Showing results: 16 - 30 of 1669 items found.
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58606 -
Chroma ATE Inc.
The Chroma 58606 PD/APD Burn-in system is a high density, multifunction and temperature controlled module based system for photo diode burn-in and lifetime test. Each module has up to 256 Source Measurement Unit channels which can source current and measure voltage in various scenarios such as one described below. The system can accommodate 7 modules for a total of 1,792 device channels.
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58602 -
Chroma ATE Inc.
Chroma 58602 is a high density, precision multi source measurement Unit (SMU) module with temperature control and exchangeable interface developed for burn-in, reliability and life test of optoelectronic components including laser diodes, VCSELs, VCSEL Arrays, silicon Photonics, photo-diodes and other similar components.
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nm-Wave AARTS System -
Accel-RF Corporation
AARTS fully integrated, automated, turnkey system provides flexibility and accuracy in determining RF and DC performance degradation with aging to predict life expectancy for compound semiconductor devices. Our millimeter-wave Automated Accelerated Reliability Test Systems (AARTS) and fixture solutions are available in standard frequency ranges from 26.5 to 67 GHz.
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58604 -
Chroma ATE Inc.
The Chroma 58604 is a high density, multi-function, and temperature controlled module for laser diode burn-in and lifetime tests. Each module has up to 256 SMU channels which can source current and measure voltage in various control modes as described below.
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DC-HTOL -
Accel-RF Corporation
The DC Automated Accelerated Reliability Test Station (AARTS) systems are designed to maximize channel density. The first systems developed by Accel-RF (ARF) were intended for RF and DC stimulus to the Device Under Test (DUT). However, there are some applications in which RF stimulus is not required.
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RF-HTOL -
Accel-RF Corporation
The RF Automated Accelerated Reliability Test Station (AARTS) systems are designed to stress devices with RF, DC, and thermal stimulus. The systems were designed from their inception to include RF stimulus - it was not added as an after-thought. Hence, the software and hardware are fully integrated and provide full-featured support.
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UltiMod Series -
Advanced Energy
The industry-proven Excelsys UltiMod power-supply platform combines technical performance with user flexibility. Built for various demanding industries, the series delivers up to 1200 W of output power in a compact 1U form factor and up to 12 isolated output voltages.
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Panasonic Industrial Devices Sales Company of America
An AEC-Q200 Compliant SeriesPanasonic components specified as AEC-Q200 Compliant are consistently designed into automotive systems. However, today’s Design Engineers are specifying AEC-Q200 components to meet the high-quality standards of devices beyond automotive applications.
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5530 -
Keysight Technologies
The configurable system offers all the components you need to perform a variety of measurements using the USB on your PC as the host controller and power source. For basic linear measurements you will need the USB Axis Module, USB Sensor Hub, Air and Material Sensors, Sensor Cables, Software, Laser, Laser Cable, Remote Control (optional)and the Linear Optics Set. Other available options include the Laser Tripod (with laser mounting plate), optics and fixturing kits for making additional types of measurements, and wheeled transit cases.
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Lattice Nexus Platform -
Lattice Semiconductor
The Lattice Nexus FPGA platform combines Lattice’s long-standing low power FPGA expertise with leading 28nm FD-SOI semiconductor manufacturing technology. With this platform, Lattice enables the rapid development of multiple device families that deliver low power, high performance, high reliability and small form factor.
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ERA-XV/ERA-XK Series -
Panasonic Industrial Devices Sales Company of America
Anti-Sulfurated Thin Film Chip Resistors From Panasonic For Dependable, Accurate And Reliable Performance In Extremely Hazardous EnvironmentsPanasonic's ERA-xV and ERA-xK Series Thin Film Chip Resistors feature a soft terminal and passivated layer. With a total of 2,889 part number variants, Panasonic ERA-xV and ERA-xK Series Resistors provide design engineers with a wide array of Resistors to choose from specifically developed to handle extremely hazardous and challenging application environments.
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Yelo Ltd.
Laser reliability testing consists of a series of tests that laser diodes can be put under in order to ensure their reliability for post-production use. There are different types of tests that can be carried out and there are multiple measurements that can be taken in order to evaluate the reliability of the device. One of these tests is laser diode burn-in.
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Checker Range -
SDT Ultrasound Solutions
Ideal for reliability departments adopting operator driven reliability (ODR), Checkers engage any stakeholder who is responsible for ensuring reliable operation of their assets prior to, during, and after their shift
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AFL
Bandwidth, Performance, and Reliability for cutting-edge applications.