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product
Solar Cell Characterisation
The PVE300 permits the determination of device spectral responsivity (from which may be determined EQE), and, having performed measurements of sample reflectance (and transmittance where required) the determination of IQE.
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Lens Measurement Spectrophotometers
LINZA 150
LINZA 150 spectrophotometer is designed for broadband transmittance and reflectance measurement of lenses and lens assemblies (objectives) ensuring that only perfect lenses are approved for lens assemblies, delivered to customers or meet specs provided to your lens supplier. The instrument is perfectly suited for both routine lens measurements and sophisticated improvement of lens production technology: Fast on-axis transmittance measurement of individual convex/concave lenses. Fast on-axis transmittance measurement of lens assemblies (objectives). Unattended on-axis and off-axis reflectance measurement of individual lenses providing measurement data virtually from any area on lens surface (both convex and concave). Ideal for fine-tuning of deposition technology used to produce coatings on lenses.
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Transmission / Reflection Measurement
Measure spectral transmittance and reflectance of optical elements such as lens, plate glass, filter, reflector, prism and so on.The wavelength range is 350 to 1100 nm as standard and 220 to 2000 nm as an option.Reflection measurement of a general spectrophotometer can only measure several types of fixed angles, but in this device the incident angle of the sample at the time of reflectance measurement is variable at an arbitrary angle and the minimum incident angle at reflectance measurement is 15 ° ( Optical axis angle 30 °) can be set up.
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Optical Scattering Measurements & Equipment
Synopsys TIS Pro is an optical scattering instrument for efficient measurements of reflectance, transmittance and absorption. This fully automated device features an integrated sphere and a spectral detector assembled in a housing that controls stray light to ensure fast, accurate measurement results.
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Thin Film Metrology Systems
Gemini Series
The n&k Gemini-TF, Gemini-TF-M and Gemini-FPD are specifically designed for measurements of patterned and unpatterned films on transparent or opaque substrates. These tools are used extensively for solar cell, flat panel and photomask applications. The tools belonging to the Gemini-TF Series are based on unpolarized Reflectance (R) and unpolarized Transmittance (T) measurements, with a 50μm spot size for both R and T. R and T are simultaneously measured to determine film thickness and n and k spectra from 190nm – 1000nm
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General Purpose Integrating Spheres
General Purpose Integrating Sphere Systems are designed to spatially integrate radiant flux in order to measure optical radiation. The spheres can be coupled with a sensor to create radiometers, photometers, or spectroradiometers in order to measure the total geometric flux emanating from a light source or the flux density of an illuminated area. Additionally, these sphere systems can be used to measure the output of high power lasers and laser diodes or to measure the reflectance and transmittance of materials.
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Spectrometer & Colorimeter
Spectroradiometer is widely used to measure the spectral, photometric and colorimetric parameters of all kinds of lighting sources which usually include relative spectral power distribution P(λ), chromaticity coordinate (x,y), (u,v), correlated color temperature(CCT), color rendering index(CRI), dominant wavelength, peak wavelength, spectral bandwidth, color purity, color ratio, luminous flux, Illuminance, luminance, spectral transmittance and reflectance, etc. PIMACS provides different types of spectroradiometers and colorimeter to meet the requirements in laboratories or on production lines. They are applied in the measurement for general light sources, LED & OLED products, displays, etc.
