Showing results: 1216 - 1230 of 2823 items found.
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Langer EMV-Technik GmbH
The measuring coil is horizontally located in the probe head. The near field micro probes are operated with a positioning system (Langer Scanner).
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N2870A -
Keysight Technologies
The N2870A passive probe offers DC to 35 MHz and 1:1 attenuation factor, making this probe ideal for low-level signal measurements.
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N2872A -
Keysight Technologies
Compact 2.5-mm probe head diameter, low input capacitance, and various fine-pitch probe tip accessories make the Keysight N2870A Series passive probes ideal for probing densely populated IC components or surface-mount devices used in today’s high-speed digital applications.
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N2871A -
Keysight Technologies
Compact 2.5-mm probe head diameter, low input capacitance, and various fine-pitch probe tip accessories make the Keysight N2870A Series passive probes ideal for probing densely populated IC components or surface-mount devices used in today’s high-speed digital applications.
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RF2 set -
Langer EMV-Technik GmbH
The RF2 near field probe set consists of 4 passive near field probes for measurements in the development phase of the magnetic field in the range from 30 MHz to 3 GHz on electronic assemblies. The probe heads of the RF2 set allow the step by step localization of interference sources of the RF magnetic field on assemblies. From greater distances the electromagnetic interference can be detected by RF-R 400-1 and RF-R 50-1 probes. The RF-B 3-2 and RF-U 5-2 probes with their higher resolution can more precisely detect the interference sources. Field orientation and field distribution on an electronic assembly can be detected through a trained special use of the near field probe. The near field probes are small and handy. They have a sheath current attenuation and are electrically shielded. They can be connected to a spectrum analyzer or an oscilloscope with a 50 Ω input. They do not have an internal terminating resistance.
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RF6 set -
Langer EMV-Technik GmbH
The RF6 near field probe set consists of 2 passive magnetic field probes and 2 passive E field probes for measurements in the development phase of the E-field and magnetic field in the range from 30 MHz to 3 GHz on electronic assemblies. The probe heads of the RF6 set allow a step by step localization of interference sources of the RF magnetic field and RF-E-field on an assembly. From a larger distance the electromagnetic interference is detected by RF-R 50-1 for the magnetic field and by RF-E 02 for the E-field. The RF-B 3-2 and RF-E 10 probes with their higher resolution can more presicely detect the interference sources of the magnetic field and the E-field. Field orientation and field distribution on an electronic assembly can be detected by special guidiance of the near field probe. The near field probes are small and handy. They have a sheath current attenuation and are electrically shielded. They can be connected to a spectrum analyzer or an oscilloscope with a 50 Ω input. They do not have an internal terminating resistance.
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N2841A -
Keysight Technologies
The Keysight N2841A low-cost passive probe provides a 10:1 attenuation and features a high input resistance of 10 MΩ. The probe can be adjusted for low-frequency compensation and high-frequency compensation.
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N2843A -
Keysight Technologies
The Keysight N2843A low-cost passive probe provides a 10:1 attenuation and features a high input resistance of 10 MΩ. The probe can be adjusted for low-frequency compensation and high-frequency compensation.
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N2842A -
Keysight Technologies
The Keysight N2842A low-cost passive probe provides a 10:1 attenuation and features a high input resistance of 10 MΩ. The probe can be adjusted for low-frequency compensation and high-frequency compensation.
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N2889A -
Keysight Technologies
The Keysight N2889A low-cost passive probe provides up to 350 MHz bandwidth and features high-input resistance of 10 MΩ (@10:1 mode) to address a wide range of measurement needs with low probe loading. The N2889A comes with a convenient switch in the probe handle that lets you switch between a 1:1 and 10:1 attenuation ratio.
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RF1 set -
Langer EMV-Technik GmbH
The RF1 near field probe set consists of 4 passive near field probes for making measurements in the development phase of E-field and magnetic field in the ranges of 30 MHz to 3 GHz on electronic assemblies. The probe heads of the RF1 set allow for measurements close to the electronic assemblies, e.g. on single IC pins, conducting paths, components and their connectors in order to localize interference sources. Field orientation and field distribution on an electronic assembly can be detected through a trained special use of the near field probe. The near field probes are small and handy. They have a sheath current attenuation and are electrically shielded. They can be connected to a spectrum analyzer or an oscilloscope with a 50 Ω input. They do not have an internal terminating resistance.
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N2876A -
Keysight Technologies
The N2876A passive probe offers DC to 1.5 GHz and 100:1 attenuation factor to measure fast edges in high speed applications more accurately. This probe needs 50 Ω input on the oscilloscope.
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N2820A -
Keysight Technologies
The N2820A 2-channel current probe connects to two oscilloscope channels to provide simultaneous low- and high-gain views for wider dynamic range measurement, while the N2821A 1-channel current probe provides one user-selectable view at a time.
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N2874A -
Keysight Technologies
A compact 2.5-mm probe head diameter, low input capacitance, and fine-pitch probe tip accessories make the N2870A Series ideal for probing densely populated IC components or surface-mount devices used in today’s high-speed digital applications.