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Showing results: 556 - 570 of 691 items found.

  • Voltage Input Device For FieldDAQ

    NI

    The Voltage Input Device for FieldDAQ measures up to eight ±10 V channels with 24-bit resolution and simultaneous sample rates up to 100 kS/s/ch. Some models can power sensors, such as pressure sensors, with up to 24 V per input channel. This device offers 500 V channel-to-channel isolation, protecting instrumentation from high-transient voltages. Additionally, the device is IP65 and IP67 rated to be dust-proof and water-submersible, can operate in -40 °C to 85 °C environments, and can sustain 100 g shock and 10 g vibration. It has an integrated network switch for simplified daisy chaining and provides tight synchronization over time sensitive networking (TSN) for distributed data acquisition systems.The Voltage Input Device for FieldDAQ includes the NI-DAQmx driver and configuration utility that simplify configuration and measurements. NI-DAQmx supports NI programming environments as well as Python, ANSI C, C#.NET, and MathWorks MATLAB® software.

  • 6 Digits Process Meter

    A6-PR - Chuan Sheng Electronics Co., Ltd.

    A6-PR 6 Digits Process Meter has been designed with high accuracy measurement, 6 digit display, flexible I/O functions and communication port for process measuring application.There are also build in 4x External Control Inputs, and can option 4x Relay outputs, 1x Analog output and 1x RS485 (Modbus RTU Mode) communication port with multi-functions such as control, alarm, re-transmission and communication for a wide range of industrial applications.There was designed the zero tracking and stable tracking function in programming level.According to the application, user can set the function to get the suitable reading.

  • Analog Mixed Signal Testers

    SPEA S.p.A.

    - PC-performance independent: multiple SPEA CPUs provide test program timing, while pc replacement does not require the test program requalification- Pattern-based programming: -30% test time vs competitors- 64-line synchrobus and 16-line high-speed synchrobus for real-time instrument synchronization: no embedded delay when running pattern-based testing- 99% parallel test efficiency- Multi-site test capabilities for up to 256 devices in parallel- High-density, floating instruments, for true parallel analog test- Universal slot architecture, up to 1,408 channels- RF generators up to 3 GHz

  • Boundary Scan Test

    Test Coach Corporation

    Boundary Scan is a very useful tool for quick, low-cost, re-usable powered-up test of an assembly for basic functionality. Because a fixture with test probes is not required, it is possible to have a working test available within hours or days, rather than weeks. Designers can receive rapid feedback on their prototype boards with tests that can be used again during production testing, as well as for device programming. Given power, ground and Tap port signals, tests can be written to assess the performance of the boundary scan enabled parts on an assembly and other parts on the boundary scan chain.

  • TimerBlox

    Analog Devices Inc.

    Analog Devices TimerBlox parts are small, accurate, and simple timing devices designed for six basic operations: voltage controlled oscillation (VCO), low frequency clocking, pulse-width modulation (PWM), one-shot generation and signal delay, and power-on reset (POR). TimerBlox devices combine an accurate programmable oscillator with precision circuitry and logic. No capacitors, no crystals, no microcontroller, and no programming are required. A 20 mA source and sink capability enables the devices to directly drive opto-isolators and transformers for electrical isolation. An ideal solution for space-limited applications, each TimerBlox device can be placed at the point of use.

  • Chassis

    RSM/128-MF - Cytec Corp.

    These Chassis controls up to 16 8x1 modules, 32 4x1 modules or any combination or configuration such as a 16x8 matrix, 32x4 matrix or two 16x4 matrices. Matrix configurations are non-blocking and physical layer switches act like a cable connection with D connectors creating a one to one connection between D9, D15 or D25 connectors. All wires are switched as a group on each connector for easy programming. LEDs on the front panel show switch and power status. Add Switch Modules, Driver Modules and a Control Module to complete the system.

  • Multi-IDE Bundle

    NI

    The Multi-IDE Bundle provides a LabVIEW and C solution to build applications using multiple development environments. The bundle includes LabVIEW Professional Development System, LabWindows/CVI Full Development System, and Measurement Studio Enterprise Edition. LabVIEW NXG 1.0 the next generation of LabVIEW is included with your purchase of the Multi-IDE Bundle. It minimizes time to measurement with your data acquisition devices and benchtop instruments with engineering workflows for acquiring and visualizing data sets - programming optional. When needed, you can transition to a development approach to customize your test and measurement system.

  • Web Services

    Cimetrics Inc.

    Web services technology has become the most popular method for integrating enterprise computing applications with building automation and control systems. Cimetrics currently offers two gateway products that allow enerprise applications, acting as web services clients, to access some data within BACnet-based building control systems. These products are intended to make integration easier for application programmers who are familiar with web services APIs in programming languages such as VBA, Visual C#, Python and Java. There is no need to use a BACnet protocol stack within the enterprise application.

  • BME680 Environmental Sensor

    28061 - Parallax Inc.

    Raise your project’s environmental awareness with the BME680. The Bosch Sensortec BME680 Integrated Environmental Unit combines a gas sensor with air pressure, humidity, and ambient air temperature sensing functions within a single package for high performance air quality measurement.  Parallax Inc. places the BME680 on a compact PCB with a 6-pin male header. This capable sensor does not have to be difficult to use. The BME680 is supported by BlocklyProp visual programming as well as C libraries for the Propeller multicore microcontroller.  Code for other controllers is available from the Bosch Github repository.

  • High-Performance Intelligent Pod for Corelis Boundary-Scan Controllers

    ScanTAP 4 & 8 - Corelis, Inc.

    Boundary-scan has proven itself time and again to be a truly versatile interface for structural test, embedded functional test, built-in self-test (BIST), software debug, and in-system programming. Supporting such diverse applications requires equipment with high-performance specifications and extended features.Corelis ScanTAP pods are designed for use with PCI-1149.1/Turbo and PCIe-1149.1 high-speed JTAG controllers. Featuring 4 & 8 independent Test Access Ports (TAPs), up to 80 MHz clock rates, and advanced TAP capabilities such as analog voltage measurement, the ScanTAP family of intelligent pods is the ideal JTAG interface for high-performance environments.

  • Embedded Control and Monitoring Software Suite (Subscription License)

    NI

    The Embedded Control and Monitoring Software Suite (Subscription License) helps you quickly respond to the changing requirements of your system with software tools that span between OSs, hardware technologies, and I/O types. With a subscription license, lower the upfront cost of purchasing software by buying access to the suite for a year, with the option to renew.LabVIEW is the ultimate design software to efficiently design, prototype, and deploy applications with hundreds of prevalidated libraries, tight hardware integration, and a variety of programming approaches including graphical development, .m file scripts and integration of C/C++, and Python and HDL code.

  • Digital I/O Vector Development Software

    DIOEasy - Marvin Test Solutions, Inc.

    DIOEasy offers test engineers an efficient tool for developing, debugging, and executing digital test vectors for Marvin Test Solutions' GX5050 series, GX5150 series, GX5280 series and GX5291, GX5292, GX5293 and GX5295 dynamic digital instruments.Digital I/O (DIO) systems are very complex and typically require a substantial amount of programming effort to define data vectors. In order to simplify vector development, Marvin Test Solutions developed Windows-based DIOEasy, providing users with an easy to use interface. Toolbars and menus provide quick access to vector editing and viewing tools.

  • Low-Profile High-Performance IEEE488 GPIB Interface for PCI Bus

    LPCI-3488A - ADLINK Technology Inc.

    ADLINK LPCI-3488A GPIB controller interface card, fully compatible with the IEEE 488 instrumentation control and communication standard, is capable of controlling up to 14 stand-alone instruments via IEEE 488 cables. It is designed to meet the requirements for high performance and maximum programming portability. The built-in 2KB FIFO and a block transfer mode provide up to 1.5 MB/s GPIB transfer rate. With the APIs that are compatible with NI-488.2* and VISA support, the LPCI-3488A provides the greatest compatibility with your existing applications and instrument drivers. (* NI-488.2 mentioned here is the trademarks and properties of National Instruments Corporation.)

  • PXI FlexRIO IF Transceiver

    NI

    The PXI FlexRIO IF Transceiver combines analog I/O and a user-programmable FPGA into a single, customizable instrument. The instrument enables direct RF acquisition up to 6 GHz. You can use the instrument in a dual-channel mode at 3.2 GS/s or in a single-channel interleaved mode at 6.4 GS/s. The PXI FlexRIO IF Transceiver uses FPGAs from Xilinx alongside LabVIEW and Vivado programming options for custom algorithm implementation and real-time signal processing. Using this instrument with NI-TClk, you can synchronize modules in one or more PXI chassis at up to picosecond‐level accuracy for high‐channel‐count applications.

  • Anite Development Toolset

    Keysight Technologies

    Benefit from a comprehensive suite of tools that support all phases of wireless terminal development, from pre-silicon protocol module development through to systems integration and verificationGain easy access to parameters at lower layers to re-create tests in the very early stages of chipset and device developmentAccess an extensive LTE/LTE-Advanced technology roadmap including early 5G specificationsRemain in control of test designs through accessing Layer 1 and Layer 2 using Application Programming Interfaces (APIs)Benefit from a high level of flexibility and control in terms of test creation

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