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SPM
Used to study the properties of surfaces at the atomic level. (www.eng.yale.edu)
See Also: Scanning Probe Microscopes, AFM
- Pickering Interfaces Inc.
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Switch Path Manager Lite License - SPM Lite
90-900-901
A low-cost "lite" version of our Switch Path Manager has a site license (can be used on unlimited PCs) and a boot limitation of two switching modules.
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Components - Subharmonic Mixers (SPM)
SPM Series
Farran offers fundamental (RF ≈ LO), sub-harmonic (RF ≈ 2xLO) and harmonic mixers (RF≈NxLO, where N=2, 4, 6 …) for a wide variety of applications from 26.5 GHz to 500 GHz. All mixers use planar Schottky diodes and provide state of the art performance in a small and lightweight package.High-performance sub harmonically pumped mixers are available in frequencies from 50 to 350 GHz and beyond.
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Create Topographic Profiles from SPM Images
TopoStitch
topoStitch™ offers the easiest and most accurate way to stitch topographic or greyscale images from Scanning Probe Microscopes (SPM’s), profilers, interferometers, confocal microscopes or any other instrument type. All images are placed automatically according to stage position coordinates when stored in the image files. Otherwise, the Grid Layout Wizard helps to lay out images in seconds. topoStitch™ even offers advanced snapping and semi transparent rendering, which makes it easy to place and adjust images manually.
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High-Resolution Scanning Probe Microscope (SPM)
High-Resolution Scanning Probe Microscope (SPM)
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MountainsSPIP™ 8
We are currently working hard on a new development, together with our colleagues at Digital Surf *), to bring you the next generation of SPM image analysis software, based on the industry-standard Mountains platform and all the best SPIP interactivity and analytical tools.Our new product, called MountainsSPIP 8, will be unveiled at the MRS Fall Exhibit in Boston November 2018 and available for customers early 2019.
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Scanning Probe Microscope
SPM-9700HT
Making the Unknown Visible Scanning probe microscope (SPM) is a generic term for microscopes that scan sample surfaces with an extremely sharp probe to observe their three-dimensional image or local properties at high magnifications. The SPM-9700HT takes high-throughput observations to the next level.
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Scanning Probe Microscopy
SPECS Surface Nano Analysis GmbH
As Scanning Probe Microscopy (SPM) is a key tool for nanotechnology, SPECS offers dedicated solutions for highly demanding requirements.In UHV, strong emphasis lies on spectroscopic methods such as scanning tunneling spectroscopy and inelastic tunneling spectroscopy as well as single atom and molecule manipulation. With the invention of a Joule-Thomson cryostat by Prof. Wulf Wulfhekel, SPECS now offers the JT-STM , operating sample and sensors in thermal equilibrium below 1K with optional high magnetic field.
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SPM Control System
Nanonis
SPECS Surface Nano Analysis GmbH
Unbound to any specific microscope, the Nanonis SPM Control System is designed for the uncompromising demands of scientific excellence in a wide variety of SPM applications. Its modular concept implemented in a fully digital fashion is carefully thought through, with a strong emphasis on usability, stability and flexibility.
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Surface Analysis
Shimadzu offers a range of instruments that are ideal for all sample forms handled by customers in the fields of steel, non-ferrous metals, environment, foods, chemicals, pharmaceuticals, semiconductors, ceramics, and polymers. EPMA/SEM offers analysis of targets from several centimeters to several microns; XPS offers analysis from several millimeters to several microns; and SPM permits observations from over a hundred microns to several nanometers.
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The Golden STM
*Golden (chemically resistive) vibration isolated STM body with implemented preamplifier*Computer with PCI board based SPM controller *Anfatec Scan & Anfatec Present*19“ STM controller (extra low noise 24 bit converters)*HV display for z-direction*High voltage amplifiers for the x-y-tube scanning*Optional: PC controlled bi-potentiostat and electrochemical cell
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SPM Monitor
CS-150
The CS-150 is a high-precision chemical concentration monitor designed for use with the SPM solutions used in semiconductor-manufacturing cleaning processes. Featuring fast response and a compact size, the CS-150 continually monitors the concentrations of the various components of the SPM solutions (H2SO4/H2O2/H2O) used to remove metal ions and organic substances. Feedback control based on the monitor output is used to keep the concentrations of the SPM solutions within the allowable ranges and to eliminate unnecessary replacement of chemicals.A short measuring cycle allows the accurate tracking of chemical concentrations, while the compact design facilitates integration with a cleaning device.
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Atomic Force Microscope
AFM
Atomic Force Microscopes are the most widely used SPM microscopes. They can be applied in fields that span from surface science, semiconductor technology, magnetic media, polymer science, optics to biology, chemistry and medicine.Absolute positioning with an accuracy of 2 nm.
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AFM & SPM Probes
Nanonics offers a wide variety of custom-made probes for Nanonics MultiView systems to meet all your imaging, writing, manipulation, and characterization needs. See below for different categories of probes we offer.
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NSOM & SNOM SPM
NSOM Is the premier tool for imaging and manipulation of light on the nanoscale and is a critical instrument for understanding plasmonics, photonic waveguides, photovoltaic and photoconductivity studies. The optical openness of the NSOM system permits any illumination scenario while the Multiprobe NSOM head offers optical transport and dynamic study on the nanoscale for the first time. Offering a variety of options from entry level to low-temperature systems, the MultiView NSOM series has been the platform of choice for imaging on the nanoscale for nearly two decades.
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SPM Controller
the ability to provide independent torque (current) control or speed (voltage) control to the motor at any throttle position.
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SPM Probes
AppNano silicon probes are manufactured out of prime grade, low resistivity (0.01- 0.025 Ω-cm), n-type antimony doped, single crystal siliconOur well-established silicon technologies combined with novel micro-fabrication processes achieve consistent high quality monolithic probes with unprecedented tip sharpnessWe have many standard silicon probe series designed for a wide variety of applications that are compatible with most AFM equipment in the market
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Switch Path Manager License - SPM Full (Pro)
90-900-001
Simplifies signal routing through switching systems and speeds up the development of switching system software. It is available as a site license (see below for additional information).
