Temp range: RT ~ 300°C - Hot and cool chuck from 0 °C ~ 300 °C can be provided. - Maximum 6pcs of manipulators can be installed on the base unit of probe station EPS500.
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Current Probes
PMI® introduces the convenience of flexible current probes (Flex CTs)! These 5,000A probes come in 12″, 24″, 36″, and 48″ lengths that allow you to easily surround multiple conductor bundles. They are available in sets of two, three, or four for use with different recorders. The Flex CTs are powered from recorder voltage and DO NOT require a battery pack for operation.
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Interposers and Probes
The Summit product family includes a wide variety of Interposer systems, designed to reliably capture serial data traffic while minimizing perturbations in the serial data stream. Probes include interposers, which are designed to capture data traffic crossing the PCI Express card connector interface, and MidBus probes, which are designed to capture traffic flowing within a PCB.
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Flying Probe
EnteFP-5060TDR
Two head TDR flying probe with rotation, max panel size: 20X24, accuracy +/25um, CCD camera alignment.
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Scanning Probes
Scanning probes can acquire several hundred surface points each second, enabling measurement of form as well as size and position.
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Hi-Z Probes
B-1012-B
High Voltage Probes for Very Low Current Power Supply Voltage Measurementto 120kV, such as Electrostatic Paint Spray Applications...
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Probe Card
T40™ Series
Ultra low noise and fast settling modeling and characterization tests are made possible by Celadon’s patented ceramic probe cards.
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Semiconductor Probe
Using the spring contact probes for semiconductor package inspection, customers can test various types of packages with LEENO's Total Interface Solution.
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Acoustic Probe
AA-Ultrasonic
The AA-Ultrasonic acoustic probe is designed for use on air insulated terminations where a clear sound path between the electrically stressed insulation and the probe is present. The sensor is extremely sensitive and can detect activity below 10pC. The probe has a magnetic base to allow coupling to steel enclosures and a swivel head as so the detecting sensor can be aimed directly at the HV point. Corona in air and surface tracking can seriously damage high voltage insulating surfaces in a way that will ultimately lead to flashover and complete failure of the insulator. This discharge activity creates acoustic emission that can be detected using a high frequency sensor. The magnitude of the acoustic emission is indicative of the degree and severity of the discharge activity.
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Fibers and Probes
Ocean Insight optical fiber assemblies, probes and accessories collect and direct light in spectrometer setups. Readily available in our online shop.
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Voltage Probes
In addition to EMI measurement with LISNs (Line Impedance Stabilisation Networks, Artificial Mains Networks), Probes are used for Terminal or Line voltage measurement.
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Probe Card
VC20E Lab
*20 millimeter ceramic probe card*Optimized for DC parametric test, modeling and characterization, and single site WLR*Can be quickly installed using an interface tool into various interfaces and takes minimal storage space on the test floor*Effective operating temperature range from -65° to 200° C*Leakage as low as 5fA/V. If you require faster settling time, click here*Can be configured with up to 48 probes
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Differenzial Probe
BumbleBee®
PMK Mess- und Kommunikationstechnik GmbH
BumbleBee® is a 400 MHz, 1 kV CAT III high-voltage, differential probe, that can be used with anyoscilloscope or device providing 50 Ω termination.
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Illuminance Probe
LP471PHOT
Photometric probe for measuring the ILLUMINANCE, spectral response according to the photopic curve, class B according to CIE N° 69, cosine correction diffuser.