Showing results: 31 - 45 of 157 items found.
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P5570A -
Keysight Technologies
Keysight PCIe 6.0 Protocol Analyzer redefines protocol debugging and validation through a new innovative CEM card form factor, bringing vast improvement in signal integrity and equalization with instant link-up to systems as well as devices under test
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P5551A -
Keysight Technologies
Keysight PCIe 5.0 Protocol Exerciser gives the flexibility in emulating either as a root complex or as an endpoint device when validating PCIe designs.
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DP-1000 -
Averna
Averna’s DOCSIS Protocol Analyzers are the industry standard for functional DOCSIS 3.1 and 3.0 network analysis, providing exceptional visibility into the MAC layer. Multiple system operators (MSOs), chipset manufacturers, product developers and certification bodies use them to quickly find and correct trouble spots.
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M9816AS -
Keysight Technologies
The PXI vector component analyzer enables complex multiport device characterization with continuous wave and modulated signal measurements.
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M9817AS -
Keysight Technologies
The PXI vector component analyzer enables complex multiport device characterization with continuous wave and modulated signal measurements.
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M9815AS -
Keysight Technologies
The PXI vector component analyzer (VCA) enables complex multiport device characterization with continuous wave (CW) and modulated signal measurements.
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Keysight Technologies
Our PXI vector network analyzers (VNAs) perform fast, accurate measurements and reduce your cost-of-test. Simultaneously characterize many devices — two-port or multiport — using a single PXI chassis. By combining independent, two-port network analyzer modules into one chassis your multisite, multi-DUT, and multiport test applications scale flexibly. Use all ports to simultaneously measure your devices with multiport error correction.
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M9837A -
Keysight Technologies
The M9837A PXI network analyzer (VNA) offers unrivaled performance for testing multiport, multisite, multi-DUT modulated signal measurement from 10 MHz to 44 GHz.
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M9389A -
Keysight Technologies
The M9389A PXIe vector network analyzer source is a component for the M9485A PXIe multiport vector network analyzer. The M9389A configuration includes two PXIe modules (M9310A source output, M9309A synthesizer) and its control is provided through the M9385A software front panel (SFP). The M9485A provides a true multiport VNA with up to 12-ports in one chassis and up to 24 ports in two chassis.
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PXIe-S5090 -
Copper Mountain Technologies
The PXIe-S5090 delivers metrology-grade VNA performance and speed to National Instruments’ PXI system. This high-performance vector network analyzer allows testing of two-port devices from the bench to the production floor in a compact, modular form factor. With 138 dB dynamic range and +13 dBm maximum power, this VNA is engineered for short time to first measurement and also for high performance automation with fast test times.
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787251-01 -
NI
PXIe, 9 GHz PXI Vector Network Analyzer - The PXIe-S5090 is a 2-port Vector Network Analyzer (VNA) that helps you measure amplitude, phase, and impedance. You also can use the PXIe-S5090 to perform time-domain analysis and to calculate the S-parameters of 2-port RF devices. It features a 300 kHz to 9 GHz frequency range, a wide dynamic range, and high sweep speeds for automated design validation and production test. Additionally, the PXIe-S5090 supports automatic precision calibration, full vector analysis, and reference plane extensions.
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M9485A -
Keysight Technologies
1 MHz to 9 GHzUp to 12-ports in one chassis, 24-ports in two chassis Various applications - full N-port cal, FOM, Pulse, time-domain, noise figure and gain compression analysis capability Improve accuracy, yield & margins with the best PXI VNA speed, dynamic range, trace noise and stability Improve throughput with fast cycle time: 5 msec at 201 points, 2-port calVarious configuration with standard test set and configurable test set
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M9818AS -
Keysight Technologies
The PXI vector component analyzer enables complex multiport device characterization with continuous wave and modulated signal measurements.