S-Parameters
Scattering Parameters quantifies high frequency RF power waves propagation through a network.
See Also: Vector Network Analyzers
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S-parameter Measurement System
DPS21
Unlike a coaxial tube type or a wave guide tube type, this method does not make errors caused by air-gap as specimens are not put into a fixture. Practical data can be obtained even at the rough, uneven surfaces where the specimen is placed on.It enables compactness and measuring specimens by plane wave because of direct installment of lens with an antenna.It enables measurement by monitoring S21 and S11 parameter with connections of a test fixture to a vector network analyzer and PC.
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S-Parameter Measurement System
DPS08
KEYCOM provides S-parameter method measurement systems in two modes, the reflection mode and the transmission mode, to address the individual purposes. Both modes measure the complex permittivity (εr) and complex permeability (μr) at the same time, and the proper usage is as follows.
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Real-time S-Parameter And Power Measurement Uncertainty
S96015B
See real-time measurement uncertainty for S-parameters and power measurements with the measurement traces on one screen. Estimate uncertainty reliably and apply more realistic limit lines for pass/fail tests for better production yield rates
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Real-time S-Parameter And Power Measurement Uncertainty
S93015B
The S93015B provides real-time measurement uncertainty for S-parameters and power measurements with the measurement traces on the same screen. It enables the users to estimate more reliable uncertainty and apply more realistic limit lines for pass/fail tests for better production yield rates.
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Real-time S-Parameter And Power Measurement Uncertainty
S95015B
The S95015B provides real-time measurement uncertainty for S-parameters and power measurements with the measurement traces on one screen. It lets you estimate uncertainty reliably and apply more realistic limit lines for pass/fail tests for better production yield rates.
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Real-time S-Parameter And Power Measurement Uncertainty
S97015B
See real-time measurement uncertainty for S-parameters and power measurements with the measurement traces on one screen. Estimate uncertainty reliably and apply more realistic limit lines for pass/fail tests for better production yield rates
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Time Domain Reflectometers and S-Parameter Analyzers
The Teledyne LeCroy WavePulser 40iX and the Teledyne Test Tools T3SP15D are a perfect combination of complimentary products to serve the requirements on testing, validating and troubleshooting cables, backplanes, connectors, transmission lines on boards and interconnect.
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110 GHz Lightwave Component Analyzer
N4372E
The N4372E lightwave component analyzer helps you with optoelectronic tests with its measurement capability of 110 GHz in an extended wavelength range. It also offers RX testing up to 110 GHz in the full 1260 nm to 1620 nm range. It has a built-in optical power meter that enables you to check and control the operating power. The N4372E lightwave component analyzer's optical transmitter input port connects to an auxiliary tunable laser to verify S-parameters over wavelength.
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26.5 GHz Single-Mode Lightwave Component Analyzer
N4375E
The new N4375E single-Mode LCA is based on the latest 5222A series network analyzers with 2-port or 4-port configuration. This LCA is the ideal measurement solution for electro-optical components up 26.5GHz electro-optical components, as well as Radio over Fiber (RoF) and aerospace and defense (A&D) electro-optical test applications. The N4375D is traceable to international standards and provides guaranteed specifications for electro-optical responsively S-parameter measurements in a turn-ke...show more -
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Active Hot Parameters
S93110B
S93110B active hot parameters is available on PNA-X Series network analyzers (N524xB) and provides more accurate method to test hot S-parameters, gain and output power, etc. than traditional methods by utilizing X-parameter technologies.
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Active Hot Parameters For E5081A ENA-X And E5080B ENA
S96111B
The S96111B active hot parameters are available on ENA-X or ENA network analyzers and provide a more accurate method to test hot S-parameters, gain and output power than traditional methods by utilizing X-parameter technologies. Restricted to 50 GHz.
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Active Hot Parameters For M98xxA PXIe VNA
S95111B
S95111B active hot parameters are available on M98xxA PXIe vector network analyzers and provide a more accurate method to test hot S-parameters, gain, and output power than traditional methods by utilizing X-parameter technologies. Restricted to 50 GHz.
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Active Hot Parameters For P50xxA/B Streamline Series VNA
S97111B
S97111B active hot parameters are available on P50xxA/B Streamline Series vector and provide a more accurate method to test hot S-parameters, gain and output power than traditional methods by utilizing X-parameter technologies. Restricted to 50 GHz.
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Active Hot Parameters, Restricted To 50 GHz
S93111B
S93111B active hot parameters available on PNA-X Series network analyzers (N524xB) and provides more accurate method to test hot S-parameters, gain and output power than traditional methods by utilizing X-parameter technologies. Restricted to 50 GHz.
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Automated Measurement Expert (AMX), Test Plan Builder
S94701A
The Keysight S94701A automated measurement expert (AMX) Test Plan Builder will help you edit and create your test plans for automated multiport S-parameter measurements with the PXI Vector Network Analyzer (VNA).
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Automated Measurement Expert (AMX), VNA Plugin
S94702A
The Keysight automated measurement expert (AMX) is a smart software solution for automated multiport S-parameter measurements with the PXIe vector network analyzers M937xA/M9485A or the benchtop E5080A ENA network analyzer. The S94702A AMX VNA plugin adds S-parameter measurement capabilities to the Keysight test automation platform (TAP). The combination of the TAP and the VNA plugin forms the AMX backend software, which makes the VNA setups and executes the test sequences in the PXIe controller...show more -
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Automotive Ethernet Rx Compliance Software
AE6910R
Unlike CAN, LIN, or MOST, the IEEE standard for automotive Ethernet demands rigorous compliance verification using specific test cases. The test requirements include complex measurements: vector network analysis with S-parameters, bit error rate (BER) test, and protocol analysis of high-speed digital signals.
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Cable Assembly with 2.4mm Male Connectors
Y1740A
The Y1740A is a flexible cable with excellent phase stability. This cable is recommended for accurate S-parameter measurements using the following Keysight vector network analyzers: Streamline Series VNA, M983xA/M980xA Series PXIe VNA, or M981xAS series PXIe Vector Component Analyzer (VCA).
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Complex System Solutions
К2М-100 Series
*Operating Frequency Range: 100 MHz*Measurements per Connection*All S-Parameter Measurement (256 states)*SOLT Calibration*Measurement Profile Save*Full and Cross Measurement Result Analysis
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CTGcalc™ Software
CTGcalc™ is a Windows application that sets up microwave network analyzers, acquires measured S-parameter data, and analyzes the acquired data for CTG’s various measurement fixtures. CTGcalc™ allows the user to extract complex dielectric permittivity, magnetic permeability, or sheet impedance of the measured specimens.
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Custom Test Systems
ATE Systems has developed a wide variety of custom test systems that integrate commercial test instruments and custom hardware, tied together with a test executive. Examples of the types of tests that have been incorporated include: S-parameters (gain, return loss, VSWR, etc), Noise figure, Power, Spectral response, Linearity, Voltage, Current, Switching speed and so on
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Digital Interconnect Test System, Reference Solution
When you need to measure advanced S-parameters with a fast, low-cost and easy-to-use test solution, the Digital Interconnect Test System gives you a significant edge. It provides a full 32-port vector network analyzer (VNA) configured within a single PXI chassis – ideal for high-speed cable testing. And lets you test any linear passive interconnect faster and easier, including backplanes, connectors and PCBs. Sharpen your edge with Keysight’s Digital Interconnect Test System that enables signal integrity characterization of multiport interconnect products.
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ENA Vector Network Analyzer
E5063A
2-port, 50 ohm, S-parameter test set Select the VNA frequency option that best suits your test needs and budget, and upgrade options at any time Boost efficiency and productivity with the consistent measurement framework of the industry-standard vector network analyzer Enhance your PCB manufacturing test capability with Option 011Easier operation with support for 6 languages via softkey & the embedded help manual in English/Simplified Chinese Every spec verified, adjustments included Lock in support & peak performance from the start
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ENA Vector Network Analyzer
E5071C
9 kHz to 4.5/6.5/8.5/14/20 GHz2- or 4-port, 50 ohm, S-parameter test set Improve accuracy, yield and margins with wide dynamic range 130 dB, fast measurement speed 8 ms and excellent temperature stability 0.005 dB/CObtain design confidence through complete characterization of high-speed serial interconnects with enhanced time domain analysis option Protect your investment with upgradability across all of the options Every spec verified, adjustments included Lock in support & peak performance from the start
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ENA Vector Network Analyzer
E5061B
Select the best configuration for your test needs from a wide variety of test set options: 100 kHz to 1.5 GHz/ 3 GHz, 2-port, 50 or 75 ohm, transmission/reflection or S-parameter test set Address a broad range of applications with the LF-RF option (Option 3L5/3L4/3L3): 5 Hz to 3 GHz, 2-port, 50 ohm, S-parameter test set, gain-phase test port, built-in DC bias source Combine network analysis and impedance analysis to customize your application in a single instrument (Option3L5/3L4/3L3 plus 005) Every spec verified, adjustments included Lock in support & peak performance from the start
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Enhanced Time Domain Analysis With TDR
S93011B
S93011B enhanced time domain with TDR is available on all PNA models (N52xxB) and provides a one-box solution for high-speed interconnect analysis, including impedance, S-parameters, and eye-diagrams
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Fast Electromagnetic Analysis Suite
FEMAS
FEMAS was created to provide tools for engineers to assist in PCB and system design. Our tools are based on full wave solutions to Maxwell's equations but operate much faster than traditional CEM tools. Multi-Functional! End-to-End Link Path Analysis. S-parameter file concatenation. Time Domain analysis. Frequency Domain analysis. Transmit/Receive Equalization. Causality/Passivity Checking/enforcement. 2D Cross Section Analysis for multi-conductors. S-parameter and waveform plotting. Network parameter conversion. De-Embedding. Signal Analysis.
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FieldFox C Handheld Microwave Analyzer, 10 GHz
N9915C
Capture elusive signals with up to 120 MHz gap-free, real-time bandwidth. Measure all four S-parameters simultaneously with 115 dB dynamic range. Make accurate spectrum analyzer measurements (± 0.3 dB) without warmup. Perform over-the-air measurements for 5G NR and LTE. Use GPS/GNSS for geolocation and timestamping.
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FieldFox C Handheld Microwave Analyzer, 6.5 GHz
N9914C
Capture elusive signals with up to 120 MHz gap-free, real-time bandwidth. Capture elusive signals with up to 120 MHz gap-free, real-time bandwidth. Measure all four S-parameters simultaneously with 115 dB dynamic range. Make accurate spectrum analyzer measurements (± 0.3 dB) without warmup. Perform over-the-air measurements for 5G NR and LTE. Use GPS/GNSS for geolocation and timestamping.
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FieldFox C Handheld Microwave Analyzer, 6.5 GHz
N9914C
Capture elusive signals with up to 120 MHz gap-free, real-time bandwidth. Measure all four S-parameters simultaneously with 115 dB dynamic range. Make accurate spectrum analyzer measurements (± 0.3 dB) without warmup. Perform over-the-air measurements for 5G NR and LTE. Use GPS/GNSS for geolocation and timestamping.
