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- Pickering Interfaces Ltd.
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RF & Microwave PXI Switch Modules
These switching systems are used for design validation, reliability and production test including 5G, SD radios, S parameter testing for RF cables, antennas, radar and semiconductor verification.
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Radar Test System
UTP 5065
Radar sensors are core elements to realize autonomous driving. The UTP 5065 radar test system from NOFFZ Technologies has a compact vertical design and contains everything needed to allow State-of-the-Art measurement and sensor calibration. The test bench setup and component selection are tuned to get best possible results for highly accurate and cost-efficient testing in production of automotive radar sensors.
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Automotive Radar Test ∙ Evaluation
XRE
KEYCOM develops and manufactures various radar systems to measure and evaluate such functionalities of mass-produced millimeter and microwave radars including in-vehicle radars as transmission power, frequency, antenna beam alignment, distance accuracy, bearing accuracy and receiving accuracy. KEYCOM’s product line includes the Radar Test System (RTS) that measures radar distance accuracy and transmission power, and the Rader Alignment System (RAS) that assists you to adjust the mounting position of the in-vehicle radar.
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Radar Altimeter Test Set
EA-6061
The EA-6061 Radar Altimeter Test Set is designed to test and calibrate any and all radar altimeter systems regardless of protocol or encryption. The EA6061 provides multiple, programmable delays with front panel and/or remote computer control. It features ultra wide bandwidth, low loss, high isolation, and high dynamic range. Able to simulate altitudes up to 6350 feet, the test set operates from 4 to 5 GHz and offers NIST traceable altitude accuracy up to 2 inches
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Radar Altimeter Test Set
6000
The Eastern OptX Series 6000 Altimeter Test Set is designed to test and calibrate radar altimeter systems. The Series 6000 provides multiple, programmable delays with front panel and/or remote computer control. It features ultra wide bandwidth, low loss, high isolation, and high dynamic range. Able to simulate altitudes up to 50,000 feet, the test set operates from 4.2 to 4.4 GHz and offers altitude accuracy up to 0.1 %.
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Radar Altimeter Test Set
Core Technology
Eastern OptX core technology enables the conversion of microwave signals to optical signals (E/O), time delaying this signal then reconverting the light back to original microwave signal (O/E) with superior fidelity over traditional time delay methods. Products include Radar Target Simulation, Radar Altimeter Testing, Channel Simulation (Air Interface) and Multipath Creation.
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Automotive Radar Test Solutions
Analyze and generate automotive radar signals across the full frequency range for 24 GHz, 77 GHz, and 79 GHz radar with scalable analysis bandwidth from 2.5 GHz to > 5 GHz
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NI Vehicle Radar Test System
VRTS provides automated radar measurement and obstacle simulation capabilities for 76 to 81 GHz automotive radar systems. With VRTS, you can perform precision RF measurements and simulate a wide range of test scenarios for radar hardware and software subsystems, including sensors, advanced driver assistance systems (ADAS), and embedded software. Use VRTS for all phases, from design to manufacturing, of ADAS and radar system test.
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Standard Weather Radar Test Panel
TA-3
Universal weather radar test panel with integral gyro simulator and monitor jacks. Discrete test jacks for common signals, altitude select switches and a dedicated connector for the RDS series radars. Click on picture for larger view.
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System Tests Radar Pulse Stability
PN9002
Noise eXtended Technologies S.A.S.
The cost-effective PN9002 test simplifies the testing and analysis of pulse-to-pulse amplitude and phase stability for radar systems and components to 18GHz.
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Antenna Test Chamber for Automotive Radar
ATS1500C
The R&S®ATS1500C radar test chamber is a compact antenna test range (CATR), consisting of a gold-plated parabolic reflector and a two-axis positioner for 3D movements of the radar module. Combined with the R&S®AREG800A target simulator and other Rohde & Schwarz test and measuring instruments, it can be used for a variety of applications, including antenna characterization, module calibration, RF performance validation, interference testing or in-band compliance testing. The chamber is equipped with a universal feed antenna which gives access to both polarizations in parallel. Automated temperature testing over the range of -40 to 85°C is possible with an optional enclosure.
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Pulse Radar Reference Test Solution
Compact Reference Solution with ADP7104, M8195A, WR15CCU, WR15CCD, N5183B combines commercial off-the-shelf COTS modular hardware and software from Guzik, Keysight Technologies, KJ Microwave and Virginia Diodes, which provides a flexible testbed for radar waveform generation and analysis. Generate and analyze pulse radar waveforms. Pre-correct waveforms for overall channel response. Supports many topologies for radar transmitter / receiver testing (IQ, IF, RF, microwave, millimeter-wave).
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Radar Altimieter Test Panel for ALT-50/55
TA-55
Radar altimeter panel designed after the ALT-50A test fixture. (Ref. Fig. 5-1). Panel allows testing of the indicator or R/T independently or together. An internal power supply is provided to support stand alone testing of the indicator. This panel contains a 4 digit DVM and comes with enclosure. This panel will allow by the book testing.
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ARINC-708/453 2-Channel Test & Simulation Module for the Weather Radar Display Databus
M8K708
The M8K708 module is an ARINC-708 / 453 2-channel test and simulation module for the Weather Radar Display Databus. The M8K708 supports two ARINC-708 / 453 channels, each selectable as transmit or receive. Each channel implements an 64K×16 FIFO and supports polling and/or interrupt driven operation.The M8K708 comes complete with Windows software, a C-driver software library including source code and may be used with Exalt, Excalibur’s Analysis and Laboratory Tools, a Windows monitoring application. In addition, Excalibur produces adapter cables that convert the carrier board I/O Molex™ connector to two twinax CJ70-49 connectors. The cable may be purchased at an additional cost.
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EFT Module for Teststand
The Electronics Functional Test (EFT) Module for TestStand provides out-of-the-box tools to speed up development of automated tests for electronic assemblies including PCBAs, subassemblies and final assemblies. Test engineers can develop, deploy and execute test sequences quickly and efficiently with minimal custom code development for a shorter time-to-solution.
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Test Solutions
Our range of test solutions is far reaching, comprised of off-the-shelf test instruments and interfaces, standard automated test systems, and custom solutions for test, simulation, and training. Put our E2E focus and experience to work for you with these solutions: automated test equipment, maintenance trainers, and test management software.
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Tactical Radio Test Set
CTS-6010
The CTS-6010 brings an entire test bench to your front lines. Enable your technicians to detect equipment faults and verify operational capabilities at the I- and O-levels, saving valuable diagnostic time and cost.
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PCI Express 5.0 Test Platform
Teledyne LeCroy’s PCI Express 5.0 Test Platform is part of a suite of tools that facilitates complete protocol testing of PCI Express devices up to and including version 5.0. The latest feature of the Teledyne LeCroy Test Platform is the addition of an integrated interposer, which eliminates the need for an external interposer. This innovation simplifies setup with fewer connection points and outboard devices, making analysis easier and more reliable than ever. In addition to using the Test Platform with the Exerciser, the user can connect two of their own devices and use the Test Platform as a PCIe 5.0 backplane and as an interposer to capture protocol traffic between the systems.
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PCIe 5.0 Test Platform
PXP-500A
The Teledyne LeCroy PXP-500A Test Platform provides a convenient means for testing PCIe 5.0 cards with a self-contained portable and powered passive backplane. The PXP-500A provides power required for both cards under test.
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ARINC 818 Tester
iWave 3U VPX High-Speed Video/Data Processing Card is a rugged standalone module in the 3U VPX form factor, aimed for the high-speed data, video processing, and display applications is ideal for military, defense, and aerospace applications requiring an optimal balance of performance and power efficiency. iWave 3U VPX High-Speed Video/Data Processing Card is implemented using Xilinx Kintex-7 device architecture and has I/O interfaces including High speed 16 channels of transceiver interfaces capable of operating up to 6 Gbps data rate, Gigabit Ethernet, RS232, RS422, PCIe interface, Built-in health monitoring circuits, HDMI input, and output interfaces
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Automatic Test System
Automatic Test system is the ultimate solution for power electronic testing. The system includes a wide range of hardware choice such as AC/DC Sources, Electronic Loads, DMM, Oscillate Scope, Noise Analyzer and Short /OVP Tester. This flexibility combined with its open architecture software platform-PowerPro III, gives users a flexible, powerful and cost effective test system for almost all types of power supply testing.
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SoC Test System
Specifically designed for high-throughput and high parallel test capabilities to provide the most cost-effective solution for fabless, IDM and testing houses. With the full functions of test capability, high accuracy, powerful software tools and excellent reliability, 3650-EX is ideal for testing consumer devices, high-performance microcontrollers, analog devices and SoC devices.
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Semiconductor Test System
TS-960e
The GENASYS Semi TS-960e PXI Express Semiconductor Test System is an integrated test platform that offers comparable system features and capabilities found in proprietary ATE systems. Available as a bench top system or with an integrated manipulator, the TS-960e takes full advantage of the PXI architecture to achieve a cost-effective and full-featured test solution for device, SoC and SiP test applications.
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VLSI Test System
3380P
The 3380D/3380P/3380 test system have 4 wires HD VI source and any-pins-to-any-site high parallel test (multi-sites test) functions (512 I/O pins to test 512 ICs in parallel) that can meet the upcoming higher IC testing demands.
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VLSI Test System
3380D
The 3380D/3380P/3380 test system have 4 wires HD VI source and any-pins-to-any-site high parallel test (multi-sites test) functions (256 I/O pins to test 256 ICs in parallel) that can meet the upcoming higher IC testing demands.
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OLED Lifetime Test System
58131
The 58131 Lifetime Test System is designed specifically for the OLED industry. Model 58131 provides twoquadrant constant current (CC) and constant voltage (CV) stimulus to each OLED panel and acquires electrical and optical characteristics automatically. Two independent and isolated precision source-and-measure units (PMU) are incorporated in one modular card, which is capable of testing two OLED panels. Additional instrument cards are added to expand test capacity. Hot plug and play is a key feature of 58131. When a UUT fails or an instrument card needs to be replaced, 58131 does not have to be shutdown and testing continues for other UUTs. Hot plug and play obviates life test cycle restarts due to isolated faults and significantly improves life test efficiency. We firmly believe that hot plug and play capability should be mandatory for all lifetime test systems.
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Regenerative Battery Pack Test System
17020E
Charge/discharge modes (CC, CV, CP)Power Range: 10kW / 20kW per channelVoltage Range: 60V/ 100VCurrent Range: 100A/200A/300A/400A/ 500A/600A/700A/800A per channelRegenerative battery energy discharge, efficiency 85%Channels paralleled for higher currentsDriving cycle simulationFast current conversion without current interruptHigh precision measurementSmooth current without over shootTest data analysis functionData recovery protection (after power failure)Independent protection of multi-channel
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Photodiode Burn-in Reliability Test System
58606
The Chroma 58606 PD/APD Burn-in system is a high density, multifunction and temperature controlled module based system for photo diode burn-in and lifetime test. Each module has up to 256 Source Measurement Unit channels which can source current and measure voltage in various scenarios such as one described below. The system can accommodate 7 modules for a total of 1,792 device channels.
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Regenerative Battery Pack Test System
17040E
High-power testing equipment up to 1,700V/ 4800A/ 1.2MW Multiple safety protections for personnel safety risk management and control of battery testing Flexible Integration for automated battery verification solutions
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Photonics Module Test System
58625
Chroma 58625 provides characterization testing for 3D sensing illumination devices. various test modules are combined for validation testing under precise temperature control.
