Showing results: 856 - 870 of 1180 items found.
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Photonics Industries
355 nm wavelengthPower: 0.5W* to 5W*Air-cooled design, water cooled optionAll-in-one (AIO) single box design for 0.5 & 1W modelPatented intracavity UV generationCompact, rugged, monolithic laser headTotal pulse controlTEM00 beam with typical M² < 1.2Pulse rates from 1Hz to 300kHzRS232 computer controlField replaceable pump diodes
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Quantum Composers
The laser controllers provide a simple method of controlling Lumina and other popular laser diode drivers or full laser systems. They include the ability to easily control current levels, pulse modes, and interlock controls as well as monitor voltage and current levels as well as q-switch triggering, external triggering, sync output, and additional I/O signals.
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G-5 Series -
Shinken Co. LTD.
Both Shock tests at from relatively high acceleration(max. 4900m/s2 -500G) to low acceleration with wide pulse width, difficult to achieve with conventional Shock Test Systems and Vibration tests for not only IEC, MIL and JIS but also requiring higher acceleration, velocity and displacement than ordinary VTSs can be carried out with one system.
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KES7700 -
Kikusui Electronics Corp.
Transient Immunity Tester KES7700 Series are transient surge tester that utilizes a compact unit system. A surge generator circuit is installed for each pulse unit as the tester meets the requirement of ISO7637-2, ISO7637-3, ISO16750-2, JASO D001, SAEJ1113, and other standards. The KES7700 Series meets a broad range of independent automobile manufacturer standards as well.
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AR RF/Microwave Instrumentation
When test needs call for higher power and higher frequency, consider our “T” Series microwave amplifier line– 1 to 50 GHz, 40 to 20,000 W CW and Pulse. These amplifiers provide coverage for a wider range of high-power microwave test applications than any other brand of microwave amplifier on the market and are incredibly feature-rich.
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Quantum Composers
The laser controllers provide a simple method of controlling Lumina and other popular laser diode drivers or full laser systems. They include the ability to easily control current levels, pulse modes, and interlock controls as well as monitor voltage and current levels as well as q-switch triggering, external triggering, sync output, and additional I/O signals.
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Techimp HQ S.r.L
It is a deeply customizable test bench which is suitable to generate frequency and amplitude controlled voltage. This test bench could be used for life test or quality test on samples or devices. It can be configured both for sinusoidal test (STANDARD version) and both for square wave or pulse test (TechSQUARE). It includes safety systems for avoiding overload and incorrect use.
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Hatteras -
Del Mar Photonics, Inc.
The Hatteras is first professional system on the market for ultra fast transient absorption pump - probe spectroscopy. Two linear image sensors (multichannel detection) or two photodiodes (singlechannel detection) are placed behind an imaging spectrometer to measure probe and reference pulses, originating from a femtosecond white light (continuum) generator or from an optical parametric amplifier.
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295B -
JSD TestPhone Ltd
The Testphone 295B is a test telephone designed for use on Public Switched Telephone Networks (PSTN). It is designed for use on both Dual-tone Multi-frequency (DTMF - tone dialling) and Loop Disconnect (LD - pulse dialling) lines. Fitted with an integral ADSL filter, the telephone will not cause interference when connected to ADSL/Broadband lines in either `on hook` or `off hook` mode.
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TAS7400TS -
Advantest Corp.
The system uses two channels of ultra short pulse lasers (1.55 ?m) with either biased output (for THz generation) or signal input (for THz detection). Advantest's unique optical sampling method, utilizing phase-modulated dual-laser-synchronized control technology without a mechanical optical delay line, enables extremely high speed terahertz spectroscopy.
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52403P -
Chroma ATE Inc.
Chroma's 52403P is a PXI Express Short Pulse SMU (Source/Measure Unit) designed for fast, precise and reliable sourcing and measurement of thermo-sensitive devices such as high-power laser diodes (LD). Integrating a high-speed pulser, a high precision SMU and a DAQ module into a single PXIe SMU, the 52403P can measure both the LIV and the low-level leakage current of a high-power LDs.
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Shanghai Guantu Technology Co., Ltd.
GCW series combined wave generators can generate high energy surges for combined wave testing. It has the characteristics of fast rise and long pulse duration. According to different modulation components, different surge waveforms can be generated; the control system can automatically record and analyze the above surge waveforms. standard:IEC60060-4-5, IEC61643-11, UL1449-2006, GB18802.1, GB/T18802.21,
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HBM-TS10-A -
High Power Pulse Instruments GmbH
*±6 kV Human-Body-Model (HBM) tester according ANSI/ESDA/JEDEC JS-001 standard with C = 100 pF, R = 1.5 kΩ discharge network*Wafer, package and system level HBM testing*True HBM: the classical discharge network of the HBM-S1-A according the standard ensures compliant waveforms for all load conditions*No trailing pulses*Integrated 10 kΩ charge removal resistor*Integrated DUT HBM current sensor for real time transient current monitoring with 1V/A output sensitivity into 50 Ω digital oscilloscope input*Integrated DUT HBM voltage sensor for real time transient voltage monitoring with 1/200V/V output sensitivity into 50 Ω digital oscilloscope input*Integrated overvoltage protection of the DUT voltage sensor, DUTcurrentsensor and DC test interface for efficient overload protection of the digital oscilloscope and SMU during high voltage HBM testing*Integrated DC test DUT switch with automatic switch control*Integrated 50 Ω precision hardware trigger output for high speed digital oscilloscopes*Fast HBM measurements, typically 0.5s per pulse including one-point DC measurement between pulses*Eficient sofware for system control and waveform data management (fully compatible with TLP measurement data)*The sofware can control automatic probers for fast measurements of complete wafers*Compact size 145 mm x 82.5 mm x 44 mm of the integrated HBM pulse generator probehead*System controller size 483 mm x 487 mm x 133 mm*High performance and high quality components*Optionally available hardware upgrades to all HPPI fully integrated HBM/HMM/TLP/VF-TLP test systems TLP-3010C, 4010C, 8010A, and 8010C
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Optronik Line DSP 200 -
Instrument Systems Optische Messtechnik GmbH
DSP 200 offers outstanding sensitivity and stability for precise measurements even at very low illumination levels. The instrument meets, of course, all requirements of the newest standards, like EN 13032-1 and DIN 5032-7 (2017). A low-noise photo diode with V(lambda)-filtering and optimized electronics provides for a broad dynamic range from 0.1 mlx to 200 klx. At the same time the very high local resolution allows an accurate determination even of high gradients when measuring headlamps. Therefore, the DSP 200 is suitable for all automotive and traffic applications, as well as for flashlights and for measurements of all pulse width modulated light sources.
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Southern Photonics Ltd
Southern Photonics designed and manufactured all the test equipment currently being manufactured by Coherent Solutions, as well as equipment for non-telecoms applications. This includes FBG strain interrogators, optical pulse phase analysers, OSNR meters, optical power meters, optical spectrum analysers, optical gas sensors… you get the idea. All test equipment we build is robust and easy to use. The picture shows some of what we can do – anything from prototype benchtop test gear (as in the combination ASE source and laser combiner on top of the stack) to field test equipment (the portable fast OSA on the bottom).
