Filter Results By:
Products
Applications
Manufacturers
RF Probes
Coaxial Probes are said to offer repeatable performance up to 3 GHz in custom or standard configurations.
See Also: Test Probes
- LBA Group, Inc
product
Digital RF Power Monitor
3024
The COMM-connect 3024 RF Power Monitor from LBA Technology can control up to 8 external RF Measuring heads. The high dynamic range with external couplers and RF measuring heads cover from 1W to 1MW. The Power conversion algorithms handles multi carrier, multi mode, peak, average and RMS signals. The power readout is auto scaled and VSWR can be calculated between any probes. Also the measured and calculated results along with alarms can be shown in the local LCD. The instrument has SNMP support to allow network management. The instrument can be configured for VSWR and Power limits to give alarms. The alarms can be configured to operate relay drivers or isolated Optcouplers. The alarms can also be configured as SNMP traps sending relevant information to the network control center. The COMM-connect 3024 WEB enabled RF Power Monitor gives an unlimited number of applications to monitor and control the last part of your RF network installation from transmitters to the antenna.
-
product
RealProbe RF Probes
Unmatched performance In-Circuit RF Probes covering up to 18GHz. These are must tools for any in-circuit RF and Microwave testing and troubleshooting.
-
product
RF Voltage Probe
P-20 Series
The P-20A is a PASSIVE 10:1 RF VOLTAGE PROBE with a 50 Volt DC BLOCK built in. It has been designed to allow users of RF test equipment to use standard signal tracing techniques. The P-20A makes it possible to conveniently and accurately monitor or inject signals up to 3 GHz into RF circuits without significantly loading or detuning them.
-
product
RF Coaxial Probes & Probe Positioner
Fairview Microwave’s line of coaxial RF probes and RF PCB probe positioner are ideal for use with chip evaluations, signal integrity measurements, coplanar waveguide, substrate characterization, gigabit SERDES and test fixture applications. The RF coaxial probes provide return loss better than 10 dB and a maximum operating frequency of 20 GHz. The probes have a 3.5mm female interface, a pitch of 800 or 1500 micron and they can be cable-mounted. They feature gold-plated contacts and can be used by hand, with or without a probe positioner. Compliant coaxial GSG (or GS) pogo pins allow for a broad range of probing angles. The RF PCB probe positioner can hold coaxial probes, has articulated joints and delivers multi-axis positioner control. This positioner also boasts a magnetic mounting plate with on-off positioner switch.
-
product
RF Test Probes
With over 50 Tip-Styles, you can be certain we can help you find the right solution for your testing demands. And if we don’t offer a probe solution already in production, we will work together with you to develop a custom solution.
-
product
SMART III RF Probe
Finna Sensors’ Smart III RF Moisture Probe is appropriate in those situations where NIR use on conveying systems/web applications or RF flat plate sensor use on board type products are not sufficient. Examples include tanks, bins, barrels, drums, Super Sacks™, silos, etc. These applications require a probe type moisture meter where the probe is inserted into, and is surrounded by product. Since the probe generates a 3 inch diameter radio frequency field around the length of the probe, a significant volume of product is measured. As the product is slowly removed from the silo, and refilled from the top, it passes by the RF Probe, thereby providing a constant real time moisture measurement. Typical applications would include starches, distillers and brewers grains, granulated chemicals or food ingredients, whole grains such as corn kernels, rice, soybeans, tree nut stockpiles, etc.
-
product
RF Radio - Frequency Probes
*3 to 6 Ghz *PCB MCX SMB SMC *SMA U. FL MS / MM Fakra *Exchangeable inner plunger
-
product
Deep Access RF Probes
GigaTest Microwave Probes are perfect for device characterization and modeling. GigaTest Probes have a high tolerance allowing them to land repeatedly and take high-quality data.
-
product
RF High Frequency Probes
*Low impedance*High bandwidth up to 20 GHz*Repeatable measurements*Coaxial design*Interchangeable center conductor
-
product
Snap-on RF Current Monitoring Probe
TBCP2-250
The TBCP2-250 is a snap-on RF current monitoring probe. The probe has a very flat response with a 3dB bandwidth of 250 MHz and is characterized over the frequency range from 30kHz to 300 MHz. Upon request, it can also be supplied with a test protocol covering the frequency range 1 kHz to 350 MHz. The aperture of the RF current monitoring probe is 32 mm. Its transfer impedance is > 12 dB Ohm in the range from 700 kHz to 300 MHz.
-
product
Fixed Aperture RF Current Monitoring Probe
TBCP1-200
The TBCP1-200 is a fixed aperture RF current monitoring probe.The probe has a 3dB bandwidth of approximately 200 MHz. The aperture of the RF current monitoring probe is 25 mm. Its transfer impedance is > 14 dB Ohm in the range from 40 kHz to 200 MHz.
-
product
RF Near Field Probe Set DC to 9GHz
EMF & RF close field sniffer-set for use with any Spectrum Analyzer or Measurement Receiver. The EMC Near Field probe set allows for straightforward pinpointing and measurement of interference sources in electronic component groups as well as execution and monitoring of generic EMC measurement. Our RF near field probe set is especially suitable for: - Pinpointing interference sources - Estimation of interference field strength - Verification of shielding and filtering measures - Identifying faulty components - Detecting circuitry overly sensitive to interference.
-
product
Active RF Probe 3 GHz - 0.2 pF - 1:10
RFP 3
The Active RF Probe provides a very low capacitive load of the system to be measured.
-
product
PXIe-5650, 1.3 GHz RF Signal Generator
781215-01
The PXIe‑5650 features continuous-wave generation capabilities with FM, 2‑FSK, or OOK modulation. It uses direct digital synthesis (DDS) for high-resolution frequency hopping or phase-continuous sweeping for fixture and device characterization applications. The PXIe‑5650 is ideal for clocking nonstandard sample rates, such as WCDMA signals at baseband or intermediate frequency (IF). With these versatile signal generators, you can perform analog and digital modulation through the onboard DDS circuit, which gives you frequency modulation and frequency-shift keying for applications such as bit error rate test, antenna testing, or even keyless entry. You can also perform amplitude modulation using on-off keying.
-
product
PXI-5650, 1.3 GHz RF Signal Generator
779670-00
The PXI‑5650 features continuous-wave generation capabilities with FM, 2‑FSK, or OOK modulation. It uses direct digital synthesis (DDS) for high-resolution frequency hopping or phase-continuous sweeping for fixture and device characterization applications. The PXI‑5650 is ideal for clocking nonstandard sample rates, such as WCDMA signals at baseband or intermediate frequency (IF). With these versatile signal generators, you can perform analog and digital modulation through the onboard DDS circuit, which gives you frequency modulation and frequency-shift keying for applications such as bit error rate test, antenna testing, or even keyless entry. You can also perform amplitude modulation using on-off keying.
-
product
PXIe-5651, 3.3 GHz RF Signal Generator
PXIe-5651 / 781216-01
PXIe, 3.3 GHz, PXI RF Analog Signal Generator—The PXIe‑5651 features continuous-wave generation capabilities with FM, 2‑FSK, or OOK modulation. It uses direct digital synthesis (DDS) for high-resolution frequency hopping or phase-continuous sweeping for fixture and device characterization applications. The PXIe‑5651 is ideal for clocking nonstandard sample rates, such as WCDMA signals at baseband or intermediate frequency (IF). With these versatile signal generators, you can perform analog and digital modulation through the onboard DDS circuit, which gives you frequency modulation and frequency-shift keying for applications such as bit error rate test, antenna testing, or even keyless entry. You can also perform amplitude modulation using on-off keying.
-
product
PXI-5652, 6.6 GHz RF Analog Signal Generator
779670-02
6.6 GHz PXI RF Analog Signal Generator—The PXI‑5652 features continuous-wave generation capabilities with FM, 2‑FSK, or OOK modulation. It uses direct digital synthesis (DDS) for high-resolution frequency hopping or phase-continuous sweeping for fixture and device characterization applications. The PXI‑5652 is ideal for clocking nonstandard sample rates, such as WCDMA signals at baseband or intermediate frequency (IF). With these versatile signal generators, you can perform analog and digital modulation through the onboard DDS circuit, which gives you frequency modulation and frequency-shift keying for applications such as bit error rate test, antenna testing, or even keyless entry. You can also perform amplitude modulation using on-off keying.
-
product
PXIe-5654, 10 GHz or 20 GHz RF Signal Generator
783126-01
The PXIe‑5654 features an ideal combination of exceptional phase noise and frequency tuning time. These features address applications such as blocker test/receiver desensitization, high-performance intermodulation distortion measurements, and various electronic warfare applications. The PXIe‑5654 is designed to meet the challenging requirements of RFIC characterization, satellite test, and radar applications.
-
product
Broadband Isotropic Field Strength Probes
PI-01, PI-01E, PI-03, PI-05
Modern design probes meeting the requirements of most EMC and RF safety standards for RF safety, industrial, military and radar communication applications: 0.2-1000 V/m, 10 KHz-40 GHz.
-
product
Near Field Probes 30 MHz - 6 GHz
XF Family
The XF family consists of 4 passive magnetic field probes and 3 passive E field probes designed for measuring magnetic and E-fields in ranges from 30 MHz to 6 GHz during the development phase. Due to their integrated impendance matching the probes are less sensitive in the lower frequency range than the RF type probes.
-
product
Probe Cards
U-Probe for Multi-die Test of Memory IC. Vertical-Probe Needle Type Probe card suitable for multi-die test of devices with peripheral pads. ertical-Probe Spring Type. Probe card suitable for area array pad test. 64DUTs Multi-Die. Probe Card for RF devices. Fine Pitch.
-
product
WLCSP Probe Heads
Smiths Interconnect offers Wafer Level Chip Scale Package (WLCSP) Probe Heads utilizing spring probe technology which provide high parallelism in test, superior signal integrity and high speed / RF testing capability.
-
product
Frequency Shaped Isotropic Electric Probes
PI-SH-FCC, PI-SH-ICNIRP
An isotropic electric field probe with shaped frequency response meeting the ICNIRP or FCC RF safety standards for occupational and general public exposure limits (see the specified frequency ranges below). Meter readings are shown in % of the STD – standard reference level, eliminating the need to know the source frequency. Probe output is proportional to RF power density in the whole specified power range, producing the correct RF power measurements in single and multi-signal environments, typically present at multiple antenna sites.
-
product
4-Channel Broadcast Monitor
The COMM-connect Entry Level Broadcast Power Monitor type 3025 can control two external RF Measuring heads. The high dynamic range with external couplers and RF measuring heads cover from 1W to 1MW. Equipped with the RMS Probes the Power conversion algorithms handles multi carrier, multi mode signals. With the 3026 Diode base probe the power readout gives good repeatable results. The power readout is auto scaled and VSWR will be calculated between the two probes. The COMM-connect Entry Level Power Monitor gives a number of application to monitor and control the last part of your RF network installation from transmitters to the antenna.
-
product
Eddy Current Probes and Drivers
Proximity sensors work on the eddy current principle. A proximity system consists of an eddy current probe, extension cable and driver. A high-frequency RF signal is generated by the driver, sent through the extension and probe cables and radiated from the probe tip. The tip consists of a precision wound copper coil inside a chemical and temperature resistant PEEK case.
-
product
MPI Fully Automatic Probe Systems
MPI Advanced Semiconductor Test
Addressing the RF and High Power communication devices and discrete passive components production test market requirements, MPI introduced the TS2500 200 mm fully automatic probe system series. The system is based on industry leading production equipment from the Photonics Automation Division and incorporates decades of experience in RF and High Power measurement techniques from the MPI’s Advanced Semiconductor Test (AST) Division in combination with other AST products such as RF Probes, related calibration technology, and High Power accessories.
-
product
Compact Monitoring Probe
ISDB-T/Tb
Network operators:automate the tests of new transmittertemporary monitoring/investigation toolrebroadcasting receiver: RF to ASI or IPBroadcasters: off-air monitoring probe to validate the on-air contentTV/STB producers: automated tests against a professional receiverLabs: easy & simple access to live DTV sources via RF
-
product
Current Probes
Com-Power's Current Injection Probes are used for RF conducted immunity testing per IEC 61000-4-6, CISPR 16-1-2, RTCA DO-160 and MIL-STD 461. Current injection Probes are to be used only when there is no commercially available CDN for the type of port(s) to be tested.
-
product
Probe Cards
Ceramic Blades
SV TCL offers a variety of ceramic blades and blade probe cards. We have patented ceramic microstrip blade probes available in low leakage and low capacitance for optimal signal transference, while SV TCL's blade cards are ideal for parametric and RF testing.
-
product
EMC Probes
The Beehive Electronics 100 series EMC probes allow the accurate measurement of magnetic and electric fields. They are useful for EMC troubleshooting, field strength measurement, and troubleshooting of RF circuits.
-
product
RF Power Generators
MKS RF Power Generators provide reliable solid state power for thin films processing equipment. They are vital components of semiconductor fabrication systems, which produce the integrated circuits (ICs) or chips required by modern computers and electronic equipment. MKS RF Generators, combined with our Impedance Matching Network and our V/I Probe form a complete RF Delivery System.