Showing results: 151 - 165 of 185 items found.
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LG-9200 -
Ono Sokki
The LG-9200 is a non-contact type optical detector which emits red visible light and detects the reflected light from the rotating shaft. The reflection mark is used for the detection by affixing it on the rotating shaft. It enables detection at an angle. (reflective mark: HT-011 by Ono Sokki)The LG-9200 has a built-in compact amplifier and outputs the square wave (voltage) after waveform shaping.With a compact and light weight body, performances are upgraded compared to the previous model LG-916.(LG-9200 detection distance: up to 40 mm, response speed: up to 40 m/s)
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Cuming-Lehman Chambers
It’s nearly impossible to perform VHF/UHF measurements in a rectangular chamber. In the 1960’s Emerson determined that tapering one end of an Anechoic Chamber would cause the chamber to act like an indoor ground reflection range.Tapered Chambers work very well at the lower frequencies. Their design forms a uniform illumination across the test region. The tapered end of the chamber forces the wall images close together forming a source antenna array. Tapered Chambers are usually a less expensive option compared to rectangular antenna measurement chambers or compact ranges.
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InfraCal 2 ATR-SP -
Ametek Spectro Scientific
The InfraCal Model ATR-SP is recommended for measuring oil in water, TPH in soil or FOG in wastewater concentration levels when using hexane, pentane or Vertrel MCA as the extracting solvent. Measurement data obtained with this analyzer will correlate to EPA Method 1664 as both procedures are based on evaporation techniques and measuring the residual oil and grease. The analyzer is equipped with a built-in cubic zirconia horizontal attenuated total reflection (HATR) stainless steel sample stage. The InfraCal 2 ATR-SP is a direct replacement for the original InfraCal HATR-T2 used worldwide for the determination of TOG/TPH in water and soil.
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Tektronix, Inc.
Logic probes are used to analyze the logic states (high/true: logic 1 or low/false: logic 0) of digital signals. To verify and debug today’s high-speed, low-voltage digital signals, you need logic probes that can accurately acquire signals from a wide variety of electronic designs, while protecting signal fidelity. Tektronix logic analyzer probes contain a variety of connectivity options that are engineered to ensure that signal acquisition is a true reflection of your design's performance. Compare and learn more about Tektronix logic analyzer probe solutions below.
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780587-42 -
NI
PXIe, 6.6 GHz, 50 Ω, Solid-State, Quad 2x1 PXI RF Relay Module - The PXIe‑2542 is a terminated switch module suited for routing RF signals for production test applications. It features high-performance solid-state relays that offer unique benefits such as unlimited mechanical lifetime and fast switching time. Front-mounted SMA connectors provide easy connection to your RF devices, and the module features termination on every COM line and channel. The channel termination and COM lines help minimize reflections of the RF signal and protect your instruments.
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778572-42 -
NI
6.6 GHz, 50 Ω, Solid-State, Quad 2x1 PXI RF Relay Module - The PXI‑2542 is a terminated switch module suited for routing RF signals for production test applications. It features high-performance solid-state relays that offer unique benefits such as unlimited mechanical lifetime and fast switching time. Front-mounted SMA connectors provide easy connection to your RF devices, and the module features termination on every COM line and channel. The channel termination and COM lines help minimize reflections of the RF signal and protect your instruments.
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HS160 -
Shenzhen Chuangxin Instruments Co., Ltd.
HS160 Wall measurement thickness gauge, wall thickness measuring equipment apply to measure the thickness of all kinds of material, through which the ultrasonic wave can propagate at a constant speed and can get reflection from the back. This instrument can be used for a variety of plate and all kinds of machining parts for accurate measurement. Another important function of this gauge is to monitor all kinds of pipelines and pressure vessels used in the production equipment, monitoring their degree of corroded thinning during the using process. It's widely used in petroleum, chemical industry, metallurgy, shipbuilding, aviation, aerospace and other fields.
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Wuhan Sunma Technology Co., Ltd.
Radio & Vector Network Analyzer adopts the advanced digital and RF combination design technology, fundamental wave frequency mixing technology, digital IF processing technology, intelligent power management technology, etc. It comes with features of high precision, small size, light weight, battery power, can measure SWR, Return Loss, Cable Loss, Impedance, DTF, etc, is used to the field test of cable, feeder, and the reflection parameters test of RF components in science and teaching. SunmaFiber provide all kinds of CATV meters, such as Signal Level Meter, QAM Analyzer, Spectrum Analyzer, DVB/DVC/DVT Analyzer and other TV testers.
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SR Series -
Angstrom Sun Technologies, Inc.
Spectroscopic reflectometer (SR) series are relative low cost and easy to use tools. To enusre accurate measurement on spectra, a long working distance and also adjustable working distance set up are professionaly desgined and considered. Since reflection spectra measurments require to use known reference to calibrate light intensity, it is hard to image user could get accurate spectra without optimizing signal step during such calibration because reference thickness is different from sample substrate's thickness in most of cases. Adjusting power output to lamp is our another consideration in ensuring a good measurement by reducing non-linearity effect of the detector
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GAO Tek Inc.
GAOTek’s laser distance meters are used to measure the distance between the target and the device. Our device sends a pulse of laser light to the target and measures the time it takes for the reflection to return. Its ergonomic design emphasizes function and user-friendly usage. GAOTek’s laser distance meters are reliable, of high quality, and affordable instruments that provide an accurate measuring. Our products offer an easier inspection or testing experience, is compact, and portable. A laser distance meter offers efficient testing, accuracy, versatility, safety, functionality, and convenience compared to the old-fashioned tape method when used in the field. Our laser distance meters are available for purchase to the United States, Canada and globally.
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7 -
Picoprobe
Designed as a companion probe to Models 12C and 18C for driving integrated circuit lines so the Model 12C and 18C can be used to measure the response of adjacent nodes. The Model 7 consists of a flexible 6 foot, 50 ohm coaxial cable accurately terminated to 50 ohms in order to avoid undesirable reflections. A special miniature connector receives replacement coaxial probe tips that provide a shielded environment to within 3 mm of the fine tungsten probe point, thus minimizing capacitive coupling to other parts of the circuit. The replaceable coaxial probe tips are offered in various point sizes and can also be bent to any shape in order to accommodate a variety of probing geometries.
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TLP-8010C -
High Power Pulse Instruments GmbH
*Wafer and package level TLP/VF-TLP/HMM testing*Combines TLP-8010A and TLP-4010C into one system*Can be operated together with TLP-8012A5 and TLP-3011C pulse width extenders*Ultra fast 50 Ω high voltage pulse output with typical rise time 100 ps (0-40 A) and 300 ps (> 40 A)*Up to 80 kW peak output power into 50 Ω load*Built-in HMM pulse up to ±15 kV with 50 Ω configuration*High pulse output current up to ±80 A (short circuit) with minimum 6 dB reflection suppression*High speed 50 Ω trigger output for oscilloscopes (synchronous to high voltage pulse output)*6 GPIB programmable pulse rise times: 100 ps to 50 ns*8 programmable pulse widths: 1 ns to 100 ns (0-40 A), 1 built-in pulse width: 100 ns (> 40 A)*The optional pulse width extender TLP-3011C enables pulse width up to 1.6 µs in 68 GPIB programmable steps (0-40 A)*Optional external pulse width extensions from 5 ns to 500 ns (> 40…80 A) using the external pulse width extender TLP-8012A5*Built-in pulse reflection suppression*Fast measurement time, typically less than 0.2 s per pulse including one-point DC measurement between pulses*Efficient software for system control and waveform data management*The software can control automatic probers for fast measurements of complete wafers*High performance and high quality components
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Stacked LPDA -
Schwarzbeck Mess Elektronik
The stacked Logarithmic Periodic Dipole Antenna consists of two ordinary Log.-Per. structures. The excellent characteristics (flat gain over a large bandwidth, low SWR) of the ordinary Log.-Per. designs could be maintained using the stacked LP design. The stacked design helps to focus the directional pattern of the H-plane somewhat, resulting in a typical gain improvement of ca. 2-3 dB compared to an ordinary LPDA. This is especially important for immunity testing, where a maximum fieldstrength and a good field uniformity is required. The beamwidth in the E-plane and the H-plane are nearly identical, providing an optimised illumination of the EuT with minimised ground reflection influence. Further the STLP 9128 C has an excellent cross-polar rejection.
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Anderson Materials Evaluation, Inc.
Materials characterization, failure analysis, quality control, and materials and process development services are offered. Our analytical techniques allow us to assess elemental and chemical material composition, thermal properties, coating thickness, electrochemical properties, surface chemistry, surface wetting, corrosion rates and pitting potentials, contamination and degradation problems, metallography, fractography, phase transitions, static coefficient of friction, adhesive bonding strength and causes of adhesive bonding failures, surface tension and surface energy, tensile and compressive strength, bend deflection, lapshear strength, elasticity properties, UV and visible light absorption and reflection, density and porosity, and many other material properties integral to improving your products.
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Hinds Instruments, Inc.
The 2-MGEM Optical Anisotropy Factor Measurement System is a normal-incidence polarization reflection microscope designed to measure the sample Mueller matrix and is a 2008 R&D 100 Award Winner. This system is designed specifically to evaluate the Optical Anisotropy Factor (OPTAF) of cross sections of TRISO nuclear fuel pyrocarbon layers. Other possible material characterizations include measuring Mueller matrix elements of other crystals, carbon compounds, and thin film coatings (e.g. surfacedeposition films) at normal incidence. The 2-MGEM can also measure retardation (d), circular diattenuation (CD) and the polarization factor (ß). These parameters are not measurable using older techniques, since those techniques do not incorporate a compensating optical element.
