Showing results: 1 - 15 of 27 items found.
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CS-150 -
HORIBA, Ltd.
The CS-150 is a high-precision chemical concentration monitor designed for use with the SPM solutions used in semiconductor-manufacturing cleaning processes. Featuring fast response and a compact size, the CS-150 continually monitors the concentrations of the various components of the SPM solutions (H2SO4/H2O2/H2O) used to remove metal ions and organic substances. Feedback control based on the monitor output is used to keep the concentrations of the SPM solutions within the allowable ranges and to eliminate unnecessary replacement of chemicals.A short measuring cycle allows the accurate tracking of chemical concentrations, while the compact design facilitates integration with a cleaning device.
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Applied NanoStructures, Inc.
AppNano silicon probes are manufactured out of prime grade, low resistivity (0.01- 0.025 Ω-cm), n-type antimony doped, single crystal siliconOur well-established silicon technologies combined with novel micro-fabrication processes achieve consistent high quality monolithic probes with unprecedented tip sharpnessWe have many standard silicon probe series designed for a wide variety of applications that are compatible with most AFM equipment in the market
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Nanonis -
SPECS Surface Nano Analysis GmbH
Unbound to any specific microscope, the Nanonis SPM Control System is designed for the uncompromising demands of scientific excellence in a wide variety of SPM applications. Its modular concept implemented in a fully digital fashion is carefully thought through, with a strong emphasis on usability, stability and flexibility.
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Nanonics Imaging Ltd.
Nanonics offers a wide variety of custom-made probes for Nanonics MultiView systems to meet all your imaging, writing, manipulation, and characterization needs. See below for different categories of probes we offer.
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Nanonics Imaging Ltd.
NSOM Is the premier tool for imaging and manipulation of light on the nanoscale and is a critical instrument for understanding plasmonics, photonic waveguides, photovoltaic and photoconductivity studies. The optical openness of the NSOM system permits any illumination scenario while the Multiprobe NSOM head offers optical transport and dynamic study on the nanoscale for the first time. Offering a variety of options from entry level to low-temperature systems, the MultiView NSOM series has been the platform of choice for imaging on the nanoscale for nearly two decades.
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SPM Series -
Farran Technology Ltd
Farran offers fundamental (RF ≈ LO), sub-harmonic (RF ≈ 2xLO) and harmonic mixers (RF≈NxLO, where N=2, 4, 6 …) for a wide variety of applications from 26.5 GHz to 500 GHz. All mixers use planar Schottky diodes and provide state of the art performance in a small and lightweight package.High-performance sub harmonically pumped mixers are available in frequencies from 50 to 350 GHz and beyond.
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TopoStitch -
Image Metrology A/S
topoStitch™ offers the easiest and most accurate way to stitch topographic or greyscale images from Scanning Probe Microscopes (SPM’s), profilers, interferometers, confocal microscopes or any other instrument type. All images are placed automatically according to stage position coordinates when stored in the image files. Otherwise, the Grid Layout Wizard helps to lay out images in seconds. topoStitch™ even offers advanced snapping and semi transparent rendering, which makes it easy to place and adjust images manually.
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90-900-001 -
Pickering Interfaces Ltd.
Simplifies signal routing through switching systems and speeds up the development of switching system software. It is available as a site license (see below for additional information).
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90-900-901 -
Pickering Interfaces Ltd.
A low-cost "lite" version of our Switch Path Manager has a site license (can be used on unlimited PCs) and a boot limitation of two switching modules.
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SPM-9700HT -
Shimadzu Corp.
Making the Unknown Visible Scanning probe microscope (SPM) is a generic term for microscopes that scan sample surfaces with an extremely sharp probe to observe their three-dimensional image or local properties at high magnifications. The SPM-9700HT takes high-throughput observations to the next level.
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SPM -
PJ Electronics, Inc.
High Frequency Digital Surge Tester and DC Hi-Pot Tester (similar to the "SP" Model) together in a compact cabinet. Take this portable tester to your test site and accurately perform Surge, Hi-Pot, PI and Resistance Tests.
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AFM -
A.P.E. Research
Atomic Force Microscopes are the most widely used SPM microscopes. They can be applied in fields that span from surface science, semiconductor technology, magnetic media, polymer science, optics to biology, chemistry and medicine.Absolute positioning with an accuracy of 2 nm.
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Rocky Mountain Laboratories, Inc.
Scanning probe microscopy (SPM) refers to a family of measurement techniques that utilize a scanning probe. The most common measurement is Atomic Force Microscopy (AFM Analysis), which measures surface topography. Imaged areas can be from the nm scale to as large as 100 µm X 100 µm. Heights and depths of features can be measuredand many surface roughness parameters, e.g Ra, can be calculated. 3-D images can also be produced for dramatic data presentation. Magnetic and electrical response can also be measured with SPM.
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SpectraView 2500 -
DYNEOS AG
* Ultra-low noise SPM* Colocalized nanochemical analysis by IR, THz, Raman, AFM* Cantilever probes are completely transparent* Versatile configurations: Kelvin Probe chemical potential, electrical, thermal and photon force
