Showing results: 1201 - 1215 of 2825 items found.
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D400A-AT-PB2 -
Teledyne LeCroy
- Choice of 4 GHz or 6 GHz bandwidth models- Up to 5 Vpk-pk dynamic range with low noise- ±3 V offset range- Low loading and high impedance for minimal signal disturbance- Ideal for DDR2, DDR3, LPDDR2- Deluxe soft carrying case- Innovative QuickLink architecture- Wide variety of tips and leads-- Solder-In Lead-- Optional Positioner (Browser) Tip-- Quick Connect Lead-- Square Pin Lead-- HiTemp Solder-In Lead
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D600A-AT-PB2 -
Teledyne LeCroy
- Choice of 4 GHz or 6 GHz bandwidth models- Up to 5 Vpk-pk dynamic range with low noise- ±3 V offset range- Low loading and high impedance for minimal signal disturbance- Ideal for DDR2, DDR3, LPDDR2- Deluxe soft carrying case- Innovative QuickLink architecture- Wide variety of tips and leads-- Solder-In Lead-- Optional Positioner (Browser) Tip-- Quick Connect Lead-- Square Pin Lead-- HiTemp Solder-In Lead
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D600A-AT-PL -
Teledyne LeCroy
- Choice of 4 GHz or 6 GHz bandwidth models- Up to 5 Vpk-pk dynamic range with low noise- ±3 V offset range- Low loading and high impedance for minimal signal disturbance- Ideal for DDR2, DDR3, LPDDR2- Deluxe soft carrying case- Innovative QuickLink architecture- Wide variety of tips and leads-- Solder-In Lead-- Optional Positioner (Browser) Tip-- Quick Connect Lead-- Square Pin Lead-- HiTemp Solder-In Lead
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90061-XH Series -
HITEC Sensor Solutions Inc.
This system is ideal for field measurement and data logging of forces between the tips of resistance spot welders. The system consists of a handheld sensor and portable readout/ data logger (PMAC 2000).
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RT70V series -
NAPSON Corp.
• Combinational measurement system by Measurement tester(RT-70V) & Stage.• Thickness input with easy JOG dial operation (RT-70V Tester)• Tester self-test function/Auto change-over measurement range function• Thickness & Temperature correction function for Silicon sample
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1169B -
Keysight Technologies
Provides a large common mode range and a large offset range for measuring differential and single-ended signals.
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1168B -
Keysight Technologies
Provides a large common mode range and a large offset range for measuring differential and single-ended signals.
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PP016 -
Teledyne LeCroy
Passive probes are the standard probe provided with most oscilloscopes. Typical passive probes provide a 10:1 attenuation and feature a high input resistance of 10 MΩ. This high input resistance means that passive probes are the ideal tool for low frequency signals since circuit loading at these frequencies is minimized. Passive probes are designed to handle voltages of at least 400V, some as high as 600V. Teledyne LeCroy passive probes feature an attenuation sense pin which tells the oscilloscope to scale the waveforms automatically requiring no user input.Each passive probe is recommended for a certain oscilloscope, using the right passive probe with the right oscilloscope means that the probe will be properly compensated across the entire bandwidth. Using probes with a different oscilloscope will only let you compensate for low frequencies.
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10073D -
Keysight Technologies
The Keysight 10073D passive probe is our most rugged 500 MHz probe. With a 10:1 attenuation ratio and high 2.2 M ohm input impedance, it is ideal as a general purpose, high bandwidth passive probe for the Keysight 300 MHz - 1 GHz 6000 series, 7000, 8000 and 9000 Series oscilloscopes. The probe identification feature automatically configures the oscilloscope for the probe attenuation.
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PP005A -
Teledyne LeCroy
Passive probes are the standard probe provided with most oscilloscopes. Typical passive probes provide a 10:1 attenuation and feature a high input resistance of 10 MO. This high input resistance means that passive probes are the ideal tool for low frequency signals since circuit loading at these frequencies is minimized. Passive probes are designed to handle voltages of at least 400V, some as high as 600V. Teledyne LeCroy passive probes feature an attenuation sense pin which tells the oscilloscope to scale the waveforms automatically requiring no user input.
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XF1 set -
Langer EMV-Technik GmbH
The XF1 set of near field probes consists of 4 passive near field probes and one passive E field probe for making measurements in the development phase of the magnetic and electric fields in ranges from 30 MHz to 6 GHz. Due to their integrated impendance matching, the probes are less sensitive in the lower frequency range than the RF type probes. The probe heads of the XF1 set allow for the step by step identification of interference sources of the magnetic field on an electronic assembly. At first, for example the XF-R 400-1 detects the fields which the assembly emits in total. Next, using higher resolution probes the interference sources can be more precisely detected. The E field probe is used for the detection of electric interfering fields near the assemblies. With trained use of the near field probes, field orientation and field distribution can be detected. The near field probes are small and handy. They have a sheath current attenuation and are electrically shielded. They can be connected to a spectrum analyzer or an oscilloscope with a 50 Ω input. They have an internal terminating resistance.
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Langer EMV-Technik GmbH
The measurement coil is located vertically in the probe head. The near field probes are run with a positioning system (Langer Scanner).
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L2.92A-PLINK -
Teledyne LeCroy
The Teledyne LeCroy LabMaster 10 Zi oscilloscope utilizes precision 2.92mm input connectors to achieve up to 36GHz of input bandwidth. But some applications may require the use of lower-bandwidth probes for performance and cost reasons.The L2.92A-PLINK adapter converts the 2.92mm interface to a ProLink interface. This brings the benefits of a wider selection of probes to the LabMaster 10 Zi such as Dx10/Dx20/Dx00A-AT 4-6 GHz differential probes and DH Series 8 to 20 GHz differential probes using the ProLink oscilloscope probe connection. Full probe power and control is provided through a built-in LEMO interface.